| Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
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| 06/05/2002 | EP1210564A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus |
| 05/30/2002 | US20020063867 Method for the interferometric measurement of non-rotationally symmetric wavefront errors |
| 05/29/2002 | DE10058650A1 Verfahren zur interferometrischen Messung von nichtrotationssymmetrischen Wellenfrontfehlern Method for interferometric measurement of non-rotationally symmetric wavefront errors |
| 05/28/2002 | US6396588 Hybrid curvature-tilt wave front sensor |
| 05/28/2002 | US6396582 Wavelength reference for laser |
| 05/28/2002 | US6396574 Apparatus for measuring the wavelength, optical power and optical signal-to-noise ratio of each optical signal in wavelength-division multiplexing optical communication |
| 05/23/2002 | WO2002040952A1 Laser wavelength meter |
| 05/23/2002 | US20020061039 Wavelength stabilization monitor and method for adjusting the working wavelength of said monitor |
| 05/22/2002 | CN1350165A Planar crystal spectrometer capable of calibrating wave length of spectral line directly |
| 05/21/2002 | US6392746 Electronic fiberoptic power and wavelength measuring instrument |
| 05/16/2002 | WO2001098012A3 FOUR KHz GAS DISCHARGE LASER |
| 05/16/2002 | WO2001036901A9 Systems and methods for quantifying nonlinearities in interferometry systems |
| 05/15/2002 | EP1123491B1 Wavefront sensing device |
| 05/15/2002 | CN1349392A High resolution device for observing a body |
| 05/10/2002 | WO2001028409A9 Rapid, automatic measurement of the eye's wave aberration |
| 05/09/2002 | US20020054734 Wavelength monitor apparatus and wavelength stabilizing light source |
| 05/09/2002 | CA2351998A1 Wavelength monitor apparatus and wavelength stabilizing light source |
| 05/08/2002 | EP1203926A1 An anisotropy analyzing method and an anisotropy analyzing apparatus |
| 05/07/2002 | US6382793 Method and apparatus for measuring a wavefront |
| 05/02/2002 | WO2001004590A9 Sub-lens spatial resolution shack-hartmann wavefront sensing |
| 05/02/2002 | EP1200797A1 Apparatus and method for the non-destructive testing of articles using optical metrology |
| 05/02/2002 | EP1200796A1 Birefringement interferometer |
| 05/02/2002 | EP0852715B1 Integrated optic interferometric sensor |
| 04/30/2002 | US6380531 Wavelength tunable narrow linewidth resonant cavity light detectors |
| 04/30/2002 | US6379984 High-precision etalon device and method of construction |
| 04/30/2002 | US6379005 Method and apparatus for improving vision and the resolution of retinal images |
| 04/25/2002 | WO2002033346A1 Interferometric sensor and method to detect optical fields |
| 04/25/2002 | US20020048294 Wavemeter for gas discharge laser |
| 04/25/2002 | US20020048024 Anisotropy analyzing method and an anisotropy analyzing apparatus |
| 04/23/2002 | US6377349 Arrangement for spectral interferometric optical tomography and surface profile measurement |
| 04/23/2002 | US6376819 Sub-lens spatial resolution Shack-Hartmann wavefront sensing |
| 04/18/2002 | WO2002031932A1 Very narrow band, two chamber, high rep rate gas discharge laser system |
| 04/18/2002 | WO2002031452A1 Temporally resolved wavelength measurement method and apparatus |
| 04/18/2002 | US20020044586 Very narrow band, two chamber, high rep rate gas discharge laser system |
| 04/18/2002 | US20020044280 Temporally resolved wavelength measurement method and apparatus |
| 04/11/2002 | WO2002028272A1 Method and apparatus for measuring wavefront aberrations |
| 04/10/2002 | EP1195927A2 System and method for optical heterodyne detection of an optical signal including optical preselection that is adjusted to accurately track a local oscillator signal |
| 04/10/2002 | EP1194755A1 Sub-lens spatial resolution shack-hartmann wavefront sensing |
| 04/10/2002 | EP1194732A1 Gas insensitive interferometric apparatus and methods |
| 04/10/2002 | EP0619021B1 Current sensor |
| 04/09/2002 | US6370169 Method and apparatus for controlling optical wavelength based on optical frequency pulling |
| 04/09/2002 | US6369932 System and method for recovering phase information of a wave front |
| 04/03/2002 | EP1193483A2 Method and system for optical heterodyne detection of an optical signal |
| 04/03/2002 | EP1193466A2 Interferometric device to superpose at least two lightwaves |
| 04/03/2002 | EP1192433A1 Apparatus and method for evaluating a target larger than a measuring aperture of a sensor |
| 04/03/2002 | EP1192414A1 Method and system for measuring the relief of an object |
| 03/28/2002 | WO2002025232A2 Wavelength detector and method of detecting wavelength of an optical signal |
| 03/28/2002 | WO2002024060A1 Wavefront refractor simultaneously recording two hartmann-shack images |
| 03/28/2002 | WO2001078585A3 Wavefront sensor for objective measurement of an optical system and associated methods |
