Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
01/2010
01/27/2010CN101634678A Functional test platform of converter of auxiliary power supply of internal-combustion engine locomotive
01/27/2010CN101634677A Digital instrument based on UVC transmission protocol and use method thereof
01/27/2010CN100586262C Ic socket
01/27/2010CN100586016C Method and apparatus for overcoming negative bias temperature instability effect in life span
01/27/2010CN100585981C Terminal row capable of remote controlling and measuring
01/27/2010CN100585979C Process and apparatus for modulating terminal voltage of battery
01/27/2010CN100585941C Battery management system and drive method
01/27/2010CN100585934C Detection, mark-wrapping, measurement automatic production line and process flow of mobile phone cell
01/27/2010CN100585928C Fuel cell state monitor apparatus and method
01/27/2010CN100585852C Semiconductor device tested using minimum pins and methods of testing the same
01/27/2010CN100585827C Testing circuit and testing method for semiconductor device and semiconductor chip
01/27/2010CN100585826C Method for manufacturing semiconductor IC device
01/27/2010CN100585764C Method and apparatus for testing electronic elements
01/27/2010CN100585472C LCD device
01/27/2010CN100585426C Method for calibrating closed hull precision of synthetic parametric tester for relay
01/27/2010CN100585424C Method of displaying remaining battery power, and electronic apparatus
01/27/2010CN100585423C Battery fuel gauge circuit
01/27/2010CN100585422C Method and system for simulating a modular test system
01/27/2010CN100585421C System and method for customized burn-in of cores on a multicore integrated circuit chip
01/27/2010CN100585420C Dual in-line package type double-contact test fixture of double sides straight packaging shape
01/27/2010CN100585419C TCP Handling device
01/27/2010CN100585418C Tester used for testing operating reliability of oxygen distribution loop of capsule cabin
01/27/2010CN100585417C Isolation buffers with controlled equal time delays
01/27/2010CN100585416C Electronic device and method for realizing dynamic environmental stress screening
01/27/2010CN100585415C Device and method for electrically inspecting printed circuit board
01/27/2010CN100585414C Apparatus for testing USB memory and method thereof
01/27/2010CN100585411C Method of making microelectronic spring contact array
01/26/2010US7653855 Random number test circuit, random number generation circuit, semiconductor integrated circuit, IC card and information terminal device
01/26/2010US7653854 Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memory
01/26/2010US7653853 Integrated circuit internal test circuit and method of testing by using test pattern and signature generations therewith
01/26/2010US7653852 Semiconductor device and method of adding tester circuit for the same
01/26/2010US7653851 Phase shifter with reduced linear dependency
01/26/2010US7653850 Delay fault detection using latch with error sampling
01/26/2010US7653849 Input-output device testing including embedded tests
01/26/2010US7653848 Selectively engaging optional data reduction mechanisms for capturing trace data
01/26/2010US7653844 Communication apparatus and communication system
01/26/2010US7653843 Method and arrangement to estimate transmission channel characteristics
01/26/2010US7653462 Control unit for vehicle and total control system therefor
01/26/2010US7652997 Data communication system, data communication apparatus and data communication method, connection establishment method and apparatus, connection establishment system, and computer program thereof
01/26/2010US7652996 Method for adjusting transmission rate of MPEG-2 data and apparatus therefor
01/26/2010US7652993 Multi-stream pro-active rate adaptation for robust video transmission
01/26/2010US7652992 Two tier traffic shaper approach for resilient packet ring stations
01/26/2010US7652986 Route determination with differential delay compensation for virtually-concatenated data traffic
01/26/2010US7652985 System and method of data transmission and method of selecting communication path for dual-controller system
01/26/2010US7652982 Providing high availability network services
01/26/2010US7652566 Arc wave generator for testing an arc-fault circuit interrupter
01/26/2010US7652497 Sequential semiconductor device tester
01/26/2010US7652496 Commutation failure detection circuit for back-to-back SCR circuit and controlling method thereof having relatively better efficiency
01/26/2010US7652495 Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies
