Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
03/2010
03/31/2010CN101688898A State of charge determination
03/31/2010CN101688897A System and method to determine electric motor efficiency nonintrusively
03/31/2010CN101688896A Testable integrated circuit and test method
03/31/2010CN101688895A Opener and buffer table for test handler
03/31/2010CN101688894A photodiode self-test
03/31/2010CN101688893A Test equipment for automated quality control of thin film solar modules
03/31/2010CN101688892A Method and device to predict a state of a power system in the time domain
03/31/2010CN101688891A Electronic apparatus testing device and electronic apparatus testing method
03/31/2010CN101688888A increased reliability in the processing of digital signals
03/31/2010CN101687465A Vehicle power supply device and method for estimating charge state of accumulator in on-vehicle power supply device
03/31/2010CN101686600A Flexible printing wiring board, method for manufacturing the same, and flexible printing wiring board for hard disc device
03/31/2010CN101686035A Multiphase motor driving device
03/31/2010CN101685655A Optical disc drive and optical storage medium
03/31/2010CN101685648A Optical driver and optical storage medium
03/31/2010CN101685644A Optical disc drive and optical storage medium
03/31/2010CN101685641A Optical disc drive and optical storage medium
03/31/2010CN101685591A Detection device and method for automatically detecting picture format supported by display device
03/31/2010CN101685571A Restorable linear heat detector of normally open type rate-of-rise and fixed temperature switches connected in series
03/31/2010CN101685570A Restorable linear heat detector of normally open type rate-of-rise and fixed temperature switches connected in parallel
03/31/2010CN101685415A Test device and test method
03/31/2010CN101685208A Mounting state inspection method for electronic component, mounting state inspection device for electronic component, and manufacturing method of electronic device
03/31/2010CN101685207A Measuring method and device
03/31/2010CN101685144A Mine lamp service life monitoring device and implement method
03/31/2010CN101685143A Auxiliary examination jig
03/31/2010CN101685142A System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material
03/31/2010CN101685141A Method and system for determining a state of charge of a battery based on a transient response
03/31/2010CN101685140A Accumulator routing inspection circuit
03/31/2010CN101685139A Simulation test system of large directly driven permanent magnet wind generating set
03/31/2010CN101685138A Method for testing electrical property of AC generating set
03/31/2010CN101685137A Method and device for monitoring a switching procedure and relay component group
03/31/2010CN101685136A Mueller christian [de]
03/31/2010CN101685135A Test device and test method for testing circuit board
03/31/2010CN101685134A Mainboard detection alarm circuit
03/31/2010CN101685133A Integrated circuit component test equipment and test method thereof
03/31/2010CN101685132A Probe apparatus
03/31/2010CN101685131A Method for positioning local discharge of gas-insulator switchgear
03/31/2010CN101685130A Directional detection of a ground fault
03/31/2010CN101685129A Artificial climate room for detecting and testing UHV transmission line
03/31/2010CN101685128A High tension line open circuit positioning device
03/31/2010CN101685127A Method and apparatus for testing an electro-optical device under a high/low working temperature condition
03/31/2010CN101685126A Method and apparatus for testing an electro-optical device under a special high/low temperature condition
03/31/2010CN101685125A Method of testing isolation between wire cables by adopting harmonic waves
03/31/2010CN101685124A Electromagnetic compatibility quick detecting platform for wire cable layout of helicopter
03/31/2010CN101685123A Computing method of broadband interference influence of non-linearity of power amplifier on communication system
03/31/2010CN101685122A Potentiometer abrasion auxiliary testing device and testing method
03/31/2010CN101685121A Dynamic process online monitoring device for electric power system and method thereof
03/31/2010CN101685120A Method and circuit for detecting three-phase three-wire input default phase or imbalance
03/31/2010CN101685117A Internal resistance measuring method for storage battery
03/31/2010CN101685114A Measurement method of GIS fully enclosed 126KV combined circuit breaker contact persistence
03/31/2010CN101685108A Interval overvoltage online monitoring device for electric power system and method thereof
03/31/2010CN100596331C High pressure measurement device and antitheft electric method for high-low pressure electric quantity measurement contrast
03/30/2010USRE41187 Variable clocked scan test circuitry and method
03/30/2010US7689948 System and method for model-based scoring and yield prediction
03/30/2010US7689887 Automatic shutdown or throttling of a BIST state machine using thermal feedback
03/30/2010US7689885 Integrated circuit and method for identifying propagation time errors in integrated circuits
03/30/2010US7689884 Multicore chip test
03/30/2010US7689882 Fault diagnosis in relaying data among a plurality of networks
03/30/2010US7689876 Real-time optimized testing of semiconductor device
03/30/2010US7689377 Technique for aging induced performance drift compensation in an integrated circuit
03/30/2010US7689240 Transmit-power control for wireless mobile services
03/30/2010US7688751 Server apparatus
03/30/2010US7688746 Method and system for dynamic resource allocation
03/30/2010US7688744 Broadband test line access circuit, broadband test-line access board and broadband test device
03/30/2010US7688742 System and method for monitoring end nodes using ethernet connectivity fault management (CFM) in an access network
03/30/2010US7688736 Network switch with quality of service flow control
03/30/2010US7688734 Scheduling incoming packet traffic on an output link of a network device associated with a data network
03/30/2010US7688731 Traffic congestion
03/30/2010US7688726 Broadcast reception apparatus, TS packet reproduction apparatus, broadcast reception method and program
03/30/2010US7688725 Content-aware congestion control system
03/30/2010US7688720 Method for selecting a restoration path in a mesh network
03/30/2010US7688719 Virtualization and high availability of network connections
03/30/2010US7688714 Network routing apparatus that performs soft graceful restart
03/30/2010US7688712 Selecting one of multiple redundant network access points on a node within an industrial process control network
03/30/2010US7688316 Adaptive method for acquiring color measurements
03/30/2010US7688103 Cell with fixed output voltage for integrated circuit
03/30/2010US7688101 Semiconductor chip test apparatus and testing method
03/30/2010US7688100 Integrated circuit and a method for measuring a quiescent current of a module
03/30/2010US7688099 Sequential semiconductor device tester
03/30/2010US7688098 Power supply noise measuring circuit and power supply noise measuring method
03/30/2010US7688097 Wafer probe
03/30/2010US7688096 Contact load measuring apparatus and inspecting apparatus
03/30/2010US7688095 Interposer structures and methods of manufacturing the same
03/30/2010US7688094 Electrical connecting apparatus
03/30/2010US7688093 Sharing conversion board for testing chips
03/30/2010US7688092 Measuring board for electronic device test apparatus
03/30/2010US7688091 Chuck with integrated wafer support
03/30/2010US7688090 Wafer-level burn-in and test
03/30/2010US7688089 Compliant membrane thin film interposer probe for intergrated circuit device testing
03/30/2010US7688088 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
03/30/2010US7688087 Test apparatus
03/30/2010US7688086 Fabrication method of semiconductor integrated circuit device and probe card
03/30/2010US7688085 Contactor having a global spring structure and methods of making and using the contactor
03/30/2010US7688084 Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection
03/30/2010US7688083 Analogue measurement of alignment between layers of a semiconductor device
03/30/2010US7688077 Test system and daughter unit
03/30/2010US7688076 Insulation inspection apparatus
03/30/2010US7688063 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies
03/30/2010US7688062 Probe station
03/30/2010US7687174 Optical fuel cell stack cell voltage monitor
03/30/2010US7685705 Method of fabricating a probe card
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