Patents for G01N 23 - Investigating or analysing materials by the use of wave or particle radiation not covered by group or , e.g. x-rays, neutrons (32,258) |
---|
04/01/2009 | EP2043131A2 Minute sample processing method |
04/01/2009 | EP2042860A2 X-ray diffraction apparatus and x-ray diffraction method |
04/01/2009 | EP2042859A2 Low activity nuclear density gauge |
04/01/2009 | EP2041770A1 Method and device for machining workpieces |
04/01/2009 | EP2041558A1 Method for obtaining and analyzing solids, preferably crystals |
04/01/2009 | EP2041557A1 Improved target composition determination method and apparatus |
04/01/2009 | EP2040809A2 Microfluidic device for crystallization and chrystallographic analysis of molecules |
04/01/2009 | EP1102061B1 Combinatorial x-ray diffractor |
04/01/2009 | CN201215549Y Angle indicating device for directed X ray flaw detection machine |
04/01/2009 | CN201215548Y Lead board arranging device |
04/01/2009 | CN101400992A X-ray tomography inspection systems |
04/01/2009 | CN101400991A Method to reduce cross talk in a multi column e-beam test system |
04/01/2009 | CN101398609A Radiation photograph detector light path system |
04/01/2009 | CN101398398A X-ray computed tomographic apparatus |
04/01/2009 | CN101398397A CT imaging method of multitime scanning mode |
04/01/2009 | CN101396272A Method for creating material-selective volume images |
04/01/2009 | CN100473981C X-ray absorption spectrum detector for chemical valence state research and method thereof |
04/01/2009 | CN100473974C Time-resolved measurement apparatus |
04/01/2009 | CN100473347C X-ray CT system |
04/01/2009 | CN100473346C Ct gantry balance system and method |
04/01/2009 | CN100473345C Duel function CT scan |
03/31/2009 | US7512213 Multiple-view-angle cargo security inspection method and system |
03/31/2009 | US7512212 Multi-array detector module structure for radiation imaging |
03/31/2009 | US7511286 Image-based flat panel alignment |
03/31/2009 | US7511281 Ultraviolet light treatment chamber |
03/31/2009 | US7511272 Method for controlling charged particle beam, and charged particle beam apparatus |
03/31/2009 | US7511269 Method of approaching probe and apparatus for realizing the same |
03/31/2009 | CA2616739C Radiographic camera |
03/26/2009 | WO2009039342A2 X-ray inspection of solder reflow in high-density printed circuit board applications |
03/26/2009 | WO2009038526A1 Method for creating, displaying, and analyzing x-ray images and apparatus implementing the method |
03/26/2009 | WO2009036983A1 Method for determining a corrective value of a position of the focal spot of an x-ray source in a measuring array, and measuring array for generating radiographs |
03/26/2009 | WO2009012200A3 Object identification in dual energy contrast-enhanced ct images |
03/26/2009 | WO2008100914A3 Small spot x-ray fluorescence (xrf) analyzer |
03/26/2009 | US20090080613 Arrangement for the taking of X-ray scatter images and/or gamma ray scatter images |
03/26/2009 | US20090080611 Computer Controllable LED Light Source for Device for Inspecting Microscopic Objects |
03/26/2009 | US20090080609 Digital radiation image imaging system |
03/26/2009 | US20090080608 Method and apparatus for measuring long bone density of small-animals |
03/26/2009 | US20090080607 Device and process for fat analysis |
03/26/2009 | US20090078893 Image reading apparatus |
03/26/2009 | US20090078892 Computed radiography system and method for manufacturing the same |
03/26/2009 | US20090078884 Automatic radioactivity analyzer of mixed liquid beta emitter |
03/26/2009 | US20090078869 Magnetic electron microscope |
03/26/2009 | US20090078868 Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope |
03/25/2009 | EP2039883A2 Methods for repairing gas turbine engine components |
03/25/2009 | EP2038642A2 Arrangement for producing electromagnetic radiation and method for operating said arrangement |
03/25/2009 | EP2038641A1 X-ray interferometer for phase contrast imaging |
03/25/2009 | EP1381851B1 High spatial resolution X-ray microanalysis in a particle-optical apparatus |
03/25/2009 | EP1324699B1 Cardiac helical half scan reconstructions for multiple detector row ct |
03/25/2009 | CN101393146A Method and sensor for detecting nucleic acid on-site damage by photoelectrochemistry |
03/25/2009 | CN101393145A Cone beam double-helix CT Scanning and imaging method for large sized object |
03/25/2009 | CN101393144A Multi-point diffusion type alpha energy spectrum cumulated soil radon measuring method |
03/25/2009 | CN100472206C Method for detecting foreign body in food |
03/25/2009 | CN100471453C Radiographic imaging apparatus, control method thereof, and radiographic imaging system |
