Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
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02/29/1996 | WO1996006472A1 Stabilised multi-frequency light source and method of generating synthetic light wavelengths |
02/29/1996 | WO1996006335A1 Device for carrying out spectroscopic measurements |
02/27/1996 | US5495334 Fourier transform spectroscope with quadrangular common path interferometer |
02/20/1996 | US5493395 Wavelength variation measuring apparatus |
02/20/1996 | US5493394 Method and apparatus for use in measuring frequency difference between light signals |
02/20/1996 | US5493391 One dimensional wavefront distortion sensor comprising a lens array system |
02/07/1996 | EP0695956A2 Integrated optic asymmetric Mach-Zehnder interferometer |
01/31/1996 | EP0694805A1 Analog-digital converter and analog-digital system using said converter |
01/25/1996 | WO1996002009A1 An optical measurement method and apparatus |
01/23/1996 | US5486919 Inspection method and apparatus for inspecting a particle, if any, on a substrate having a pattern |
01/23/1996 | US5486918 Optical wavelength meter with an up-down counter which measures the amounts of the overshoot and the back-shift of the moving mirror |
01/18/1996 | DE4427352C1 High resolution distance measurement using FMCW laser radar |
01/09/1996 | US5483344 Process and apparatus for performing differential refractive index measurements using interference of modulated light beams passing through reference and test samples |
01/09/1996 | US5483343 Wavelength compensator in a helium ambience |
01/09/1996 | US5483341 Cavity dispersing measuring method and measuring apparatus thereof |
01/09/1996 | CA2060943C Optical frequency deviation measure and control device for laser light |
12/14/1995 | WO1995033971A1 Method and apparatus for acquiring images |
11/30/1995 | DE4418213A1 Apparatus for measuring changes in optical pathlength and its direction |
11/29/1995 | EP0683889A1 Control of spectral shift errors |
11/07/1995 | US5465147 Method and apparatus for acquiring images using a ccd detector array and no transverse scanner |
10/31/1995 | US5463460 Particle monitoring sensor |
10/17/1995 | US5459571 Multiple control frequency phase modulator in phase modulated interferometer precision distance measuring system |
10/12/1995 | DE4192191C1 Multichannel analogue detection method |
10/10/1995 | US5457529 Rotating mirror interferometer |
10/05/1995 | DE19509598A1 Light wavelength measurement appts. |
09/14/1995 | WO1995024621A1 Coherence imaging system |
09/06/1995 | EP0670467A1 Interferometer |
09/05/1995 | US5448053 Optical system |
08/31/1995 | DE19506954A1 Optical wavelength measuring device using interferometer |
08/30/1995 | EP0668993A1 Optical spectrum analyzer and encoder using a modulated phase grating |
08/23/1995 | EP0531354B1 Process for the measurement of the thickness and refractive index of a thin film on a substrate, and a device for carrying out the process |
08/17/1995 | DE4404663A1 Optical measurement of distance separating two parallel measurement surfaces of object |
08/15/1995 | US5442169 Method and apparatus for determining a measuring variable by means of an integrated optical sensor module |
08/10/1995 | DE4403929A1 Optical interferometer with non-reflecting multiport coupler |
08/10/1995 | DE4403229A1 Interferometric laser diagnosis method for esp. high powered laser |
08/08/1995 | US5440383 Phase detection deflectometer-type optical device having a large measuring range |
07/27/1995 | WO1995020144A1 Optical wavelength sensor |
07/25/1995 | US5436442 High temperature photodetector array |
07/11/1995 | US5432602 Light wavelength measuring apparatus with light modulation |
06/20/1995 | US5426502 Optical fiber interference wavelength/frequency detection apparatus which eliminates a movable element |
06/07/1995 | EP0478785B1 Apparatus for measuring wavelength of light by high precision detection of interference fringe |
06/06/1995 | US5422713 Bi-refringent waveguide rotational alignment method using white light interferomety |
05/30/1995 | US5420877 Temperature compensation method and apparatus for wave meters and tunable lasers controlled thereby |
05/30/1995 | US5420687 Interferometer with processor for linearizing fringers for determining the wavelength of laser light |
05/24/1995 | EP0654655A1 Optical achromatic interferometer of the trilateral phase shift type |
05/24/1995 | DE4228535C2 Dünnschicht-Interferometer Thin-film interferometer |
05/16/1995 | US5416578 Waveguide type wavelength measuring apparatus |
05/16/1995 | CA2036567C Michelson interferometer for producing optical path differences |
