Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525)
05/2003
05/01/2003WO2002097936A3 Apparatus and method for controlling the operating wavelength of a laser
04/2003
04/24/2003WO2003034010A1 Phase determination of a radiation wavefield
04/24/2003US20030076503 Wavemeter with increased wavelength range
04/24/2003US20030076502 Method and apparatus for locking the transmission wavelength in optical communication laser packages
04/24/2003US20030076083 Electronic method and apparatus for measuring optical wavelength and locking to a set optical wavelength of fabry-perot tunable cavity opto-electronic devices
04/23/2003EP1303736A2 Systems and methods for quantifying nonlinearities in interferometry systems
04/23/2003EP1194755B1 Sub-lens spatial resolution shack-hartmann wavefront sensing
04/22/2003US6553042 Laser apparatus for generating vacuum ultraviolet narrow-band laser beams
04/22/2003US6552808 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
04/22/2003US6552800 Single-arm sagnac interferometer with two beam splitters
04/17/2003US20030072010 Non-etalon reflective wavelength locking optical sub-assembly and associated methods
04/15/2003US6549548 Interferometric filter wavelength meter and controller
04/15/2003US6548805 Method and system for detecting radiation
04/15/2003US6548797 Apparatus and method for measuring a wavefront using a screen with apertures adjacent to a multi-lens array
04/15/2003US6547395 Methods of measuring moving objects and reducing exposure during wavefront measurements
04/10/2003WO2003030409A1 Monitor for an optical fibre and multi-guide optical fibre circuits and methods of making them
04/10/2003WO2003029774A1 Non-etalon reflective wavelength locking optical sub-assembly and associated methods
04/10/2003WO2003029751A1 Method and device for measuring point diffraction interference
04/10/2003WO2002006777A9 Waveform measurement method and apparatus resolving 2-pi ambiguity
04/10/2003US20030067658 Optical module for wavelength reference measurement in WDM systems
04/10/2003US20030067610 Low signal-to-noise ratio branch-point-capable adaptive optics sensor
04/10/2003US20030067601 Tunable filter with wavelength monitor
04/09/2003EP1200797B1 Apparatus and method for the non-destructive testing of articles using optical metrology
04/09/2003CN1105310C 辐射场分析器 Radiation field analyzer
04/08/2003US6546028 Optical fiber wavelength reference device
04/03/2003US20030063290 Non-etalon wavelength locking optical sub-assembly and assoicated methods
04/03/2003US20030063285 Heterodyne based optical spectrum analysis with reduced data acquisition requirement
04/03/2003US20030063278 Method for overlay metrology of low contrast features
04/02/2003EP1298422A2 Heterodyne based optical spectrum analysis with reduced data acquisition requirement
04/02/2003EP0795120B1 Method and apparatus for calibrating a laser wavelength control mechanism
04/01/2003USRE38054 Reliable, modular, production quality narrow-band high rep rate F2 laser
04/01/2003US6540358 Wavefront characterization of corneas
03/2003
03/31/2003WO2002031455A1 Detection of the phase and amplitude of electromagnetic waves
03/27/2003US20030058452 Signal modulation compensation for a wavelength meter
03/27/2003US20030057351 Light wavelength meter
03/25/2003US6539046 Wavemeter for gas discharge laser
03/25/2003US6538737 High resolution etalon-grating spectrometer
03/20/2003WO2003022139A1 Holder for corneas
03/20/2003US20030053071 Methods and apparatus for splitting, imaging, and measuring wavefronts in interferometry
03/20/2003US20030053069 Method and system for measuring optical characteristics of a sub-component within a composite optical system
03/20/2003US20030053068 Interferometric optical component analyzer based on orthogonal filters
03/20/2003US20030053064 Wavelength detector and optical transmitter
03/20/2003US20030053026 Method and apparatus for using adaptive optics in a scanning laser ophthalmoscope
03/19/2003CN1404640A Integrated wavelength monitor
03/13/2003WO2003021728A2 Very narrow band, two chamber, high rep rate gas discharge laser system
03/13/2003WO2003021727A2 Line selected f2 two chamber laser system
03/13/2003WO2003020121A1 Adaptive optics in a scanning lase ophtalmoscope
03/13/2003US20030048441 Tilt-compensated interferometers
