| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/13/2010 | US7695988 Quantum dot conjugates in a sub-micrometer fluidic channel |
| 04/13/2010 | US7695766 Test equipment for circuit boards; a plate with simple, color coding, features so that a technician may readily visually identify which holes are to accept probes; dual-stage translation to bring a unit into physical and electric contact with a tall probes, then with short probes |
| 04/13/2010 | US7695652 Optical waveguide and method for manufacturing the same |
| 04/13/2010 | CA2537526C System and method for monitoring battery state |
| 04/08/2010 | WO2010039684A2 Apparatus and method for monitoring and evaluating greensand molds |
| 04/08/2010 | WO2010039634A1 Controlled alignment in polymeric solar cells |
| 04/08/2010 | WO2010039500A2 Light soaking system and test method for solar cells |
| 04/08/2010 | WO2010039153A1 Portable system for immotive multiphasic motive force electrical machine testing |
| 04/08/2010 | WO2010038556A1 Ic socket |
| 04/08/2010 | WO2010038330A1 Semiconductor integrated circuit and electronic device |
| 04/08/2010 | WO2010038136A1 Battery cell and monitoring device for assembled battery |
| 04/08/2010 | WO2010037537A1 Wind energy plant testing device |
| 04/08/2010 | WO2010004167A3 Method and machine for multidimensional testing of an electronic device on the basis of a monodirectional probe |
| 04/08/2010 | US20100088564 Semiconductor ic incorporating a co-debugging function and test system |
| 04/08/2010 | US20100088563 Saving debugging contexts with periodic built-in self-test execution |
| 04/08/2010 | US20100088562 Functional frequency testing of integrated circuits |
| 04/08/2010 | US20100088561 Functional frequency testing of integrated circuits |
| 04/08/2010 | US20100088560 Method and system for selecting test vectors in statistical volume diagnosis using failed test data |
| 04/08/2010 | US20100088054 Methods and apparatus for data analysis |
| 04/08/2010 | US20100088051 Electronic device, battery, and battery remaining capacity display method |
| 04/08/2010 | US20100088050 Portable heavy load battery testing system and method |
| 04/08/2010 | US20100088048 Method And Device To Predict A State Of A Power System In The Time Domain |
| 04/08/2010 | US20100088042 Apparatus And Method For Testing Defects |
| 04/08/2010 | US20100086019 High-Speed Decoder for a Multi-Pair Gigabit Transceiver |
| 04/08/2010 | US20100085669 Arc fault detection using fuzzy logic |
| 04/08/2010 | US20100085074 Power converter, short detection circuit thereof, and method for detecting short |
| 04/08/2010 | US20100085073 Accurate measuring of long steady state minority carrier diffusion lengths |
| 04/08/2010 | US20100085072 Detection control circuit for anti-leakage |
| 04/08/2010 | US20100085071 Thermoelectric device and method |
| 04/08/2010 | US20100085070 Carrier tray for use with prober |
| 04/08/2010 | US20100085069 Impedance optimized interface for membrane probe application |
| 04/08/2010 | US20100085064 Universal power and testing platform |
| 04/08/2010 | US20100085063 Method of diagnosing defective elements in a standalone system, powered by an intermittent power source |
| 04/08/2010 | US20100085062 Network Device, Network Connection Detector and Detection Method Thereof |
| 04/08/2010 | US20100085061 Calibrated two port passive intermodulation (pim) distance to fault analyzer |
| 04/08/2010 | US20100085060 Electric power source circuit and abnormality diagnosis system |
| 04/08/2010 | US20100085059 Differential power detection |
| 04/08/2010 | US20100085058 Trainline integrity locomotive test device |
| 04/08/2010 | US20100085009 Cell balancing apparatus and method |
| 04/08/2010 | US20100085002 Electrical machine and an electrical drive with such an electrical machine |
| 04/08/2010 | US20100083489 Carbon nanotube columns and methods of making and using carbon nanotube columns as probes |
| 04/08/2010 | DE19943388B4 Vorrichtung zum Prüfen von Leiterplatten An apparatus for testing printed circuit boards |
| 04/08/2010 | DE112007003452T5 Verfahren und Gerät zum Abbilden eines sich bewegenden Objekts A method and device for imaging a moving object |
| 04/08/2010 | DE10354939B4 Verfahren zur Zuverlässigkeitsprüfung eines Bauelements einer Schaltung A method for reliability testing of a component of a circuit |
| 04/08/2010 | DE10297010B4 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
| 04/08/2010 | DE102008050753A1 Verfahren zum Erfassen einer physikalischen Größe durch einen Leistungsschalter A method for detecting a physical quantity by a circuit breaker |
| 04/08/2010 | DE102008050398A1 Verfahren zum Betrieb eines Flurföderzeugs mit einer Batterieeinheit Method for operating a battery pack having a Flurföderzeugs |
| 04/08/2010 | DE102008049629A1 Windenergieanlagenprüfeinrichtung Windenergieanlagenprüfeinrichtung |
| 04/08/2010 | DE102008049468A1 Verfahren zum Erkennen einer Beschädigung eines Bauteiles A method for detecting a damage of a component |
| 04/08/2010 | DE102008048930A1 Prüfung der Meldelinien einer Gefahrenmeldeanlage Examination of reporting lines of a security system |
