Patents
Patents for G01R 35 - Testing or calibrating of apparatus covered by the other groups of this subclass (8,105)
05/2007
05/10/2007DE102006052842A1 Jittermessvorrichtung, Jittermessverfahren und Prüfvorrichtung Jitter, jitter and Tester
05/09/2007EP1782079A1 Calibration standard
05/08/2007US7216049 Method for calibrating current offset and filtering bad data in a system that detects power output
05/08/2007US7215128 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
05/03/2007WO2007005211A3 Methods and apparatus for optimizing an electrical response to a conductive layer on a substrate
05/03/2007US20070100570 Dual sine-wave time stamp method and apparatus
05/03/2007US20070100569 Method of Automated Calibration and Diagnosis of Laboratory Instruments
05/03/2007DE112005001303T5 Verfahren zum Überwachen einer Einbrennvorrichtung A method for monitoring a burn-
05/02/2007CN2896300Y Passive thunder-and-lightning counter tester
05/02/2007CN1955748A Method and device of providing impedance calibration for source series terminated serial link transmitter
04/2007
04/25/2007EP1777530A1 Method and arrangement for measuring inverter output currents
04/25/2007CN1952678A Verification system of electric energy measurement chip
04/25/2007CN1952677A Fixed clamp for calibrating surface electrometer and calibration method
04/24/2007US7209848 Pulse stretching architecture for phase alignment for high speed data acquisition
04/24/2007US7209847 Measuring apparatus with a validation capability of its previous calibration
04/24/2007US7208936 Socket lid and test device
04/24/2007CA2387941C External transformer correction in an electricity meter
04/19/2007US20070088517 Parameter correction circuit and parameter correction method
04/19/2007US20070085670 Industrial process sensor with sensor coating detection
04/19/2007US20070085551 Calibration jig and calibration apparatus having the same
04/19/2007US20070084035 Measurement error correcting method and electronic component characteristic measurement device
04/18/2007CN1950716A Method and apparatus of temperature compensation for integrated circuit chip using on-chip sensor and computation means
04/17/2007US7205773 Method for calibrating a pulsed measurement system
04/12/2007DE102004056133B4 Verfahren zur Erfassung einer Offsetdrift bei einer Wheatstone-Meßbrücke A method for detecting an offset drift in a Wheatstone measuring bridge
04/11/2007EP1440328B1 Method and apparatus for calibration and validation of high performance dut power supplies
04/11/2007CN1947022A Intelligent probe card architecture
04/11/2007CN1945350A Detecting method and device for electric energy metering secondary coop composition error
04/11/2007CN1945349A Flexible generating device for embedded AC motor complex fault
04/11/2007CN1945348A Flexible generating device for AC motor complex fault
04/10/2007US7203614 Method and calibration system for IQ DC offset and imbalance calibration by utilizing analytic formulas to quickly determined desired compensation values
04/05/2007WO2007037827A2 System and method for calibrating moisture meters with associated settable slurry products for determining relative dryness
04/05/2007WO2005085883A3 Signal measurement and processing method and apparatus
04/05/2007DE10047228B4 Multiple-N-Verfahren zur Kalibrierung vektorieller Netzwerkanalysatoren Multiple-N-method for the calibration of vector network analyzers
04/03/2007CA2315896C Electronic circuit for monitoring voltage variation
03/2007
03/29/2007US20070073506 Closed loop controlled reference voltage calibration circuit and method
03/29/2007US20070073500 Method and program for designing semiconductor integrated circuits, and semiconductor integrated circuit designing apparatus
03/28/2007EP1766423A2 Method and apparatus for instrument transformer reclassification
03/28/2007EP1181562B1 Scattering parameter calibration system and method
03/22/2007WO2006052990A3 Data-dependent jitter (ddj) calibration methodology
03/22/2007US20070067129 Device and method for testing integrated circuits
03/22/2007DE10335164B4 Vorrichtung und Verfahren zum parallelen Testen von mehreren integrierten Schaltkreisen Apparatus and method for parallel testing of a plurality of integrated circuits
03/15/2007US20070061094 Test apparatus, timing generator and program therefor
03/15/2007US20070057679 Calibration method and system
03/13/2007US7191083 Method and apparatus for calibrating data-dependent noise prediction
03/13/2007US7190174 Method for calibrating timing clock
03/13/2007US7190173 Impedance calibration circuit and method thereof
03/08/2007WO2007026603A1 Insulation resistance degradation detector and failure self-diagnostic method for insulation resistance degradation detector
03/08/2007WO2007026563A1 Calibration board for electronic component testing apparatus
03/08/2007DE112004002807T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics
03/08/2007CA2605356A1 Insulation resistance drop detector and failure self-diagnosis method for insulation resistance drop detector
03/07/2007EP1173738B1 Digital phase sensitive rectification of ac driven transducer signals
03/06/2007US7187164 Apparatus for calibrating a probe station
