Patents
Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105)
01/2007
01/16/2007US7164999 Data-dependent jitter (DDJ) calibration methodology
01/16/2007US7164279 System for evaluating probing networks
01/11/2007WO2007005211A2 Methods and apparatus for optimizing an electrical response to a conductive layer on a substrate
01/11/2007US20070010961 Driver calibration methods and circuits
01/11/2007US20070010958 Method and apparatus for automating calibration of test instruments
01/11/2007US20070007989 System For Measuring Signal Path Resistance For An Integrated Circuit Tester Interconnect Structure
01/11/2007US20070007969 Circuit and system for detecting dc component in inverter device for grid-connection
01/10/2007EP1740969A2 Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means
01/04/2007DE102006021766A1 Systeme, Verfahren und Computerprogramme zum Kalibrieren eines automatisierten Schaltungstestsystems Systems, methods and computer programs for calibrating an automated circuit test system
01/04/2007DE102005028881A1 Fehlerstromanalysator zur Erfassung eines Fehlerstroms und Einrichtung mit Fehlerstromerfassungsfunktion Fehlerstromanalysator for detecting a fault current and fault current detection device with function
01/04/2007DE10051160B4 Sensoranordnung zur kontaktlosen Messung eines Stroms Sensor arrangement for contactless measurement of a current
01/03/2007CN2854621Y Back inserted calibrating conversion device of electric energy meter
01/02/2007US7157918 Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path
01/02/2007US7155836 Method and apparatus for using magnetic field
12/2006
12/28/2006WO2006138499A1 Microprocessor programmable clock calibration system and method
12/28/2006WO2005125015A3 Method and apparatus for time measurement
12/27/2006CN1885059A Microelectronic standard matter preparing technology
12/26/2006US7154282 System and method for calibrating moisture meters with associated settable slurry products for determining relative dryness
12/21/2006US20060284621 Method for calibrating timing clock
12/20/2006EP1360544B1 Calibrating voltage controllable optical components in communication systems
12/19/2006US7152010 Calibrating an analog-to-digital converter using a test signal with a precise DC voltage
12/19/2006US7152008 Calibrated differential voltage crossing
12/14/2006WO2006132956A1 Production of radio frequency id tags
12/14/2006WO2006007000A3 Method and apparatus for instrument transformer reclassification
12/14/2006US20060279295 Probe based information storage for probes used for opens detection in in-circuit testing
12/14/2006DE112005000430T5 Netzwerkanalysator, Verfahren, Programm und Speichermedium zur Netzwerkanalyse Network analyzer, method, program, and storage medium for network analysis
12/13/2006CN1879006A Geomagnetic sensor and geomagnetic sensor correction method, temperature sensor and temperature sensor correction method, geomagnetism detection device
12/13/2006CN1877355A Insulated on-line monitoring system checker of high-voltage electric equipment
12/13/2006CN1289943C Calibrating voltage controllable optical components in communication systems
12/13/2006CN1289896C Instrument detecting method for intelligent instrument detecting apparatus
12/12/2006US7148702 VNA and method for addressing transmission line effects in VNA measurement data
12/12/2006US7148700 Normalizing circuit with reduced error voltage
12/12/2006US7148699 Technique for calibrating electronic devices
12/12/2006US7148685 Magnetic resonance imaging with fat suppression
12/07/2006WO2005119180A3 Multi-element smart gas sensor
12/07/2006US20060273809 Method of designing an application specific probe card test system
12/07/2006DE10106254B4 Verfahren zur Fehlerkorrektur durch De-embedding von Streuparametern, Netzwerkanalysator und Schaltmodul The error correction method by de-embedding of scattering parameters, network analyzer and switching module
12/06/2006CN2844939Y Relay protection debugging load device
12/05/2006US7146283 Calibrating analog-to-digital systems using a precision reference and a pulse-width modulation circuit to reduce local and large signal nonlinearities
11/2006
11/30/2006WO2006128066A2 Ghost-compensation for improved stereoscopic projection
11/30/2006US20060271320 Sensor calibration method and apparatus
11/30/2006US20060271319 Analysis system and method
11/30/2006US20060268104 Ghost-compensation for improved stereoscopic projection
11/30/2006US20060267637 Calibration comparator circuit
11/30/2006US20060267596 Spring constant calibration device
11/30/2006DE102006011952A1 Dualspektrumanalysator-Messsystem Dualspektrumanalysator measurement system
11/28/2006US7141992 Method for measuring impurity metal concentration
11/23/2006US20060265163 Circuit for driving a plant such as a mechanical beam scanner and related system and method
11/23/2006DE102006013458A1 Leistungskalibrierung für Mehrtor-Vektornetzanalysatoren (VNA) Power calibration for multi-port Vektornetzanalysatoren (VNA)
11/23/2006DE102005058874A1 Zusammenstellung von Kalibrierungsinformationen für mehrere Testabläufe Compilation of calibration information for several test sequences
11/22/2006EP1723436A2 Signal measurement and processing method and apparatus
