| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/10/2010 | CN100589203C Management of unusable block in non-volatile memory system |
| 02/10/2010 | CN100589082C System for debugging inspecting apparatus |
| 02/10/2010 | CN100588982C On-spot programmable gate array configurable logic block validation method and system |
| 02/10/2010 | CN100588981C On-site programmable gate array duplex selector verification method |
| 02/10/2010 | CN100588980C Multi-field coupling experimental method and device based on analog IC service condition |
| 02/10/2010 | CN100588979C Testing method for integrated circuit high temperature dynamic aging and testing device thereof |
| 02/10/2010 | CN100588978C Method for improving dielectric breakdvwn voltage and reliability of PIP capacitor |
| 02/10/2010 | CN100588977C Method and device for lack of zero detection for three phase circuit |
| 02/10/2010 | CN100588976C Test zone molding type electronic assembly tester |
| 02/10/2010 | CN100588975C Led lamp beam-splitting colour-separating testing method |
| 02/09/2010 | US7661053 Methods and apparatus for patternizing device responses |
| 02/09/2010 | US7661052 Using statistical signatures for testing high-speed circuits |
| 02/09/2010 | US7661051 System to reduce programmable range specifications for a given target accuracy in calibrated electronic circuits |
| 02/09/2010 | US7661050 Method and system for formal verification of partial good self test fencing structures |
| 02/09/2010 | US7661049 Integrated circuit with JTAG port, TAP linking module, and off-chip TAP interface port |
| 02/09/2010 | US7661048 Apparatus and method for embedded boundary scan testing |
| 02/09/2010 | US7661047 Method and dual interlocked storage cell latch for implementing enhanced testability |
| 02/09/2010 | US7661046 Method and dual interlocked storage cell latch for implementing enhanced testability |
| 02/09/2010 | US7661040 Method of testing a sequential access memory plane and a corresponding sequential access memory semiconductor device |
| 02/09/2010 | US7661003 Systems and methods for maintaining performance of an integrated circuit within a working power limit |
| 02/09/2010 | US7660691 Clock circuits and counting values in integrated circuits |
| 02/09/2010 | US7660263 Graphical representations of associations between devices in a wireless communication network indicating available throughput and channel selection |
| 02/09/2010 | US7660259 Methods and systems for hybrid hardware- and software-base media access control (MAC) address learning |
| 02/09/2010 | US7660258 Method for automatically configuring network addresses in mobile multi-hop network |
| 02/09/2010 | US7660256 System and method for monitoring label switched path in network |
| 02/09/2010 | US7660251 Method and apparatus for hierarchial scheduling of virtual paths with underutilized bandwidth |
| 02/09/2010 | US7660246 Method and apparatus for scaling input bandwidth for bandwidth allocation technology |
| 02/09/2010 | US7660240 Method of achieving the network link status penetrate |
| 02/09/2010 | US7660234 Fault-tolerant medium access control (MAC) address assignment in network elements |
| 02/09/2010 | US7660233 Reporting dial-up access problems using a real-time automated system |
| 02/09/2010 | US7659744 Pixel testing circuit and method for liquid crystal display device |
| 02/09/2010 | US7659743 Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer |
| 02/09/2010 | US7659742 Vacuum chamber AC/DC probe |
| 02/09/2010 | US7659741 Parallel scan distributors and collectors and process of testing integrated circuits |
| 02/09/2010 | US7659740 System and method of digitally testing an analog driver circuit |
| 02/09/2010 | US7659739 Knee probe having reduced thickness section for control of scrub motion |
| 02/09/2010 | US7659738 Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same |
| 02/09/2010 | US7659737 Electrical, high temperature test probe with conductive driven guard |
| 02/09/2010 | US7659736 Mechanically reconfigurable vertical tester interface for IC probing |
| 02/09/2010 | US7659735 Probe card capable of multi-probing |
| 02/09/2010 | US7659734 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination |
| 02/09/2010 | US7659733 Electrical open/short contact alignment structure for active region vs. gate region |
| 02/09/2010 | US7659732 Four-wire ohmmeter connector and ohmmeter using same |
| 02/09/2010 | US7659728 Method and apparatus for measuring degradation of insulation of electrical power system devices |
| 02/09/2010 | US7659727 Multilayer wiring board and method for testing the same |
| 02/09/2010 | US7659726 Image forming apparatus with plural AC sources |
| 02/09/2010 | US7659711 Test handler including single-door-type stockers |
| 02/09/2010 | CA2366531C Apparatus and method for electrical measurements on conductors |
| 02/04/2010 | WO2010014337A2 Method and apparatus for telematics-based vehicle no-start prognosis |
| 02/04/2010 | WO2010014302A1 Method and apparatus for fast fault detection |
| 02/04/2010 | WO2010013464A1 Testing device |
| 02/04/2010 | WO2010013212A1 Apparatus and method for analysing the state of maintenance and efficiency op batteries, especially for industrial and/or commercial vehicles |
