| Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
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| 03/03/2005 | DE102004034879A1 Verfahren und Vorrichtung zum Messen einer zu testenden Vorrichtung unter Verwendung einer verbesserten Durchgangs-Reflexions-Leitungs-Messkalibierung Method and apparatus for measuring a device under test using an improved passage-reflection line Messkalibierung |
| 03/02/2005 | CN1589409A Method and apparatus for in-circuit testing of sockets |
| 03/02/2005 | CN1588114A Quick correcting method for multiple test port |
| 03/01/2005 | US6861846 Distortion measurements with a vector network analyzer |
| 02/24/2005 | WO2005017542A2 Calibration of tester and testboard by golden sample |
| 02/24/2005 | WO2004021454A3 Method for calibration of a photodiode, semiconductor chip and operating method |
| 02/24/2005 | US20050043909 Method for measuring integrated circuit processor power demand and associated system |
| 02/24/2005 | US20050040900 Method and system for calibration of a voltage controlled oscillator (VCO) |
| 02/24/2005 | US20050040837 System for evaluating probing networks |
| 02/23/2005 | CN2681149Y Precision multiple valued inductance standard |
| 02/17/2005 | US20050035777 Probe holder for testing of a test device |
| 02/17/2005 | US20050035774 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 02/16/2005 | EP1506428A1 Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer |
| 02/16/2005 | CN2679700Y Drive moment of watt-hour meter |
| 02/15/2005 | US6856154 Test board for testing IC package and tester calibration method using the same |
| 02/10/2005 | WO2005012933A1 Device and method for testing integrated circuits |
| 02/10/2005 | US20050030047 Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration |
| 02/10/2005 | DE19514814B4 Übertragungsvorrichtung und Übertragungsverfahren für Kalibrierungsdaten eines Halbleiter-Testgeräts Transmission apparatus and transmission method for calibration data of a semiconductor test equipment |
| 02/08/2005 | US6853180 Measured value acquisition and processing unit for small measuring signals |
| 02/03/2005 | DE10321200B3 Einrichtung und Verfahren zur Kalibrierung von R/C-Filterschaltungen Apparatus and method for calibration of R / C filter circuits |
| 02/03/2005 | DE10245536B4 Kalibrieren von Halbleitereinrichtungen mittels einer gemeinsamen Kalibrierreferenz Calibration of semiconductor devices by means of a joint calibration reference |
| 02/02/2005 | CN2676221Y Regulation free meter pressing mechanism mounted in T-slot |
| 02/02/2005 | CN2676220Y Standard large capacitance box |
| 02/01/2005 | US6850082 Probe holder for testing of a test device |
| 01/27/2005 | WO2004099798A3 Fiberoptic faraday effect sensor |
| 01/27/2005 | US20050021271 Measuring apparatus with a validation capability of its previous calibration |
| 01/27/2005 | US20050021261 Wideband signal analyzer |
| 01/27/2005 | US20050017734 Method for on-line calibration of low accuracy voltage sensor through communication bus |
| 01/25/2005 | US6847212 Apparatus and method for calibrating voltage spike waveforms |
| 01/25/2005 | US6847211 Apparatus and method for calibrating voltage spike waveforms for three-phase electrical devices and systems |
| 01/25/2005 | US6847200 Portable tester for watt hour meter |
| 01/19/2005 | EP1498942A1 Signal detection contactor and signal correcting system |
| 01/19/2005 | EP1498741A1 Watthour meter with integrated self-testing |
| 01/19/2005 | CN1566968A Pre-calibration electrical energy measuring chip |
| 01/13/2005 | US20050007092 Compensation of simple fibre optic Faraday effect sensors |
| 01/12/2005 | CN1564015A Method of self-calibrating of current ratio standard device |
| 01/11/2005 | US6842709 Quality monitoring and maintenance for products employing end user serviceable components |
| 01/11/2005 | US6841401 Integrated circuit device and correction method for integrated circuit device |
| 01/06/2005 | US20050001487 Concept for compensating the influences of external disturbing quantities on physical functional parameters of integrated circuits |
| 12/30/2004 | DE102004020037A1 Vector network analyzer calibration for multiport measurement on semiconductor wafer, involves performing calibration measurement at multiple-fold one-port using known impedances and unknown reflective terminations, respectively |
| 12/29/2004 | EP1491903A1 Fiberoptic Faraday effect sensor |
| 12/29/2004 | EP1490910A2 Determination apparatus and method of calibrating the apparatus |
| 12/29/2004 | EP1490700A1 Circuit arrangement and method for testing an electric circuit |
| 12/29/2004 | CN2667504Y Three phase three-wire system and three phase four-wire system universal electric energy meter calibrating table meter receptacle holder |
| 12/28/2004 | US6836743 Compensating for unequal load and source match in vector network analyzer calibration |
| 12/28/2004 | US6836108 Three-phase electricity meter including integral test switch |
| 12/23/2004 | US20040260500 Device and method for calibrating R/C filter circuits |
