Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
---|
01/16/2007 | US7164999 Data-dependent jitter (DDJ) calibration methodology |
01/16/2007 | US7164279 System for evaluating probing networks |
01/11/2007 | WO2007005211A2 Methods and apparatus for optimizing an electrical response to a conductive layer on a substrate |
01/11/2007 | US20070010961 Driver calibration methods and circuits |
01/11/2007 | US20070010958 Method and apparatus for automating calibration of test instruments |
01/11/2007 | US20070007989 System For Measuring Signal Path Resistance For An Integrated Circuit Tester Interconnect Structure |
01/11/2007 | US20070007969 Circuit and system for detecting dc component in inverter device for grid-connection |
01/10/2007 | EP1740969A2 Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means |
01/04/2007 | DE102006021766A1 Systeme, Verfahren und Computerprogramme zum Kalibrieren eines automatisierten Schaltungstestsystems Systems, methods and computer programs for calibrating an automated circuit test system |
01/04/2007 | DE102005028881A1 Fehlerstromanalysator zur Erfassung eines Fehlerstroms und Einrichtung mit Fehlerstromerfassungsfunktion Fehlerstromanalysator for detecting a fault current and fault current detection device with function |
01/04/2007 | DE10051160B4 Sensoranordnung zur kontaktlosen Messung eines Stroms Sensor arrangement for contactless measurement of a current |
01/03/2007 | CN2854621Y Back inserted calibrating conversion device of electric energy meter |
01/02/2007 | US7157918 Method and system for calibrating a measurement device path and for measuring a device under test in the calibrated measurement device path |
01/02/2007 | US7155836 Method and apparatus for using magnetic field |
12/28/2006 | WO2006138499A1 Microprocessor programmable clock calibration system and method |
12/28/2006 | WO2005125015A3 Method and apparatus for time measurement |
12/27/2006 | CN1885059A Microelectronic standard matter preparing technology |
12/26/2006 | US7154282 System and method for calibrating moisture meters with associated settable slurry products for determining relative dryness |
12/21/2006 | US20060284621 Method for calibrating timing clock |
12/20/2006 | EP1360544B1 Calibrating voltage controllable optical components in communication systems |
12/19/2006 | US7152010 Calibrating an analog-to-digital converter using a test signal with a precise DC voltage |
12/19/2006 | US7152008 Calibrated differential voltage crossing |
12/14/2006 | WO2006132956A1 Production of radio frequency id tags |
12/14/2006 | WO2006007000A3 Method and apparatus for instrument transformer reclassification |
12/14/2006 | US20060279295 Probe based information storage for probes used for opens detection in in-circuit testing |
12/14/2006 | DE112005000430T5 Netzwerkanalysator, Verfahren, Programm und Speichermedium zur Netzwerkanalyse Network analyzer, method, program, and storage medium for network analysis |
12/13/2006 | CN1879006A Geomagnetic sensor and geomagnetic sensor correction method, temperature sensor and temperature sensor correction method, geomagnetism detection device |
12/13/2006 | CN1877355A Insulated on-line monitoring system checker of high-voltage electric equipment |
12/13/2006 | CN1289943C Calibrating voltage controllable optical components in communication systems |
12/13/2006 | CN1289896C Instrument detecting method for intelligent instrument detecting apparatus |
12/12/2006 | US7148702 VNA and method for addressing transmission line effects in VNA measurement data |
12/12/2006 | US7148700 Normalizing circuit with reduced error voltage |
12/12/2006 | US7148699 Technique for calibrating electronic devices |
12/12/2006 | US7148685 Magnetic resonance imaging with fat suppression |
12/07/2006 | WO2005119180A3 Multi-element smart gas sensor |
12/07/2006 | US20060273809 Method of designing an application specific probe card test system |
12/07/2006 | DE10106254B4 Verfahren zur Fehlerkorrektur durch De-embedding von Streuparametern, Netzwerkanalysator und Schaltmodul The error correction method by de-embedding of scattering parameters, network analyzer and switching module |
12/06/2006 | CN2844939Y Relay protection debugging load device |
12/05/2006 | US7146283 Calibrating analog-to-digital systems using a precision reference and a pulse-width modulation circuit to reduce local and large signal nonlinearities |
11/30/2006 | WO2006128066A2 Ghost-compensation for improved stereoscopic projection |
11/30/2006 | US20060271320 Sensor calibration method and apparatus |
11/30/2006 | US20060271319 Analysis system and method |
11/30/2006 | US20060268104 Ghost-compensation for improved stereoscopic projection |
11/30/2006 | US20060267637 Calibration comparator circuit |
11/30/2006 | US20060267596 Spring constant calibration device |
11/30/2006 | DE102006011952A1 Dualspektrumanalysator-Messsystem Dualspektrumanalysator measurement system |
11/28/2006 | US7141992 Method for measuring impurity metal concentration |
11/23/2006 | US20060265163 Circuit for driving a plant such as a mechanical beam scanner and related system and method |
11/23/2006 | DE102006013458A1 Leistungskalibrierung für Mehrtor-Vektornetzanalysatoren (VNA) Power calibration for multi-port Vektornetzanalysatoren (VNA) |
11/23/2006 | DE102005058874A1 Zusammenstellung von Kalibrierungsinformationen für mehrere Testabläufe Compilation of calibration information for several test sequences |
