Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
02/2010
02/03/2010CN201397380Y 电池测试电路 Battery test circuit
02/03/2010CN201397379Y Modularized fuel cell performance verifying and testing set
02/03/2010CN201397378Y Power system stabilizer test waveform recorder for detecting uncompensated property of excitation system of generator
02/03/2010CN201397377Y Silicon rectifying generator and regulator detecting device for automobile
02/03/2010CN201397376Y Switch contact fusion welding and electric service life test control device
02/03/2010CN201397375Y Pressure detection device for pressure relay
02/03/2010CN201397374Y Simulative lightning impulse machine
02/03/2010CN201397373Y Ultrasonic plane array sensor for partial discharge detection of transformer
02/03/2010CN201397372Y Single-phase earthing fault locating device for electric distribution network
02/03/2010CN201397371Y Device for detecting the sliding contact state of current collector
02/03/2010CN201397370Y A/V detecting wire
02/03/2010CN201397369Y Development test circuit device
02/03/2010CN201397368Y Testing equipment for control unit of auxiliary inverter
02/03/2010CN201397367Y Conducted electromagnetic interference noise analyzer of electronic device
02/03/2010CN201397348Y High-voltage test power supply in serial and parallel structure
02/03/2010CN201397347Y Resistor testing needle
02/03/2010CN201397129Y Distance measuring and detection device for brake lamp switch
02/03/2010CN101641607A State estimating device for secondary battery
02/03/2010CN101641606A State estimating device of secondary battery
02/03/2010CN101641605A Data receiving circuit, tester using same, and timing adjusting circuit for strobe signal and method
02/03/2010CN101641604A Arc recovery without over-voltage plasma chamber power supplies using a shunt switch
02/03/2010CN101639523A Method and device for measuring internal impedance of secondary battery, method and device for determining deterioration, and power supply system
02/03/2010CN101639522A Equipment for diagnosing degradable state of secondary battery
02/03/2010CN101639521A Method and system for testing charging performance of battery
02/03/2010CN101639520A Detecting method of alternating current traction motor stator connection line
02/03/2010CN101639519A Detection circuit
02/03/2010CN101639518A Power transformer load tap changer switching contact burning fault diagnosis method and device
02/03/2010CN101639517A Power transformer load tap changer switching contact slap fault diagnosis method and device
02/03/2010CN101639516A Data processing method, controller and system
02/03/2010CN101639515A Testing device
02/03/2010CN101639514A Detecting device for detecting IGBT
02/03/2010CN101639513A Method for improving accuracy of cable fault location
02/03/2010CN101639512A Detecting and feeding mechanism of belt electronic components
02/03/2010CN101639511A Device for detecting cable for elevator encoder
02/03/2010CN101639510A Hardware quadrangular test method and system
02/03/2010CN101639509A Inspecting method and program for object to be inspected
02/03/2010CN101639508A Detection circuit and display
02/03/2010CN101639507A Controllable metal oxide arrester action characteristic testing device and method therefor
02/03/2010CN101639506A Test method of electronic device
02/03/2010CN101639505A Test method of magnetically controlled reactor
02/03/2010CN101639504A Live testing system for electrical equipment
02/03/2010CN100587509C Efficient switching architecture with reduced stub lengths
02/03/2010CN100587508C Scan chain and method for realizing high speed testing circuitry
02/03/2010CN100587507C Method and system for measuring manufactured integrate circuit component
02/03/2010CN100587506C Analysis method for electrical characteristic of parallel connection and parallel-serial connected piezoelectric voltage transformer
02/02/2010US7657874 Pattern types as constraints on generic type parameters
02/02/2010US7657813 Method and apparatus for generating expect data from a captured bit pattern, and memory device using same
02/02/2010US7657811 Low power testing of very large circuits
02/02/2010US7657810 Scan testing using scan frames with embedded commands
02/02/2010US7657809 Dual scan chain design method and apparatus
02/02/2010US7657808 Propagation test strobe circuitry with boundary scan circuitry
02/02/2010US7657807 Integrated circuit with embedded test functionality
02/02/2010US7657806 Position independent testing of circuits
02/02/2010US7657805 Integrated circuit with blocking pin to coordinate entry into test mode
02/02/2010US7657804 Plesiochronous transmit pin with synchronous mode for testing on ATE
02/02/2010US7657803 Memory controller with a self-test function, and method of testing a memory controller
02/02/2010US7657801 Test apparatus, program, and test method
02/02/2010US7657799 Method and apparatus for testing a dual mode interface
02/02/2010US7657386 Integrated battery service system
02/02/2010US7656948 Transcoding system and method for maintaining timing parameters before and after performing transcoding process
02/02/2010US7656938 Demodulator for a multi-pair gigabit transceiver
02/02/2010US7656807 Telecommunications transmissions test set
02/02/2010US7656806 Storage system, path management method and path management device
02/02/2010US7656805 Optimal communication path routing in a system employing interconnected integrated circuit technology
02/02/2010US7656795 Preventing duplicate sources from clients served by a network address port translator
02/02/2010US7656793 Collision detection in a non-dominant bit radio network communication system
02/02/2010US7656792 Method and apparatus for computing alternate multicast/broadcast paths in a routed network
02/02/2010US7656791 Systems and methods for hitless equipment protection
02/02/2010US7656790 Handling link failures with re-tagging
02/02/2010US7656787 Modular numerical control
02/02/2010US7656183 Method to extract gate to source/drain and overlap capacitances and test key structure therefor
02/02/2010US7656182 Testing method using a scalable parametric measurement macro
02/02/2010US7656181 Apparatus and method for testing circuit characteristics by using eye mask
02/02/2010US7656180 Burn-in board connection device and method
02/02/2010US7656179 Relay connector having a pin block and a floating guide with guide hole
02/02/2010US7656178 Method for calibrating semiconductor device tester
02/02/2010US7656177 Test apparatus
02/02/2010US7656176 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment
02/02/2010US7656175 Inspection unit
02/02/2010US7656174 Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device
02/02/2010US7656172 System for testing semiconductors
02/02/2010US7656171 Method and apparatus for reviewing defects by detecting images having voltage contrast
02/02/2010US7656170 Multiple directional scans of test structures on semiconductor integrated circuits
02/02/2010US7656166 Multilayer wiring board and method for testing the same
02/02/2010US7656162 Electronic battery tester with vehicle type input
02/02/2010US7656152 Pusher for match plate of test handler
02/02/2010US7656151 Printed circuit board with an opening to access components attached to the printed circuit board
02/02/2010US7656150 Test handler and loading method thereof
02/02/2010US7656124 Battery management system and driving method thereof
02/02/2010US7656123 System, method, and article of manufacture for determining an estimated battery state vector
02/02/2010US7656122 Method for calculating power capability of battery packs using advanced cell model predictive techniques
02/02/2010US7655946 IC with comparator receiving expected and mask data from pads
02/02/2010US7655558 Method and system for determining semiconductor characteristics
02/02/2010US7654572 Automotive passenger restraint and protection apparatus
02/02/2010US7654121 Method for selecting QoS Policy
02/02/2010CA2484812C Ground-fault monitor for multiple circuits
02/02/2010CA2325101C Method of calculating surge propagation speed and system for locating fault points by the use thereof
01/2010
01/29/2010CA2669881A1 Port tester with flex bushing, and contact bases
01/29/2010CA2668132A1 Stray flux processing method and system
01/29/2010CA2638379A1 Integrated circuit characterisation system and method