Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2010
03/24/2010CN201429478Y On-line pressure detection device
03/24/2010CN201429464Y Automatic test spectrometer for united LED
03/24/2010CN201429463Y Lumen efficiency test device of LED lamp
03/24/2010CN101682060A 燃料电池系统 The fuel cell system
03/24/2010CN101681861A Fixing device of probe card
03/24/2010CN101681392A Constrained random simulation coverage closure guided by a cover property
03/24/2010CN101680933A Method of diagnosing defective elements in a standalone system, powered by an intermittent power source
03/24/2010CN101680932A Integrated circuit with self-test feature for validating functionality of external interfaces
03/24/2010CN101680931A Temperature monitor for bus structure flex connector
03/24/2010CN101680930A Plunger for holding and moving electronic components in particular ic's with a heat conducting body
03/24/2010CN101680929A Integrated circuit probe card analyzer
03/24/2010CN101680928A Test plate pocket for electronic handler
03/24/2010CN101680927A Power converters with rate of change monitoring for fault prediction and/or detection
03/24/2010CN101680926A Tft panel substrate inspecting device
03/24/2010CN101680925A System and method for presenting multiple transaction options in a portable device
03/24/2010CN101680923A Electronic device and electronic device testing method
03/24/2010CN101680915A Method and device for evaluating fast current changes
03/24/2010CN101680914A Testing of electronic circuits using an active probe integrated circuit
03/24/2010CN101680912A Universal switching device of special testing machine for testing circuit board and universal fixture
03/24/2010CN101677356A Video display device, method of displaying connectors, transmission-line state detection device, transmission line-state detection method and semiconductor integrated circuit
03/24/2010CN101677190A Component having multiple output voltages and electronic device using same
03/24/2010CN101676736A Test wiring platform containing multiple groups of wiring plates
03/24/2010CN101676733A Structure of probe card for integrated circuit test
03/24/2010CN101676732A Wiring plate with high frequency
03/24/2010CN101676731A Circuit board structure of circuit test device
03/24/2010CN100595601C Pump storage plant generator/ motor stator transient time constant test method
03/24/2010CN100595600C Method for revising relative air density of DC equipment corona-starting voltage
03/24/2010CN100595599C Multi-core cable detecting device and method thereof
03/24/2010CN100595598C Die design with integrated assembly aid
03/24/2010CN100595597C Lightning arrester various waveform aging test device
03/24/2010CN100595596C Dynamic data compression storage method in electric network wide-area measuring systems (WAMS)
03/24/2010CN100595595C High precision broad frequency contaminated insulator leakage current sensor
03/23/2010US7685542 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing
03/23/2010US7685491 Test generation methods for reducing power dissipation and supply currents
03/23/2010US7685489 Semiconductor integrated circuit and testing method
03/23/2010US7685488 Circuit interconnect testing arrangement and approach therefor
03/23/2010US7685487 Simultaneous core testing in multi-core integrated circuits
03/23/2010US7685486 Testing of an embedded multiplexer having a plurality of inputs
03/23/2010US7685485 Functional failure analysis techniques for programmable integrated circuits
03/23/2010US7685484 Methods for the support of JTAG for source synchronous interfaces
03/23/2010US7685483 Design features for testing integrated circuits
03/23/2010US7685482 Tap sampling at double rate
03/23/2010US7685479 Telecommunications network testing
03/23/2010US7685478 Method of testing memory card operation
03/23/2010US7685327 Identification of multi-device systems
03/23/2010US7685272 Application server external resource monitor
03/23/2010US7684949 Apparatus and method for determining reliability of an integrated circuit
03/23/2010US7684941 Battery management system and driving method thereof
03/23/2010US7684940 Method and system to identify grounding concerns in an electric power system
03/23/2010US7684834 Method of monitoring battery characteristics and radio terminal equipment
03/23/2010US7684611 Photoresist edge bead removal measurement
03/23/2010US7684608 Tape and reel inspection system
03/23/2010US7684446 System and method for multiplexing setpoints
03/23/2010US7684440 Method and apparatus for maximizing peer-to-peer frame sizes within a network supporting a plurality of frame sizes
03/23/2010US7684405 Broadband access method with great capacity and the device and the system thereof
03/23/2010US7684403 EPON bridge apparatus and method for forwarding thereof
03/23/2010US7684348 Method for ensuring service class of packet service and method of rate limitation
03/23/2010US7684346 Communications control for extending the period over which a terminal is able to have an open connection with a host accessible via a packet data network
03/23/2010US7684320 Method for real time network traffic classification
03/23/2010US7684317 Protecting a network from unauthorized access
03/23/2010US7684315 Ordered switchover of cable modems
03/23/2010US7684194 Systems and methods for cooling an electronic device
03/23/2010US7684023 Apparatus and method for generating THz wave by heterodyning optical and electrical waves
03/23/2010US7683652 Low-voltage detection circuit
03/23/2010US7683651 Test structure for electromigration analysis and related method
03/23/2010US7683650 Measurement instrument with synchronized interference signals
03/23/2010US7683649 Testing system contactor
03/23/2010US7683648 Integrated circuit socket and method of use for providing adjustable contact pitch
03/23/2010US7683647 Instrument per pin test head
03/23/2010US7683646 Probe card and method of producing the same by a fine inkjet process
03/23/2010US7683645 High-frequency probe card and transmission line for high-frequency probe card
03/23/2010US7683630 Self test, monitoring, and diagnostics in grouped circuitry modules
03/23/2010US7683629 Circuit tester device
03/23/2010US7683628 Cable tester
03/23/2010US7683627 Semiconductor device having a function of detection breakages on a periphery thereof
03/23/2010US7683626 Circuit with an arrangement for the detection of an interrupted connecting line
03/23/2010US7683608 Handler comprising an acceleration device for testing electronic components
03/23/2010US7683606 Flexible display testing and inspection
03/23/2010US7683579 Method and apparatus of controlling for charge/discharge power of battery
03/23/2010US7682847 Method for sorting integrated circuit devices
03/23/2010US7682846 Single and double-gate pseudo-FET devices for semiconductor materials evaluation
03/23/2010US7682845 Methods for calibrating a process for growing an epitaxial silicon film and methods for growing an epitaxial silicon film
03/23/2010CA2568147C Device for automatic detection of battery polarity
03/18/2010WO2010030580A1 Testing circuit split between tiers of through silicon stacking chips
03/18/2010WO2010030428A1 Protection for provider backbone bridge traffic engineering
03/18/2010WO2010029942A1 Battery state detection device and battery pack incorporating same, and battery state detection method
03/18/2010WO2010029863A1 Battery state detection device and battery pack containing the same
03/18/2010WO2010029772A1 Test device and test method
03/18/2010WO2010029746A1 Test module and test method
03/18/2010WO2010029709A1 Testing device, testing method, circuit system, power supply device, power supply evaluation device, and method for emulating power supply environment
03/18/2010WO2010029637A1 Probe pin contact checking apparatus and liquid crystal substrate inspection apparatus
03/18/2010WO2010029597A1 Tester and circuit system
03/18/2010WO2010029355A2 State of charge estimation
03/18/2010WO2010029353A1 Isolation detection
03/18/2010WO2010028914A1 Method for verifying a test substrate in a prober under defined thermal conditions
03/18/2010WO2010004166A3 Method and device for detecting defects of an electronic assembly
03/18/2010WO2009148989A4 Verifying speaker operation during alarm generation
03/18/2010WO2009132403A4 Automated method for controlling and testing products
03/18/2010WO2009011696A8 A device and method for reparing a microelectromechanical system
03/18/2010US20100070810 Adapting scan architectures for low power operation