03/24/2009 | US7508914 Radiology device |
03/24/2009 | US7508910 System and methods for x-ray backscatter reverse engineering of structures |
03/24/2009 | US7508909 Apparatus and method for inspecting a sealed container |
03/24/2009 | US7508908 CT method and apparatus for liquid safety-detection with a radiation source |
03/24/2009 | US7508907 X-ray analysis apparatus |
03/24/2009 | US7508906 Filter for X-ray radiation, and an arrangement for using filtered X-ray radiation for excitation |
03/24/2009 | US7508904 X-ray CT apparatus |
03/24/2009 | US7508903 Collimator control method and X-ray CT apparatus |
03/24/2009 | US7508500 Characterizing organic materials in a thin film |
03/24/2009 | US7507984 Storage phosphor layer and system and method for erasing same |
03/24/2009 | US7507983 Radiation image information reading apparatus |
03/24/2009 | US7507968 Systems and methods for correcting a positron emission tomography emission image |
03/24/2009 | US7507958 Conductive carbon nanotube tip, probe having the conductive carbon nanotube tip, and method of manufacturing the conductive carbon nanotube tip |
03/24/2009 | US7507957 Probe microscope system suitable for observing sample of long body |
03/24/2009 | US7507956 Charged particle beam energy width reduction system for charged particle beam system |
03/24/2009 | US7507027 Method and apparatus for positioning an object with respect to the isocenter of an acquisition system |
03/24/2009 | US7507026 Systems, methods and devices for x-ray device focal spot control |
03/19/2009 | WO2009035958A2 Low temperature bonding electronic adhesives |
03/19/2009 | WO2009035895A2 Non-intrusive method to identify presence of nuclear materials using energetic prompt neutrons from neutron-induced fission |
03/19/2009 | WO2009035841A1 Determining dopant information by use of a helium ion microscope |
03/19/2009 | WO2009035208A1 Moon grid for transmission electron microscopy tomography and method of fabricating the same |
03/19/2009 | WO2009034968A1 X-ray inspection system |
03/19/2009 | WO2009033363A1 Detecting container |
03/19/2009 | US20090077696 Methods, Systems and Computer Program Products for Measuring Critical Dimensions of Fine Patterns Using Scanning Electron Microscope Pictures and Secondary Electron Signal Profiles |
03/19/2009 | US20090075325 Systems and methods for analyzing agricultural products |
03/19/2009 | US20090074142 Use of nearly monochromatic and tunable photon sources with nuclear resonance fluorescence in non-intrusive inspection of containers for material detection and imaging |
03/19/2009 | US20090074141 Automated selection of x-ray reflectometry measurement locations |
03/19/2009 | US20090074139 Method and an apparatus for detecting and localizing a metabolic marker |
03/19/2009 | US20090074138 Portable control station for the inspection of people and luggage |
03/19/2009 | US20090074137 Accurate measurement of layer dimensions using xrf |
03/19/2009 | US20090074134 Linear accelerator with wide bore CT scanner |
03/19/2009 | US20090072171 Systems and methods for volumetric tissue scanning microscopy |
03/19/2009 | US20090072139 Substrate inspection apparatus, substrate inspection method and method of manufacturing semiconductor device |
03/19/2009 | US20090072138 Test Apparatus |
03/19/2009 | US20090072137 Nanowire electron scattering spectroscopy |
03/19/2009 | DE102007043799A1 Charged particles e.g. positively charged ions, detection method for impulse spectrometer, involves accelerating removed particles in section-wise for time intervals towards detector such that particles are detected in detector |
03/18/2009 | EP2037260A1 Secondary ion mass spectrometry method and imaging method |
03/18/2009 | EP2035817A1 Method and apparatus for computed tomography |
03/18/2009 | EP2035816A1 Radiographic calibration |
03/18/2009 | EP1867949B1 Method of measuring film thickness of surface oxide film of zinc-based plated steel sheet |
03/18/2009 | CN101390186A Aberration-correcting cathode lens microscopy instrument |
03/18/2009 | CN101389951A Measurement of ash composition using scanning high voltage x-ray sensor |
03/18/2009 | CN101387611A Translational pipe CT detection device and detection method thereof |
03/18/2009 | CN101387610A Double source double energy straight-line type safety inspection CT apparatus and inspection method thereof |
03/18/2009 | CN101386933A Neutron diffraction sample chamber |
03/18/2009 | CN101385650A Computed tomography system and apparatus |
03/18/2009 | CN100470750C Substrate testing method, manufacturing method of semiconductor device and substrate testing apparatus |