Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
10/2008
10/08/2008CN101283258A Leak detector
10/08/2008CN101281148A Semiconductor radiation detector with high resolution
10/08/2008CN101281147A Digitization signal-noise ratio reinforced processing method used for X fluorescent spectrometer
10/08/2008CN101281146A Method for detecting industry CT of batch product internal material density
10/08/2008CN100424725C Method and apparatus for generating temporally interpolated tomographic images
10/07/2008US7433788 Crystallization of IGF-1
10/07/2008US7433448 Method for the production of a corrected x-ray image data set
10/07/2008US7432503 Scanning electron microscope and method for detecting an image using the same
10/07/2008US7432502 Information acquisition method and apparatus for information acquisition
10/07/2008US7432501 Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements
10/07/2008US7431500 Dynamic exposure control in radiography
10/07/2008US7430931 Microgranulometry and methods of applications
10/02/2008WO2008060667A3 Systems and methods for determining an atomic number of a substance
10/02/2008WO2008036135A3 Crystal structure of crig and c3b: crig complex
10/02/2008US20080242557 System For Detecting Molecular Interactions
10/02/2008US20080240342 Advanced Csct Detector Shapes
10/02/2008US20080240341 Hybrid energy discriminating charge integrating ct detector
10/02/2008US20080240340 Method for scattered radiation correction in x-ray imaging devices
10/02/2008US20080240329 Detecting special nuclear materials in suspect containers using high-energy gamma rays emitted by fission products
10/02/2008US20080237508 Radiation image detection apparatus, residual charge amount estimation method for use with the apparatus and program therefor
10/02/2008US20080237507 Radiation image recording system
10/02/2008US20080237506 Integrated Puf
10/02/2008US20080237505 Method and System for Image Processing for Profiling with Uncoded Structured Light
10/02/2008US20080237486 Substrate Handling Device for a Charged Particle Beam System
10/02/2008US20080237465 Scanning electron microscope
10/02/2008US20080237463 Monochromator and scanning electron microscope using the same
10/02/2008US20080237462 Semiconductor Testing Method and Semiconductor Tester
10/02/2008US20080237460 Method for maskless particle-beam exposure
10/02/2008US20080237456 Method And Apparatus For Observing A Specimen
10/02/2008DE102007013569A1 Detection substrate for use with detector modules for computer tomography equipment, has multiple detector elements and wiring substrate, where wiring substrate has unit for shielding of radiation
10/01/2008EP1973469A2 Method and apparatus for low dose computed tomography
10/01/2008CN201126429Y Portable soil heavy metal analyzer
10/01/2008CN201126428Y Automatic board-pasting apparatus for making board
10/01/2008CN101278360A Monochromatic x-ray micro beam for trace element mapping
10/01/2008CN100421624C X-ray diagnostic apparatus
09/2008
09/30/2008US7430277 Optical device for X-ray applications
09/30/2008US7430276 Low dose X-ray mammography method
09/30/2008US7430275 Method and apparatus for measuring the diameter of a steel reinforcement rod in concrete
09/30/2008US7430274 XRF analyzer
09/30/2008US7430273 Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities
09/30/2008US7430271 Ray tracing kernel
09/30/2008US7430052 Method for correlating the line width roughness of gratings and method for measurement
09/30/2008US7429732 Scanning probe microscopy method and apparatus utilizing sample pitch
09/30/2008CA2583557A1 User interface for use in security screening providing image enhancement capabilities and apparatus for implementing same
09/25/2008WO2008114684A1 Energy analyzer, 2-dimensional display type energy analyzer, and photoelectron microscope
09/25/2008US20080234942 Analyzing Body Tissue
09/25/2008US20080232551 X-Ray Manipulator
09/25/2008US20080232546 Method for scattered radiation correction in x-ray imaging, and x-ray imaging system for this purpose
09/25/2008US20080232545 Tomosynthesis imaging system and method
09/25/2008US20080232542 Dynamic Dose Control For Computed Tomography
09/25/2008US20080232541 Ct scan security check device and method
09/25/2008US20080230716 Dna biosensor and methods for making and using the same
09/25/2008US20080230697 Charged particle beam apparatus
09/25/2008US20080230696 Surface treatment and surface scanning
09/25/2008US20080230695 Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object
