Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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10/08/2008 | CN101283258A Leak detector |
10/08/2008 | CN101281148A Semiconductor radiation detector with high resolution |
10/08/2008 | CN101281147A Digitization signal-noise ratio reinforced processing method used for X fluorescent spectrometer |
10/08/2008 | CN101281146A Method for detecting industry CT of batch product internal material density |
10/08/2008 | CN100424725C Method and apparatus for generating temporally interpolated tomographic images |
10/07/2008 | US7433788 Crystallization of IGF-1 |
10/07/2008 | US7433448 Method for the production of a corrected x-ray image data set |
10/07/2008 | US7432503 Scanning electron microscope and method for detecting an image using the same |
10/07/2008 | US7432502 Information acquisition method and apparatus for information acquisition |
10/07/2008 | US7432501 Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements |
10/07/2008 | US7431500 Dynamic exposure control in radiography |
10/07/2008 | US7430931 Microgranulometry and methods of applications |
10/02/2008 | WO2008060667A3 Systems and methods for determining an atomic number of a substance |
10/02/2008 | WO2008036135A3 Crystal structure of crig and c3b: crig complex |
10/02/2008 | US20080242557 System For Detecting Molecular Interactions |
10/02/2008 | US20080240342 Advanced Csct Detector Shapes |
10/02/2008 | US20080240341 Hybrid energy discriminating charge integrating ct detector |
10/02/2008 | US20080240340 Method for scattered radiation correction in x-ray imaging devices |
10/02/2008 | US20080240329 Detecting special nuclear materials in suspect containers using high-energy gamma rays emitted by fission products |
10/02/2008 | US20080237508 Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor |
10/02/2008 | US20080237507 Radiation image recording system |
10/02/2008 | US20080237506 Integrated Puf |
10/02/2008 | US20080237505 Method and System for Image Processing for Profiling with Uncoded Structured Light |
10/02/2008 | US20080237486 Substrate Handling Device for a Charged Particle Beam System |
10/02/2008 | US20080237465 Scanning electron microscope |
10/02/2008 | US20080237463 Monochromator and scanning electron microscope using the same |
10/02/2008 | US20080237462 Semiconductor Testing Method and Semiconductor Tester |
10/02/2008 | US20080237460 Method for maskless particle-beam exposure |
10/02/2008 | US20080237456 Method And Apparatus For Observing A Specimen |
10/02/2008 | DE102007013569A1 Detection substrate for use with detector modules for computer tomography equipment, has multiple detector elements and wiring substrate, where wiring substrate has unit for shielding of radiation |
10/01/2008 | EP1973469A2 Method and apparatus for low dose computed tomography |
10/01/2008 | CN201126429Y Portable soil heavy metal analyzer |
10/01/2008 | CN201126428Y Automatic board-pasting apparatus for making board |
10/01/2008 | CN101278360A Monochromatic x-ray micro beam for trace element mapping |
10/01/2008 | CN100421624C X-ray diagnostic apparatus |
09/30/2008 | US7430277 Optical device for X-ray applications |
09/30/2008 | US7430276 Low dose X-ray mammography method |
09/30/2008 | US7430275 Method and apparatus for measuring the diameter of a steel reinforcement rod in concrete |
09/30/2008 | US7430274 XRF analyzer |
09/30/2008 | US7430273 Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities |
09/30/2008 | US7430271 Ray tracing kernel |
09/30/2008 | US7430052 Method for correlating the line width roughness of gratings and method for measurement |
09/30/2008 | US7429732 Scanning probe microscopy method and apparatus utilizing sample pitch |
09/30/2008 | CA2583557A1 User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same |
09/25/2008 | WO2008114684A1 Energy analyzer, 2-dimensional display type energy analyzer, and photoelectron microscope |
09/25/2008 | US20080234942 Analyzing Body Tissue |
09/25/2008 | US20080232551 X-Ray Manipulator |
09/25/2008 | US20080232546 Method for scattered radiation correction in x-ray imaging, and x-ray imaging system for this purpose |
09/25/2008 | US20080232545 Tomosynthesis imaging system and method |
09/25/2008 | US20080232542 Dynamic Dose Control For Computed Tomography |
09/25/2008 | US20080232541 Ct scan security check device and method |
09/25/2008 | US20080230716 Dna biosensor and methods for making and using the same |
09/25/2008 | US20080230697 Charged particle beam apparatus |
09/25/2008 | US20080230696 Surface treatment and surface scanning |
09/25/2008 | US20080230695 Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object |
