Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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12/18/2008 | US20080310586 Apparatus and method for providing a shielding means for an x-ray detection system |
12/18/2008 | US20080310580 Nuclear medical diagnosis apparatus |
12/18/2008 | US20080308731 Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection Method, and Method of Fabricating Specimen Holder |
12/18/2008 | US20080308730 Real-Time, 3D, Non-Linear Microscope Measuring System and Method for Application of the Same |
12/18/2008 | US20080308729 Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former |
12/18/2008 | US20080308728 Atom Probes, Atom Probe Specimens, and Associated Methods |
12/18/2008 | US20080308726 Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System |
12/18/2008 | US20080308725 Semiconductor device inspection apparatus |
12/18/2008 | US20080307902 Method for Defining Element Content and/or Mineral Content |
12/18/2008 | US20080307866 Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus |
12/18/2008 | DE102007026895A1 Method for analysis of measuring signal consisting of individual signal values, particularly measuring signal of medical picture detector, involves capturing measuring signal with multiple channels exhibiting detector |
12/18/2008 | DE102007026115A1 Verfahren zum Erzeugen einer 3D-Rekonstruktion eines Körpers A method of generating a 3D reconstruction of a body |
12/17/2008 | EP2002246A1 Extended electron tomography |
12/17/2008 | EP1495312A4 Sample surface inspection apparatus and method |
12/17/2008 | EP1053551B1 Wavelength dispersive x-ray spectrometer with x-ray collimator optic for increased sensitivity over a wide x-ray energy range |
12/17/2008 | CN201166621Y Apparatus for expeling air blister by spinning-shaking fused sample |
12/17/2008 | CN101326591A Anti-scatter grid for an x-ray device with non-uniform distance and/or width of the lamellae |
12/17/2008 | CN101326437A Displaced-ray CT inspection |
12/17/2008 | CN101324537A Abnormal detection system and method of coaxial cable, and processing apparatus equipped with the abnormal detection system |
12/17/2008 | CN100443054C X-ray computed tomographic equipment |
12/17/2008 | CN100443050C Rotational angiography based hybrid 3D reconstruction of coronary arterial structure |
12/16/2008 | USRE40607 Methods and apparatus for scout-based cardiac calcification scoring |
12/16/2008 | US7466798 Digital X-ray camera for quality evaluation three-dimensional topographic reconstruction of single crystals of biological macromolecules |
12/16/2008 | US7466794 Multi-channel data transmission system for computer tomographs |
12/16/2008 | US7466793 Distinct incident energy spectra detection |
12/16/2008 | US7465949 Device for reading out X-ray information stored in a phosphor layer |
12/16/2008 | US7465945 Method and apparatus for processing a micro sample |
12/16/2008 | US7465923 Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test |
12/16/2008 | US7465922 Accelerating electrostatic lens gun for high-speed electron beam inspection |
12/16/2008 | US7465549 incubating SV2 protein or fragment with levetiracetam or an analog or derivative thereof and a potential binding partner and determining if the potential binding partner modulates the binding of levetiracetam to the SV2 protein |
12/11/2008 | WO2008150336A2 A portable/mobile fissible material detector and methods for making and using same |
12/11/2008 | WO2008149078A1 Detection of x-ray scattering |
12/11/2008 | WO2008148228A1 Device and method for the non-destructive testing of objects |
12/11/2008 | WO2008148225A1 Device and method for the non-destructive testing of objects |
12/11/2008 | US20080304622 X-Ray Tomography Inspection Systems |
12/11/2008 | US20080304619 Modular Multi-Hole Collimators Method and System |
12/11/2008 | US20080302973 Apparatus for Monitoring an Item for Radioactive Material on or Associated with the Item |
12/11/2008 | US20080302968 Charged particle detector and detecting apparatus utilizing the same |
12/11/2008 | US20080302965 Electron Interferometer or Electron Microscope |
12/11/2008 | US20080302964 Method and apparatus for inspecting integrated circuit pattern |
12/11/2008 | US20080302963 Sheet beam-type testing apparatus |
12/11/2008 | US20080302962 Charged particle beam apparatus |
12/11/2008 | US20080302961 Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope |
12/11/2008 | DE102007025448A1 X-ray detection system for capturing x-ray photographs of test object, has two digital x-ray detectors with partly closed housing |
12/11/2008 | DE102007024156B3 Röntgenabsorptionsgitter X-ray absorption grating |
12/11/2008 | CA2688148A1 A device and method for the non-destructive testing of objects |
12/10/2008 | EP1370851B1 X-ray fluorescence analyzer |
12/10/2008 | CN201160854Y Radiation photography prober camera positioning device |
12/10/2008 | CN101322009A X-ray inspection device |
