| Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
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| 03/14/2006 | US7013229 Obtaining calibration parameters for a three-port device under test |
| 03/14/2006 | US7012435 State detecting method and insulation resistance fall detector |
| 03/09/2006 | US20060052962 Integrated circuit having clock trim circuitry |
| 03/09/2006 | US20060052961 Individual data line strobe-offset control in memory systems |
| 03/09/2006 | US20060052960 Sorting method for automated optimization of asymmetric waveform generator lc tuning electronics |
| 03/09/2006 | US20060049823 Probe card and method for testing magnetic sensor |
| 03/08/2006 | CN2763777Y Multi-purpose check meter for instrument |
| 03/07/2006 | US7009407 Delay lock circuit having self-calibrating loop |
| 03/02/2006 | WO2006021280A1 Calibration standard |
| 03/02/2006 | US20060043978 Method of calibrating a network analyzer |
| 03/02/2006 | DE202005020193U1 Magnetic field sensor e.g. magnetometer, calibrating generator, has measuring station with calibration heads, which are spaced from each other in axial direction, and calibration coils, whose distance is variably adjustable |
| 03/01/2006 | CN1740805A Method for correcting electric current voltage testing instrument |
| 02/28/2006 | US7005868 Apparatus and method for canceling DC errors and noise generated by ground shield current in a probe |
| 02/28/2006 | US7005860 Insulation resistance drop detector and method of detecting state thereof |
| 02/28/2006 | US7005859 Circuit arrangement and method for monitoring a current circuit |
| 02/28/2006 | US7005844 Measuring circuit arrangement for electricity meters for direct connection |
| 02/23/2006 | DE102004037718A1 Electrically conductive or dielectric layer`s surface defect detecting method for e.g. absorber chamber, involves transforming scattering parameter from frequency domain to time domain and detecting surface defects from process in domains |
| 02/22/2006 | CN2760572Y Low-voltage current transformer detecting instrument |
| 02/21/2006 | US7003419 Card for testing functions of card interface |
| 02/21/2006 | US7003408 Hysteresis characteristic setting device and hysteresis characteristic setting method |
| 02/16/2006 | WO2006017743A2 Method and system for radio-frequency signal coupling to medium tension power lines with auto-tuning device |
| 02/16/2006 | US20060036388 Method and system for radio-frequency signal coupling to medium tension power lines with auto-tuning device |
| 02/16/2006 | US20060036383 Method and device for obtaining a stereoscopic signal |
| 02/16/2006 | DE112004000614T5 System und Methode für die Kalibrierung von Testgerät unter Verwendung von Bauelement-Photoemission System and method for the calibration of test equipment using component-photoemission |
| 02/15/2006 | EP1625408A2 Fiberoptic faraday effect sensor |
| 02/15/2006 | CN2758789Y Fault monitoring circuit for Hall current sensor |
| 02/15/2006 | CN1735815A Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer |
| 02/14/2006 | US6998834 Real-time time drift adjustment for a TDR step stimulus |
| 02/09/2006 | US20060028225 Process and a device for the calibration of a semiconductor component test system |
| 02/09/2006 | DE102004028907B3 High accuracy voltage standard for voltmeter calibration has two J-DACs with multiplexer switched between them to give varying output signal |
| 02/08/2006 | CN1732537A Method of addressing individual memory devices on a memory module |
| 02/08/2006 | CN1731196A AC/DC dual-purpose electronic galvanometer |
| 02/07/2006 | US6995576 Thin film transistor array inspection apparatus |
| 02/07/2006 | US6995571 Vector network analyzer mixer calibration using the unknown thru calibration |
| 02/07/2006 | US6995568 Method for fault tracing in electronic measurement and test arrangements for electrochemical elements |
| 02/02/2006 | WO2006012529A1 Apparatus and method for calibrating equipment for high frequency measurements |
| 02/02/2006 | US20060025949 Photosensitive control with dynamic calibration |
| 01/26/2006 | US20060020410 Method and system for wideband device measurement and modeling |
| 01/26/2006 | US20060020409 Method for electronically adjusting the selective oscillation frequency of a coriolis gyro |
| 01/26/2006 | DE102004031436A1 Einrichtung und Verfahren zum Kalibrieren eines Halbleiter-Bauelement-Test-Systems, insbesondere einer probecard bzw. eines Halbleiter-Bauelement-Testgeräts Apparatus and method for calibrating a semiconductor device test system, in particular a probe card and a semiconductor device tester |
| 01/25/2006 | EP1619515A2 Apparatus and method for compensation of errors in a reference voltage |
| 01/24/2006 | US6989663 Flatness correction |
| 01/19/2006 | WO2006007000A2 Method and apparatus for instrument transformer reclassification |
| 01/19/2006 | WO2005085880A3 Electrical power meter |
| 01/19/2006 | US20060015280 Apparatus and method for determining angular position of a rotating disk |
| 01/19/2006 | CA2571764A1 Method and apparatus for instrument transformer reclassification |
| 01/18/2006 | CN2752786Y Electric energy meter interface detecting instrument |
| 01/18/2006 | CN1721612A Method for calibrating current offset and filtering bad data in a system that detects power output |
| 01/17/2006 | US6988061 Operational verification for product safety testers |
| 01/17/2006 | US6988043 External transformer correction in an electricity meter |
| 01/17/2006 | US6987398 System for evaluating probing networks |
