Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
09/2008
09/02/2008US7420106 Scanning probe characterization of surfaces
09/02/2008CA2412711C Self diagnostic system for optically coupled digital radiography
08/2008
08/28/2008WO2008103902A1 Methods and systems for the directing and energy filtering of x-rays for non-intrusive inspection
08/28/2008WO2008103747A1 Compact scanned electron-beam x-ray source
08/28/2008WO2008103571A1 Instrument having x-ray fluorescence and spark emission spectroscopy analysis capabilities
08/28/2008US20080207474 Blending cylinder oils and fuel with adjuvants and metals; monitoring concentration of metals
08/28/2008US20080205734 X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality
08/28/2008US20080205598 Coherent Scatter Computer Tomography Material Identification
08/28/2008US20080205596 Method for Inspecting Ceramic Structures
08/28/2008US20080205594 Dual energy radiation scanning of contents of an object
08/28/2008US20080205593 Instrument having x-ray fluorescence and spark emission spectroscopy analysis capabilities
08/28/2008US20080205592 XRF analyzer
08/28/2008US20080205591 X-ray diagnostic apparatus, image processing apparatus, and image processing method
08/28/2008US20080205584 Ct extremity scanner
08/28/2008US20080205583 Radiation scanning of objects for contraband
08/28/2008US20080203336 Radiation image detector
08/28/2008US20080203301 Electron Microscope
08/28/2008US20080203300 Scanning Electron Microscope
08/28/2008US20080203299 Charged Particle Beam Apparatus
08/28/2008US20080203298 Electrostatic Charge Measurement Method, Focus Adjustment Method, And Scanning Electron Microscope
08/28/2008US20080203297 Specimen Inspection Equipment and How to Make the Electron Beam Absorbed Current Images
08/28/2008US20080203296 Transmission Electron Microscope Provided with Electronic Spectroscope
08/28/2008US20080203295 Deformation method of nanometer scale material using particle beam and nano tool thereby
08/28/2008US20080203291 Ion detection using a pillar chip
08/28/2008DE102008008829A1 Method for registration of real structure-information in solid crystal bodies by X-ray radiation, involves representing crystallographic real structure of solid crystal body by hard X-ray braking radiation on detector holding surface
08/27/2008CN201107283Y Angle controller in ray detection
08/27/2008CN201107282Y Adjusting device for mounting ray generators
08/27/2008CN201107281Y Radiation photograph detector light path system test device
08/27/2008CN201107280Y Automatic X ray real time imaging testing apparatus
08/27/2008CN201107279Y High speed X ray detector
08/27/2008CN201107278Y Paper quality water content detecting system
08/27/2008CN201104890Y Numerical control X ray camera
08/27/2008CN101253410A Microchip and analyzing method and device employing it
08/27/2008CN101251499A Method for testing oxide and slag inclusion in magnesium alloy
08/27/2008CN101251498A Method for testing and evaluating wall rock loosening ring based on electromagnetic radiation principle
08/26/2008US7418078 Spot-size effect reduction
08/26/2008US7418077 Integrated carry-on baggage cart and passenger screening station
08/26/2008US7418073 Computed tomography device and method with three-dimensional backprojection
08/26/2008US7417236 Sheet beam-type testing apparatus
08/26/2008US7417234 Spatial-phase locking of energy beams for determining two-dimensional location and beam shape
08/26/2008US7417227 Scanning interference electron microscope
08/26/2008US7416604 Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same
08/26/2008US7416462 Glass substrate processing method and material removal process using x-ray fluorescence
08/26/2008CA2216907C Simplified conditions and configurations for phase-contrast imaging with hard x-rays
08/21/2008WO2008101088A2 Handheld x-ray fluorescence spectrometer
08/21/2008WO2008099676A1 Sample piece collection method and blade temperature estimation method
08/21/2008WO2008061531A8 Method of providing a density profile of a plate-shaped body
08/21/2008WO2008012419A3 System for delivering a stabilized x-ray beam
08/21/2008US20080201091 Sample electrification measurement method and charged particle beam apparatus
08/21/2008US20080200747 Power filling of syringe while reducing exposure to radiation using shielded container; electromechanical drive; computer
