Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2010
09/01/2010CN101820166A Magnetizing inrush current discrimination method based on equivalent excitation impedance frequency domain character of transformer
09/01/2010CN101820164A Current leakage detection module and current leakage protection circuit breaker with current leakage detection module
09/01/2010CN101820153A System debugging method for DC ice melting device
09/01/2010CN101820139A Transformer substation grounding wire monitoring device and monitoring method thereof
09/01/2010CN101819940A Method and structure for testing wafer
09/01/2010CN101819705A Anti-theft alarm for wireless station
09/01/2010CN101819261A Three-phase source phase failure and power failure detection circuit
09/01/2010CN101819260A Method and system for controlling power supply test and power supply test method
09/01/2010CN101819259A Method for evaluating consistency of battery pack
09/01/2010CN101819258A Solar battery pack wireless monitoring method and system thereof based on internet of things
09/01/2010CN101819257A Generator rotor parameter measuring device
09/01/2010CN101819256A System for testing turn-to-turn short circuit of rotor winding of automobile turbine generator
09/01/2010CN101819255A Nonlinear method for computing effective open and close times of breaker
09/01/2010CN101819254A Error detection in an integrated circuit
09/01/2010CN101819253A Probabilistic neural network-based tolerance-circuit fault diagnosis method
09/01/2010CN101819252A Analog-circuit fault diagnosis method
09/01/2010CN101819251A Device for monitoring state and diagnosing fault of power electronic circuit
09/01/2010CN101819250A Method, system and target device for boundary scan experiment
09/01/2010CN101819249A Method for testing circuit board
09/01/2010CN101819248A Semiconductor device measuring voltage applied to semiconductor switch element
09/01/2010CN101819247A Device for automatically detecting high pressure resistance and electric function of electronic component product
09/01/2010CN101819246A Discharge capacity monitoring and collecting method, device and system for ultrahigh frequency local discharge
09/01/2010CN101819245A Monitoring method and system of transmission line
09/01/2010CN101819244A On-line early warning method of failure of cross-linked polyethylene power cable
09/01/2010CN101819243A Area information based quiescent voltage unstability prediction method
09/01/2010CN101819242A Improved detecting device for turn-to-turn short circuit of transformer by using voltage differential
09/01/2010CN101819241A Electrical identifying device for multi-branch cable in low-voltage distribution network
09/01/2010CN101819240A Special measuring and monitoring indicator for clean surgery room
09/01/2010CN101819239A Rapidly constructed transformer fault diagnosis system based on three-dimensional temperature field
09/01/2010CN101819238A Electronic device test apparatus
09/01/2010CN101819235A Short-wave radio set electromagnetic pulse test circuit based on finite-difference time-domain analytical method
09/01/2010CN101819232A Liquid water sensor signal conditioning circuit for use in PEM fuel cells
09/01/2010CN101819224A Lightning current measuring transducer based on differential ring
09/01/2010CN101819220A Suction nozzle structure with light source
09/01/2010CN101819099A Push rod of key testing machine
09/01/2010CN101819049A Sensor apparatus
09/01/2010CN101819047A Device and method for evaluating power supply sensitivity of fiber gyro
09/01/2010CN101266262B High speed test card
09/01/2010CN101176006B TFT substrate inspecting apparatus
09/01/2010CN101169463B Insulated test device for cable connector base
09/01/2010CN101153892B Verification method for field programmable gate array input/output module
09/01/2010CN101140313B Methods and apparatus for inline measurement of switching delay history effects in pd-soi technology
09/01/2010CN101118271B Contact type probe used a ball
09/01/2010CN101078666B Reflective type display apparatus detection device and method
09/01/2010CN101073016B Method and system for performing installation and configuration management of tester instrument modules
09/01/2010CN101065679B Integrated circuit and a method for testing a multi-tap integrated circuit
09/01/2010CN101059605B Apparatus and method of testing display panel
09/01/2010CN101051068B Group distributing system and its method capable of wire group positioning
09/01/2010CN101013677B Semiconductor wafer testing apparatus and method of testing semiconductor wafer
09/01/2010CN101009414B Novel current leakage protection jack
08/2010
08/31/2010US7788573 Fault detection method, test circuit and semiconductor device
08/31/2010US7788565 Semiconductor integrated circuit