09/25/2008US20080230694 Beam Optical Component Having a Charged Particle Lens
09/25/2008DE102007013567A1 Detector module for computer tomography equipment, has printed board that carries electronic element, where electronic element is brought in between lower surface of wiring substrate and printed board
09/25/2008DE102005056829B4 Kristallmonochromator für Röntgenanalysengeräte und Verfahren zur schnellen Einstellung der Rocking-Kurve von Kristallmonochromatoren Crystal monochromator for X-ray analysis apparatus and method for rapid adjustment of the rocking curve of Kristallmonochromatoren
09/24/2008EP1972932A1 Security gate system and security gate control method
09/24/2008EP1971851A1 Artifact suppression
09/24/2008EP1971850A2 Displaced-ray ct inspection
09/24/2008EP1053659B1 An x-ray examination apparatus having an object absorption dependent brightness control
09/24/2008CN201123168Y Cured high-frequency high voltage power supply
09/24/2008CN201122146Y Scanning electron microscope example bench
09/24/2008CN201122138Y Example holder for pressing X-ray fluorescence analysis test sample wafer
09/24/2008CN201122096Y Example bench for viewing silicon slice example section
09/24/2008CN101271075A CT scanning safety inspection method and device thereof
09/24/2008CN101271074A Method for detecting air-out pollution constituent of non-metal material for space application
09/24/2008CN100420937C Method for monitoring positioning of vehicle radioactive substance and its device
09/23/2008US7428294 Method for recording an X-ray image, and X-ray detector
09/23/2008US7428293 Fluorescent X-ray analysis apparatus
09/23/2008US7428292 Method and system for CT imaging using multi-spot emission sources
09/23/2008US7428291 Operating method for an X-ray apparatus, operating method for a computer, and items corresponding to said operating methods
09/23/2008US7427757 Large collection angle x-ray monochromators for electron probe microanalysis
09/23/2008US7427756 Method of precision measurements of sizes and line width roughness of small objects in accordance with their images obtained in scanning electron microscope
09/23/2008US7427755 Integrated electron beam tip and sample heating device for a scanning tunneling microscope
09/23/2008US7427754 Telegraph signal microscopy device and method
09/23/2008CA2551844C Method and system for mitigating threats and hoaxes perpetrated through a mail system
09/21/2008CA2625549A1 Systems and methods for material authentication
09/18/2008WO2008112950A1 Small spot and high energy resolution xrf system for valence state determination
09/18/2008WO2008111522A1 X-ray inspection device and production system
09/18/2008WO2008110667A1 Web measurement
09/18/2008WO2008110017A1 Systems and methods for monitoring wood product characteristics
09/18/2008US20080226743 Glass filters; anticancer agents
09/18/2008US20080226028 Method and apparatus for automated, digital, radiographic inspection of aerospace parts
09/18/2008US20080226026 BUILDUP-ROBUST DENSITY, LEVEL AND INTERFACE MEASUREMENT WITH y-BACKSCATTERING
09/18/2008US20080226025 Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker
09/18/2008US20080226019 Multiple Scatter Correction
09/18/2008US20080226017 Data Handling and Analysis in Computed Tomography With Multiple Energy Windows
09/18/2008US20080224922 Device and method for resonant high-speed microscopic impedance probe
09/18/2008US20080224374 Sample holding mechanism and sample working/observing apparatus
09/18/2008US20080224198 Apparatus for working and observing samples and method of working and observing cross sections
09/18/2008US20080224071 Inspection apparatus
09/18/2008US20080224066 Modular, High Volume, High Pressure Liquid Disinfection Using Uv Radiation
09/18/2008US20080224040 Image Forming Method and Electron Microscope
09/18/2008US20080224039 Scanning electron microscope with length measurement function and dimension length measurement method
09/18/2008US20080224037 Charged Particle Beam Device
09/18/2008US20080224036 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures
09/18/2008US20080224035 Pattern displacement measuring method and pattern measuring device
09/18/2008US20080222881 Method of producing active material for lithium secondary battery, method of producing electrode for lithium secondary battery, method of producing lithium secondary battery, and method of monitoring quality of active material for lithium secondary battery