Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
03/2008
03/12/2008CN201034949Y X-ray detection device of printed circuit board
03/12/2008CN201034948Y Nave casting flaw automatic detection device based on image comprehention
03/12/2008CN201034947Y Spiral welding line X ray real time digital image-forming detecting and autotracking unit
03/12/2008CN201034946Y X ray digital image forming apparatus
03/12/2008CN201034884Y Nano lines in-situ stretching device in scanning electron microscope
03/12/2008CN201034883Y Single nano line in-situ mechanics all-round property testing device in scanning electron microscope
03/12/2008CN101140247A Method and equipment for safety-checking liquid stage article with ray
03/12/2008CN101140246A X-ray CT test system and CTmethod for testing objects
03/12/2008CN101138501A Method and system for generating a multi-spectral image of an object
03/12/2008CN100375122C Method and apparatus for deriving motion information from projection data
03/12/2008CN100374878C Radiation detector module, Radiation detecting method, computed tomography photoscanner
03/11/2008US7343000 Imaging apparatus and imaging system
03/11/2008US7342997 Method for measuring dead time of X-ray detector
03/11/2008US7342996 X-ray means for determining the location of malignant neoplasm and its radiotherapy
03/11/2008US7342995 Apparatus for estimating specific polymer crystal
03/11/2008US7342994 Mammogram recording and read-out apparatus
03/11/2008US7342993 System for dynamic low dose x-ray imaging
03/11/2008US7342992 X-ray apparatus provided with a positionally adjustable X-ray detector
03/11/2008US7342242 Method and apparatus for estimating photomultiplier sensitivity change
03/11/2008US7342238 Systems, control subsystems, and methods for projecting an electron beam onto a specimen
03/11/2008US7342226 Stress measuring method and system
03/11/2008US7342225 Crystallographic metrology and process control
03/06/2008WO2008027543A2 Confocal secondary electron imaging
03/06/2008WO2008026936A1 Tilted gammameter
03/06/2008WO2008026935A1 Compact gammameter
03/06/2008WO2008003865A3 Device and method of characterizing surfaces
03/06/2008WO2007120552A8 Monitoring the laydown of a reagent like potassium ferricyanide using xrf spectrometry
03/06/2008WO2007067314A3 Ion sources, systems and methods
03/06/2008US20080058977 Reviewing apparatus using a sem and method for reviewing defects or detecting defects using the reviewing apparatus
03/06/2008US20080058643 Imaging apparatus and imaging method
03/06/2008US20080057589 Using spectral data to identify coompounds in liquids
03/06/2008US20080056449 Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate
03/06/2008US20080056447 Method for providing a 3D x-ray image data record and an x-ray imaging system with a measuring facility for detecting the breathing phase of a patient
03/06/2008US20080056446 Tire inspection method
03/06/2008US20080056445 Systems and methods for adaptive image processing using acquisition data and calibration/model data
03/06/2008US20080056444 System and method for integrating explosive detection systems
03/06/2008US20080056443 Method and device for security-inspection of liquid articles with radiations
03/06/2008US20080056442 X-ray analysis apparatus
03/06/2008US20080056437 Acquisition and reconstruction of projection data using a stationary CT geometry
03/06/2008US20080056436 Acquisition and reconstruction of projection data using a stationary CT geometry
03/06/2008US20080056435 Acquisition and reconstruction of projection data using a stationary CT geometry
03/06/2008US20080056434 Particle beam irradiation system
03/06/2008US20080054199 Apparatus and Method for Reading Out Storage Phosphor Plates
03/06/2008US20080054179 Method of fabricating sample membranes for transmission electron microscopy analysis
03/06/2008DE102007039573A1 Verfahren zur analytischen Rekonstruktion für eine Mehrfachquellen-Inversgeometrie-CT Analytical method for reconstruction for multi-source inverse geometry CT
03/05/2008EP1895292A2 X-ray analysis apparatus
03/05/2008EP1893984A2 Radiation scanning units with reduced detector requirements
03/05/2008EP1893983A1 X-ray laminography and/or tomosynthesis apparatus
03/05/2008CN101137899A Pixel implemented current amplifier
03/05/2008CN101137889A Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample
03/05/2008CN101135657A X-ray analysis apparatus
03/05/2008CN101135656A Pipe-pipe sheet weld joint gamma-ray digital image-forming automatic detection system
03/05/2008CN101135655A Blocked scan rebuilding and space assembly method of large object image-forming with cone-beam CT
03/05/2008CN101133962A Method for reconstructing a three-dimensional image volume and x-ray devices
03/05/2008CN100373573C Method for affirming fatal fault in deep-sub-micrometer semiconductor device
