Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/2010
08/25/2010CN201561993U Test switch
08/25/2010CN201561991U Adjustable probe bracket for solar battery detection
08/25/2010CN201561989U Built-in device of local discharge sensor
08/25/2010CN1979198B Detecting system and method for input/output board
08/25/2010CN1979193B Ageing test apparatus and ageing test drive plate and control method of the ageing test apparatus and drive plate
08/25/2010CN1971301B An examining system for battery
08/25/2010CN1815250B Board checking device, board checking method
08/25/2010CN1737592B Method for testing pixels for LCD TFT displays
08/25/2010CN101815952A Tempering chamber for tempering electronic components in particular IC's
08/25/2010CN101815951A Test design optimizer for configurable scan architectures
08/25/2010CN101814730A Fault phase selection method of double transmission line protection on the same pole
08/25/2010CN101814686A Crimper for numerical-control double-sided insulation displacement connector
08/25/2010CN101813835A Liquid crystal panel detection device and liquid crystal panel detection method
08/25/2010CN101813755A Charge and discharge test equipment for full on-line storage battery pack
08/25/2010CN101813754A State estimating method for automobile start illumination type lead-acid storage battery
08/25/2010CN101813753A Electric quantity measuring and fault recording device for power generator
08/25/2010CN101813752A High voltage switch dynamic characteristics tester
08/25/2010CN101813751A Handle-driving mechanism of low-pressure breaker
08/25/2010CN101813750A Device and method for detecting wear and aging of contactor
08/25/2010CN101813749A Reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system
08/25/2010CN101813748A Method for detecting noise of integrated circuit substrate
08/25/2010CN101813747A Method for diagnosing faults of nonlinear analog circuit based on Wiener kernels and neural network
08/25/2010CN101813746A Detection circuit for printed circuit boards
08/25/2010CN101813745A Electrical performance test method and equipment thereof
08/25/2010CN101813744A Parallel test system and parallel test method
08/25/2010CN101813743A Method for detecting partial discharge in gas insulated switchgear and detecting and positioning device
08/25/2010CN101813742A Method for probing and locating high-voltage partial discharge of power grid by utilizing optical fiber
08/25/2010CN101813741A High temperature and high pressure electrical stability tester
08/25/2010CN101813740A System and method for detecting high voltage transmission line faults
08/25/2010CN101813739A Adaptive three-phase symmetric fault phase selecting method for ultra high voltage transmission line
08/25/2010CN101813738A Wireless digital power supply line fault alarm device and method
08/25/2010CN101813737A Multifunctional power failure recorder
08/25/2010CN101813736A Distance protection measurement method of double-circuit line on the same pole
08/25/2010CN101813735A Grounding detection device for power distribution system and fault detection method thereof
08/25/2010CN101813734A Device and method for detecting circuit
08/25/2010CN101813733A MSP85 mode panel-selecting driving tester
08/25/2010CN101813732A Shielding effectiveness testing system for near-zone low-frequency strong magnetic field and testing method thereof
08/25/2010CN101813731A Method for judging running state of external arrester of transformer balancing winding
08/25/2010CN101813730A Device for detecting power equipment discharge based on ultraviolet method
08/25/2010CN101813729A No-load applied voltage test and protection method for DC ice-smelting device
08/25/2010CN101813728A Electromagnetic interference detection device
08/25/2010CN101464129B Calibration method for micro-image
08/25/2010CN101435852B Method for measuring junction type semiconductor lighting device light efficiency degradation parameter by electric method
08/25/2010CN101424596B Calibration stand and calibration method for SF6 gas density and pressure monitoring device
08/25/2010CN101299055B Simulation integrated switch current circuit testing method based on wavelet-neural net
08/25/2010CN101261295B Automatic socketing tool equipment and its control circuit for LCD television set debugging production line
08/25/2010CN101246043B On-line monitoring method for vibration and noise of AC power transformer influenced by DC magnetic biasing
08/25/2010CN101221206B Method for diagnosing turn-to-turn short circuit of permanent magnet fault-tolerant motor