03/01/2007US20070050166 Method and system for simulating test instruments and instrument functions
03/01/2007US20070050165 System and method for automatic self-alignment of a surgical laser
02/2007
02/28/2007CN1922499A Network analyzer, network analyzing method, program, and recording medium
02/28/2007CN1920580A Forcipated mutual-inductor, forcipated ammeter and verification method of forcipated ammeter
02/27/2007US7185255 Test apparatus
02/27/2007US7184912 Memory device with apparatus for recalibrating output signal of internal circuit and method thereof
02/27/2007US7184911 Determination apparatus and method of calibrating the apparatus
02/27/2007US7183896 Wake-up circuit
02/22/2007WO2006083351A3 Calibration method and apparatus for potentiostats
02/22/2007US20070043527 Systems, methods, and apparatus for image processing, for color classification, and for skin color detection
02/22/2007US20070041512 Calibration method and apparatus
02/22/2007US20070040561 Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics
02/15/2007DE112004002808T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics
02/15/2007DE102005037353A1 Messvorrichtung, insbesondere vektorieller Netzwerkanalysator, mit Phasenregelung Measuring device, in particular vectorial network analyzer with phase control
02/14/2007EP1360544B8 Calibrating voltage controllable optical components in communication systems
02/14/2007CN2869881Y High-pressure generator for electroscope
02/13/2007US7176711 On-die termination impedance calibration device
02/08/2007US20070032975 Content transmission device and content reproduction device
02/08/2007US20070032974 Self-calibrating sensor
02/08/2007US20070030012 Method and apparatus for measuring high-frequency electrical characteristics of electronic device, and method for calibrating apparatus for measuring high-frequency electrical characteristics
02/08/2007US20070029989 Error factor acquisition device, method, program, and recording medium
02/08/2007DE19828682B4 Automatische Kalibrierung eines Netzwerkanalysators Automatic calibration of a network analyzer
02/08/2007DE10338072B4 Verfahren und Vorrichtung zum Kalibrieren eines Meßvorrichtungswegs und zum Messen der S-Parameter einer Testvorrichtung in dem kalibrierten Meßvorrichtungsweg Method and apparatus for calibrating a Meßvorrichtungswegs and measuring the S parameters of a test device in the calibrated Meßvorrichtungsweg
02/08/2007DE10159165B4 Vorrichtung zum Messen und/oder Kalibrieren eines Testkopfes A device for measuring and / or calibrating a test head
02/07/2007CN1299098C Calibration mechanism, electron compass having said mechanism and electron clock
02/06/2007US7173433 Circuit property measurement method
02/01/2007US20070027650 Methods and apparatus for memory calibration
02/01/2007US20070027649 Method and calibration system for iq dc offset and imbalance calibration by utilizing analytic formulas to quickly determined desired compensation values
02/01/2007DE112004002805T5 Verfahren und Gerät zum Messen von elektrischen Hochfrequenzcharakteristika einer elektronischen Vorrichtung und Verfahren zum Kalibrieren von Geräten zum Messen von elektrischen Hochfrequenzcharakteristika Method and apparatus for measuring high-frequency electrical characteristics of an electronic device and method for calibrating apparatus for measuring high-frequency electrical characteristics
01/2007
01/31/2007CN1904631A Test method of electric energy metering secondary loop comprehensive error and test device
01/30/2007US7171323 Integrated circuit having clock trim circuitry
01/30/2007US7171322 Algorithm for estimation of multiple faults on a transmission line or waveguide
01/30/2007US7171321 Individual data line strobe-offset control in memory systems
01/30/2007US7170297 Transmission response measurement system and method of using time gating
01/25/2007WO2007009425A1 Method and apparatus for measuring current
01/25/2007US20070021937 Apparatus and method for compensating secondary currents used in differential protection to correct for a phase shift introduced between high voltage and low voltage transformer windings
01/25/2007DE102005033919A1 Verfahren und Vorrichtung Strommessung Method and device current measurement
01/24/2007EP1745307A1 Mri with separation of fat and water signal using radial ssfp sequence
01/24/2007EP0901638B1 Radiator calibration
01/24/2007CN2862057Y Insulated in-line monitoring system verifying device for high-voltage electrical equipment
01/24/2007CN1902500A Energy metering system
01/24/2007CN1900733A Current meter correcting system
01/24/2007CN1296719C Probe based information storage for probes used for opens detection in in-circuit testing
01/18/2007US20070013388 Method and system for calibrating measurement tools for semiconductor device manufacturing
01/17/2007EP1743182A2 Intelligent probe card architecture
01/17/2007CN1898674A Methods for calibrating mass spectrometry (ms) and other instrument systems and for processing ms and other data
01/17/2007CN1898526A Azimuth measurement device
01/17/2007CN1897242A Method and system for calibrating semiconductor-device manufacture measuring tool
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