Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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08/04/2010 | CN101793935A Non-contact type wire tracing method and device |
08/04/2010 | CN101793934A Universal anti-drawing test equipment and test method thereof |
08/04/2010 | CN101793933A Online measuring system for contact resistors of electric connector |
08/04/2010 | CN101793932A Electrostatic test system, electrostatic test operating system and electrostatic test method |
08/04/2010 | CN101793931A High-pressure transducer testing system |
08/04/2010 | CN101793930A System, device and method for testing power over Ethernet (POE) function |
08/04/2010 | CN101793929A Durability test device for automobile ignition coil |
08/04/2010 | CN101793928A Phase-shifting full-bridge convertor real-time fault diagnosis method and system |
08/04/2010 | CN101793927A Optimization design method of step-stress accelerated degradation test |
08/04/2010 | CN101793926A Aging test bench |
08/04/2010 | CN101793925A Conductive element of aging test bench |
08/04/2010 | CN101793924A Method for analyzing threshold of radiation intermodulation immunity of radio-frequency receiver |
08/04/2010 | CN101793923A Electrostatic discharge test device, system and method |
08/04/2010 | CN101793917A Induction type electric display and short circuit grounding fault comprehensive indicator |
08/04/2010 | CN101793914A Contact type probe using flexible wire |
08/04/2010 | CN101793625A Detection method of automobile air conditioning switch |
08/04/2010 | CN101303380B Method for testing on site high voltage dielectric loss of capacitance type mutual inductor |
08/04/2010 | CN101275994B Method for monitoring probe card state |
08/04/2010 | CN101246200B Analog PCB intelligent test system based on neural network |
08/04/2010 | CN101208586B Method and system for luminance characterization |
08/04/2010 | CN101145354B Optical driver and optical storage medium |
08/04/2010 | CN101140308B Method for detecting false locking of phase-locked loop |
08/04/2010 | CN101114002B Aging and selecting circuit applied to photoelectric collection tube in photoelectric shaft-position encoder |
08/04/2010 | CN101114000B Electrolyze polar plate status intelligent detecting method and system |
08/04/2010 | CN101050577B Detecting mechanism for needle lifting position of electronic jacquard machine |
08/04/2010 | CN101034124B Frequency inverter air conditioner power supply module and testing method of driving module |
08/03/2010 | USRE41466 Fuse saving tester for fused circuit |
08/03/2010 | US7770084 Selectable JTAG or trace access with data store and output |
08/03/2010 | US7770083 DDR register circuitry input to IC test controller circuitry |
08/03/2010 | US7770082 Semiconductor integrated circuit and test method therefor |
08/03/2010 | US7770081 Interface circuit for a single logic input pin of an electronic system |
08/03/2010 | US7770078 Integrated circuit communication self-testing |
08/03/2010 | US7769915 Systems and method of controlling control and/or monitoring devices |
08/03/2010 | US7769497 Method of super super decoupled loadflow computation for electrical power system |
08/03/2010 | US7769101 Multi-pair gigabit ethernet transceiver |
08/03/2010 | US7769044 Voice over internet protocol favoring aggregating technology in a WLAN |
08/03/2010 | US7769025 Load balancing in data networks |
08/03/2010 | US7769022 System and process for QoS-based packet scheduling |
08/03/2010 | US7768935 System and method for providing topology and reliability constrained low cost routing in a network |
08/03/2010 | US7768922 Communication terminal device, method, program, recording medium, and integrated circuit for use in communication network system |
08/03/2010 | US7768918 Method for expanding the service VLAN space of a provider network |
08/03/2010 | US7768914 Switch and a switching method |
08/03/2010 | US7768911 Platform-based method and apparatus for containing worms using multi-timescale heuristics |
08/03/2010 | US7768908 Systems and methods of providing redundant communication to an electronic device |
08/03/2010 | US7768907 System and method for improved Ethernet load balancing |
08/03/2010 | US7768905 Program and method for controlling communication |
08/03/2010 | US7768904 Method and system for fail-safe renaming of logical circuit identifiers for rerouted logical circuits in a data network |
08/03/2010 | US7768777 Electronic package with direct cooling of active electronic components |
08/03/2010 | US7768292 Non-invasive power supply tester |
08/03/2010 | US7768291 Display device |
08/03/2010 | US7768290 Circuit and apparatus for detecting electric current |
