| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/26/2009 | CN201295463Y Explosion-proof type fast body electrostatic discharge guide tester |
| 08/26/2009 | CN101517845A Socket, module board, and inspection system using the module board |
| 08/26/2009 | CN101517594A Method and system for standing wave detection for radio frequency identification marker readers |
| 08/26/2009 | CN101517588A System-on-a-chip (SOC) test interface security |
| 08/26/2009 | CN101517425A Device for measurting the parameters of an electric power source comprising a clock |
| 08/26/2009 | CN101517424A Wafer inspection system and a method for translating wafers |
| 08/26/2009 | CN101517423A Method and apparatus for indirect planarization |
| 08/26/2009 | CN101517422A Single support structure probe group with staggered mounting pattern |
| 08/26/2009 | CN101516442A Remaining time indication for a rechargeable implantable medical device |
| 08/26/2009 | CN101515781A Universal servocontrol platform device for motor-operating mechanism of high-voltage switch apparatus and method |
| 08/26/2009 | CN101515718A Remote alarm method and a system of a surge protector |
| 08/26/2009 | CN101515650A Energy management module and driving device |
| 08/26/2009 | CN101515520A Intelligent self-diagnosis medium-pressure vacuum circuit breaker |
| 08/26/2009 | CN101515442A Peripheral circuit |
| 08/26/2009 | CN101515074A Array substrate circuit for testing optical properties of liquid crystal panels and realization method thereof |
| 08/26/2009 | CN101515025A A device for monitoring and detecting road traffic signal lamp failure and the detecting method thereof |
| 08/26/2009 | CN101515024A Online low performing cell prediction and detection of fuel cell system |
| 08/26/2009 | CN101515023A Accumulator and accumulator tester |
| 08/26/2009 | CN101515022A Method for evaluating consistency of batteries |
| 08/26/2009 | CN101515021A Detection of current leakage through opto-switches |
| 08/26/2009 | CN101515020A Built-in self-test method of FPGA logical resource |
| 08/26/2009 | CN101515019A Dynamic boundary scanning chain test method based on programmable devices |
| 08/26/2009 | CN101515018A Circuit detection loop and methods for manufacturing and using same |
| 08/26/2009 | CN101515017A Detection device of chip diode |
| 08/26/2009 | CN101515016A Probe apparatus, probing method, and storage medium |
| 08/26/2009 | CN101515015A Power quality monitoring and recording device of power system |
| 08/26/2009 | CN101515014A Analog device of control cabinet matched with detection switch apparatus |
| 08/26/2009 | CN101515013A Electricity safety inspection system and method thereof |
| 08/26/2009 | CN101515012A External mounted electric combined test car |
| 08/26/2009 | CN101515011A Method and device for detecting failure of electromagnetic movement mechanism |
| 08/26/2009 | CN101515010A Electrical property detecting and analyzing system of micromachine sensing device and method thereof |
| 08/26/2009 | CN101515009A Unattended automatic test system of quartz crystal oscillator |
| 08/26/2009 | CN101515008A Automatic test instrument for high-frequency cable and measurement method thereof |
| 08/26/2009 | CN101515006A Method for measuring nonlinear susceptibility of materials |
| 08/26/2009 | CN101515003A Method for measuring surface charge density of materials |
| 08/26/2009 | CN101514997A Probe device having a light source thereon |
| 08/26/2009 | CN101513859A Method of externally charging a powertrain |
| 08/26/2009 | CN100534052C Network message processing using inverse pattern matching |
| 08/26/2009 | CN100533947C Ac rotary machine constant measuring apparatus |
| 08/26/2009 | CN100533713C Method for controlling heat of circuit, apparatus, and system |
| 08/26/2009 | CN100533703C Technique for evaluating a fabrication of a semiconductor component and wafer |
| 08/26/2009 | CN100533702C Temperature monitoring system of testing classifying machine |
| 08/26/2009 | CN100533532C Luminance compensation method and apparatus for emissive displays |
| 08/26/2009 | CN100533210C Detecting method for LCD device electro-optical characteristic and average slope angle corresponding relationship |
| 08/26/2009 | CN100533170C Calibrating device and testing system for testing channel of calibrating and testing apparatus |
| 08/26/2009 | CN100533166C Current converter test circuit |
| 08/26/2009 | CN100533165C Methods of conducting wafer level burn-in of electronic devices |
| 08/26/2009 | CN100533164C Modal checking method and system of vacuum electronic device |
| 08/26/2009 | CN100533163C Crystal wafer for testing aging and electricity performances and construction thereof |
| 08/26/2009 | CN100533162C Apparatus for partial discharge detection of turn-to-turn in motor |
| 08/26/2009 | CN100533161C Method and apparatus for identifying intermittent earth fault |
| 08/26/2009 | CN100533160C Thyristor AC-AC frequency converter complete shut-down detection circuit |
