Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105) |
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05/10/2007 | DE102006052842A1 Jittermessvorrichtung, Jittermessverfahren und Prüfvorrichtung Jitter, jitter and Tester |
05/09/2007 | EP1782079A1 Calibration standard |
05/08/2007 | US7216049 Method for calibrating current offset and filtering bad data in a system that detects power output |
05/08/2007 | US7215128 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit |
05/03/2007 | WO2007005211A3 Methods and apparatus for optimizing an electrical response to a conductive layer on a substrate |
05/03/2007 | US20070100570 Dual sine-wave time stamp method and apparatus |
05/03/2007 | US20070100569 Method of Automated Calibration and Diagnosis of Laboratory Instruments |
05/03/2007 | DE112005001303T5 Verfahren zum Überwachen einer Einbrennvorrichtung A method for monitoring a burn- |
05/02/2007 | CN2896300Y Passive thunder-and-lightning counter tester |
05/02/2007 | CN1955748A Method and device of providing impedance calibration for source series terminated serial link transmitter |
04/25/2007 | EP1777530A1 Method and arrangement for measuring inverter output currents |
04/25/2007 | CN1952678A Verification system of electric energy measurement chip |
04/25/2007 | CN1952677A Fixed clamp for calibrating surface electrometer and calibration method |
04/24/2007 | US7209848 Pulse stretching architecture for phase alignment for high speed data acquisition |
04/24/2007 | US7209847 Measuring apparatus with a validation capability of its previous calibration |
04/24/2007 | US7208936 Socket lid and test device |
04/24/2007 | CA2387941C External transformer correction in an electricity meter |
04/19/2007 | US20070088517 Parameter correction circuit and parameter correction method |
04/19/2007 | US20070085670 Industrial process sensor with sensor coating detection |
04/19/2007 | US20070085551 Calibration jig and calibration apparatus having the same |
04/19/2007 | US20070084035 Measurement error correcting method and electronic component characteristic measurement device |
04/18/2007 | CN1950716A Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means |
04/17/2007 | US7205773 Method for calibrating a pulsed measurement system |
04/12/2007 | DE102004056133B4 Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke A method for detecting an offset drift in a Wheatstone measuring bridge |
04/11/2007 | EP1440328B1 Method and apparatus for calibration and validation of high performance dut power supplies |
04/11/2007 | CN1947022A Intelligent probe card architecture |
04/11/2007 | CN1945350A Detecting method and device for electric energy metering secondary coop composition error |
04/11/2007 | CN1945349A Flexible generating device for embedded AC motor complex fault |
04/11/2007 | CN1945348A Flexible generating device for AC motor complex fault |
04/10/2007 | US7203614 Method and calibration system for IQ DC offset and imbalance calibration by utilizing analytic formulas to quickly determined desired compensation values |
04/05/2007 | WO2007037827A2 System and method for calibrating moisture meters with associated settable slurry products for determining relative dryness |
04/05/2007 | WO2005085883A3 Signal measurement and processing method and apparatus |
04/05/2007 | DE10047228B4 Multiple-N-Verfahren zur Kalibrierung vektorieller Netzwerkanalysatoren Multiple-N-method for the calibration of vector network analyzers |
04/03/2007 | CA2315896C Electronic circuit for monitoring voltage variation |
03/29/2007 | US20070073506 Closed loop controlled reference voltage calibration circuit and method |
03/29/2007 | US20070073500 Method and program for designing semiconductor integrated circuits, and semiconductor integrated circuit designing apparatus |
03/28/2007 | EP1766423A2 Method and apparatus for instrument transformer reclassification |
03/28/2007 | EP1181562B1 Scattering parameter calibration system and method |
03/22/2007 | WO2006052990A3 Data-dependent jitter (ddj) calibration methodology |
03/22/2007 | US20070067129 Device and method for testing integrated circuits |
03/22/2007 | DE10335164B4 Vorrichtung und Verfahren zum parallelen Testen von mehreren integrierten Schaltkreisen Apparatus and method for parallel testing of a plurality of integrated circuits |
03/15/2007 | US20070061094 Test apparatus, timing generator and program therefor |
03/15/2007 | US20070057679 Calibration method and system |
03/13/2007 | US7191083 Method and apparatus for calibrating data-dependent noise prediction |
03/13/2007 | US7190174 Method for calibrating timing clock |
03/13/2007 | US7190173 Impedance calibration circuit and method thereof |
03/08/2007 | WO2007026603A1 Insulation resistance degradation detector and failure self-diagnostic method for insulation resistance degradation detector |
03/08/2007 | WO2007026563A1 Calibration board for electronic component testing apparatus |
03/08/2007 | DE112004002807T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics |
03/08/2007 | CA2605356A1 Insulation resistance drop detector and failure self-diagnosis method for insulation resistance drop detector |
