Patents
Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group  or , e.g. x-rays, neutrons (32,258)
11/2008
11/12/2008CN101303225A Projection rotating center measurement method suitable for 2D-CT scanning system
11/12/2008CN100431496C X-ray computer tomography apparatus
11/11/2008US7450686 Contaminant detector for food inspection
11/11/2008US7450685 X-ray fluorescence spectrometer and program for use therewith
11/11/2008US7450684 Glass recovery method
11/11/2008US7449898 Method and apparatus for reviewing defects by detecting images having voltage contrast
11/11/2008US7449692 Charged particle beam apparatus
11/11/2008US7449691 Detecting apparatus and device manufacturing method
11/11/2008US7449690 Inspection method and inspection apparatus using charged particle beam
11/11/2008US7449682 System and method for depth profiling and characterization of thin films
11/06/2008WO2008134757A1 Method and apparatus for shadow aperture backscatter radiography (sabr) system and protocol
11/06/2008WO2008133765A2 Ct scanning and contraband detection
11/06/2008WO2008133424A1 A detector module with pixelated scintillators for radiation imaging and the manufacturing method thereof
11/06/2008WO2008132845A1 Nondestructive identification method and nondestructive identification device
11/06/2008WO2008131825A1 X-ray apparatus and detection unit for an x-ray apparatus
11/06/2008US20080273662 CD-GISAXS System and Method
11/06/2008US20080273651 Methods and apparatus for reducing artifacts in computed tomography images
11/06/2008US20080272392 Nondestructively evaluated by X ray diffraction; quantitatively defining quality of surface layer; epitaxially grown; light emitting devices
11/06/2008US20080272301 Micro-protruding structure
11/06/2008US20080272300 Charged particle beam apparatus
11/06/2008US20080272299 Probe System Comprising an Electric-Field-Aligned Probe Tip and Method for Fabricating the Same
11/06/2008US20080272298 Inspection Equipment for Fine Pattern and Morphology Using Microcolumn
11/06/2008US20080272297 Scanning electron microscope and CD measurement calibration standard specimen
11/06/2008US20080272296 Data Processing Device, Tomography Apparatus for Examination of an Object of Interest, Method of Examining an Object of Interest, Computer-Readable Medium and Program Element
11/06/2008US20080271667 Nitride crystal, nitride crystal substrate, epilayer-containing nitride crystal substrate, semiconductor device and method of manufacturing the same
11/06/2008DE102007020642A1 Röntgengerät sowie Sensoreinheit für ein Röntgengerät X-ray machine and sensor unit for an X-ray machine
11/05/2008EP1988564A1 X-ray source, and fluorescent x-ray analyzing device
11/05/2008EP1987523A2 Process and apparatus for imaging
11/05/2008CN201145675Y CT flaw detection equipment for industry
11/05/2008CN201145674Y Radiation imaging detector
11/05/2008CN201145673Y Detector apparatus and CT checking system with the same
11/05/2008CN201145672Y Checking system, CT apparatus and detecting device
11/05/2008CN201145662Y Scanning electron microscope sample platform
11/05/2008CN101300480A Scanning probe microscopy method and apparatus utilizing sample pitch
11/05/2008CN101300345A 聚集蛋白聚糖酶结构 Aggrecanase structure
11/05/2008CN101299041A Method for quickly predicting rattan cane anatomical property
11/05/2008CN100430022C Method and apparatus for detection of ionizing radiation
11/04/2008US7446332 Radiation image read-out apparatus and radiation image convertor panel
11/04/2008US7446331 Apparatus for scanning stimulable phosphor medium
10/2008
10/30/2008WO2008130450A2 Method and apparatus for inspection of containers
10/30/2008WO2008130325A1 Method and apparatus for reorientated reconstruction of computed tomography images of planar objects
10/30/2008WO2008128978A2 Method and apparatus for dimensionally measuring by means of coordinate measuring instruments
10/30/2008WO2008087368A3 Radioactive isotope identification
10/30/2008US20080270044 Defect Review Apparatus and Method of Reviewing Defects
10/30/2008US20080267353 Energy Discriminating Scatter Imaging System
10/30/2008US20080267350 Integrated carry-on baggage cart and passenger screening station
10/30/2008US20080267349 Particle Therapy
10/30/2008US20080267348 Filter for x-ray radiation, and an arrangement for using filtered x-ray radiation for excitation
10/30/2008US20080267347 X-Ray Tomograph and Stereoradioscopic Image Constructing Equipment
10/30/2008US20080267346 X-Ray Imaging Apparatus and Method
10/30/2008US20080267343 Ct system with synthetic view generation