| 04/08/2010 | DE102008048879A1 Method for applying high voltage to semiconductor component arranged on semiconductor wafer, involves producing high voltage at position spatially adjacent to semiconductor component, from supplied low voltage |
| 04/08/2010 | DE102008048834A1 Vorrichtung zum Prüfen von Solarzellen A device for testing solar cells |
| 04/08/2010 | DE102008048830A1 Schaltungsanordnung mit Schmelzsicherung und Verfahren zum Ermitteln eines Zustands einer Schmelzsicherung Circuit arrangement with fuse and method for determining a state of a fuse |
| 04/08/2010 | DE102008042652A1 Elektrowerkzeug und Verfahren zum Betreiben eines Elektrowerkzeugs Power tool and method for operating a power tool, |
| 04/08/2010 | DE102006040630B4 Elektrischer Steckverbinder mit Abdeckvorrichtung Electrical connector with capping |
| 04/08/2010 | DE10103061B4 Verfahren zur Inspektion der Tiefe einer Öffnung in einer dielektrischen Materialschicht A method for inspection of the depth of an opening in a dielectric material layer |
| 04/08/2010 | CA2739633A1 Secondary market and vending system for devices |
| 04/08/2010 | CA2738411A1 Wind energy plant testing device |
| 04/07/2010 | EP2172968A1 Testing apparatus |
| 04/07/2010 | EP2171848A1 Circuit having a local power block for leakage reduction |
| 04/07/2010 | EP2171490A2 Method for synchronizing a plurality of measuring channel assemblies and/or measuring devices, and appropriate measuring device |
| 04/07/2010 | EP2171489A2 Semi-adaptive voltage scaling for low-energy digital vlsi-design |
| 04/07/2010 | EP2171488A1 Method for locating a ground fault according to the distance protection principle and electric distance protection device |
| 04/07/2010 | EP2171482A1 Mobile high-voltage test set with housing |
| 04/07/2010 | EP2047287B1 Method and pulse-width-modulated current control circuit for driving inductive loads in motor vehicles |
| 04/07/2010 | CN201436761U UPS with automatic cell detection function |
| 04/07/2010 | CN201436756U Motor protector having function of high accuracy ammeter |
| 04/07/2010 | CN201436591U A voltage current monitoring system applied to power ageing test |
| 04/07/2010 | CN201436590U Vehicle generator dynamic salt mist controllable water tank |
| 04/07/2010 | CN201436589U Test probe |
| 04/07/2010 | CN1793999B 半导体集成电路 The semiconductor integrated circuit |
| 04/07/2010 | CN101692583A Battery management system for pure electric bus |
| 04/07/2010 | CN101692449A Method for parallel measurement of hot carrier injection effect |
| 04/07/2010 | CN101692430A Method for detecting random defects of silicon gate of CMOS process |
| 04/07/2010 | CN101692120A Measuring device and measuring method for measuring maximum available energy of series storage battery pack |
| 04/07/2010 | CN101692119A Method for measuring internal resistance of storage battery based on differential equation |
| 04/07/2010 | CN101692118A Testing device and testing method of linear motor |
| 04/07/2010 | CN101692117A Low power consumption excitation generating system |
| 04/07/2010 | CN101692116A Visual monitoring of low-frequency oscillation of critical circuits |
| 04/07/2010 | CN101692115A Polarity tester for current transformer at transformer neutral point |
| 04/07/2010 | CN101692114A Disconnection monitoring and alarm system for high voltage cable grounding system |
| 04/07/2010 | CN101692113A Method for diagnosing fault of power transformer on the basis of interval mathematical theory |
| 04/07/2010 | CN101692112A High-power electric energy quality signal generator for testing 400Hz electric equipment |
| 04/07/2010 | CN101692110A Method for determining combined insulation thermal resistance of cable and method for calculating current-carrying capacity of cable |
| 04/07/2010 | CN101692105A Device for real-time detecting product of production line of remote control |
| 04/07/2010 | CN101692103A Testing method of parameters and characteristics of lightning strike of electric transmission line |
| 04/07/2010 | CN101691140A Pico-satellite solar cell simulator and simulation method |
| 04/07/2010 | CN101285875B Detection circuit and alternating-current /direct current coupling configuration checking method |
| 04/07/2010 | CN101252198B Proton exchanging film fuel battery test platform |
| 04/07/2010 | CN101116003B Secondary cell charge/discharge electricity amount, polarization voltage and SOC estimation method and device |
| 04/07/2010 | CN101071156B Multi-connecting board bad-product detecting device and method |
| 04/07/2010 | CN101022216B Small earthing current electric network single phase fault wire selecting method and apparatus |
| 04/06/2010 | US7694246 Test method for yielding a known good die |
| 04/06/2010 | US7694203 On-chip samplers for asynchronously triggered events |
| 04/06/2010 | US7694202 Providing memory test patterns for DLL calibration |
| 04/06/2010 | US7694201 Semiconductor testing device having test result sending back to generate second data |
| 04/06/2010 | US7694200 Integrated circuit having built-in self-test features |
| 04/06/2010 | US7694199 Three boundary scan cell switches controlling input to output buffer |
| 04/06/2010 | US7694198 Self-repairing of microprocessor array structures |
| 04/06/2010 | US7694197 Integrated circuit comprising a test mode secured by detection of the state of a control signal |