08/03/2010 | US7768289 Testing method and testing device for an integrated circuit |
08/03/2010 | US7768288 Detection device |
08/03/2010 | US7768287 Methods and apparatus for managing defective processors through power gating |
08/03/2010 | US7768286 Electronic device testing apparatus and temperature control method in an electronic device testing apparatus |
08/03/2010 | US7768285 Probe card for semiconductor IC test and method of manufacturing the same |
08/03/2010 | US7768284 Test apparatus for testing a semiconductor device, and method for testing the semiconductor device |
08/03/2010 | US7768283 Universal socketless test fixture |
08/03/2010 | US7768282 Apparatus and method for terminating probe apparatus of semiconductor wafer |
08/03/2010 | US7768281 Probe assembly for lapping a bar using a patterned probe |
08/03/2010 | US7768280 Apparatus for a low-cost semiconductor test interface system |
08/03/2010 | US7768279 Control method and control program for prober |
08/03/2010 | US7768278 High impedance, high parallelism, high temperature memory test system architecture |
08/03/2010 | US7768275 Method and apparatus for characterising a three phase transformer using a single phase power supply |
08/03/2010 | US7768274 Voltage tolerance measuring apparatus for motherboard |
08/03/2010 | US7768268 Verification of a ground connection fabrication process for ESD resistors in magnetic heads |
08/03/2010 | US7768255 Interconnection substrate, skew measurement method, and test apparatus |
08/03/2010 | US7768251 Superconducting coil testing |
08/03/2010 | US7768238 System and method for remote monitoring of battery condition |
08/03/2010 | US7767957 Arrangement for monitoring electric devices on stray light arcs |
08/03/2010 | US7767473 Multiple die wafers having increased reliability and methods of increasing reliability in same |
08/03/2010 | US7767471 Auto routing for optimal uniformity control |
08/03/2010 | US7766905 Method and system for continuity testing of medical electrodes |
08/03/2010 | US7765673 Method for improving power distribution current measurement on printed circuit boards |
07/29/2010 | WO2010085687A1 Fault testing for interconnections |
07/29/2010 | WO2010085381A2 Reducing far-end crosstalk in chip-to-chip communication systems and components |
07/29/2010 | WO2010085376A2 Reducing far-end crosstalk in electrical connectors |
07/29/2010 | WO2010084287A2 Method for the preventive detection, and the diagnosis of the origin, of contact faults between an electricity supply line and a conducting member movable along said line |
07/29/2010 | WO2010084253A1 Method and device for the high energy yield charge-test of an equipment |
07/29/2010 | WO2010084073A1 Detecting the voltage in battery cells |
07/29/2010 | WO2010084070A1 Impedance measurement of electrochemical energy stores in vehicles |
07/29/2010 | WO2010083948A1 Method for determining the degradation and/or efficiency of laser modules and laser unit |
07/29/2010 | WO2010044609A3 Circuit for measuring dielectric breakdown |
07/29/2010 | WO2010044571A3 Apparatus and method for testing the insulation property of a cell module assembly, and probe for same |
07/29/2010 | WO2010020385A3 Apparatus and method for monitoring individual photovoltaic modules of a photovoltaic system |
07/29/2010 | WO2009155792A3 Battery polarity detecting system |
07/29/2010 | US20100192135 Method and Structure to Develop a Test Program for Semiconductor Integrated Circuits |
07/29/2010 | US20100192031 Tap time division multiplexing with scan test |
07/29/2010 | US20100192030 Method and apparatus for implementing a hierarchical design-for-test solution |
07/29/2010 | US20100192028 Diagnostics of cable and link performance for a high-speed communication system |
07/29/2010 | US20100191491 System, method, and article of manufacture for determining an estimated battery parameter vector |
07/29/2010 | US20100191490 Method and device for determining the state of charge of a battery |
07/29/2010 | US20100191486 Method and an apparatus for monitoring an activity of partial electrical discharges in an electrical apparatus powered with direct voltage |
07/29/2010 | US20100190448 Compensation circuit and test apparatus |
07/29/2010 | US20100190361 Electrical connecting apparatus |
07/29/2010 | US20100188979 Forwarding packets to a directed acyclic graph destination using link selection based on received link metrics |
07/29/2010 | US20100188114 Circuit for Detecting Tier-to-Tier Couplings in Stacked Integrated Circuit Devices |
07/29/2010 | US20100188113 Cantilever probe and applications of the same |
07/29/2010 | US20100188112 Inspection socket |
07/29/2010 | US20100188099 Apparatus and method for screening electrolytic capacitors |