Patents
Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105)
07/2002
07/16/2002US6419844 Method for fabricating calibration target for calibrating semiconductor wafer test systems
07/09/2002US6417682 Semiconductor device testing apparatus and its calibration method
07/09/2002US6417674 Two port self-calibration for an N-port network analyzer
07/04/2002US20020084780 System and method for on-line Hall sensor programming
07/04/2002DE10065644A1 Calibration arrangement with calibration standards of the same insertion length for use with different conductor lengths for calibration of vectorial network analyzers by connecting standardized calibration lengths together
07/03/2002EP1220413A1 Apparatus for battery capacity measurement and for remaining capacity calculation
07/02/2002US6414579 Current transformer and method for correcting asymmetries therein
07/02/2002US6414480 Method and system for eddy current inspection calibration
07/02/2002US6414477 Method for optimizing probe card analysis and scrub mark analysis data
06/2002
06/27/2002US20020079911 Probe holder for low current measurements
06/25/2002CA2287014C Method and apparatus for electronic meter testing
06/18/2002US6408215 Isothermal port for microwave network analyzer and method
06/18/2002US6407542 Implementation of a multi-port modal decomposition system
06/13/2002WO2002046785A1 Semiconductor test equipment and its preventive maintenance method
05/2002
05/30/2002US20020065619 Battery test module
05/29/2002EP1209472A2 Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth
05/28/2002US6397160 Power sensor module for microwave test systems
05/16/2002US20020057182 Current transformer and method for correcting asymmetries therein
05/16/2002US20020057162 Current transformer and method for correcting asymmetries therein
05/09/2002US20020053899 Method and apparatus for linear characterization of multi-terminal single-ended or balanced devices
05/09/2002US20020053898 Multiport automatic calibration device for a multiport test system
05/07/2002US6384615 Probe holder for low current measurements
05/07/2002US6384350 Meter test switch
05/02/2002DE10051160A1 Sensor arrangement for contactless measurement of low currents positioned in loop formed by symmetrical conductor branches
04/2002
04/25/2002WO2001096887A3 Method for measuring fault locations in high frequency cables and lines
04/25/2002WO2001092832A3 Method and apparatus to control power drawn by a measurement device
04/25/2002US20020047714 Abnormality diagnosis method and apparatus for separable transformer
04/24/2002CN1083577C Processor contact checking device and method of testing integrated circuit devices
04/17/2002CN1344980A AC power source stable feedback method
04/11/2002WO2002004966A3 An apparatus and method for testing a socket on a burn-in board using a flex strip probe
04/11/2002DE10047228A1 Multiple N method for calibrating vectorial four-measuring point network analyzer, by selecting suitable combination of three calibrating modules
04/04/2002US20020039022 Calibration device for semiconductor testing apparatus, calibration method and semiconductor testing apparatus
04/03/2002EP1193725A1 Method for diagnosing abnormal condition of isolation transformer and device therefor
04/03/2002CN2484576Y Protective meter-adapting seat
04/03/2002CN2484575Y Protective automatic shorting meter adapting-seat
04/03/2002CN2484574Y Current autoamtic switching-over device for standard electric meter
03/2002
03/28/2002US20020038205 Operational verification for product safety testers
03/27/2002CN2483735Y Photoelectric sampler for measuring of electric energy meter
03/27/2002CN1341864A Transient travelling-wave protection tester and its testing method
03/21/2002WO2002023212A1 Method and apparatus for linear characterization of multiterminal single-ended or balanced devices
03/19/2002US6359419 Quasi-adaptive method for determining a battery's state of charge
03/13/2002CN2482100Y Optoelectronic sampler for measuring electric energy meter
03/06/2002CN2480857Y Electronic type test power source and check device having same
03/06/2002CN1339114A Multi-port device analysis apparatus and method and calibration method thereof
02/2002
02/28/2002WO2002016863A1 Measuring the wall thickness of an electrically conductive object
02/28/2002WO2001079868A3 System for measuring signal path resistance for an integrated circuit tester interconnect structure
02/28/2002US20020023362 Adjusting method of electronic azimuth meter, adjusting system of electronic azimuth meter, magnetic field generating apparatus, electronic azimuth meter and electronic timepiece having electronic azimuth meter
02/28/2002CA2420309A1 Measuring the wall thickness of an electrically conductive object
02/27/2002EP1181562A2 Scattering parameter calibration system and method
02/27/2002EP1181540A1 Electronic battery tester
02/26/2002US6351116 System and method for on-line hall sensor programming
02/26/2002US6351112 Calibrating combinations of probes and channels in an oscilloscope
02/21/2002WO2002015109A1 Pda instrument/process calibrator