| 01/17/2006 | US6987390 Method for testing a transformer and corresponding test device |
| 01/12/2006 | WO2006004569A2 Algorithm for estimation of multiple faults on a transmission line or waveguide |
| 01/12/2006 | US20060006859 Signal detection contactor and signal calibration system |
| 01/12/2006 | DE19614506B4 Aufbau und Verfahren zur Auswertung von Signalzuständen in einem Sondenmeßnetzwerk Structure and method for evaluation of signal states in a Sondenmeßnetzwerk |
| 01/11/2006 | CN1719275A Parallel calibration system for a test device |
| 01/04/2006 | CN1715946A Capacitive voltage transformer transient error digital correcting method |
| 01/03/2006 | US6983215 RF metrology characterization for field installation and serviceability for the plasma processing industry |
| 01/03/2006 | US6983213 comprises digital calibration filter |
| 01/03/2006 | US6982606 Method and device for dynamically calibrating frequency |
| 01/03/2006 | US6982561 Scattering parameter travelling-wave magnitude calibration system and method |
| 12/29/2005 | US20050289392 Power supply device, method, program, recording medium, network analyzer, and spectrum analyzer |
| 12/29/2005 | US20050288885 Method for calibrating current offset and filtering bad data in a system that detects power output |
| 12/29/2005 | US20050288884 Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals |
| 12/29/2005 | US20050288877 Method and apparatus for instrument transformer reclassification |
| 12/29/2005 | US20050288876 Method and apparatus for instrument transformer reclassification |
| 12/29/2005 | US20050285606 Delay lock circuit having self-calibrating loop |
| 12/29/2005 | US20050285605 Delay lock circuit having self-calibrating loop |
| 12/28/2005 | EP1610144A2 Method for calibrating offset from DC bus |
| 12/28/2005 | EP1224487B1 Circuit and method for improved test and calibration in automated test equipment |
| 12/27/2005 | US6980915 Phase noise compensation for spectral measurements |
| 12/22/2005 | WO2005121823A1 Method for diagnosing status of burn-in apparatus |
| 12/22/2005 | US20050283332 Method and device for inspecting and monitoring the seal integrity of sterile packages |
| 12/22/2005 | DE102005014993A1 Korrektur von Verlust und Streuung bei Kabelfehlermessungen Correction of loss and scattering in cable fault finding |
| 12/22/2005 | DE102004024336A1 Electronic semiconductor component for determination of supply voltage has two input terminals for supply of voltage and current and output terminal and circuit with logic element is connected between terminals with control circuit |
| 12/21/2005 | EP1607758A1 Test apparatus |
| 12/15/2005 | WO2005043176A3 Probe testing structure |
| 12/15/2005 | DE102005021247A1 Eigenschaftsmessverfahren für Hochfrequenzschaltung, Kalibriermuster und Kalibriervorrichtung Property Measuring method for high frequency circuit calibration pattern and calibration |
| 12/15/2005 | DE102004056133A1 Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke A method for detecting an offset drift in a Wheatstone measuring bridge |
| 12/14/2005 | EP1605275A2 Electronic meter digital phase compensation |
| 12/13/2005 | US6975951 Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals |
| 12/10/2005 | CA2509473A1 Meter apparatus and method for phase angle compensation employing linear interpolation of digital signals |
| 12/08/2005 | WO2005116669A1 Method for correcting measurement error and instrument for measuring characteristics of electronic component |
| 12/08/2005 | US20050270087 Current comb generator |
| 12/08/2005 | US20050270015 Method and apparatus for electronic meter testing |
| 12/08/2005 | DE19644283B4 Verzögerungszeit-Meßvorrichtung für eine Verzögerungsschaltung Delay time measuring device for a delay circuit |
| 12/08/2005 | DE102004035556B3 Verfahren und Einrichtung, insbesondere probecard, zum Kalibrieren eines Halbleiter-Baulement-Test-Systems, insbesondere eines Halbleiter-Bauelement-Testgeräts Method and apparatus, in particular probe card, for calibrating a semiconductor element Baule-test system, especially a semiconductor device testing apparatus |
| 12/07/2005 | CN1230962C Apparatus for battery capacity measurement and for remaining capacity calculation |
| 12/06/2005 | US6973400 System and method for oscillator self-calibration using AC line frequency |
| 12/06/2005 | US6973399 Method and circuit for correcting periodic signals of an incremental position measuring system |
| 12/06/2005 | US6972563 Method of adjusting a fluxgate magnetometer apparatus |
| 12/01/2005 | WO2005114245A1 Mri with separation of fat and water signal using radial ssfp sequence |
| 12/01/2005 | WO2005091869A3 Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means |
| 12/01/2005 | US20050264301 Scattering parameter travelling-wave magnitude calibration system and method |
| 12/01/2005 | US20050264300 Impedance calibration circuit and method thereof |
| 12/01/2005 | DE10393797T5 Energieversorgungsvorrichtung, Verfahren, Programm, Aufnahmemedium, Netzwerkanalysator, und Spektrumsanalysator Power supply apparatus, method, program, recording medium, network analyzer, spectrum analyzer and |
| 11/29/2005 | US6970002 Tube measurement and calibration system |
| 11/24/2005 | US20050258838 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 11/24/2005 | US20050258819 Property measurement method for high frequency circuit, calibration pattern, and calibration jig |
| 11/22/2005 | US6968302 System and method for remote analysis and control of test and measurement devices |