Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2010
09/15/2010CN101833028A Device convenient for testing output voltage of power supply
09/15/2010CN101521407B Three-segment out-of-step self-adaptive disconnecting method
09/15/2010CN101373196B Method and apparatus for measuring MgO exoelectron emission current
09/15/2010CN101363885B Method for discriminating voltage instability and load angle instability based on thevenin equivalent
09/15/2010CN101344557B Radiation sensitivity test method of protection power amplifier
09/15/2010CN101308819B Manufacturing method of semiconductor integrated circuit device and probe card
09/15/2010CN101261294B Permanent-magnetic electric machine inductance parameter measuring apparatus and method
09/15/2010CN101169471B Secondary cell capacity estimation method
09/15/2010CN101135720B System for detecting battery electric quantity and mobile phone thereof
09/15/2010CN101120260B Pre-burning device
09/14/2010US7797653 Circuit verification apparatus, circuit verification method, and signal distribution method for the same
09/14/2010US7797603 Low power decompression of test cubes
09/14/2010US7797602 Compressor/decompressor circuits coupled with TDO-TMS/TDI die channel circuitry
09/14/2010US7797601 Slack-based transition-fault testing
09/14/2010US7797600 Method and apparatus for testing a ring of non-scan latches with logic built-in self-test
09/14/2010US7797599 Diagnostic information capture from logic devices with built-in self test
09/14/2010US7797598 Dynamic timer for testbench interface synchronization
09/14/2010US7797594 Built-in self-test of 3-dimensional semiconductor memory arrays
09/14/2010US7797592 Automatic communication channel fault mitigation
09/14/2010US7797590 Consensus testing of electronic system
09/14/2010US7797560 System and method for integrated temperature measurement in power over Ethernet applications
09/14/2010US7797117 Method and system for early prediction of performance of HID lamps
09/14/2010US7797061 Redundant fieldbus system
09/14/2010US7796802 System for recording and displaying annotated images of object features
09/14/2010US7796754 Information recording processing apparatus, information reproduction processing apparatus, information recording medium, information recording processing method, information reproduction processing method, and computer program
09/14/2010US7796584 Method for connection between communication networks of different types and gateway apparatus
09/14/2010US7796526 Versatile communication network test apparatus and methods
09/14/2010US7796512 Switching source device, switching destination device, high speed device switching system, and signaling method
09/14/2010US7796508 Method of generically specifying congestion control and avoidance behavior
09/14/2010US7796506 Load balancing network using Ethernet bridges
09/14/2010US7796505 Method for processing traffic data in a wireless communications system
09/14/2010US7796504 Method for establishing an MPLS data network protection pathway
09/14/2010US7796503 Fault tolerant network routing
09/14/2010US7796501 System and methods for redundant switch fabric and switch controller
09/14/2010US7796500 Automated determination of service impacting events in a communications network
09/14/2010US7796164 Signal reading apparatus and test apparatus
09/14/2010US7796156 Organic electroluminescent display panel testing apparatus and method thereof
09/14/2010US7796048 Polyphase source detecting circuit
09/14/2010US7795901 Automatic isolation of a defect in a programmable logic device
09/14/2010US7795898 Fan having function for detecting fault in the fan
09/14/2010US7795897 Test apparatus and driver circuit
09/14/2010US7795896 High-power optical burn-in
09/14/2010US7795895 Loop-back testing method and apparatus for IC
09/14/2010US7795894 Built-in-self-test arrangement for a single multiple-integrated circuit package and methods thereof
09/14/2010US7795893 Test mode enable circuit
09/14/2010US7795892 Probe card
09/14/2010US7795891 Tester with low signal attenuation
09/14/2010US7795890 Reduced ground spring probe array and method for controlling signal spring probe impedance
09/14/2010US7795889 Probe device
09/14/2010US7795888 Contact device to contact an electrical test specimen to be tested and a corresponding contact process