11/22/2006 | EP1723436A2 Signal measurement and processing method and apparatus |
11/22/2006 | EP1723435A1 Energy meter system and method for calibration |
11/22/2006 | EP1520150B1 Gauge calibration |
11/16/2006 | US20060256137 Scaling method and apparatus for displaying signals |
11/15/2006 | EP0919822B1 System for verifying signal voltage level accuracy on a digital testing device |
11/15/2006 | CN1864114A Programmable calibration circuit for power supply current sensing and droop loss compensation |
11/14/2006 | US7137083 Verification of integrated circuit tests using test simulation and integrated circuit simulation with simulated failure |
11/09/2006 | DE19728381B4 Verfahren und Schaltung zur Funktionsüberwachung einer Sensorbrücke Method and circuit for monitoring the operation of a sensor bridge |
11/08/2006 | CN1859009A System and method for timing calibration of time-interleaved data converters |
11/02/2006 | US20060247877 Visual monitor calibration |
11/02/2006 | US20060246611 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment |
11/02/2006 | US20060244438 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture |
11/02/2006 | EP1717775A1 Method for calibrating an electronic circuit comprising a sensor system having an active semiconductor circuit |
11/01/2006 | CN1856715A Method of determining a zero point of a current sensor |
10/31/2006 | US7130756 Calibration method for carrying out multiport measurements on semiconductor wafers |
10/31/2006 | US7129688 Method for on-line calibration of low accuracy voltage sensor through communication bus |
10/26/2006 | WO2006111213A1 Calibration device and calibration method for adjusting a directional coupler measuring system |
10/26/2006 | DE102006017183A1 Kalibrierungsvorrichtung und Verfahren, wobei ein Impuls für Frequenz-, Phase- und Verzögerungs-Eigenschaften verwendet wird Calibration apparatus and method in which a pulse for frequency, phase and delay characteristics is used |
10/26/2006 | DE102005018090A1 Kalibriervorrichtung und Kalibrierverfahren zum Abgleich eines Richtkoppler-Messsystems Calibration and calibration method for calibrating a directional coupler measurement system |
10/25/2006 | EP1490910A4 Determination apparatus and method of calibrating the apparatus |
10/25/2006 | CN2831157Y 4 end-on a.c. resistor |
10/25/2006 | CN2831156Y 4 end-on standard capacitor |
10/25/2006 | CN1853109A Error factor acquisition device, method, program, and recording medium |
10/25/2006 | CN1851495A Current mutual inductor in-situ detecting device and method |
10/24/2006 | US7126345 Integrated circuit capable of reduced error calibration |
10/19/2006 | WO2006109358A1 Electronic component handling apparatus |
10/19/2006 | US20060232260 Compensation of simple fibre optic faraday effect sensors |
10/18/2006 | CN2828837Y Linear pointer meter capable of easy regulating precision |
10/17/2006 | US7123005 Magnetometer with structure asymmetry correction |
10/17/2006 | US7121132 Method for calibrating semiconductor test instruments |
10/12/2006 | DE19639515B4 Anordnung zum Kalibrieren eines Netzwerkanalysators für die On-Wafer-Messung an integrierten Mikrowellenschaltungen Arrangement for calibrating a network analyzer for on-wafer measurement of integrated microwave circuits |
10/11/2006 | CN1846141A Calibration comparator circuit |
10/10/2006 | US7119730 Analog-to-digital converter for programmable logic |
10/10/2006 | US7119549 Output calibrator with dynamic precision |
10/10/2006 | US7119533 Method, system and device for calibrating a magnetic field sensor |
10/05/2006 | US20060224345 System and method for improving electrical equipment accuracy by environmental condition compensation |
10/05/2006 | US20060224343 Calibration of tester and testboard by golden sample |
10/05/2006 | DE102006001476A1 Electric circuit for improving the accuracy of electrical equipment using compensation for environmental conditions |
10/04/2006 | CN2824059Y Test connecting box for single phase electric energy meter with mutual inductor |
10/04/2006 | CN2823989Y Regulating mechanism for fixing supporter of photoelectric head |
10/04/2006 | CN1841077A Compilation of calibration information for plural testflows |
10/03/2006 | US7116113 Systems and methods for sense FET calibration |
10/03/2006 | US7114851 Methods and systems for calibrating medical imaging devices |
09/28/2006 | US20060217913 System, Method, and Computer Software Product for Gain Adjustment in Biological Microarray Scanner |
09/28/2006 | US20060217912 Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit |
09/28/2006 | DE202004021017U1 Probe calibrating substrate for electronic application, has two conductive units interconnected with two respective ground paths of probes, where resistive material extends certain percentage of distance between units |
09/28/2006 | DE102004034879B4 Verfahren und Vorrichtung zum Messen einer zu testenden Vorrichtung unter Verwendung einer verbesserten Durchgangs-Reflexions-Leitungs-Messkalibrierung Method and apparatus for measuring a device under test using an improved passage-reflection line calibration measurement |
09/28/2006 | DE10121291B4 Verfahren zum Kalibrieren einer Testvorrichtung zum parallelen Testen einer Mehrzahl von elektronischen Bauteilen A method for calibrating a test device for the parallel testing a plurality of electronic components |
09/26/2006 | US7113891 Multi-port scattering parameter calibration system and method |
09/26/2006 | US7113630 PICA system detector calibration |