Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
09/2008
09/18/2008DE19854550B4 Resonatorgehäuse für Mikrowellen Resonator for microwave
09/18/2008DE102007012362A1 Röntgengerät X-ray machine
09/18/2008DE102006062319B4 Verfahren zur Reduktion von streustrahlungsbedingten Artefakten in rekonstruierten CT-Bilddaten und Röntgen-CT-System mit Recheneinheit zur Durchführung dieses Verfahrens A method of reducing stray radiation-induced artifacts in the reconstructed CT image data and X-ray CT system with computing unit for implementing this method
09/18/2008DE102005009817B4 Lochmaske für einen Röntgenstrahlendetektor, Computertomographiegerät, aufweisend eine Lochmaske und Verfahren zur Justierung einer Lochmaske Shadow mask for an X-ray detector computed tomography apparatus comprising a shadow mask and method for aligning a shadow mask
09/17/2008EP1970934A2 X-ray examination apparatus and X-ray examination method using the same
09/17/2008EP1970702A1 Detection of an element in a flow
09/17/2008EP1970701A2 X-Ray examination method and X-ray examination apparatus
09/17/2008EP1970700A1 A system and dodging method for imaging and detecting a moving object
09/17/2008EP1969357A1 Measurement of ash composition using scanning high voltage x-ray sensor
09/17/2008EP1969356A1 X-ray tomography inspection systems
09/17/2008EP1969339A1 Nickel flux composition
09/17/2008EP1609165B1 Ion beam incident angle detector for ion implant systems
09/17/2008EP1474033B1 Optical projection imaging system and method for automatically detecting cells
09/17/2008CN201116907Y Gold spraying instrument sample bench
09/17/2008CN101267506A Radiation imaging apparatus, and method and program for controlling radiation imaging apparatus
09/17/2008CN101266909A Information acquisition apparatus, cross section evaluating apparatus and cross section evaluating method
09/17/2008CN101266218A X-ray examination apparatus and X-ray examination method using the same
09/17/2008CN101266217A X-ray examination method and X-ray examination apparatus
09/17/2008CN101266216A Method for calibrating dual-energy CT system and image rebuilding method
09/16/2008US7426256 Motion-corrected three-dimensional volume imaging method
09/16/2008US7425704 Inspection method and apparatus using an electron beam
09/16/2008US7425703 Electron beam apparatus, a device manufacturing method using the same apparatus, a pattern evaluation method, a device manufacturing method using the same method, and a resist pattern or processed wafer evaluation method
09/16/2008US7425702 Charged particle beam apparatus
09/16/2008US7425698 Feedback influenced increased-quality-factor scanning probe microscope
09/16/2008US7425694 Time-resolved measurement apparatus
09/16/2008CA2550158C Apparatus for measuring absorbed power
09/12/2008WO2008109875A1 Pulsed laser atom probe and associated methods
09/12/2008WO2008107181A1 Detection of an element in a flow
09/12/2008WO2008107108A1 X-ray analysis instrument
09/12/2008WO2008091371A3 Apparatus and method for combined micro-scale and nano-scale c-v,q-v, and i-v testing of semiconductor materials
09/12/2008WO2008060327A3 Method of determining the power transfer of a nuclear component with a layer of material placed upon a heating surface of the component
09/11/2008US20080220441 Advanced drug development and manufacturing
09/11/2008US20080219804 Container crane apparatus and method for container security screening during direct transshipment between transportation modes
09/11/2008US20080219412 Methods and Devices for Quantitative Analysis of X-Ray Images
09/11/2008US20080219408 Methods and systems for the directing and energy filtering of x-rays for non-intrusive inspection
09/11/2008US20080219404 Method and Apparatus to Facilitate Formation of a Two-Dimensional Image Using X-Ray Fan Beam Scatter
09/11/2008US20080219403 Computed Tomography Facilitation Method and Apparatus
09/11/2008US20080217561 Phantom for ion range detection
09/11/2008US20080217559 Computed Tomography Measuring Arrangement and Method
09/11/2008US20080217535 Method of forming a sample image and charged particle beam apparatus
09/11/2008US20080217534 Scanning Electron Microscope
09/11/2008US20080217533 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
09/11/2008US20080217532 Method and apparatus for setting sample observation condition, and method and apparatus for sample observation
09/11/2008US20080217531 Integrated deflectors for beam alignment and blanking in charged particle columns
09/11/2008US20080217530 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
09/11/2008US20080217529 Method for adjusting imaging magnification and charged particle beam apparatus
09/11/2008DE102007014829B3 Verfahren zur Streustrahlungskorrektur in bildgebenden Röntgengeräten sowie Röntgenbildgebungssystem A method for scatter correction in x-ray imaging devices as well as X-ray imaging system