08/21/2008US20080198968 Radiation image projection apparatus and radiation image projection method
08/21/2008US20080198967 High throughput baggage inspection system
08/21/2008US20080198963 System and Method for Real Time Dual Energy X-Ray Image Acquisition
08/21/2008US20080198962 Device for measuring size of steel bar in structure and method thereof
08/21/2008US20080198467 Standard Component For Length Measurement, Method For Producing The Same, and Electron Beam Metrology System Using The Same
08/21/2008US20080197293 Direction correcting apparatus, method thereof and movable radiation inspecting system
08/21/2008US20080197282 Scanning Transmission Charged Particle Beam Device
08/21/2008US20080197281 Electron Microscopic Method and Electron Microscope Using Same
08/21/2008US20080197279 Radiation Inspection System
08/21/2008DE102007008349A1 Anordnung zur Röntgen-Computertomographie Arrangement for X-ray computed
08/21/2008DE102005029674B4 Blende für eine bildgebende Einrichtung Visor for an imaging device
08/21/2008DE102005028411B4 Kollimator für einen Strahlendetektor und Computertomographiegerät Collimator for a radiation detector and computer tomography apparatus
08/21/2008CA2677908A1 Small spot x-ray fluorescence (xrf) analyzer
08/21/2008CA2675435A1 Specimen collecting method and blade temperature estimating method
08/20/2008EP1957963A1 X-ray testing device for circuit boards with height-adjustable table and screening mounted thereon
08/20/2008CN101248349A Appraisement method for stamp-forming characteristics of galvanized steel sheet
08/20/2008CN101246134A X-ray diffraction charge density recovery, processing and analytical method
08/20/2008CN101246133A Direction correcting device and method and mobile radiation checkout system
08/20/2008CN101246132A Focused ion beam equipment and focused ion beam detecting method
08/20/2008CN101246117A Gas-hydrate synthesizing and macro-microscopic mechanics nature synthetic experiment system
08/20/2008CN100412682C Projector and zoom adjustment method
08/20/2008CN100412560C Imaging device and method
08/19/2008US7415149 Pattern inspection apparatus
08/19/2008US7415146 Method and apparatus to determine bone mineral density utilizing a flat panel detector
08/19/2008US7415094 Security scanner with bin return device
08/19/2008US7414250 Cryogenic variable temperature vacuum scanning tunneling microscope
08/19/2008US7414243 Transmission ion microscope
08/19/2008CA2332376C Method and apparatus for measuring multiphase flows
08/14/2008WO2008097345A2 Wide parallel beam diffraction imaging method and system
08/14/2008WO2008096787A1 Weight inspection device and weight inspection system using the same
08/14/2008WO2008096691A1 X-ray imaging element and method, and x-ray imaging device
08/14/2008WO2008060192A3 A method and a device for measuring multiphase wellstream composition
08/14/2008WO2008023325A3 Apparatus and method for environmental monitoring
08/14/2008US20080192891 Radiation Imaging Device
08/14/2008US20080192890 Method and Apparatus to Facilitate Provision and Use of Multiple X-Ray Sources
08/14/2008US20080192889 Handheld x-ray fluorescence spectrometer
08/14/2008US20080192888 Fluorescent X-Ray Analysis Method and Device
08/14/2008US20080192878 Detecting special nuclear materials in suspect containers using high-energy gamma rays emitted by fission products
08/14/2008US20080191858 System for detecting contraband
08/14/2008US20080191151 Method and apparatus for specimen fabrication
08/14/2008US20080191135 Scanning Electron Microscope
08/14/2008US20080191134 Charged particle detector assembly, charged particle beam apparatus and method for generating an image
08/14/2008US20080191133 Radiation portal monitor system and method
08/13/2008EP1955354A2 Ion sources, systems and methods
08/13/2008EP1955350A2 Ion sources, systems and methods
08/13/2008EP1955348A2 Ion sources, systems and methods
08/13/2008EP1706035B1 Dental radiology apparatus and signal processing method used therewith
08/13/2008EP1546694A4 Imaging apparatus and method with event sensitive photon detection
08/13/2008EP1213995B1 Radiology device comprising improved image enlarging means
08/13/2008CN101241092A Garbage landfill seepage area quick detection device