01/26/2010US7652494 Operating an integrated circuit at a minimum supply voltage
01/26/2010US7652493 Test arrangement having chips of a first substrate on a second substrate and chips of the second substrate on a third substrate
01/26/2010US7652492 Integrated compound nano probe card
01/26/2010US7652485 Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor
01/26/2010US7652483 Network device, network connection detector and detection method thereof
01/26/2010US7652482 Network analyzer, network analyzing method, automatic corrector, correcting method, program, and recording medium
01/26/2010US7652481 Method and apparatus to detect and locate roof leaks
01/26/2010US7652480 Methods and systems for testing a functional status of a light unit
01/26/2010US7652467 Carrier tray for use with prober
01/26/2010US7652449 Battery management system and driving method thereof
01/26/2010US7651873 Method relating to the accurate positioning of a semiconductor wafer
01/26/2010US7650762 Cooling air flow control valve for burn-in system
01/26/2010CA2662034A1 Permanent magnet rotor crack detection
01/26/2010CA2490498C Attachment means for cards and components
01/26/2010CA2381364C Fault location device and method
01/24/2010CA2663971A1 Asynchronous communication using standard boundary architecture cells
01/24/2010CA2663966A1 Asynchronous communication apparatus using jtag test data registers
01/21/2010WO2010009013A2 Test head docking system and method
01/21/2010WO2010008959A2 Dc test resource sharing for electronic device testing
01/21/2010WO2010008759A2 Apparatus, method and computer-readable medium for testing a panel of interferometric modulators
01/21/2010WO2010008257A2 A spring assembly and a test socket using the same
01/21/2010WO2010008168A2 Apparatus for removing the partial discharge noise of an electrical power facility and apparatus for detecting a partial discharge generated section
01/21/2010WO2010008030A1 Substrate-inspecting device having cleaning mechanism for tips of pins
01/21/2010WO2010008029A1 Fiber optic current sensor, current-measuring method and fault section-detection device
01/21/2010WO2010007927A1 Solar simulator and method of measuring multijunction solar cell
01/21/2010WO2010007846A1 Portable device, display method, and display program
01/21/2010WO2010007770A1 Testing device
01/21/2010WO2010007654A1 Signal output circuit, timing generation circuit, testing device, and receiving circuit
01/21/2010WO2010007653A1 Socket guide, socket, pusher and electronic part testing device
01/21/2010WO2010007652A1 Test head moving device and electronic part testing device
01/21/2010WO2010007473A1 Integrated testing circuitry for high-frequency receiver integrated circuits
01/21/2010WO2010007472A1 An integrated circuit die, an integrated circuit package and a method for connecting an integrated circuit die to an external device
01/21/2010WO2010007203A1 Method and apparatus for measuring bearing currents in an electrical machine
01/21/2010WO2010007102A1 Method for increasing the esd pulse stability of an electrical component
01/21/2010WO2010006879A1 Integrated circuit, method and electronic apparatus
01/21/2010WO2010006652A1 Method and device for fault location of series-compensated transmission line
01/21/2010WO2009144420A3 Burn-in sensor for implantation onto a microelectronic integrated circuit and integrated circuit thus obtained
01/21/2010WO2009143544A3 Vlf test generator
01/21/2010WO2009143543A3 Vlf test generator
01/21/2010WO2009127422A3 Method and device for checking the electrical insulation as well as a method and system for producing photovoltaic modules
01/21/2010WO2008134222A3 A system for and method of integrating test structures into an integrated circuit
01/21/2010US20100017667 Method and Device to Detect Failure of Static Pervasive Control Signals
01/21/2010US20100017666 Faulty site identification apparatus, faulty site identification method, and integrated circuit
01/21/2010US20100017155 Battery management system
01/21/2010US20100017154 Battery Monitoring and Protecting Device
01/21/2010US20100015014 Mixed Ionic and Electronic Conducting Membrane
01/21/2010US20100014427 Arbitration scheme for an optical bus
01/21/2010US20100013515 Electrostatic discharge protection device, method of manufacturing the same, method of testing the same
01/21/2010US20100013514 Test device and semiconductor integrated circuit device
01/21/2010US20100013513 Test device and semiconductor integrated circuit device
01/21/2010US20100013512 Apparatus and methods for through substrate via test