| Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
|---|
| 01/10/1989 | US4797642 Zero-setback sliding load for network analyzer calibration |
| 01/10/1989 | US4797607 Method of updating the scale factor of apparatus for measuring an alternating electric current by means of the faraday effect |
| 01/03/1989 | US4795969 Load loss standard for testing and calibrating high voltage power measuring systems |
| 12/27/1988 | US4794325 Calibrated power detector |
| 12/21/1988 | CN88102088A Method of updating scale factor of apparatus for measuring alternating electric current by means of faraday effect |
| 12/13/1988 | US4790175 Method and apparatus for calibrating a transducer having real and reactive impedance |
| 12/08/1988 | DE3817156A1 Verfahren und geraet zur bestimmung von wechselspannungs(ac)-kalibrierfehlern und geraet mit einer einrichtung zur lieferung von wechselspannungs(ac)-kalibrierfehlern Method and apparatus for the determination of alternating voltage (ac) -kalibrierfehlern and geraet with a device for delivery of alternating voltage (ac) -kalibrierfehlern |
| 12/07/1988 | CN88103246A Method of and apparatus for determining ac calibration errors and apparatus using device with ac calibration errors |
| 12/06/1988 | US4789829 Method and apparatus for determining RE gasket shielding effectiveness |
| 11/30/1988 | EP0292515A1 A high speed sampling apparatus and method for calibrating the same. |
| 11/15/1988 | US4785419 Logarithmic amplifier calibrator |
| 11/09/1988 | EP0289791A1 Process for updating the scale factor of an electric alternating current measuring appliance using the Faraday effect |
| 11/03/1988 | DE3712783A1 Method for checking the operability of a test device for high-voltage conductors and test device |
| 11/02/1988 | EP0220233A4 Target keys for wafer probe alignment. |
| 10/25/1988 | US4780755 Frame buffer self-test |
| 10/18/1988 | US4779039 Oscilloscope having temperature monitor and recalibration feature to provide long-term high accuracy |
| 09/06/1988 | US4769592 Six-port reflectometer test arrangement |
| 08/23/1988 | US4766370 System and method for calibrating an energy meter |
| 08/17/1988 | EP0278635A1 Negative feedback power supply apparatus |
| 08/16/1988 | US4764925 Method and apparatus for testing integrated circuits |
| 08/10/1988 | CN88100509A Apparatus and method for correcting electric measuring device from inner side |
| 08/02/1988 | US4760730 Calibration system for blood pressure transducer |
| 07/27/1988 | CN87108187A Method and device for directly reading and ckecking dc mutual inductor comparison value difference |
| 07/27/1988 | CN85107787B Amplitude spectrum generator for statistical and uniformly distributed two-dimension (time-amplitude) random pulses |
| 07/20/1988 | EP0275142A2 Flow computer calibration technique |
| 07/20/1988 | CN87208833U Testing instrument for electrified watt-hour meter |
| 07/19/1988 | US4758779 Probe body for an electrical measurement system |
| 07/13/1988 | CN87210619U Aligner |
| 07/05/1988 | US4755750 Wafer keys for wafer probe alignment |
| 06/29/1988 | CN86108441A Automatic mutual-inductor calibrating instrument |
| 06/28/1988 | US4754329 Focusing and screen calibration method for display screen coupled to video camera |
| 06/21/1988 | US4752733 Compensating circuit for a magnetic field sensor |
| 06/15/1988 | CN87209186U Checking device for ac kilowatt-hour metre |
| 06/07/1988 | US4749907 Method and apparatus for automatically calibrating a graticuled cathode ray tube |
| 06/02/1988 | WO1988004059A1 A high speed sampling apparatus and method for calibrating the same |
| 05/24/1988 | US4747095 Use in a digital communications system |
| 05/03/1988 | US4742561 Apparatus for generating signals useful for testing the sensitivity of microwave receiving equipment |
| 04/28/1988 | DE3635611A1 Partial-discharge measurement of a high-voltage transformer |
| 04/27/1988 | EP0265218A2 Vector modulators and calibration thereof |
| 04/07/1988 | WO1988002310A1 System enabling the electrical balancing of transducers arranged in inking heads |
| 04/07/1988 | DE3631587A1 Method for calibrating multi-channel direction finders |
| 03/01/1988 | US4728816 Error and calibration pulse generator |
| 03/01/1988 | CA1233517A1 Test operation of electronic demand register |
| 02/25/1988 | DE3726708A1 Arrangement for testing the function of a measuring or monitoring device |
| 02/09/1988 | US4724378 Calibrated automatic test system |
| 01/27/1988 | EP0254017A2 Calibrated automatic test system |