03/04/2008US7340082 Method and medical imaging apparatus for determining a slice in an examination volume for data acquisition in the slice
03/04/2008US7340033 X-ray unit having an automatically adjustable collimator
03/04/2008US7340032 System for dynamic low dose x-ray imaging and tomosynthesis
03/04/2008US7340030 Asymmetric cone beam
03/04/2008US7339675 Apparatus for stacking sheet members, apparatus for measuring dimensions of sheet members, and apparatus for and method of marking sheet members
03/04/2008US7339656 Method and apparatus for measuring electron density of plasma and plasma processing apparatus
03/04/2008US7338806 Reagent kit of global analysis for protein expression and method for qualitative and quantitative proteomic analysis using the same
03/04/2008US7338168 Particle analyzing system and methodology
02/2008
02/28/2008WO2008024825A2 Scatter attenuation tomography
02/28/2008WO2007093848A3 Crystalline enoyl-(acyl-carrier-protein) reductase from heliobacter pylori
02/28/2008WO2007067328A3 Ion sources, systems and methods
02/28/2008US20080049899 Scatter Attenuation Tomography
02/28/2008US20080049895 Accurate measurement of layer dimensions using XRF
02/28/2008US20080049892 High-energy photon detector
02/28/2008US20080049888 High Brightness - Multiple Beamlets Source for Patterned X-ray Production
02/28/2008US20080048699 Defective product inspection apparatus, probe positioning method and probe moving method
02/28/2008US20080048118 Electron Beam Apparatus and Method for Production of Its Specimen Chamber
02/28/2008US20080048116 Charged particle beam device and method for inspecting specimen
02/28/2008DE102006037969A1 Method for x-ray imaging under application of subtraction technology, involves recording x-ray image of examination area by detector dose, where multiple other x-ray images of examination area are recorded by another detector dose
02/28/2008DE102006037740A1 X-ray diagnostics unit for production of series of x-ray images, has high voltage generator for x-ray emitter, x-ray detector and dose measuring chamber arranged in front of x-ray detector
02/28/2008DE102006011243B4 Verfahren zum Aufnehmen einer Röntgenbildserie Procedure for taking an X-ray image series
02/28/2008DE102006009222B4 Verfahren und Vorrichtung zur Bestimmung der Konzentration einer Substanz in einem Körpermaterial mittels Mehr-Energie-Computertomographie Method and apparatus for determining the concentration of a substance in a body material by means of multi-energy CT
02/28/2008DE102004017540B4 Verfahren zur Erstellung von computertomographischen Aufnahmen mit einem CT-Gerät und CT-Gerät Process for the preparation of computed tomography scans with CT scanners and CT scanner
02/28/2008CA2660765A1 Apparatus and method for environmental monitoring
02/27/2008EP1892953A1 X-Ray image processing system
02/27/2008EP1891421A1 Secondary ion mass spectroscopy (sims) with polyatomic primary ion beam, which is directed at a surface coated with caesium
02/27/2008EP1891420A1 Testing of components or semifinished products with an expanded metallic layer
02/27/2008CN201028996Y Soil emanometer
02/27/2008CN101133300A Method for measuring surface layer oxide film thickness of galvanized steel plate
02/27/2008CN101131370A Double-light path full-reflection X fluorescence analyser
02/27/2008CN101131369A X radial energy spectrometer with compatible measurement of thin sample and thick sample
02/27/2008CN101131367A Spot grid array imaging system
02/27/2008CN100371689C X-ray monitoring
02/26/2008US7337098 Diffraction condition simulation device, diffraction measurement system, and crystal analysis system
02/26/2008US7336764 Electron beam accelerator and ceramic stage with electrically-conductive layer or coating therefor
02/26/2008US7336762 Scan program communication method and X-ray CT apparatus
02/26/2008US7336760 Methods, systems, and computer-program products to estimate scattered radiation in cone-beam computerized tomographic images and the like
02/26/2008US7335905 Radiation image information reading apparatus with radiation conversion panel, and method of correcting sensitivity of radiation conversion panel
02/26/2008US7335904 Process for read-out of radiation image
02/26/2008US7335887 System and method for target inspection using discrete photon counting and neutron detection
02/26/2008US7335882 High resolution low dose transmission electron microscopy real-time imaging and manipulation of nano-scale objects in the electron beam
02/26/2008US7335881 Method of measuring dimensions of pattern
02/26/2008US7335879 System and method for sample charge control
02/26/2008US7334940 Scatter measurement method, scatter correction method, and X-ray CT apparatus
02/26/2008US7334470 Digital interface and receiver for time-of-flight level measurement and pulse-echo ranging systems