05/11/1995 | WO1995012802A1 Interferometer with processor for linearizing fringes for determining the wavelength of laser light |
05/03/1995 | CN1102288A Nanometer metrology |
05/02/1995 | US5412469 Optical spectrum analyzer and encoder using a modulated phase grating wherein said grating diffracts the wavelength as a function of the magnetic field |
05/02/1995 | US5412200 In an optical system subject to wavefront distortions |
04/27/1995 | WO1995011432A1 Detector for wavelength of excimer laser |
04/26/1995 | EP0525162B1 Sequential demultiplexing receiver for an optical sensor array with spectral modulation coding |
04/25/1995 | US5410532 Method for a adjusting a beam splitter in an optical recording and reproducing apparatus |
04/25/1995 | US5410397 Method and apparatus for holographic wavefront diagnostics |
04/20/1995 | WO1995010907A1 Cryptographic receiver |
04/20/1995 | WO1995010759A1 Spectral wavelength discrimination system and method for using |
04/20/1995 | DE4343663C1 Device for polarisation-sensitive spectroscopy |
04/12/1995 | EP0647310A1 Method of an apparatus for interferometrically inspecting a surface of an object. |
04/11/1995 | CA1335160C Detector apparatus for detecting coherent mono-chromatic point-source radiation |
04/04/1995 | US5404366 Narrow band excimer laser and wavelength detecting apparatus |
03/28/1995 | CA2107062A1 Methods for wavelength determination of monochromatic light beams |
03/22/1995 | EP0466881B1 Wave front sensor |
03/16/1995 | DE4429748A1 Interferometer and method for measuring and stabilising the wavelength of light emitted by a laser diode |
03/15/1995 | EP0585333B1 Interferometric measuring device in integrated optics |
03/02/1995 | DE4430198A1 Device and method for investigating the performance of a phase-shift reticle |
02/22/1995 | EP0639264A1 Solid-block homodyne interferometer. |
02/21/1995 | US5392116 Interferometric phase measurement |
02/14/1995 | US5390017 Optical network analyzer for measuring the amplitude characteristics and group delay time dispersion characteristics of an optical circuit device |
02/07/1995 | US5387974 Laser apparatus including Fabry-perot wavelength detector with temperature and wavelength compensation |
02/07/1995 | US5387972 Coherent phase and frequency detection using sum-frequency mixing in non-linear waveguides |
02/07/1995 | US5387309 Process for the measurement of the thickness and refractive index of a thin film on a substrate, and an apparatus for carrying out the process |
02/02/1995 | DE4325758A1 Phase-modulated interferometer III |
01/25/1995 | EP0635705A2 Angular michelson interferometer and optical wavemeter based on a rotating periscope |
01/24/1995 | US5384455 Measurement-diverse speckle imaging |
01/19/1995 | DE4422641A1 Optisches Wellenmeßgerät Optical Wellenmeßgerät |
01/18/1995 | EP0634636A1 Michelson-type interferometer |
01/18/1995 | EP0619021A4 Current sensor. |
01/12/1995 | DE4107549C2 Verfahren zum Betrieb und zur Wellenzahlkalibrierung eines Interferometers nach Michelson Method of operation and wavenumber calibration of a Michelson interferometer |
01/11/1995 | EP0633464A2 Particle monitoring sensor |
01/10/1995 | US5381230 Emission source spectrum stabilizer |
01/05/1995 | DE4311726A1 Arrangement and method for extending the measuring range of Nomarski microscopes |
12/28/1994 | EP0630467A1 Nanometer metrology |
12/27/1994 | US5377008 Integrated optical compensating refractometer apparatus |
12/07/1994 | EP0627770A1 Voltage-tunable photodetector |
11/24/1994 | WO1994018525A3 Control of spectral shift errors |
11/22/1994 | US5367375 Spatial wavefront evaluation by intensity relationship |
11/22/1994 | US5367175 Method of measuring liquid level with a thermal interface detection |
11/17/1994 | EP0399004B1 Interferometry |
11/15/1994 | US5365065 Sensitive interferometric parallel thermal-wave imager |
11/10/1994 | DE4314680A1 Method for spectroscopic determination of nitrogen oxide content |
11/09/1994 | EP0623801A2 Procedure and device for absolute measurements with a laser-interferometer |
11/03/1994 | DE4306884A1 Phase-modulated interferometer II |
11/01/1994 | US5361312 Method and apparatus for phase evaluation of pattern images used in optical measurement |
10/27/1994 | DE4414287A1 Shearing-speckle interferometry and Shearogram imaging |
10/26/1994 | EP0620912A1 Interferometer structure |
10/26/1994 | CN1026356C Laser wavelength meter |
10/18/1994 | US5357337 High speed interferometer fourier transform spectrometer including a weighted capacitive matrix |
10/18/1994 | CA2006125C Optical communication systems using fabry-perot cavities |