08/31/2010US7788563 Generation of test sequences during memory built-in self testing of multiple memories
08/31/2010US7788562 Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data
08/31/2010US7788561 Diagnosing mixed scan chain and system logic defects
08/31/2010US7788560 Interleaver with linear feedback shift register
08/31/2010US7788559 Test access mechanisms, associated controllers and a selector
08/31/2010US7788558 Semiconductor integrated circuit and control method thereof
08/31/2010US7788557 Baseboard testing interface and testing method thereof
08/31/2010US7788556 System and method for evaluating an erroneous state associated with a target circuit
08/31/2010US7788553 Mass production testing of USB flash cards with various flash memory cells
08/31/2010US7788552 Method to improve isolation of an open net fault in an interposer mounted module
08/31/2010US7788078 Processor/memory co-exploration at multiple abstraction levels
08/31/2010US7788076 Interference analysis method, interference analysis device, interference analysis program and recording medium with interference analysis program recorded thereon
08/31/2010US7788058 Method and apparatus for diagnosing broken scan chain based on leakage light emission
08/31/2010US7788052 Method and device for determining state of health of the battery, and battery power supply system
08/31/2010US7788050 System and method to locate common path distortion on cable systems
08/31/2010US7787995 Method and system for controlling an operation of an electrical power network
08/31/2010US7787978 Apparatus and method for controller performance monitoring in a process control system
08/31/2010US7787394 Network status display device and method using traffic flow-radar
08/31/2010US7787389 Method and system for utilization of an outer decoder in a broadcast services communication system
08/31/2010US7787383 Method and apparatus for monitoring a connection in a peer-to-peer network
08/31/2010US7787380 Resource reservation protocol with traffic engineering point to multi-point label switched path hierarchy
08/31/2010US7787378 Method and apparatus for conversion of an arbitration table into count values to control the distribution of resources
08/31/2010US7787376 Communication method for performing communications between two radio apparatuses according to channel characteristics and a radio apparatus using the communication method
08/31/2010US7787372 Transmission control protocol with performance enhancing proxy for degraded communication channels
08/31/2010US7787370 Technique for adaptively load balancing connections in multi-link trunks
08/31/2010US7787367 Method and a system for flow control in a communication network
08/31/2010US7787363 Dual-purpose uplinks used in a fault-tolerant stack
08/31/2010US7787361 Hybrid distance vector protocol for wireless mesh networks
08/31/2010US7787360 System and method for preserving multicast data forwarding during control failures in a router
08/31/2010US7787300 Memory devices with page buffer having dual registers and method of using the same
08/31/2010US7786971 Flat display apparatus capable of compensating a panel defect electrically and picture quality controlling method thereof
08/31/2010US7786747 Microdisplay assemblies and methods of packaging microdisplays
08/31/2010US7786746 Semiconductor integrated circuit apparatus, measurement result management system, and management server
08/31/2010US7786745 Method and apparatus for single-sided extension of electrical conductors beyond the edges of a substrate
08/31/2010US7786744 Probe card assembly and test probes therein
08/31/2010US7786743 Probe tile for probing semiconductor wafer
08/31/2010US7786742 Prober for electronic device testing on large area substrates
08/31/2010US7786741 Measuring tip for high-frequency measurement
08/31/2010US7786740 Probe cards employing probes having retaining portions for potting in a potting region
08/31/2010US7786739 Identification of board connections for differential receivers
08/31/2010US7786736 Method and system for detecting damage in aligned carbon nanotube fiber composites using networks
08/31/2010US7786735 Corrective device protection
08/31/2010US7786724 Methods and apparatus for collecting process characterization data after first failure in a group of tested devices
08/31/2010US7786723 Test stage for a carrier having printhead integrated circuitry thereon
08/31/2010US7786722 Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
08/31/2010US7786721 Multilayer type test board assembly for high-precision inspection
08/31/2010US7786719 Optical sensor, optical current sensor and optical voltage sensor
08/31/2010US7786436 FIB based open via analysis and repair