Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2010
01/06/2010CN100578578C Detection module of measuring carrier for display panel
01/06/2010CN100578577C Display substrate and device and method for testing display panel with the display substrate
01/06/2010CN100578328C Array substrate tending measuring TFT features
01/06/2010CN100578301C Test fixture and lighting test station using the test fixture
01/06/2010CN100578249C Accelerated testing method of rapidly evaluating lifespan of fuel cell
01/06/2010CN100578248C Digitalized motor experiment station
01/06/2010CN100578247C Method for testing motor and testing circuit
01/06/2010CN100578246C Method for generating testing vector
01/06/2010CN100578245C Oscillator detecting fixture
01/06/2010CN100578244C Loop oscillator start circuit
01/06/2010CN100578243C Full-automatic each specification wafer test and discriminating device
01/06/2010CN100578242C Multifunctional electric cable failure detector
01/06/2010CN100578241C Method and device for oriental insulating barrier in isolated offground AC network
01/06/2010CN100578240C Method for implementing chip test
01/06/2010CN100578239C Dynamic property test analysis system for DC hybrid contactor reliable life experiment
01/06/2010CN100578238C Trimming system and method for PCB measurement
01/06/2010CN100578237C Method of testing oxperimental applicance
01/06/2010CN100578236C M-w grade microwave power instrumentation system based on calorimetric method
01/06/2010CN100578235C Method and apparatus for measuring impedance across pressure joints in a power distribution system
01/06/2010CN100578218C Airborne power transmission line inspection system based on multi-angel imaging technology
01/05/2010US7644398 System and method for automatic test-case generation for software
01/05/2010US7644334 Requirements-based test generation
01/05/2010US7644333 Restartable logic BIST controller
01/05/2010US7644331 System and method for testing and debugging analog circuits in a memory controller
01/05/2010US7644330 Adapting scan architectures for low power operation
01/05/2010US7644329 Integrated circuit testing method and related circuit thereof
01/05/2010US7644328 Sharing routing of a test signal with an alternative power supply to combinatorial logic for low power design
01/05/2010US7644327 System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded FPGA
01/05/2010US7644326 Testing system and testing system control method
01/05/2010US7644325 Semiconductor integrated circuit device and method of testing the same
01/05/2010US7644310 Semiconductor IC incorporating a co-debugging function and test system
01/05/2010US7644182 Reconfiguring a multicast tree
01/05/2010US7644178 End to end test between gateways in a IP network
01/05/2010US7643979 Method to analyze an analog circuit design with a verification program
01/05/2010US7643951 Battery monitor
01/05/2010US7643432 Method for analyzing a network environment
01/05/2010US7643430 Methods and apparatus for determining reverse path delay
01/05/2010US7643417 Data rate control
01/05/2010US7643415 Method for controlling link connections in a communication system and corresponding communication system
01/05/2010US7643411 Network-triggered quality of service (QoS) reservation
01/05/2010US7643409 Computer network with point-to-point pseudowire redundancy
01/05/2010US7643365 Semiconductor integrated circuit and method of testing same
01/05/2010US7642973 Electromagnetic wave analysis apparatus and design support apparatus
01/05/2010US7642806 Test apparatus, system, and method with a magnetic feature
01/05/2010US7642805 Short detection circuit
01/05/2010US7642804 Testing high frequency signals on a trace
01/05/2010US7642803 Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same
01/05/2010US7642802 Method and apparatus for cooling non-native instrument in automatic test equipment
01/05/2010US7642801 Circuit testing apparatus for testing a device under test
01/05/2010US7642800 Wafer test system wherein period of high voltage stress test of one chip overlaps period of function test of other chip
01/05/2010US7642799 Test chip socket and method for testing a chip
01/05/2010US7642798 Probe card needle cleaning frequency optimization
01/05/2010US7642797 Power supply stabilizing circuit, an electronic device and a test apparatus
