| Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
|---|
| 01/08/2003 | EP1272824A1 Method and apparatus for measuring phase differences between intensity-modulated optical signals |
| 01/08/2003 | EP1272823A2 Spatial and spectral wavefront analysis and measurement |
| 01/08/2003 | EP1272822A1 Imaging and analyzing parameters of small moving objects such as cells |
| 01/07/2003 | US6504613 Optical interferometer with a casing and an optical part that is movable with respect to the casing |
| 01/07/2003 | CA2349085C Apparatus and method of measuring polarization mode dispersion, and recording medium |
| 01/03/2003 | WO2003001166A1 Interferometer |
| 01/03/2003 | WO2003001143A2 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 01/02/2003 | US20030002546 Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof |
| 01/02/2003 | US20030002048 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 01/02/2003 | EP1269586A1 Integrated wavelength monitor |
| 01/02/2003 | EP1212581A4 Wavelength reference device |
| 12/31/2002 | US6501550 Method for improving the accuracy of measurements made using a laser interferometer |
| 12/26/2002 | US20020196818 Tunable laser source device |
| 12/26/2002 | US20020195548 Wavefront coding interference contrast imaging systems |
| 12/24/2002 | US6498800 Double etalon optical wavelength reference device |
| 12/24/2002 | US6498650 Adaptive optics system using wavefront selection |
| 12/24/2002 | US6497483 Apparatus and method for objective measurement of optical systems using wavefront analysis |
| 12/19/2002 | US20020191652 Tunable laser source device |
| 12/19/2002 | US20020191194 Wavelength monitoring system |
| 12/19/2002 | US20020191193 Method, system, and computer program product for determining refractive index distribution |
| 12/19/2002 | US20020191190 Determination of properties of an optical device |
| 12/19/2002 | DE10129651A1 Compensation of dispersion in high resolution short coherence or optical coherence tomography interferometers without compensation optics in the reference beam path for altering its path length |
| 12/19/2002 | DE10128529A1 Wave propagation parameter recording system separates near and far field |
| 12/18/2002 | EP1266198A1 Optical module for the wavelength reference measurement in wdm systems |
| 12/18/2002 | CN1385676A Wavefront sensor |
| 12/14/2002 | CA2390782A1 Tunable laser source device |
| 12/14/2002 | CA2390780A1 Tunable laser source device |
| 12/12/2002 | WO2002099502A1 Wavefront coding interference contrast imaging systems |
| 12/12/2002 | WO2002099357A1 Optical signal interleaver and deinterleaver devices with chromatic dispersion compensation |
| 12/12/2002 | WO2002061388A3 High resolution etalon-grating monochromator spectrometer |
| 12/12/2002 | US20020186373 Determination of an optical parameter of an optical signal |
| 12/11/2002 | CN1384720A Wavefront sensor with off-axis illumination |
| 12/10/2002 | US6493094 Method and apparatus for beam directing |
| 12/05/2002 | WO2002097936A2 Apparatus and method for controlling the operating wavelength of a laser |
| 12/05/2002 | WO2002057815A3 Single-etalon, multi-point wavelength calibration reference and fully integrated optical system using the same |
| 12/05/2002 | US20020181761 Method for processing spatial-phase characteristics of electromagnetic energy and information conveyed therein |
| 12/05/2002 | US20020181519 Apparatus and method for controlling the operating wavelength of a laser |
| 12/05/2002 | US20020181515 Apparatus and method for controlling the operating wavelength of a laser diode |
| 12/05/2002 | US20020180982 Interferometric measuring device |
| 12/05/2002 | US20020180980 Optical signal interleaver and deinterleaver devices with chromatic dispersion compensation |
| 12/05/2002 | US20020180977 Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator |
| 12/05/2002 | US20020180967 Light wavelength measuring instrument, light wavelength measuring method and laser apparatus |
| 12/04/2002 | EP1262735A1 Method for the absolute calibration of an interferometer |
| 12/03/2002 | US6490042 Wave meter for measuring the wavelength of an optical wavelength division multiplexed signal |
| 12/03/2002 | US6490041 Wavemeter |
| 11/28/2002 | US20020176092 Wavefront and intensity analyzer for collimated beams |
| 11/28/2002 | DE10125785A1 Absolute calibration of interferometer by measuring optical element in four positions and two angular positions, inter-focally and extra-focally |
| 11/27/2002 | EP1259785A1 Method and system for detecting radiation |
| 11/27/2002 | EP1058812B1 Interferometric measuring device for determining the profile or the distance, especially of rough surfaces |
| 11/27/2002 | EP0876595B1 Low-coherence interferometric device |
