Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
12/2005
12/15/2005WO2005117708A2 C-arm device with adjustable detector offset for cone beam imaging involving partial circle scan trajectories
12/15/2005US20050277029 Microstructured pattern inspection method
12/15/2005US20050276383 Detector drawer for a mobile detector
12/15/2005US20050276379 Portable, digital X-ray apparatus for producing, storing, and displaying electronic radioscopic images
12/15/2005US20050276378 Total reflection X-ray fluorescence analysis method
12/15/2005US20050276376 Contraband detection systems using a large-angle cone beam CT system
12/15/2005US20050276374 Tomography device
12/15/2005US20050276373 Method of and system for adaptive scatter correction in multi-energy computed tomography
12/15/2005US20050276370 Tamper to delay motion and decrease ionization of a sample during short pulse x-ray imaging
12/15/2005US20050274917 Radiation image reading system
12/15/2005US20050274873 CCD imaging array with improved charge sensing circuit
12/15/2005DE102004025121A1 Verfahren zum Betrieb eines Röntgenanalysegeräts mit zweidimensionalem Array-Detektor und Röntgenanalysegerät zum Durchführen des Verfahrens Method for operating an X-ray analysis apparatus having a two-dimensional array detector and X-ray analysis apparatus for carrying out the method
12/15/2005DE102004021790B3 Chemical analysis system for surface of ultra-thin layer of semiconductor wafer uses Photo Emission Electron Microscopy sensor in chamber with vacuum-tight window in front of photodetector
12/14/2005EP1604195A1 A method and an apparatus for detecting water on a ship's deck
12/14/2005EP1603460A2 X-ray diffraction-based scanning system
12/14/2005EP1603459A1 Method and imaging system for imaging the spatial distribution of an x-ray fluorescence marker
12/14/2005EP1579202A4 Radiographic equipment
12/14/2005EP1448979A4 Bulk material analyser and method of assembly
12/14/2005EP1114310A4 X-ray fluorescence elemental analyzer
12/14/2005CN2746387Y Sample stand for investigating solid block sample by X-ray diffractometer
12/14/2005CN1708686A Folded array CT baggage scanner
12/14/2005CN1707252A Silylation mica substrate and its application in growth of protein crystal
12/14/2005CN1707251A Detecting apparatus capable of adaptive regulating X-ray source and detecting method thereof
12/14/2005CN1706343A Systems, methods and apparatus of an extending column
12/13/2005US6975700 X-ray sensor signal processor and X-ray computed tomography system using the same
12/13/2005US6975125 Semiconductor device tester
12/13/2005US6974954 Radiation imaging apparatus and radiographing method for radiation imaging apparatus
12/13/2005CA2272494C Inspection of containers employing a single area array sensor and alternately strobed light sources
12/08/2005WO2005116618A1 Method of glass discrimination, and glass discrimination apparatus
12/08/2005WO2005116608A1 Method of preparing specimen for estimation of crystal property and method of estimating crystal property
12/08/2005WO2005013309A3 Multi-mode charged particle beam device
12/08/2005US20050273367 Secure health information connectivity system
12/08/2005US20050272993 Image information processing apparatus, image information processing method, and program
12/08/2005US20050271184 Inspection system for limited access spaces
12/08/2005US20050270631 AOM modulation techniques for facilitating pulse-to-pulse energy stability in laser systems
12/08/2005US20050270630 AOM modulation techniques employing plurality of transducers to improve laser system performance
12/08/2005US20050270629 AOM modulation techniques employing transducers to modulate different axes
12/08/2005US20050269527 Method of implanting a substrate and an ion implanter for performing the method
12/08/2005US20050269524 Spatial-phase locking of energy beams for determining two-dimensional location and beam shape
12/08/2005US20050269511 Probe driving method, and probe apparatus
12/08/2005DE102005022156A1 Verfahren und Vorrichtung zum Einstufen von Pixeln in medizinischer Bildgebung Method and apparatus for classifying pixels in medical imaging
12/08/2005DE102004024810A1 Verfahren und Vorrichtung zur optischen Abtastung einer Probe Method and device for optically scanning a sample
12/08/2005DE102004024097A1 Verfahren und Vorrichtung zur Erhöhung der Patientensicherheit in klinischen Scannern Method and apparatus for improving patient safety in clinical scanners
12/07/2005EP1603068A2 Process for monitoring fabrication of crystals of biomolecules
12/07/2005EP1392168B1 Aerostatic rotor bearing
12/07/2005CN1230781C Method for bean hardening correcting original image recorded by CT Instrument
12/07/2005CN1230693C Small area pixel electrode direct plane plate X-ray detector
12/07/2005CN1230674C Whole set testing equipment employing X-rays
12/06/2005USRE38910 Low activity nuclear density gauge
12/06/2005US6973161 X-ray foreign material detecting apparatus simultaneously detecting a plurality of X-rays having different amounts of energy
12/06/2005US6973159 Radiological imaging apparatus and radiological imaging method and radiological imaging support method