01/05/2010US7642796 Control system and method of semiconductor inspection system
01/05/2010US7642795 Drive method and drive circuit of peltier element, attaching structure of peltier module and electronic device handling apparatus
01/05/2010US7642794 Method and system for compensating thermally induced motion of probe cards
01/05/2010US7642793 Ultra-fine pitch probe card structure
01/05/2010US7642792 Probe card for tests on photosensitive chips and corresponding illumination device
01/05/2010US7642791 Electronic component/interface interposer
01/05/2010US7642790 Systems and methods for testing conductive members employing electromagnetic back scattering
01/05/2010US7642789 Storage device, and writing unit diagnosing method
01/05/2010US7642788 Voltage measurement instrument and method having improved automatic mode operation
01/05/2010US7642787 Automotive vehicle electrical system diagnostic device
01/05/2010US7642786 Battery tester capable of identifying faulty battery post adapters
01/05/2010US7642772 Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers
01/05/2010US7642771 Pin fixture for glue dispenser
01/05/2010US7642770 Light-driving system capable of providing signal-measured calibration and a method for performing the same
01/05/2010US7642769 Insert and tray for electronic device handling apparatus, and electronic device handling apparatus
01/05/2010US7642551 Wafer-level package having test terminal
01/05/2010US7642105 Manufacturing method for partially-good memory modules with defect table in EEPROM
01/05/2010US7642104 Method for contacting semiconductor components with a test contact
01/05/2010US7642101 Semiconductor device having in-chip critical dimension and focus patterns
01/05/2010CA2488832C Multi-socket board for open/short tester
01/05/2010CA2456405C Operation state determining apparatus and method for fuel cell
01/04/2010CA2638049A1 Acquisition, control and measurement device
12/2009
12/31/2009US20090328048 Distributed Processing Architecture With Scalable Processing Layers
12/31/2009US20090327824 Techniques for performing a logic built-in self-test in an integrated circuit device
12/31/2009US20090327823 Removeable and replaceable tap domain selection circuitry
12/31/2009US20090326854 Testing state retention logic in low power systems
12/31/2009US20090326841 Pattern recognition approach to battery diagnosis and prognosis
12/31/2009US20090326749 Degradation assessment system for power storage device, vehicle, degradation assessment method for power storage device, and computer-readable recording medium having program recorded thereon for computer to execute the degradation assessment method
12/31/2009US20090325328 Plasma processing apparatus and plasma processing method
12/31/2009US20090325325 Laser Optical Path Detection in Integrated Circuit Packaging
12/31/2009US20090323535 Distributing information across equal-cost paths in a network
12/31/2009US20090323233 Apparatus and method of determining insulation resistance in an ungrounded mobile vehicle electrical bus system
12/31/2009US20090322554 Determining Electrical Characteristics of an Electrical Cable
12/31/2009US20090322412 Systems and methods for adjusting threshold voltage
12/31/2009US20090322373 Permanent magnet rotor crack detection
12/31/2009US20090322372 Automatic test equipment
12/31/2009US20090322371 Measuring Arrangement, Semiconductor Arrangement and Method for Operating a Semiconductor Component as a Reference Source
12/31/2009US20090322370 Method And Apparatus For Test And Characterization Of Semiconductor Components
12/31/2009US20090322369 Test system
12/31/2009US20090322368 Integrated Tester Chip Using Die Packaging Technologies
12/31/2009US20090322367 Integrated circuit and a method for measuring a quiescent current of a module
12/31/2009US20090322366 Integrated Tester Chip Using Die Packaging Technologies
12/31/2009US20090322365 Integrated mems metrology device using complementary measuring combs
12/31/2009US20090322363 Operation voltage supply method for semiconductor device
12/31/2009US20090322362 Test pad structure, a pad structure for inspecting a semiconductor chip and a wiring subtrate for a tape package having the same
12/31/2009US20090322360 Test system for identifying defects and method of operating the same
12/31/2009US20090322346 Motherboard test system and test method thereof