10/30/2008US20080266825 Electronic component package, electronic component mounted apparatus, method of inspecting bonding portion therein, and circuit board
10/30/2008US20080265251 Structure and method for determining a defect in integrated circuit manufacturing process
10/30/2008US20080265160 Observation Method With Electron Beam
10/30/2008US20080265159 Sample surface inspection apparatus and method
10/30/2008US20080265158 Charged particle beam apparatus
10/30/2008US20080265157 Scanning Ion Probe Systems and Methods of Use Thereof
10/30/2008DE102007018810A1 Verfahren zur Bewegungsüberwachung bei einer medizintechnischen Anlage sowie zugehörige medizintechnische Anlage A method for monitoring movement at a medical facility and related medical facility
10/30/2008DE102005018329B4 Detektormodul für Röntgen- oder Gammastrahlung auf Basis von Wellenleitern Detector module for X-ray or gamma radiation on the basis of waveguides
10/30/2008CA2672536A1 Method and apparatus for inspection of containers
10/29/2008EP1985998A1 Method for inspecting pipes, and radiographic non-destructive inspection apparatus
10/29/2008CN201141981Y Continuous wave Terahertz real-time imaging device
10/29/2008CN201141842Y X-ray direct digital imaging detection system for powder materiel
10/29/2008CN201141821Y Special sample seat for electron back scattering diffraction
10/29/2008CN101296840A An improved cargo container scanning crane
10/29/2008CN101294918A Method for choosing exposure parameter by using X ray exposure equation
10/29/2008CN101294888A Method for confirming preferred generating phase section of biphase stainless steel corrosive pitting
10/29/2008CN101292904A 图像诊断支持系统 Image diagnosis support system
10/28/2008US7444010 Method and apparatus for the reduction of artifacts in computed tomography images
10/28/2008US7443955 X-ray diagnosis apparatus and method for obtaining an X-ray image
10/28/2008US7443952 X-ray diffraction measurement method and X-ray diffraction apparatus
10/28/2008US7443951 Exempt source for an x-ray fluorescence device
10/28/2008US7443950 Mammography apparatus
10/28/2008US7442952 Method for erasing radiation energy remaining in radiation image storage panel
10/28/2008US7442930 Method for correcting distortions in electron backscatter diffraction patterns
10/28/2008US7442929 Scanning electron microscope
10/28/2008US7442924 Repetitive circumferential milling for sample preparation
10/28/2008US7442923 Scanning electron microscope
10/23/2008WO2008127291A2 Advanced drug development and manufacturing
10/23/2008WO2008127074A1 Apparatus for measuring and scanning density inside a dredging pipeline
10/23/2008WO2008126892A1 METHOD FOR DETECTING Br IN RESIN, RESIN FRACTIONATING DEVICE, AND METHOD FOR MANUFACTURING REPRODUCED RESIN ARTICLE
10/23/2008WO2008125596A1 Methods and systems for performing differential radiography
10/23/2008WO2008125450A1 Device for the x-ray analysis of a specimen, comprising an energy/angle-filtering diffraction analyser system
10/23/2008WO2006135586A8 Radiation scanning units with reduced detector requirements
10/23/2008US20080262205 Unphosphorylated glycogen synthase kinase-3-g-beta (GSK) from baculovirus overexpression system; competitive binding; diabetes, Alzheimer's disease
10/23/2008US20080260097 Container Inspection System
10/23/2008US20080260096 Method and Apparatus for Improving Identification and Control of Articles Passing Through a Scanning System
10/23/2008US20080258086 Optical Detector
10/23/2008US20080258076 Medical isotope generator systems
10/23/2008US20080258061 Method and apparatus for automated image analysis of biological specimens
10/23/2008US20080258060 Charged particle beam apparatus and method for operating a charged particle beam apparatus
10/23/2008US20080258059 Scanning Probe Microscope System
10/23/2008US20080258058 Interferometer
10/23/2008US20080258056 Method for stem sample inspection in a charged particle beam instrument
10/23/2008US20080258055 Charged beam apparatus and method that provide charged beam aerial dimensional map
10/23/2008US20080257072 Methods of Separating, Identifying and Dispensing Specimen and Device Therefor, and Analyzing Device Method
10/23/2008US20080257048 Apparatus and method for non-destructive testing
10/22/2008EP1983335A2 A CT scan security check device and method
10/22/2008EP1982214A1 X-ray light valve based digital radiographic imaging systems
10/22/2008EP1982165A1 Non-line of sight reverse engineering for modifications of structures and systems