| 11/26/2002 | US6486958 Method and system for optical spectrum analysis with matched filter detection |
| 11/21/2002 | WO2002093115A2 System for monitoring wavelength |
| 11/21/2002 | US20020172457 Coated optical microcavity resonator chemical sensor |
| 11/21/2002 | US20020171843 Phase-based wavelength measurement apparatus |
| 11/20/2002 | EP1257882A2 Device for detecting wave fronts |
| 11/20/2002 | EP1164921B1 High resolution device for observing a body |
| 11/14/2002 | WO2002091534A1 Wavelength monitoring apparatus |
| 11/14/2002 | WO2002091116A2 Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator |
| 11/14/2002 | WO2002090946A1 Interferometric determination of three-dimensional refractive index distribution |
| 11/14/2002 | WO2002090905A2 Method and apparatus for measuring wavefront aberrations |
| 11/14/2002 | WO2002090880A1 Reducing coherent artifacts in an interferometer |
| 11/14/2002 | US20020167672 Holographic particle-measuring apparatus |
| 11/14/2002 | US20020167670 Method and system for optical spectrum analysis with non-uniform sweep rate correction |
| 11/14/2002 | US20020167642 Method and apparatus for measuring wavefront aberrations |
| 11/14/2002 | DE10121499A1 Optical spectroscopy apparatus has systems to generate interference pattern, and to couple light field, to give only one or separate light field modes |
| 11/13/2002 | EP1256788A2 Method and system for optical spectrum analysis with non-uniform sweep rate correction |
| 11/12/2002 | US6480275 High resolution etalon-grating monochromator |
| 11/12/2002 | US6480267 Wavefront sensor, and lens meter and active optical reflecting telescope using the same |
| 11/07/2002 | WO2002088629A1 Phase-based wavelength measurement apparatus |
| 11/07/2002 | WO2002087428A2 Defocus and astigmatism compensation in a wavefront aberration measurement system |
| 11/07/2002 | US20020163943 Device for monitoring the emission wavelength of a laser |
| 11/07/2002 | US20020163646 Swept wavelength meter |
| 11/07/2002 | DE10121516A1 Illuminating apparatus for an object under test in an interferometer with an optical axis (OA) has radiation director directing radiation at object from different locations distant from axis |
| 11/06/2002 | EP1255097A1 A device for monitoring the emission wavelength of a laser |
| 11/06/2002 | CN2519906Y Automation device for LED test platform |
| 10/31/2002 | US20020159068 Interferometer |
| 10/31/2002 | US20020159064 Vacuum ultraviolet laser wavelength measuring apparatus |
| 10/31/2002 | US20020159048 Wavefront aberration measuring method and unit, exposure apparatus, device manufacturing method, and device |
| 10/31/2002 | US20020159030 Apparatus and method for objective measurement of optical systems using wavefront analysis |
| 10/31/2002 | US20020159029 Defocus and astigmatism compensation in a wavefront aberration measurement system |
| 10/31/2002 | DE10118760A1 Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung Method for determining the transit time distribution and arrangement |
| 10/31/2002 | DE10115977C1 Optical path difference determination device for Michelson interferometer uses calculation of path difference from measured rotation angle of second optical device relative to first optical device |
| 10/30/2002 | EP1253730A2 Method and system for optical spectrum analysis with matched filter detection |
| 10/30/2002 | EP1253456A1 System and method for adjusting the angular orientation of an optical filter and optical module including this system |
| 10/30/2002 | EP1252691A1 Wavemeter for gas discharge laser |
| 10/24/2002 | WO2002084573A1 Information card system |
| 10/24/2002 | WO2002084263A1 Interferometric arrangement for determining the transit time of light in a sample |
| 10/24/2002 | WO2001082228A3 Spatial filter for enhancing hartmann-shack images and associated methods |
| 10/24/2002 | WO2001061296A9 Method and apparatus for optical system coherence testing |
| 10/24/2002 | US20020154671 Line selected F2 two chamber laser system |
| 10/24/2002 | US20020154668 Very narrow band, two chamber, high rep rate gas discharge laser system |
| 10/24/2002 | US20020154428 System and method for adjusting angular orientation of optical filter and optical module |
| 10/24/2002 | CA2482418A1 Information card system |
| 10/22/2002 | US6469790 Tilt-compensated interferometers |
| 10/17/2002 | US20020151801 Wavefront characterization of corneas |
| 10/17/2002 | US20020149780 Integrated-optic channel monitoring |
| 10/17/2002 | US20020149779 Wavelength measurement adjustment |
| 10/17/2002 | US20020149776 Wavelength meter adapted for averaging multiple measurements |
| 10/16/2002 | CN1375053A Method ans system for measuring the relief of an object |
| 10/15/2002 | US6464357 Wavefront characterization of corneas |