09/14/2010US7795887 Photoconductive based electrical testing of transistor arrays
09/14/2010US7795886 Surface voltmeter
09/14/2010US7795885 Optically isolated current monitoring for ionization systems
09/14/2010US7795880 Detecting apparatus
09/14/2010US7795879 Testing apparatus
09/14/2010US7795877 Power line communication and power distribution parameter measurement system and method
09/14/2010US7795875 Electrostatic discharge event and transient signal detection and measurement device and method
09/14/2010US7795860 Multiple probe acquisition system
09/14/2010US7795593 Surface contamination analyzer for semiconductor wafers
09/14/2010US7795045 Trench depth monitor for semiconductor manufacturing
09/14/2010US7794350 Turning device for heavy object
09/14/2010CA2267005C Test circuit for verifying operation of an arc fault detector
09/10/2010WO2010102264A2 Statistical formal activity analysis with consideration of temporal and spatial correlations
09/10/2010WO2010102228A1 Compression based on deterministic vector clustering of incompatible test cubes
09/10/2010WO2010102200A1 Cell-aware fault model creation and pattern generation
09/10/2010WO2010102019A1 Method and apparatus for system testing using scan chain decomposition
09/10/2010WO2010101995A1 Method and apparatus for system testing using multiple processors
09/10/2010WO2010101984A1 Method and apparatus for system testing using multiple instruction types
09/10/2010WO2010101909A2 Metering system and method of operation
09/10/2010WO2010101830A1 Battery system and method for system state of charge determination
09/10/2010WO2010101629A1 High speed quantum efficiency measurement apparatus utilizing solid state lightsource
09/10/2010WO2010101522A1 Method for detecting errors in an electrical power substation network
09/10/2010WO2010101416A2 Method and apparatus for diagnosing an abnormality of a current-measuring unit of a battery pack
09/10/2010WO2010101100A1 Electronic circuit and testing system
09/10/2010WO2010100998A1 Device for detecting insulation degradation
09/10/2010WO2010100955A1 Method and apparatus for time vernier calibration
09/10/2010WO2010100754A1 Detection system and electric system
09/10/2010WO2010100674A1 Equalizer circuit and testing apparatus using the same
09/10/2010WO2010099990A1 Method and device for determining a characteristic quantity for detecting the onboard supply system stability
09/10/2010WO2010099855A1 Synthesizer having adjustable, stable, and reproducible phase and frequency
09/10/2010WO2010099843A1 Device for a system components of a high-voltage impulse test system
09/10/2010WO2010099842A1 Truncating radio connection
09/10/2010WO2010099836A1 Method and arrangement for determining energy source unit status
09/10/2010WO2010099585A1 Method and device to identify, record and store traveling wave heads, in electric power systems
09/10/2010WO2010089959A9 Method and apparatus for inspecting semiconductor using absorbed current image
09/10/2010WO2009155792A9 Battery polarity detecting system
09/09/2010US20100229061 Cell-Aware Fault Model Creation And Pattern Generation
09/09/2010US20100229060 Compression Based On Deterministic Vector Clustering Of Incompatible Test Cubes
09/09/2010US20100229059 Jtag bus communication method and apparatus
09/09/2010US20100229058 Method and apparatus for system testing using scan chain decomposition
09/09/2010US20100229057 Semiconductor device test circuit, semiconductor device, and its manufacturing method
09/09/2010US20100228515 Multi-frame test signals modulated by digital signal comprising source for testing analog integrated circuits
09/09/2010US20100228507 Trace device and trace method for failure analysis
09/09/2010US20100228416 Hybrid type working machine
09/09/2010US20100226053 Detecting and sensing actuation in a circuit interrupting device
09/09/2010US20100225770 Drive circuit array substrate and production and test methods thereof
09/09/2010US20100225348 Method and apparatus for statistical cmos device characterization
09/09/2010US20100225347 Circuit for Measuring Magnitude of Electrostatic Discharge (ESD) Events for Semiconductor Chip Bonding
09/09/2010US20100225346 Device and method for evaluating electrostatic discharge protection capabilities
09/09/2010US20100225345 Apparatus and method for testing a semiconductor device
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