| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/03/2010 | CN101661067A Testing device |
| 03/03/2010 | CN101661066A Sensing element and electric quantity sensing device |
| 03/03/2010 | CN101661065A System and method for automatically testing electronic product |
| 03/03/2010 | CN101661064A Detection method and characteristic dimension measuring instrument |
| 03/03/2010 | CN101661063A Novel power quality analysis meter |
| 03/03/2010 | CN100593260C Apparatus for judging state of assembled battery |
| 03/03/2010 | CN100593121C Using parametric measurement units as a source of power for a device under test |
| 03/02/2010 | US7673262 System and method for product yield prediction |
| 03/02/2010 | US7673208 Storing multicore chip test data |
| 03/02/2010 | US7673206 Method and system for routing scan chains in an array of processor resources |
| 03/02/2010 | US7673205 Semiconductor IC and testing method thereof |
| 03/02/2010 | US7673204 Method using non-linear compression to generate a set of test vectors for use in scan testing an integrated circuit |
| 03/02/2010 | US7673203 Interconnect delay fault test controller and test apparatus using the same |
| 03/02/2010 | US7673202 Single event upset test circuit and methodology |
| 03/02/2010 | US7673201 Recovering a prior state of a circuit design within a programmable integrated circuit |
| 03/02/2010 | US7673200 Reprogrammable built-in-self-test integrated circuit and test method for the same |
| 03/02/2010 | US7673199 Multi-stream interface for parallel test processing |
| 03/02/2010 | US7673198 Testing system and related testing method for an analog design under test |
| 03/02/2010 | US7673197 Polymorphic automatic test systems and methods |
| 03/02/2010 | US7673196 Methods and apparatus for communicating with a target circuit |
| 03/02/2010 | US7672812 Cable fault detection |
| 03/02/2010 | US7672805 Synchronization of modules for analog and mixed signal testing in an open architecture test system |
| 03/02/2010 | US7672804 Analog signal test using a-priori information |
| 03/02/2010 | US7672798 Apparatus and method for determining the temperature of a charging power source |
| 03/02/2010 | US7672452 Secure scan |
| 03/02/2010 | US7672368 PHY control module for a multi-pair gigabit transceiver |
| 03/02/2010 | US7672340 Built-in-self test for high-speed serial bit stream multiplexing and demultiplexing chip set |
| 03/02/2010 | US7672250 Multi-carrier wireless communication access terminal and data transmission method |
| 03/02/2010 | US7672247 Evaluating data processing system health using an I/O device |
| 03/02/2010 | US7672246 System and method for using per-packet receive signal strength indication and transmit power levels to compute path loss for a link for use in layer II routing in a wireless communication network |
| 03/02/2010 | US7672244 Converting a network device from data rate traffic management to packet rate |
| 03/02/2010 | US7672242 Traffic management device and method thereof |
| 03/02/2010 | US7672239 System and method for conducting fast offloading of a connection onto a network interface card |
| 03/02/2010 | US7672237 Node capable of saving a third-layer operation |
| 03/02/2010 | US7672235 System and method for buffering real-time streaming content in a peer-to-peer overlay network |
| 03/02/2010 | US7672234 Congestion avoidance within aggregate channels |
| 03/02/2010 | US7672232 Methods and systems for frequency and time division access |
| 03/02/2010 | US7672230 Downstream channel change technique implemented in an access network |
| 03/02/2010 | US7672228 System and method for network loop detection and recovery |
| 03/02/2010 | US7672225 Swapping an operational networked electronic system for a nonoperational networked electronic system |
| 03/02/2010 | US7672223 Method and apparatus for replicating a transport layer protocol stream |
| 03/02/2010 | US7671650 Timing vernier using a delay locked loop |
| 03/02/2010 | US7671621 Closed loop feedback control of integrated circuits |
| 03/02/2010 | US7671620 Testing system for solar cells |
| 03/02/2010 | US7671619 Measuring system and method |
| 03/02/2010 | US7671618 Analog IC having test arrangement and test method for such an IC |
| 03/02/2010 | US7671617 Test system to test multi-chip package compensating a signal distortion |
| 03/02/2010 | US7671616 Semiconductor probe having embossed resistive tip and method of fabricating the same |
| 03/02/2010 | US7671615 Method and apparatus for controlling the temperature of electronic components |
| 03/02/2010 | US7671614 Apparatus and method for adjusting an orientation of probes |