| 03/27/2002 | EP1191321A1 Determination of properties of an optical device |
| 03/27/2002 | EP1191316A1 Determination of at least one optical parameter of an optical signal |
| 03/27/2002 | EP1190472A1 Interferometer control and laser frequency locking |
| 03/27/2002 | EP1190275A1 High speed optical analogue to digital converter and digital optical wavemeter |
| 03/26/2002 | CA2086338C Process and device for determining measured quantities by means of an integrated optical sensor module |
| 03/21/2002 | WO2001077629A3 Spatial and spectral wavefront analysis and measurement |
| 03/20/2002 | EP0786075B1 Interferometer |
| 03/19/2002 | US6360012 In situ projection optic metrology method and apparatus |
| 03/14/2002 | WO2001059413A3 System and method for measuring optical wavelengths |
| 03/14/2002 | WO2001028408A3 Wavefront sensor having multi-power beam modes, independent adjustment camera, and accommodation range measurement |
| 03/14/2002 | US20020030824 Method and apparatus for wavefront measurment that resolves the 2-II ambiguity in such measurement and adaptive optics systems utilizing same |
| 03/14/2002 | US20020030818 High-accuracy wavemeter |
| 03/13/2002 | EP1185844A1 Illumination measuring device |
| 03/13/2002 | EP1127252A4 Phase determination of a radiation wave field |
| 03/12/2002 | US6356345 In-situ source metrology instrument and method of use |
| 03/07/2002 | US20020027662 Method and apparatus for optical system coherence testing |
| 03/07/2002 | US20020027661 Spatial and spectral wavefront analysis and measurement |
| 03/07/2002 | US20020027640 Spatial filter for enhancing Hartmann-Shack images and associated methods |
| 03/07/2002 | DE10041041A1 Interferometer device e.g. for eye surgery has beam guide which directs superimposed beam onto surfaces |
| 03/06/2002 | EP1184660A2 Method and apparatus for an extended wavelength range coherent optical spectrum analyzer |
| 03/06/2002 | CN1080496C Crytographic receiver |
| 02/28/2002 | WO2002016896A1 High precision wavelength monitor for tunable laser systems |
| 02/28/2002 | US20020024005 Interference system and semiconductor exposure apparatus having the same |
| 02/28/2002 | DE19703741C2 Optisches Meßverfahren zur absoluten dreidimensionalen Messung der Form von Objekten An optical measuring method for absolute measurement of the three-dimensional shape of objects |
| 02/27/2002 | EP1182445A2 Integrated optic interferometric sensor |
| 02/27/2002 | EP1182436A1 Wavelength monitor, method of adjustment thereof, stabilized light source, and communication system using stabilized light sources |
| 02/26/2002 | US6351307 Combined dispersive/interference spectroscopy for producing a vector spectrum |
| 02/21/2002 | US20020021728 Four KHz gas discharge laser |
| 02/14/2002 | US20020018213 Wavelength dispersion measuring device and a method thereof |
| 02/13/2002 | EP1179728A2 Wavelength dispersion measuring device and method |
| 02/07/2002 | DE10035835A1 Interferometer measuring arrangement for superimposing two light waves, carries light waves within reference fiber conductor between two switching devices |
| 02/06/2002 | CN1334916A Phase determination of radiation wave field |
| 02/05/2002 | US6344898 Interferometric apparatus and methods for measuring surface topography of a test surface |
| 02/05/2002 | US6344640 Method for wide field distortion-compensated imaging |
| 01/24/2002 | WO2002006777A1 Waveform measurement method and apparatus resolving 2-pi ambiguity |
| 01/17/2002 | WO2002004888A1 Interferometric, short coherent form-measuring device for several surfaces (valve seats) using multi-focal optics, optical segments or high depth of focus |
| 01/17/2002 | WO2001059402A3 Optical systems for measuring form and geometric dimensions of precision engineered parts |
| 01/17/2002 | US20020005955 Laser wavelength and bandwidth monitor |
| 01/16/2002 | EP1172643A1 Instrument for measuring physical property of sample |
| 01/16/2002 | EP1172637A1 Device for calibrating a wavelength measuring unit |
| 01/15/2002 | US6339469 Method and device for determining the distribution of intensity and phase in a laser beam different cutting planes |
| 01/10/2002 | US20020003628 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry |
| 01/10/2002 | US20020003606 Wavefront sensor for objective measurement of an optical system and associated methods |
| 01/09/2002 | EP1169626A1 Device and method for optical spectroscopy |
| 01/03/2002 | WO2002001765A2 Optical power and wavelength monitor |
| 01/03/2002 | WO2002001266A1 Optical microcavity resonator system |
| 01/03/2002 | WO2002001204A1 Micro-optic absorption spectrometer |
| 01/03/2002 | WO2002001147A1 Coated optical microcavity resonator chemical sensor |
| 01/03/2002 | WO2002001146A1 Optical microcavity resonator sensor |
| 01/03/2002 | US20020001088 Apparatus for wavefront detection |
| 01/03/2002 | CA2381793A1 Optical power and wavelength monitor |