09/25/2008 | US20080230694 Beam Optical Component Having a Charged Particle Lens |
09/25/2008 | DE102007013567A1 Detector module for computer tomography equipment, has printed board that carries electronic element, where electronic element is brought in between lower surface of wiring substrate and printed board |
09/25/2008 | DE102005056829B4 Kristallmonochromator für Röntgenanalysengeräte und Verfahren zur schnellen Einstellung der Rocking-Kurve von Kristallmonochromatoren Crystal monochromator for X-ray analysis apparatus and method for rapid adjustment of the rocking curve of Kristallmonochromatoren |
09/24/2008 | EP1972932A1 Security gate system and security gate control method |
09/24/2008 | EP1971851A1 Artifact suppression |
09/24/2008 | EP1971850A2 Displaced-ray ct inspection |
09/24/2008 | EP1053659B1 An x-ray examination apparatus having an object absorption dependent brightness control |
09/24/2008 | CN201123168Y Cured high-frequency high voltage power supply |
09/24/2008 | CN201122146Y Scanning electron microscope example bench |
09/24/2008 | CN201122138Y Example holder for pressing X-ray fluorescence analysis test sample wafer |
09/24/2008 | CN201122096Y Example bench for viewing silicon slice example section |
09/24/2008 | CN101271075A CT scanning safety inspection method and device thereof |
09/24/2008 | CN101271074A Method for detecting air-out pollution constituent of non-metal material for space application |
09/24/2008 | CN100420937C Method for monitoring positioning of vehicle radioactive substance and its device |
09/23/2008 | US7428294 Method for recording an X-ray image, and X-ray detector |
09/23/2008 | US7428293 Fluorescent X-ray analysis apparatus |
09/23/2008 | US7428292 Method and system for CT imaging using multi-spot emission sources |
09/23/2008 | US7428291 Operating method for an X-ray apparatus, operating method for a computer, and items corresponding to said operating methods |
09/23/2008 | US7427757 Large collection angle x-ray monochromators for electron probe microanalysis |
09/23/2008 | US7427756 Method of precision measurements of sizes and line width roughness of small objects in accordance with their images obtained in scanning electron microscope |
09/23/2008 | US7427755 Integrated electron beam tip and sample heating device for a scanning tunneling microscope |
09/23/2008 | US7427754 Telegraph signal microscopy device and method |
09/23/2008 | CA2551844C Method and system for mitigating threats and hoaxes perpetrated through a mail system |
09/21/2008 | CA2625549A1 Systems and methods for material authentication |
09/18/2008 | WO2008112950A1 Small spot and high energy resolution xrf system for valence state determination |
09/18/2008 | WO2008111522A1 X-ray inspection device and production system |
09/18/2008 | WO2008110667A1 Web measurement |
09/18/2008 | WO2008110017A1 Systems and methods for monitoring wood product characteristics |
09/18/2008 | US20080226743 Glass filters; anticancer agents |
09/18/2008 | US20080226028 Method and apparatus for automated, digital, radiographic inspection of aerospace parts |
09/18/2008 | US20080226026 BUILDUP-ROBUST DENSITY, LEVEL AND INTERFACE MEASUREMENT WITH y-BACKSCATTERING |
09/18/2008 | US20080226025 Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker |
09/18/2008 | US20080226019 Multiple Scatter Correction |
09/18/2008 | US20080226017 Data Handling and Analysis in Computed Tomography With Multiple Energy Windows |
09/18/2008 | US20080224922 Device and method for resonant high-speed microscopic impedance probe |
09/18/2008 | US20080224374 Sample holding mechanism and sample working/observing apparatus |
09/18/2008 | US20080224198 Apparatus for working and observing samples and method of working and observing cross sections |
09/18/2008 | US20080224071 Inspection apparatus |
09/18/2008 | US20080224066 Modular, High Volume, High Pressure Liquid Disinfection Using Uv Radiation |
09/18/2008 | US20080224040 Image Forming Method and Electron Microscope |
09/18/2008 | US20080224039 Scanning electron microscope with length measurement function and dimension length measurement method |
09/18/2008 | US20080224037 Charged Particle Beam Device |
09/18/2008 | US20080224036 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures |
09/18/2008 | US20080224035 Pattern displacement measuring method and pattern measuring device |
09/18/2008 | US20080222881 Method of producing active material for lithium secondary battery, method of producing electrode for lithium secondary battery, method of producing lithium secondary battery, and method of monitoring quality of active material for lithium secondary battery |