08/25/2010CN101207209B Electronic load, system and method for evaluating fuel cell electric discharge performance
08/25/2010CN101196552B Method for judging existence of high-efficiency quantum structure in multi-quantum well LED materials
08/25/2010CN101163978B Testable electronic circuit, test method and tester
08/25/2010CN101131414B Method for appraising sphere nickel median voltage performance
08/25/2010CN101120262B Method and system for scheduling tests in a parallel test system
08/25/2010CN101059553B Lithium ion battery explosion cause test method
08/25/2010CN101034142B Battery voltage measuring unit of storage battery group having accident safety function
08/25/2010CN101015123B Optically reconfigurable gate array write state inspection method, write state inspection device, and optically reconfigurable gate array
08/24/2010US7784004 Skew lots for IC oscillators and other analog circuits
08/24/2010US7783948 Removeable and replaceable tap domain selection circuitry
08/24/2010US7783947 Controller applying stimulus data while continuously receiving serial stimulus data
08/24/2010US7783946 Scan based computation of a signature concurrently with functional operation
08/24/2010US7783945 Display apparatus and test circuit thereof
08/24/2010US7783942 Integrated circuit device with built-in self test (BIST) circuit
08/24/2010US7783935 Bit error rate reduction buffer
08/24/2010US7783438 Integrated non-destructive method and device for electrochemical energy system diagnostics
08/24/2010US7783437 Arc monitoring system
08/24/2010US7783316 Public safety communications network using asymmetric receive/transmit channels
08/24/2010US7782932 Circuit and method for evaluating the performance of an adaptive decision feedback equalizer-based serializer deserializer and serdes incorporating the same
08/24/2010US7782813 Monitoring network traffic
08/24/2010US7782790 Extensions to the path verification protocol to support link bundling constructs
08/24/2010US7782787 Rapid fault detection and recovery for internet protocol telephony
08/24/2010US7782786 Technique for providing dynamic modification of application specific policies in a feedback-based, adaptive data network
08/24/2010US7782781 Home network system
08/24/2010US7782779 Apparatus and method for transmitting a multimedia data stream
08/24/2010US7782778 Apparatus and method for fibre channel distance extension embedded within an optical transport system
08/24/2010US7782777 Method and system for handling network congestion
08/24/2010US7782774 TCP optimized single rate policer
08/24/2010US7782771 Adjusting to network latency changes
08/24/2010US7782767 Method and system for calculating burst bit rate for IP interactive applications
08/24/2010US7782076 Method and apparatus for statistical CMOS device characterization
08/24/2010US7782075 Electronic device, load fluctuation compensation circuit, power supply, and test apparatus
08/24/2010US7782074 System that detects damage in adjacent dice
08/24/2010US7782073 High accuracy and universal on-chip switch matrix testline
08/24/2010US7782072 Single support structure probe group with staggered mounting pattern
08/24/2010US7782071 Probe card analysis system and method
08/24/2010US7782070 Probing device
08/24/2010US7782067 Method and apparatus for inspecting an object using terahertz electromagnetic wave
08/24/2010US7782063 Partial discharge charge quantity measuring method and device
08/24/2010US7782062 Method for locating leaks in pipes
08/24/2010US7782045 Multi-signal input testing apparatus
08/24/2010US7782043 Variable bandwidth DC bias for AC measurement system
08/24/2010US7781890 Structure and method for parallel testing of dies on a semiconductor wafer
08/24/2010US7781239 Semiconductor device defect type determination method and structure
08/24/2010US7781237 Alignment marker and lithographic apparatus and device manufacturing method using the same
08/19/2010WO2010094035A1 Efficient and loss tolerant method and mechanism for measuring available bandwidth
08/19/2010WO2010093758A1 Systems and methods for detecting electrical line faults
08/19/2010WO2010093527A1 System and method to optimize data communication in a computational network
08/19/2010WO2010093517A2 Integrated unit for electrical/reliability testing with improved thermal control
08/19/2010WO2010093444A2 Magnetic state of charge sensor for a battery
08/19/2010WO2010092800A1 Testing device and testing method
08/19/2010WO2010092672A1 Semiconductor wafer testing apparatus