Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
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05/29/2008 | US20080123815 Systems and methods for controlling an x-ray source |
05/29/2008 | US20080123809 Nonintrusive Inspection Method And System |
05/29/2008 | US20080123808 Detector and method for inspecting a sealed nuclear storage container |
05/29/2008 | US20080123802 Method And Apparatus For Dual Energy Radiography |
05/29/2008 | US20080121812 Uv treatment reactor |
05/29/2008 | US20080121804 Method for inspecting substrate, substrate inspecting system and electron |
05/29/2008 | US20080121803 Charged particle beam apparatus, scanning electron microscope, and sample observation method using the same |
05/29/2008 | US20080121802 Method, computer program and apparatus for the characterization of molecules |
05/29/2008 | US20080121800 Cantilever holder and scanning probe microscope including the same |
05/29/2008 | DE112006001859T5 Verfahren und Gerät zur Erfassung von Strahlungsdaten Method and apparatus for acquiring radiation data |
05/29/2008 | DE10207331B4 Verfahren zum Rekonstruieren eines Tomogramms eines Röntgengeräts A method for reconstructing a tomogram of an X-ray device |
05/29/2008 | DE102007056791A1 Verfahren und System zur CT-Bildgebung mittels Mehrfleck-Strahlungsquellen Method and system for CT imaging using multi-spot radiation sources |
05/29/2008 | DE102007054695A1 Schnittstellenanordnung zur thermischen Kopplung eines Datenerfassungssystems an eine Sensoranordnung An interface assembly for thermally coupling a data acquisition system to a sensor arrangement |
05/29/2008 | DE102006055381A1 Noise reduction method for use during reconstruction of digital images for computer tomography device, involves subjecting intermediate results repeatedly to noise reduction algorithm after equal number of iterations |
05/29/2008 | DE102006055166A1 X-ray device i.e. C-arc X-ray device, for examining bone fractures, has retaining mechanism comprising rotatably supported telescopic arms for supporting support device at retaining mechanism, where length of arms is adjustable |
05/29/2008 | DE102006055165A1 X-ray device for examining object in operation theatre of e.g. clinic, has emitter and/or detector that is arranged at radial limitation proximate to axis and do not project over other radial limitation away from axis |
05/29/2008 | DE10133676B4 Röntgenfluoreszenz-Dickenprüfer X-ray fluorescence thickness tester |
05/29/2008 | CA2670275A1 X-ray system and method for generating x-ray images |
05/29/2008 | CA2668991A1 A method for downhole, non-isotopic generation of neutrons and an apparatus for use when practising the method |
05/28/2008 | EP1925932A1 Vertical/horizontal small-angle x-ray scattering device and measuring method for small-angle x-ray scattering |
05/28/2008 | EP1925000A2 Miniature neutron generator for active nuclear materials detection |
05/28/2008 | EP1924846A2 Atom probes, atom probe specimens, and associated methods |
05/28/2008 | EP1062499B1 X-ray device. |
05/28/2008 | CN201066334Y Analysis and pre-processing device for electronic energy spectrum instrument sample |
05/28/2008 | CN101187733A Controllable terahertz wave attenuator device and its method |
05/28/2008 | CN101187642A Intelligent spectrum X fluorescence falsification preventing method |
05/28/2008 | CN101187641A Method for X ray detection adopting multi-element exposure parameter formula |
05/28/2008 | CN101185575A Cassette type radiation image detector |
05/28/2008 | CN100390922C Evaluation of chamber components having textured coatings |
05/28/2008 | CN100390499C Method and system for representing nondestructivity of film layer |
05/27/2008 | US7379534 X-ray CT image production method and X-ray CT system |
05/27/2008 | US7379530 Method and apparatus for the safe and rapid detection of nuclear devices within containers |
05/27/2008 | US7379529 Methods and devices for quantitative analysis of x-ray images |
05/27/2008 | US7379528 Radiation detector with shielded electronics for computed tomography |
05/27/2008 | US7379527 Methods and apparatus for CT calibration |
05/27/2008 | US7379526 X-ray CT apparatus and X-ray CT imaging method |
05/27/2008 | US7378654 Processing probe |
05/22/2008 | WO2008061224A1 Sample support structure and methods |
05/22/2008 | WO2008061223A2 Enhanced sensitivity of a whispering gallery mode microsphere sensor by a high-refractive index surface layer |
05/22/2008 | WO2008060824A2 Method and system for secure communication in a communication network |
05/22/2008 | WO2008060327A2 Method of determining the power transfer of a nuclear component with a layer of material placed upon a heating surface of the component |
05/22/2008 | WO2008060237A1 Electron rotation camera |
05/22/2008 | WO2008060192A2 A method and a device for measuring multiphase wellstream composition |
05/22/2008 | WO2008058442A1 Virtual grid imaging method for being capable of eliminating the effect of scatter radiation and system thereof |
05/22/2008 | WO2008045115A3 Method for localizing labels in a sample |
05/22/2008 | WO2008017498B1 Device having a directly driven rotating body and aetostatic bearing |