12/06/2005US6973158 Multi-target X-ray tube for dynamic multi-spectral limited-angle CT imaging
12/06/2005US6973156 Method and apparatus for reconstruction of the attenuation density of an object from X-ray projection image data
12/06/2005US6972426 Radiographic image reading apparatus
12/06/2005US6972412 Particle-optical device and detection means
12/01/2005WO2005114520A2 Patient recruitment method and system
12/01/2005WO2005114093A1 Method and device for optically scanning a sample
12/01/2005WO2005112767A1 Apparatus and method for penetrating radiation measurements
12/01/2005WO2005112752A1 Penetrating radiation measurements
12/01/2005WO2005067605A3 Ultrasound gating of cardiac ct scans
12/01/2005WO2005055007A3 Method and apparatus for managing imaging system workflow
12/01/2005WO2004092727A3 Compound libraries and methods for drug discovery
12/01/2005US20050265523 C-arm device with adjustable detector offset for cone beam imaging involving partial circle scan trajectories
12/01/2005US20050265517 X-ray tomography and laminography
12/01/2005US20050265516 Method and device for increasing patient safety in clinical scanners
12/01/2005US20050263703 Pattern inspection method and apparatus using electron beam
12/01/2005US20050263702 Defect inspection and charged particle beam apparatus
12/01/2005US20050263701 Substrate inspection method, method of manufacturing semiconductor device, and substrate inspection apparatus
12/01/2005US20050263700 Processing method using probe of scanning probe microscope
12/01/2005US20050262928 Sampling apparatus
12/01/2005DE102005020024A1 Vorrichtung zur mechanischen Kraftübertragung Device for mechanical power transmission
12/01/2005DE102004022427A1 Checking method for a piece of luggage compares a first X-ray image taken in a first luggage checking unit with a second image taken by a second unit regarding relative luggage positions
12/01/2005DE102004021965A1 Verfahren zur Erstellung von tomographischen Aufnahmen eines schlagenden Herzens Process for the preparation of tomographic images of a beating heart
11/2005
11/30/2005EP1600770A1 Quantitative nondestructive evaluation method for cracking
11/30/2005EP1599723A2 Scanning-based detection of ionizing radiation
11/30/2005EP1599497A2 Crystal structure of the ternary compelex of 14-3-3, fusicoccin, and plasma membrane atpase and methods for designing new herbicides
11/30/2005CN1703425A Crystallization of IGF-1
11/30/2005CN1229528C Evaluation method for polysilicon
11/29/2005US6970533 Scanning-based detection of ionizing radiation
11/29/2005US6970531 Continuous scan RAD tomosynthesis system and method
11/29/2005US6969852 Method of evaluating of a scanning electron microscope for precise measurements
11/29/2005US6969851 nitric oxides (NOx); in an exhaust gas; small-sized, low-cost, robust, and reliable; continuous spark discharge is established between the electrically conductive shell of the ionization chamber and the needle tip of the spark electrode
11/24/2005WO2005112043A1 Multi-column charged particle optics assembly
11/24/2005WO2005111590A2 Non-intrusive inspection systems for large container screening and inspection
11/24/2005WO2005111553A2 Method for compensation of near-neighbor sample effects in a nmr check weighing system
11/24/2005WO2005111539A1 Method for the nondestructive determination of the inner dimensions and/or the outer dimensions of a shoe and/or of a last
11/24/2005WO2005098400A3 Eliminating cross-talk in a backscatter inspection portal comprising multiples sources by ensuring that only one source is emitting radiation at a time
11/24/2005WO2005075716A3 Doped lithium fluoride monochromator for x-ray analysis
11/24/2005WO2005050694A3 Liquid metal ion source and its production; processing and analyzing devices provided with said source
11/24/2005WO2005008768A3 A system and method for determining a cross sectional feature of a structural element using a reference structural element
11/24/2005US20050259891 Apparatus, method, and program for producing subtraction images
11/24/2005US20050259857 Method and apparatus for classification of pixels in medical imaging
11/24/2005US20050259790 Method for operating an X-ray analysis apparatus with two-dimensional array detector and X-ray analysis apparatus for carrying out the method
11/24/2005US20050259788 Method for detecting a mass density image of an object
11/24/2005US20050259784 Methods for spectrally calibrating CT imaging apparatus detectors
11/24/2005US20050259783 Direct conversion energy discriminating CT detector
11/24/2005US20050259781 Method of and system for computing effective atomic number images in multi-energy computed tomography
11/24/2005US20050257601 Method for measuring concentration of solid or liquid particulate matter in a gaseous carrier medium
11/24/2005DE202004011059U1 Longitudinal tube seam weld X-ray inspection system has inspection wagon driven by longitudinal chain
11/24/2005DE102004021442A1 Process for measuring the characteristics of a structure especially on a mask or wafer in semiconductor technology scans the structure in rows in at least two different directions