02/21/2002US20020021137 Method for calibrating a semiconductor testing device, a semiconductor testing apparatus, and a method for testing a semiconductor device
02/20/2002CN1336533A Electric compass and its regulating method and system, magnetic field producing device and electric time piece
02/06/2002EP1178284A2 Method and system for adjusting an electronic azimuth meter
02/06/2002CN2476030Y High voltage electric energy metering fault recording device
02/05/2002US6345236 Method for detecting installation and/or calibration errors in a plurality of signal output units of one or more partial-discharge measurement systems
01/2002
01/31/2002DE10126262A1 Verfahren zur Fehlerortmessung bei Hochfrequenzkabeln und -leitungen Method for Fehlerortmessung at high frequency cables and wires
01/24/2002US20020010558 Storage battery with integral battery tester
01/24/2002US20020008492 Motor control apparatus with a current sensor diagnostic apparatus and a current sensor diagnostic method
01/23/2002EP1173738A1 Digital phase sensitive rectification of ac driven transducer signals
01/22/2002US6340883 Wide band IQ splitting apparatus and calibration method therefor with balanced amplitude and phase between I and Q
01/17/2002WO2002004966A2 An apparatus and method for testing a socket on a burn-in board using a flex strip probe
01/17/2002DE10112311A1 Verfahren und Einrichtung zum Kalibrieren zur Korrektur von Impulsbreitenzeitfehlern beim Testen integrierter Schaltungen Method and device for calibrating to correct for pulse width time errors in the testing of integrated circuits
01/17/2002DE10033178A1 Kryoelektronischer Mikrowellenschaltkreis mit Josephsonkontakten und dessen Verwendung Cryoelectronic microwave circuit with Josephson junctions and its use
01/03/2002WO2002001642A1 Cryoelectronic microwave circuit with josephson contacts and use thereof
01/03/2002DE10024085C1 Verfahren zur Korrektur der frequenz-und längenabhängigen Leitungsdämpfung bei TDR-Messungen an Hochfrequenzkabeln Method for correcting the frequency and length-dependent line attenuation in TDR measurements on high-frequency cables
01/02/2002EP1166047A1 Method and circuit for correcting periodic signals of an incremental position measuring system
01/01/2002US6335617 Method and apparatus for calibrating a magnetic field generator
12/2001
12/26/2001CN2468061Y Tester for testing error of electric meter using laser
12/26/2001CN2468060Y Comprehensive error checking meter for electric energy metering apparatus
12/20/2001WO2001096892A1 Semiconductor testing apparatus, and its monitor device
12/20/2001WO2001096887A2 Method for measuring fault locations in high frequency cables and lines
12/19/2001EP0840896B1 Electricity meter
12/18/2001US6331783 Circuit and method for improved test and calibration in automated test equipment
12/13/2001US20010052116 Method for the analysis of a test software tool
12/12/2001EP1162470A1 Insulation controller testing apparater for electrical networks
12/11/2001US6329811 Calibration unit for semiconductor integrated circuit tester
12/06/2001WO2001092832A2 Method and apparatus to control power drawn by a measurement device
11/2001
11/29/2001WO2000046605A3 Scattering parameter calibration system and method
11/28/2001CN2462401Y Automatic short-circuit type pressure elastic meter wiring device
11/28/2001CN1323979A Calibration mechanism, electron compass having said mechanism and electron clock
11/27/2001US6323650 Electronic battery tester
11/22/2001US20010042314 Correcting mechanism of electronic azimuth meter, electronic azimuth meter having thereof and electronic time piece with electronic azimuth meter
11/21/2001EP1156341A2 Method for correcting frequency- and length-dependent line attenuation for tdr-measurements carried out on high-frequency cables
11/14/2001EP1154234A2 Correcting mechanism of electronic azimuth meter, electronic azimuth meter and electronic time piece with electronic azimuth meter
11/07/2001CN2458635Y Multifunctional harmonic powr electric source
11/06/2001US6313649 Wafer probe station having environment control enclosure
10/2001
10/31/2001CN2457616Y Autoamtic short circuit connection frame for electric meter check table
10/25/2001WO2001079868A2 System for measuring signal path resistance for an integrated circuit tester interconnect structure
10/16/2001US6304087 Apparatus for calibrating electronic battery tester
10/11/2001US20010028251 Timing calibration apparatus and method in a semiconductor integrated circuit tester
10/10/2001CN1316715A Analytical method for testing software tool
10/09/2001US6301517 Automated test position monitoring and notification system
10/09/2001US6300775 Scattering parameter calibration system and method
10/09/2001US6300757 Procedure for the calibration of a measuring device
10/03/2001CN2452033Y Terminal for electric meter calibrating console
10/02/2001US6298312 Method of determining the tip angle of a probe card needle
09/2001
09/20/2001DE10109385A1 Kalibrierungsverfahren und -vorrichtung für Fassungen Calibration method and apparatus for sockets
1 ... 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 ... 82