05/22/2008 | WO2007143734A3 User interface for an electron microscope |
05/22/2008 | US20080120051 System and Method for Matching Diffraction Patterns |
05/22/2008 | US20080118037 Method and apparatus for positioning an object with respect to the isocenter of an acquisition system |
05/22/2008 | US20080118026 Contaminant Detector For Food Inspection |
05/22/2008 | US20080116375 Scanning Electron Microscope Having Time Constant Measurement Capability |
05/22/2008 | US20080116374 Ojbect information acquisition apparatus and object information acquisition method |
05/22/2008 | US20080116368 Luminous Body, Electron Beam Detector Using the Same, Scanning Electron Microscope, and Mass Analysis Device |
05/22/2008 | US20080116056 Electromagnetic radiation of varied frequencies |
05/21/2008 | EP1540319B1 Quantitative phase analysis of textured polycrystalline materials |
05/21/2008 | DE102006048426B3 Verfahren zur Bestimmung der Reichweite von Strahlung Method for determining the range of radiation |
05/21/2008 | DE102005036527B4 Röntgen-CT-Prüfanlage sowie CT-Verfahren zur Prüfung von Objekten X-ray CT examination installation, as well as CT method for inspection of objects |
05/21/2008 | CN201063038Y Novel device for detecting and controlling liquid boil |
05/21/2008 | CN201063033Y Continuous on-line detecting device for measuring thermal value of coaly |
05/21/2008 | CN101184518A Radiopharmaceutical pigs and portable powered injectors |
05/21/2008 | CN101183083A X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
05/21/2008 | CN101183082A Ship radiation image-forming detecting system |
05/20/2008 | US7376217 Operating methods for a medical imaging system and for a computing device, and devices corresponding thereto |
05/20/2008 | US7376216 Freight container inspection system |
05/20/2008 | US7376215 Measurement of ash composition using scanning high voltage X-ray sensor |
05/20/2008 | US7376213 CT image reconstruction through employment of function that describes interpreted movement of source around particular point of object |
05/20/2008 | US7375505 Method and apparatus for testing function of active microstructural elements and method for producing microstructural elements using the test method |
05/20/2008 | US7375363 Image forming apparatus and method of transporting same |
05/20/2008 | US7375359 Portable X-ray fluorescence instrument with tapered absorption collar |
05/20/2008 | US7375358 Radiation shield for portable x-ray fluorescence instruments |
05/20/2008 | US7375352 Photomask defect correction method employing a combined device of a focused electron beam device and an atomic force microscope |
05/20/2008 | US7375330 Charged particle beam equipment |
05/20/2008 | US7375329 Scanning electron microscope |
05/20/2008 | US7375328 Charged particle beam apparatus and contamination removal method therefor |
05/20/2008 | US7375327 Method and device for measuring quantity of wear |
05/20/2008 | US7375326 Method and system for focusing a charged particle beam |
05/20/2008 | US7375324 Stylus system for modifying small structures |
05/15/2008 | WO2008037731A3 X-ray system and method for tomosynthetic scanning |
05/15/2008 | WO2008011582A3 Radiation attenuation device |
05/15/2008 | US20080112535 Retrofit digital mammography detector |
05/15/2008 | DE10153379B4 Vorrichtung und Verfahren zur Röntgenprüfung eines Rades Apparatus and method for X-ray examination of a wheel |
05/14/2008 | EP1921435A2 Density measurement with gamma backscattering |
05/14/2008 | EP1920240A1 X-ray fluorescence analysis to determine levels of hazardous substances |
05/14/2008 | CN201060174Y Cramping apparatus for Auger electron energy spectral surface analyzing observe intersecting surface |
05/14/2008 | CN201060173Y Protecting device of welding line digital image-forming fault detection |
05/14/2008 | CN201060172Y X ray flaw detection machine for industry |
05/14/2008 | CN201060154Y Beta-ray smoke smoke concentration direct-reading monitoring instrument |
05/14/2008 | CN201058034Y Apparatus for detecting X¿Cray bulb tube focus performance |
05/14/2008 | CN101178371A Electronic gun power supply for reflected high energy electron diffraction instrument |
05/14/2008 | CN101178370A X-ray computer tomography device |
05/14/2008 | CN101178369A Industry ray detection negative film digitalizer |
05/13/2008 | US7372941 System and method for matching diffraction patterns |
05/13/2008 | US7372938 Detector unit for a computer tomograph |
05/13/2008 | US7372936 Radiation computed tomography apparatus and tomographic image data generating method |
05/13/2008 | US7372050 Method of preventing charging, and apparatus for charged particle beam using the same |
05/13/2008 | US7372029 Scanning transmission electron microscope and scanning transmission electron microscopy |
05/13/2008 | US7372028 Sample electrification measurement method and charged particle beam apparatus |
05/13/2008 | US7372027 Electron beam apparatus and method for manufacturing semiconductor device |
05/13/2008 | US7372025 Scanning probe microscope using a surface drive actuator to position the scanning tip |
05/13/2008 | US7372013 Near field scanning microscope probe and method for fabricating same |