| 08/26/2009 | CN100533159C Method for identifying protection distance between extra-high voltage AC line and short wave radio direction-finding station |
| 08/26/2009 | CN100533158C Method and device of providing impedance calibration for source series terminated serial link transmitter |
| 08/26/2009 | CN100533105C Test stand for detecting hub bearing ABS sensor dynamic signal |
| 08/26/2009 | CN100533077C Method for measuring dye sensitized solar battery conversion efficiency and mono-wavelength quantum efficiency |
| 08/25/2009 | US7581152 Fault free store data path for software implementation of redundant multithreading environments |
| 08/25/2009 | US7581151 Method and apparatus for affecting a portion of an integrated circuit |
| 08/25/2009 | US7581150 Methods and computer program products for debugging clock-related scan testing failures of integrated circuits |
| 08/25/2009 | US7581149 Scan chain extracting method, test apparatus, circuit device, and scan chain extracting program |
| 08/25/2009 | US7581148 System, method and apparatus for completing the generation of test records after an abort event |
| 08/25/2009 | US7581147 Radio resource control-service data unit reception |
| 08/25/2009 | US7581146 Semiconductor memory device storing repair information avoiding memory cell of fail bit operating method thereof |
| 08/25/2009 | US7580807 Test protocol manager for massive multi-site test |
| 08/25/2009 | US7580806 Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) |
| 08/25/2009 | US7580749 Method for monitoring end of life for battery |
| 08/25/2009 | US7580361 Network system, information processor and electronic apparatus |
| 08/25/2009 | US7580358 Bidirectional communication control apparatus, terminal apparatus, and bidirectional communication control method |
| 08/25/2009 | US7580353 Method and apparatus to balance flow loads in a multipurpose networking device |
| 08/25/2009 | US7580351 Dynamically controlling the rate and internal priority of packets destined for the control plane of a routing device |
| 08/25/2009 | US7580348 Communication apparatus, control method, and computer readable information recording medium |
| 08/25/2009 | US7580334 Optical storage medium inspection apparatus for determining whether an optical storage medium is good or defective |
| 08/25/2009 | US7580107 Liquid crystal display and testing method thereof |
| 08/25/2009 | US7580037 Techniques for graphical analysis and manipulation of circuit timing requirements |
| 08/25/2009 | US7580020 Semiconductor device and liquid crystal panel driver device |
| 08/25/2009 | US7579860 Digital bandgap reference and method for producing reference signal |
| 08/25/2009 | US7579859 Method for determining time dependent dielectric breakdown |
| 08/25/2009 | US7579858 Semiconductor device and inspection method thereof |
| 08/25/2009 | US7579856 Probe structures with physically suspended electronic components |
| 08/25/2009 | US7579855 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
| 08/25/2009 | US7579854 Probe station and method for measurements of semiconductor devices under defined atmosphere |
| 08/25/2009 | US7579853 Apparatus for obtaining planarity measurements with respect to a probe card analysis system |
| 08/25/2009 | US7579852 Wafer translator having metallization pattern providing high density interdigitated contact pads for component |
| 08/25/2009 | US7579851 Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
| 08/25/2009 | US7579850 Probe card and method for assembling the same |
| 08/25/2009 | US7579849 Probe holder for a probe for testing semiconductor components |
| 08/25/2009 | US7579848 High density interconnect system for IC packages and interconnect assemblies |
| 08/25/2009 | US7579847 Probe card cooling assembly with direct cooling of active electronic components |
| 08/25/2009 | US7579843 Methods and apparatus for analyzing partial discharge in electrical machinery |
| 08/25/2009 | US7579826 Test socket for semiconductor |
| 08/25/2009 | US7579811 Battery pack, battery protection processing apparatus and control method thereof |
| 08/25/2009 | US7579269 Microelectronic spring contact elements |
| 08/25/2009 | US7578057 Method of fabricating segmented contactor |
| 08/25/2009 | CA2509956C Probe for electric test |
| 08/25/2009 | CA2423545C Polymer electrolyte fuel cell, method of manufacturing the same and inspection method therefor |
| 08/20/2009 | WO2009103086A2 An intelligent fault-tolerant battery management system |
| 08/20/2009 | WO2009103084A2 An intelligent fault-tolerant battery management system |
| 08/20/2009 | WO2009102994A1 Methodologies and tool set for iddq verification, debugging and failure diagnosis |
| 08/20/2009 | WO2009102646A1 Methods for measurement and characterization of interferometric modulators |
| 08/20/2009 | WO2009102645A1 Methods for measurement and characterization of interferometric modulators |