03/07/2007 | EP1173738B1 Digital phase sensitive rectification of ac driven transducer signals |
03/06/2007 | US7187164 Apparatus for calibrating a probe station |
03/01/2007 | US20070050166 Method and system for simulating test instruments and instrument functions |
03/01/2007 | US20070050165 System and method for automatic self-alignment of a surgical laser |
02/28/2007 | CN1922499A Network analyzer, network analyzing method, program, and recording medium |
02/28/2007 | CN1920580A Forcipated mutual-inductor, forcipated ammeter and verification method of forcipated ammeter |
02/27/2007 | US7185255 Test apparatus |
02/27/2007 | US7184912 Memory device with apparatus for recalibrating output signal of internal circuit and method thereof |
02/27/2007 | US7184911 Determination apparatus and method of calibrating the apparatus |
02/27/2007 | US7183896 Wake-up circuit |
02/22/2007 | WO2006083351A3 Calibration method and apparatus for potentiostats |
02/22/2007 | US20070043527 Systems, methods, and apparatus for image processing, for color classification, and for skin color detection |
02/22/2007 | US20070041512 Calibration method and apparatus |
02/22/2007 | US20070040561 Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics |
02/15/2007 | DE112004002808T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics |
02/15/2007 | DE102005037353A1 Messvorrichtung, insbesondere vektorieller Netzwerkanalysator, mit Phasenregelung Measuring device, in particular vectorial network analyzer with phase control |
02/14/2007 | EP1360544B8 Calibrating voltage controllable optical components in communication systems |
02/14/2007 | CN2869881Y High-pressure generator for electroscope |
02/13/2007 | US7176711 On-die termination impedance calibration device |
02/08/2007 | US20070032975 Content transmission device and content reproduction device |
02/08/2007 | US20070032974 Self-calibrating sensor |
02/08/2007 | US20070030012 Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics |
02/08/2007 | US20070029989 Error factor acquisition device, method, program, and recording medium |
02/08/2007 | DE19828682B4 Automatische Kalibrierung eines Netzwerkanalysators Automatic calibration of a network analyzer |
02/08/2007 | DE10338072B4 Verfahren und Vorrichtung zum Kalibrieren eines Meßvorrichtungswegs und zum Messen der S-Parameter einer Testvorrichtung in dem kalibrierten Meßvorrichtungsweg Method and apparatus for calibrating a Meßvorrichtungswegs and measuring the S parameters of a test device in the calibrated Meßvorrichtungsweg |
02/08/2007 | DE10159165B4 Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes A device for measuring and / or calibrating a test head |
02/07/2007 | CN1299098C Calibration mechanism, electron compass having said mechanism and electron clock |
02/06/2007 | US7173433 Circuit property measurement method |
02/01/2007 | US20070027650 Methods and apparatus for memory calibration |
02/01/2007 | US20070027649 Method and calibration system for iq dc offset and imbalance calibration by utilizing analytic formulas to quickly determined desired compensation values |
02/01/2007 | DE112004002805T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics |
01/31/2007 | CN1904631A Test method of electric energy metering secondary loop comprehensive error and test device |
01/30/2007 | US7171323 Integrated circuit having clock trim circuitry |
01/30/2007 | US7171322 Algorithm for estimation of multiple faults on a transmission line or waveguide |
01/30/2007 | US7171321 Individual data line strobe-offset control in memory systems |
01/30/2007 | US7170297 Transmission response measurement system and method of using time gating |
01/25/2007 | WO2007009425A1 Method and apparatus for measuring current |
01/25/2007 | US20070021937 Apparatus and method for compensating secondary currents used in differential protection to correct for a phase shift introduced between high voltage and low voltage transformer windings |
01/25/2007 | DE102005033919A1 Verfahren und Vorrichtung Strommessung Method and device current measurement |
01/24/2007 | EP1745307A1 Mri with separation of fat and water signal using radial ssfp sequence |
01/24/2007 | EP0901638B1 Radiator calibration |
01/24/2007 | CN2862057Y Insulated in-line monitoring system verifying device for high-voltage electrical equipment |
01/24/2007 | CN1902500A Energy metering system |
01/24/2007 | CN1900733A Current meter correcting system |
01/24/2007 | CN1296719C Probe based information storage for probes used for opens detection in in-circuit testing |
01/18/2007 | US20070013388 Method and system for calibrating measurement tools for semiconductor device manufacturing |
01/17/2007 | EP1743182A2 Intelligent probe card architecture |
01/17/2007 | CN1898674A Methods for calibrating mass spectrometry (ms) and other instrument systems and for processing ms and other data |
01/17/2007 | CN1898526A Azimuth measurement device |
01/17/2007 | CN1897242A Method and system for calibrating semiconductor-device manufacture measuring tool |