| 02/04/2010 | WO2010012172A1 Data processing method, controller and system |
| 02/04/2010 | US20100031131 Method for processing noise interference in data accessing device with serial advanced technology attachment interface |
| 02/04/2010 | US20100031105 Random error signal generator |
| 02/04/2010 | US20100031104 Automatic Scan Format Selection Based on Scan Topology Selection |
| 02/04/2010 | US20100031103 Selecting a Scan Topology |
| 02/04/2010 | US20100031102 Ieee 1149.1 and p1500 test interfaces combined circuits and processes |
| 02/04/2010 | US20100031101 Dynamically Reconfigurable Shared Scan-In Test Architecture |
| 02/04/2010 | US20100031100 Series Equivalent Scans Across Multiple Scan Topologies |
| 02/04/2010 | US20100031099 Scan Topology Discovery in Target Systems |
| 02/04/2010 | US20100031098 Method of real time optimizing multimedia packet transmission rate |
| 02/04/2010 | US20100030508 Pin electronics circuit, semiconductor device test equipment and system |
| 02/04/2010 | US20100030499 Status Detector for Power Supply, Power Supply, and Initial Characteristic Extracting Device for Use with Power Supply |
| 02/04/2010 | US20100030498 Secondary battery deterioration judging device and backup power supply |
| 02/04/2010 | US20100027427 Hop cost as secondary metric for equal cost multi-paths |
| 02/04/2010 | US20100027426 Bandwidth and cost management for ad hoc networks |
| 02/04/2010 | US20100027423 Controlling Data Flow Through A Data Communications Link |
| 02/04/2010 | US20100026335 Leak current detection circuit, body bias control circuit, semiconductor device, and semiconductor device testing method |
| 02/04/2010 | US20100026334 Testing Embedded Circuits With The Aid Of Test Islands |
| 02/04/2010 | US20100026333 Test apparatus and probe card |
| 02/04/2010 | US20100026332 Device and method for sensing a position of a probe |
| 02/04/2010 | US20100026331 Construction Structures and Manufacturing Processes for Integrated Circuit Wafer Probe Card Assemblies |
| 02/04/2010 | US20100026330 Testboard with zif connectors, method of assembling, integrated circuit test system and test method introduced by the same |
| 02/04/2010 | US20100026328 Inspecting method and program for object to be inspected |
| 02/04/2010 | US20100026313 Capacitance Structures for Defeating Microchip Tampering |
| 02/04/2010 | US20100026312 System and Method for Power System Component Testing |
| 02/04/2010 | US20100026311 Boosting system failure diagnosis device, boosting circuit controller and vehicle |
| 02/04/2010 | US20100026310 Communication System Fault Location Using Signal Ingress Detection |
| 02/04/2010 | US20100026309 Modular Electrical System and Method for its Operation |
| 02/04/2010 | US20100026306 Method and apparatus for telematics-based vehicle no-start prognosis |
| 02/04/2010 | US20100026188 Automatic lamp detection method and optimal operation for fluorescent lamps |
| 02/04/2010 | US20100025838 Electronic device protected against electro static discharge |
| 02/04/2010 | DE102008040810A1 Elektrisches Bordnetzsystem Electrical electrical system |
| 02/04/2010 | DE102008034918A1 Elektrische Prüfeinrichtung für die Prüfung eines elektrischen Prüflings sowie elektrisches Prüfverfahren Electrical test equipment for testing a device under test electrical and electrical test methods |
| 02/04/2010 | DE102008034109A1 Schaltung zur Nachbildung einer elektrischen Last Circuit for simulating an electrical load |
| 02/04/2010 | DE102008027896A1 Circuit arrangement for testing function of control device for internal combustion engine, has voltage sources arranged between terminals of input of arrangement and terminals of input of arrangement |
| 02/03/2010 | EP2149996A1 Method and device to manufacture a quantifiable phase coherence between two high frequency signals |
| 02/03/2010 | EP2149886A1 Protection of an electronic trigger circuit against fault injections |
| 02/03/2010 | EP2149796A1 Apparatus and method for analysing the state of maintenance and efficiency of batteries, especially for industrial and/or commercial vehicles |
| 02/03/2010 | EP2149794A2 Method for measuring the current strength of an alternating current |
| 02/03/2010 | EP2149054A2 Junction-photovoltage method and apparatus for contactless determination of sheet resistance and leakage current of semiconductor |
| 02/03/2010 | CN201398071Y Low current ground fault automatic isolation device based on line recloser |
| 02/03/2010 | CN201398066Y Current transformer quadric circuit wire sealing device |
| 02/03/2010 | CN201398065Y Central value resistance grounding quick-circuit selecting trip gear in urban distribution network |
| 02/03/2010 | CN201397385Y LED fluorescent tube detector |
| 02/03/2010 | CN201397384Y Resistance detection device for combined cap and annular PTC of lithium battery |
| 02/03/2010 | CN201397383Y Electric automobile lithium ferric phosphate power cell detecting device |
| 02/03/2010 | CN201397382Y Reusable packaging component for testing experimental batteries and super capacitors |
| 02/03/2010 | CN201397381Y Novel voltage internal resistance testing device for lithium ion battery |