| 01/14/1988 | DE3622570A1 Variable-voltage unit for alternating-voltage test installations |
| 01/13/1988 | CN87207750U Dynamic characteristic check signalization |
| 01/13/1988 | CN87204150U Additional equipment of avometer |
| 01/12/1988 | US4719408 Apparatus for indicating proper compensation of an adjustable frequency compensation network |
| 01/05/1988 | US4717894 Calibration of vector modulators using a scalar detector |
| 12/31/1987 | CN87201131U Variable active three-terminal capacitance and loss standard |
| 12/26/1987 | CN87201768U Portable test unit for ac/dc electric meters |
| 12/09/1987 | CN86206517U Electronic meter for measuring electricity energy |
| 12/01/1987 | US4710706 Electrical measuring meter and method including a calibrating element |
| 11/25/1987 | EP0246355A2 Error and calibration pulse generator |
| 11/11/1987 | CN86210995U Wedged axial distance regulator |
| 11/03/1987 | US4704558 For sensing the position of an electron beam within a cathode ray tube |
| 10/28/1987 | EP0242700A2 AC level calibration method and apparatus |
| 10/27/1987 | US4703433 For analyzing the response of a device under test |
| 10/14/1987 | EP0241142A1 Probe body for an electrical measurement system |
| 10/13/1987 | US4700128 For establishing multiple signal levels |
| 10/13/1987 | US4698996 Method for calibrating an electronic position transmitter |
| 10/07/1987 | EP0240102A2 Power meter having self-test function |
| 10/07/1987 | CN87100833A Method of measuring impedance, especially low-voltage capacity impedance |
| 10/01/1987 | DE3610170A1 Method for calibrating a measurement circuit |
| 09/29/1987 | US4697151 Method and apparatus for testing operational amplifier leakage current |
| 09/08/1987 | US4692697 Current sensor adjustment and test apparatus |
| 09/08/1987 | US4692696 Method for adjusting and testing current sensors |
| 09/02/1987 | EP0234111A1 Six-port reflectometer test arrangement |
| 07/22/1987 | CN85107787A Amplitude spectrum generator for statistical and uniformly distributed two-dimension (time-amplitude) random pulses |
| 07/01/1987 | EP0227248A2 Apparatus for indicating proper compensation of an adjustable frequency compensation network |
| 06/30/1987 | US4677340 Method and apparatus for calibrating deflection in an oscilloscope |
| 06/16/1987 | US4673870 Automated calibration technique for non-field perturbing (electrically small) electromagnetic field sensors |
| 06/10/1987 | EP0224582A1 Calibration apparatus for integrated circuits |
| 05/26/1987 | US4669051 Vector network analyzer with integral processor |
| 05/13/1987 | CN86208667U Two-purpose digital millivoltmeter for calibrating and measuring |
| 05/06/1987 | EP0220233A1 Target keys for wafer probe alignment. |
| 05/05/1987 | US4663586 Device with automatic compensation of an ac attenuator |
| 04/29/1987 | EP0219557A1 Method and device for checking a measuring connection of a measuring device |
| 04/28/1987 | US4661767 Vector network analyzer with integral processor |
| 02/24/1987 | US4646003 Meter testing device |
| 02/04/1987 | EP0210373A2 Calibrated power detector |
| 02/03/1987 | US4641086 Vector network analyzer with integral processor |
| 01/13/1987 | US4636717 Vector network analyzer with integral processor |
| 12/30/1986 | EP0206488A1 Method and apparatus for measuring electric current |
| 12/18/1986 | WO1986007493A1 Calibration apparatus for integrated circuits |
| 12/09/1986 | US4627268 Method for calibrating instruments for time interval measurements |
| 11/12/1986 | EP0201019A1 Static electricity-meter and method for its calibration |
| 10/23/1986 | WO1986006176A1 Target keys for wafer probe alignment |
| 09/24/1986 | EP0195162A2 Method and apparatus for calibrating deflection in an oscilloscope |
| 09/23/1986 | CA1211802A1 Lock-in amplifiers |
| 08/26/1986 | US4608657 Method and apparatus for testing probe calibration |
| 07/29/1986 | US4603294 Measuring device for the accurate adjustment of the start-of-measurement of a measuring transducer |
| 07/23/1986 | EP0187910A2 Method for calibrating an electronic position sensor |
| 07/15/1986 | US4600881 Watthour test circuitry |
| 07/02/1986 | CN85103660A Self-calibrating apparatus and method for measuring alternating magnetism |
| 07/01/1986 | US4598248 Test operation of electronic demand register |
| 05/06/1986 | CA1204161A1 Hall effect device test circuit |
| 04/15/1986 | CA1203283A1 Method and apparatus for judging the calibration of voltage attenuation probes |