| 12/21/2004 | CA2236385C Self-calibration of an oscilloscope using a square-wave test signal |
| 12/16/2004 | US20040253921 Transducer package for process control |
| 12/16/2004 | US20040251922 Methods and computer program products for full N-port vector network analyzer calibrations |
| 12/16/2004 | DE10324355A1 Electronic electricity meter has exchangeable circuit boards with measurement winding and display |
| 12/15/2004 | EP1485817A1 Digital frequency response compensator and arbitrary response generator system |
| 12/14/2004 | US6832177 Method of addressing individual memory devices on a memory module |
| 12/14/2004 | US6832173 Testing circuit and method for phase-locked loop |
| 12/14/2004 | US6831473 Ring calibration apparatus and method for automatic test equipment |
| 12/09/2004 | US20040246004 Calibration method for carrying out multiport measurements on semiconductor wafers |
| 12/08/2004 | EP1483593A2 Method for measuring the residual system directivity and/or the residual system port impedance match of a system-calibrated vector network analyser |
| 12/08/2004 | CN2662263Y Digital controlled dualpurpose photoelectric sampler |
| 12/07/2004 | US6829553 Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement |
| 12/01/2004 | CN2660549Y 电测仪表 Meter |
| 12/01/2004 | CN1551501A Apparatus and method for calibrating resistance/ capacitor filter circuit |
| 12/01/2004 | CN1550777A 测量仪器 Measuring instruments |
| 11/30/2004 | US6826506 Method and apparatus for calibrating a multiport test system for measurement of a DUT |
| 11/30/2004 | US6826490 Transducer calibration system: apparatus and method |
| 11/30/2004 | US6825490 On chip resistor calibration structure and method |
| 11/30/2004 | CA2253634C Radiator calibration |
| 11/25/2004 | US20040232904 Methods and apparatus for phase compensation in electronic energy meters |
| 11/23/2004 | US6823276 System and method for determining measurement errors of a testing device |
| 11/23/2004 | US6822458 Apparatus and method for simulating arcing |
| 11/18/2004 | WO2004099798A2 Fiberoptic faraday effect sensor |
| 11/18/2004 | US20040227504 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture |
| 11/18/2004 | CA2525248A1 Fiberoptic faraday effect sensor |
| 11/17/2004 | CN2657014Y Meter connecting sheft of power energy meter having contact point guiding and releasing mechanism |
| 11/16/2004 | US6819117 PICA system timing measurement & calibration |
| 11/11/2004 | DE10218695B4 Vorrichtung und Verfahren zur Erzeugung einer definierten Wechselspannung Apparatus and method for generating a defined ac voltage |
| 11/10/2004 | CN2655258Y Supporter for plugging three-phase three-wire electric energy meter without detaching B phase pin |
| 11/09/2004 | US6815942 Self-calibrating electricity meter |
| 11/04/2004 | US20040221214 Test apparatus |
| 11/04/2004 | US20040220766 Method and apparatus for generating an electronic test signal |
| 11/04/2004 | US20040220762 On-site, in-situ application calibration service |
| 11/04/2004 | DE202004013305U1 Kalibrierstandard Calibration |
| 11/03/2004 | EP1472550A2 Timing system measurement and calibration |
| 11/03/2004 | CN1543305A Method for correcting measurement error and electronic component characteristic measurement apparatus |
| 11/02/2004 | US6813028 Calibration methodology and system for optical network analyzer |
| 10/28/2004 | WO2004092754A1 System and method for calibration of testing equipment using device photoemission |
| 10/26/2004 | US6809536 Apparatus for measuring properties of probe card and probing method |
| 10/21/2004 | US20040207407 Apparatus and method for simulating arcing |
| 10/19/2004 | US6807500 Method and apparatus providing improved data path calibration for memory devices |
| 10/19/2004 | US6806716 Electronic battery tester |
| 10/14/2004 | US20040201403 Method and device for dynamically calibrating frequency |
| 10/14/2004 | US20040201383 Balanced device characterization including test system calibration |
| 10/14/2004 | US20040201375 System and method for calibration of testing equipment using device photoemission |
| 10/13/2004 | CN1537234A Circuit arrengement and method for monitoring circuit |
| 10/12/2004 | US6803779 Interconnect assembly for use in evaluating probing networks |
| 10/07/2004 | WO2004086071A1 Test apparatus |
| 10/07/2004 | US20040199350 System and method for determining measurement errors of a testing device |
| 10/07/2004 | DE10311995A1 Wechselbares elektronisches Modell zur Messung der elektrischen Energie/Verbrauch/Leistung Exchangeable electronic model for measuring the electrical energy / consumption / performance |
| 10/05/2004 | US6801867 Combining signal images in accordance with signal-to-noise ratios |
| 10/05/2004 | US6801042 Calibration method and apparatus for signal analysis device |
| 09/30/2004 | DE10313786A1 Verfahren und Vorrichtung zur Fehlersuche in elektronischen Meß- und Prüfanordnungen für galvanische Elemente Method and device for troubleshooting electronic measuring and test setups for galvanic elements |