11/22/2006EP1723435A1 Energy meter system and method for calibration
11/22/2006EP1520150B1 Gauge calibration
11/16/2006US20060256137 Scaling method and apparatus for displaying signals
11/15/2006EP0919822B1 System for verifying signal voltage level accuracy on a digital testing device
11/15/2006CN1864114A Programmable calibration circuit for power supply current sensing and droop loss compensation
11/14/2006US7137083 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure
11/09/2006DE19728381B4 Verfahren und Schaltung zur Funktionsüberwachung einer Sensorbrücke Method and circuit for monitoring the operation of a sensor bridge
11/08/2006CN1859009A System and method for timing calibration of time-interleaved data converters
11/02/2006US20060247877 Visual monitor calibration
11/02/2006US20060246611 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment
11/02/2006US20060244438 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
11/02/2006EP1717775A1 Method for calibrating an electronic circuit comprising a sensor system having an active semiconductor circuit
11/01/2006CN1856715A Method of determining a zero point of a current sensor
10/2006
10/31/2006US7130756 Calibration method for carrying out multiport measurements on semiconductor wafers
10/31/2006US7129688 Method for on-line calibration of low accuracy voltage sensor through communication bus
10/26/2006WO2006111213A1 Calibration device and calibration method for adjusting a directional coupler measuring system
10/26/2006DE102006017183A1 Kalibrierungsvorrichtung und Verfahren, wobei ein Impuls für Frequenz-, Phase- und Verzögerungs-Eigenschaften verwendet wird Calibration apparatus and method in which a pulse for frequency, phase and delay characteristics is used
10/26/2006DE102005018090A1 Kalibriervorrichtung und Kalibrierverfahren zum Abgleich eines Richtkoppler-Messsystems Calibration and calibration method for calibrating a directional coupler measurement system
10/25/2006EP1490910A4 Determination apparatus and method of calibrating the apparatus
10/25/2006CN2831157Y 4 end-on a.c. resistor
10/25/2006CN2831156Y 4 end-on standard capacitor
10/25/2006CN1853109A Error factor acquisition device, method, program, and recording medium
10/25/2006CN1851495A Current mutual inductor in-situ detecting device and method
10/24/2006US7126345 Integrated circuit capable of reduced error calibration
10/19/2006WO2006109358A1 Electronic component handling apparatus
10/19/2006US20060232260 Compensation of simple fibre optic faraday effect sensors
10/18/2006CN2828837Y Linear pointer meter capable of easy regulating precision
10/17/2006US7123005 Magnetometer with structure asymmetry correction
10/17/2006US7121132 Method for calibrating semiconductor test instruments
10/12/2006DE19639515B4 Anordnung zum Kalibrieren eines Netzwerkanalysators für die On-Wafer-Messung an integrierten Mikrowellenschaltungen Arrangement for calibrating a network analyzer for on-wafer measurement of integrated microwave circuits
10/11/2006CN1846141A Calibration comparator circuit
10/10/2006US7119730 Analog-to-digital converter for programmable logic
10/10/2006US7119549 Output calibrator with dynamic precision
10/10/2006US7119533 Method, system and device for calibrating a magnetic field sensor
10/05/2006US20060224345 System and method for improving electrical equipment accuracy by environmental condition compensation
10/05/2006US20060224343 Calibration of tester and testboard by golden sample
10/05/2006DE102006001476A1 Electric circuit for improving the accuracy of electrical equipment using compensation for environmental conditions
10/04/2006CN2824059Y Test connecting box for single phase electric energy meter with mutual inductor
10/04/2006CN2823989Y Regulating mechanism for fixing supporter of photoelectric head
10/04/2006CN1841077A Compilation of calibration information for plural testflows
10/03/2006US7116113 Systems and methods for sense FET calibration
10/03/2006US7114851 Methods and systems for calibrating medical imaging devices
09/2006
09/28/2006US20060217913 System, Method, and Computer Software Product for Gain Adjustment in Biological Microarray Scanner
09/28/2006US20060217912 Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit
09/28/2006DE202004021017U1 Probe calibrating substrate for electronic application, has two conductive units interconnected with two respective ground paths of probes, where resistive material extends certain percentage of distance between units
09/28/2006DE102004034879B4 Verfahren und Vorrichtung zum Messen einer zu testenden Vorrichtung unter Verwendung einer verbesserten Durchgangs-Reflexions-Leitungs-Messkalibrierung Method and apparatus for measuring a device under test using an improved passage-reflection line calibration measurement
09/28/2006DE10121291B4 Verfahren zum Kalibrieren einer Testvorrichtung zum parallelen Testen einer Mehrzahl von elektronischen Bauteilen A method for calibrating a test device for the parallel testing a plurality of electronic components
09/26/2006US7113891 Multi-port scattering parameter calibration system and method
09/26/2006US7113630 PICA system detector calibration
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