09/10/2008EP1735798A4 Breathing synchronized computed tomography image acquisition
09/10/2008EP1634303B1 Anti-scattering x-ray collimator for ct scanners
09/10/2008EP1244903B1 Methods and apparatus for determining mineral components in sheet material
09/10/2008CN101261265A Cement concrete road surface void identification and high polymer grouting rapid servicing technology
09/10/2008CN101261264A Semi-rigid base layer disease detection and high polymer grouting rapid servicing technology
09/10/2008CN101261263A Roadbed defect recognition and high polymer grouting rapid reinforcement technology
09/10/2008CN101261236A Crude oil gas fraction and moisture percentage dual energy gamma ray measurement method
09/10/2008CN101261235A Crude oil gas fraction and moisture percentage dual energy x ray measurement method
09/10/2008CN101261206A Material nanometer dynamic performance test two freedom degree loading unit
09/10/2008CN101259022A Radiography apparatus
09/09/2008US7424173 Method, apparatus and program for restoring phase information
09/09/2008US7424094 Gamma radiation imaging system for non-destructive inspection of the luggage
09/09/2008US7424093 Fluorescent x-ray analysis apparatus
09/09/2008US7424092 Fluorescent X-ray spectroscopic apparatus
09/09/2008US7423267 Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
09/09/2008US7423266 Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus
09/04/2008WO2008106090A2 Xrf analyzer
09/04/2008WO2008030212A3 Miniature neutron generator for active nuclear materials detection
09/04/2008US20080215274 Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
09/04/2008US20080212859 Calibration Image Alignment in a Pet-Ct System
09/04/2008US20080212739 X-ray analysis apparatus and x-ray analysis method
09/04/2008US20080212736 Element Analysis Device
09/04/2008US20080210884 Device for Irradiating Liquids with Uv Radiation in a Throughflow
09/04/2008US20080210868 Transmission electron microscope
09/04/2008US20080210867 Scanning Electron Microscope and Calibration of Image Distortion
09/04/2008US20080210866 Motioning Equipment for Electron Column
09/04/2008US20080210865 Pattern Measuring Method and Electron Microscope
09/04/2008DE202008008455U1 Probenträger für die Röntgen-Pulverdiffraktometrie Sample holder for the X-ray powder
09/04/2008DE202007005656U1 Vorrichtung zum Messen der Feuchtigkeit eines Materials, vorzugsweise eines Materialstroms Apparatus for measuring the moisture of a material, preferably a material flow
09/04/2008DE102005027436B4 Verfahren zur Berechnung von absorberspezifischen Gewichtungskoeffizienten und Verfahren zur Verbesserung eines von einem Absorber abhängigen Kontrast-zu-Rausch-Verhältnisses in einem von einer Röntgeneinrichtung erzeugten Röntgenbild eines zu untersuchenden Objektes Method for calculating absorber-specific weighting coefficients and method for improving a dependent of an absorber contrast-to-noise ratio in a generated from an X-ray image of a device under test object
09/03/2008EP1964132A2 Anti-scatter grid for an x-ray device
09/03/2008EP1963863A2 Method for localizing labels in a sample
09/03/2008EP1963845A2 Single-point measurement of high-z additives in sheets
09/03/2008CN101257851A Interferometer for quantative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
09/03/2008CN101256170A Method for verification of laminated board dressing type container
09/03/2008CN101256160A X-ray diffraction equipment for x-ray scattering
09/03/2008CN101256159A System for acquisition and processing of x-ray diffraction data
09/03/2008CN101256158A XANES diagnosis method for galactophore knubble tissue
09/03/2008CN100416707C Anti-scattering X-ray collimator for CT scanners
09/03/2008CN100415173C Scatter measurement method, scatter correction method, and x-ray CT apparatus
09/02/2008US7421109 Pattern inspection apparatus
09/02/2008US7421062 X-ray CT apparatus and data detecting method of X-ray CT apparatus
09/02/2008US7421060 Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate
09/02/2008US7420379 Semiconductor device test method and semiconductor device tester
09/02/2008US7420190 Length measurement pattern, semiconductor device, and method of manufacturing a semiconductor device
09/02/2008US7420181 Liquid metal ion gun
09/02/2008US7420175 Explosives detection by directional fast neutron beams scan with associated particles
09/02/2008US7420174 Nondestructive inspection device and crane equipped with nondestructive inspection device
09/02/2008US7420168 Scanning electron microscope and CD measurement calibration standard specimen
09/02/2008US7420167 Apparatus and method for electron beam inspection with projection electron microscopy
09/02/2008US7420166 Real-time S-parameter imager
09/02/2008US7420165 Method of determining the power transfer of nuclear component with a layer of material placed upon a heating surface of the component
09/02/2008US7420163 Determining layer thickness using photoelectron spectroscopy