| 03/02/2010 | US7671613 Probing blade conductive connector for use with an electrical test probe |
| 03/02/2010 | US7671612 Integrated compound nano probe card and method of making same |
| 03/02/2010 | US7671611 Apparatus, system and method for testing electronic elements |
| 03/02/2010 | US7671610 Vertical guided probe array providing sideways scrub motion |
| 03/02/2010 | US7671609 Sheet-like probe, method of producing the probe, and application of the probe |
| 03/02/2010 | US7671608 Electrical junction box |
| 03/02/2010 | US7671604 Nanoscale fault isolation and measurement system |
| 03/02/2010 | US7671603 Screening of electrolytic capacitors |
| 03/02/2010 | US7671602 Method and apparatus for cross-point detection |
| 03/02/2010 | US7671601 Abnormal condition detecting system for engine |
| 03/02/2010 | US7671578 Detection circuit for sensing the input voltage of transformer |
| 03/02/2010 | US7670859 Semiconductor device and method for manufacturing the same |
| 03/02/2010 | US7669309 Method for manufacturing a medical device having integral traces and formed electrodes |
| 02/25/2010 | WO2010021233A1 Generating device, generating method, and program |
| 02/25/2010 | WO2010021131A1 Test device and testing method |
| 02/25/2010 | WO2010021070A1 Apparatus and method for measuring withstand voltage of semiconductor element |
| 02/25/2010 | WO2010021038A1 Electronic component handling apparatus and electronic component test system |
| 02/25/2010 | WO2010020534A1 Method for monitoring the charge state and the residual capacitance of a battery or accumulator in automation technology |
| 02/25/2010 | WO2010020532A1 Method and device for determining the charge state of a battery |
| 02/25/2010 | WO2010020444A1 Electric motor assembly, method for operating an electric motor, and motor control device |
| 02/25/2010 | WO2010020385A2 Apparatus and method for monitoring individual photovoltaic modules of a photovoltaic system |
| 02/25/2010 | WO2010019992A1 Method and apparatus for defect detection |
| 02/25/2010 | WO2010019981A1 Apparatus for testing integrated circuitry |
| 02/25/2010 | WO2010019980A1 Measuring apparatus for performing positional analysis on an integrated circuit carrier |
| 02/25/2010 | WO2010001139A3 Method and apparatus for fault detection |
| 02/25/2010 | WO2009151738A3 Receiver for recovering and retiming electromagnetically coupled data |
| 02/25/2010 | WO2008155765A3 A dpi matrix allocator |
| 02/25/2010 | US20100050031 Providing Pseudo-Randomized Static Values During LBIST Transition Tests |
| 02/25/2010 | US20100050030 High speed atpg testing circuit and method |
| 02/25/2010 | US20100050029 Method And Apparatus For Testing Semiconductor Devices With Autonomous Expected Value Generation |
| 02/25/2010 | US20100050019 Test access port |
| 02/25/2010 | US20100049465 Testable electronic device for wireless communication |
| 02/25/2010 | US20100049464 System for testing integrated circuits |
| 02/25/2010 | US20100049458 Electronic equipment and power management method for the electronic equipment, and power source unit |
| 02/25/2010 | US20100049457 Method and apparatus for monitoring energy storage devices |
| 02/25/2010 | US20100049454 Light emitting diode fault monitoring |
| 02/25/2010 | US20100049453 Test apparatus and manufacturing method |
| 02/25/2010 | US20100046893 Optical connector for contactless communication, optical adapter for contactless communication, and method of manufacturing electronic appliance using the same |
| 02/25/2010 | US20100046375 Congestion Control Using Application Slowdown |
| 02/25/2010 | US20100046366 Methods and systems for providing a failover circuit for rerouting logical circuit data |
| 02/25/2010 | US20100045390 Circuit and method for measuring the performance parameters of transistors |
| 02/25/2010 | US20100045335 Methods and systems for evaluating permanent magnet motors |
| 02/25/2010 | US20100045334 Direct detect sensor for flat panel displays |
| 02/25/2010 | US20100045333 Generating test benches for pre-silicon validation of retimed complex ic designs against a reference design |
| 02/25/2010 | US20100045332 Test circuit, method, and semiconductor device |
| 02/25/2010 | US20100045331 Method of locating failure site on semiconductor device under test |
| 02/25/2010 | US20100045330 Apparatus for testing integrated circuitry |
| 02/25/2010 | US20100045329 Probeless DC testing of CMOS I/O circuits |
| 02/25/2010 | US20100045328 Circuit for detecting bonding defect in multi-bonding wire |
| 02/25/2010 | US20100045327 Test circuit and test method for power switch |