12/10/2008 | CN101317765A Double-mode imaging system of integral radio nuclide imaging and fluorescence imaging |
12/10/2008 | CN100442044C Neutron interferometer phase recovery method |
12/10/2008 | CN100441145C X-ray imaging device for shadow-reducing angiography |
12/10/2008 | CN100441144C X-ray detector and image pick up and treating method |
12/09/2008 | US7464351 Method enabling a standard CMOS fab to produce an IC to sense three-dimensional information using augmented rules creating mask patterns not otherwise expressible with existing fab rules |
12/09/2008 | US7463721 Secondary collimator for an X-ray scattering device and X-ray scattering device |
12/09/2008 | US7463714 Foreign object detection |
12/09/2008 | US7463712 Scatter correction for x-ray imaging using modulation of primary x-ray spatial spectrum |
12/09/2008 | US7462854 Collimator fabrication |
12/09/2008 | US7462846 Apparatus for measuring a position of an ion beam profiler and a method for its use |
12/09/2008 | US7462842 Device, EUV lithographic device and method for preventing and cleaning contamination on optical elements |
12/09/2008 | US7462830 Method and apparatus for observing inside structures, and specimen holder |
12/09/2008 | US7462828 Inspection method and inspection system using charged particle beam |
12/09/2008 | US7462293 Method and apparatus for measuring electron density of plasma and plasma processing apparatus |
12/04/2008 | WO2008148054A1 Structures of aminoglycoside antibiotics bound to both subunits of the bacterial ribosome |
12/04/2008 | WO2008145449A1 Method and device for measuring the composition of fibrous suspensions |
12/04/2008 | WO2008121820A3 Pulse-to-pulse-switchable multiple-energy linear accelerators based on fast rf power switching |
12/04/2008 | US20080298551 Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device |
12/04/2008 | US20080298547 X-ray inspection apparatus |
12/04/2008 | US20080298546 Cargo container inspection method |
12/04/2008 | US20080298545 Cargo container inspection system and apparatus |
12/04/2008 | US20080298544 Genetic tuning of coefficients in a threat detection system |
12/04/2008 | US20080298539 X-ray ct apparatus and method of controlling the same |
12/04/2008 | US20080298538 System and Method for Laminography Inspection |
12/04/2008 | US20080298537 Planar x-ray tomosynthesis device |
12/04/2008 | US20080296499 Charged Particle Instrument Equipped with Optical Microscope |
12/04/2008 | US20080296497 Method and apparatus for specimen fabrication |
12/04/2008 | US20080296496 Method and apparatus of wafer surface potential regulation |
12/04/2008 | DE102007039000A1 Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper A method for sample preparation of liquid or pasty substances for measuring by X-ray fluorescence and for a suitable specimen |
12/04/2008 | DE102007025710A1 Method for production of fibrous material web, particularly paper or cardboard web, involves measuring portion different solids provided in material suspension by two sensors |
12/04/2008 | DE102007025709A1 Verfahren und Vorrichtung zur Messung der Zusammensetzung von Faserstoffsuspensionen Method and apparatus for measuring the composition of fiber suspensions |
12/03/2008 | EP1997944A1 Method of making mineral wool |
12/03/2008 | EP1996077A1 Dual-source scanning-based detection of ionizing radiation |
12/03/2008 | CN201159789Y Image detection device |
12/03/2008 | CN201159723Y Material performance measurement system for plasma display screen protective film material |
12/03/2008 | CN201159722Y Multifunctional example frame for X-ray diffraction instrument |
12/03/2008 | CN201159721Y Portable thermal value quick ash monitor |
12/03/2008 | CN101315342A Density calibration method of carbon/silicon carbide ceramic matrix composite |
12/03/2008 | CN101315341A System and method for laminography inspection |
12/03/2008 | CN101315340A Processing method for raw wood irradiation quarantine |
12/03/2008 | CN100439905C Method for X ray detection adopting multi-element exposure parameter formula |
12/03/2008 | CN100439397C Crystallization of IGF-1 |
12/03/2008 | CN100439203C Baggage screening system |
12/02/2008 | US7460714 Method and apparatus for measuring dimension using electron microscope |
12/02/2008 | US7460641 X-ray image taking device |
12/02/2008 | US7460639 Nonintrusive inspection method and system |
12/02/2008 | US7460637 High spatial resolution X-ray computed tomography (CT) method and system |
12/02/2008 | US7460635 X-ray CT apparatus, method of controlling the same, and program |
12/02/2008 | US7459714 Image recording carrier |
12/02/2008 | US7459712 Method and apparatus of measuring pattern dimension and controlling semiconductor device process having an error revising unit |
12/02/2008 | US7459699 Method of determining processing position in charged particle beam apparatus, and infrared microscope used in the method |