03/13/2003CA2458619A1 Line selected f2 two chamber laser system
03/13/2003CA2457869A1 Very narrow band, two chamber, high rep rate gas discharge laser system
03/12/2003EP1290415A1 Apparatus for interrogating an optical signal
03/12/2003EP1290414A1 Method and apparatus for wavefront sensing
03/12/2003CN1103045C Method and device for determing phase and/or amplitude data of electromagnetic wave
03/06/2003WO2002001146A9 Optical microcavity resonator sensor
03/06/2003US20030043381 Numerical a posteriori dispersion compensation in PCI measurement signals and OCT A-scan signals with spatially variant correlation core
03/05/2003EP1288641A1 Polarisation interferometer
02/2003
02/27/2003WO2003016841A1 Convolution method for measuring laser bandwidth
02/27/2003WO2003016814A1 Multiple-interferometer device for wavelength measuring and locking
02/27/2003US20030038943 Method and apparatus for measuring wavelength jitter of light signal
02/27/2003US20030038921 Tomographic wavefront analysis system and method of mapping an optical system
02/26/2003EP1286150A2 Interferometric optical component analyzer based on orthogonal filters
02/25/2003US6525308 Apparatus and method for wavelength detection with fiber bragg grating sensors
02/20/2003US20030035566 Phase unwrapping method for fringe image analysis
02/20/2003US20030035121 Wavemeter having two interference elements
02/20/2003US20030035120 Multiple-interferometer device for wavelength measuring and locking
02/18/2003US6522911 Apparatus for imaging a blood vessel
02/13/2003WO2002075367A3 Tomographic wavefront analysis system
02/13/2003US20030030819 Apparatus and method(s) for reducing the effects of coherent artifacts in an interferometer
02/12/2003EP1282809A1 Wavelength monitor for wdm systems
02/06/2003WO2001036901A3 Systems and methods for quantifying nonlinearities in interferometry systems
02/06/2003US20030025915 Method for absolute calibration of an interferometer
02/06/2003US20030025910 Interferometric measurement apparatus for wavelength calibration
02/06/2003US20030025874 Method and apparatus for improving vision and the resolution of retinal images
02/04/2003US6515752 Wavelength monitoring system
02/04/2003US6515741 Optical device and method for line-narrowed excimer or molecular fluorine laser
02/04/2003US6515276 Heterodyne optical spectrum analyzer with provisions for intensity noise subtraction
02/04/2003CA2072998C Optical immunoassay
01/2003
01/30/2003WO2002001147A9 Coated optical microcavity resonator chemical sensor
01/30/2003US20030023140 Pathlength corrected oximeter and the like
01/30/2003US20030021308 Interferometric filter wavelength meter and controller
01/30/2003US20030020872 Apparatus and method for measuring vision defects of a human eye
01/29/2003EP1279010A1 Measuring wavelength change
01/28/2003US6512627 Fiber-optic frequency shifter, optical interferometer and method of generating two complementary optical interference signals using the same
01/23/2003WO2003006940A1 Device for analysing a wavefront with enhanced resolution
01/23/2003US20030016363 Gas discharge ultraviolet wavemeter with enhanced illumination
01/22/2003EP1277172A2 Spatial filter for enhancing hartmann-shack images and associated methods
01/22/2003EP1192433B1 Apparatus and method for evaluating a target larger than a measuring aperture of a sensor
01/21/2003US6509970 Wavelength monitoring apparatus for laser light for semiconductor exposure
01/21/2003CA2266704C System and method for discriminating between direct and reflected electromagnetic energy
01/16/2003US20030011777 Method and system for optical spectrum analysis with matched filter detection
01/16/2003US20030011744 Wavefront characterization of corneas
01/15/2003EP1274340A2 Wavefront sensor for objective measurement of an optical system and associated methods
01/14/2003US6507684 Optical microcavity resonator system
01/14/2003US6507404 Method and apparatus for measuring optical wavelength
01/09/2003WO2003002026A2 Wavefront characterization of corneas
01/09/2003WO2003002025A2 Wavefront characterization
01/09/2003WO2003002024A2 Wavefront characterization of corneas
01/09/2003US20030007143 In-situ source metrology instrument and method of use
01/08/2003EP1273895A2 Interferometric measuring apparatus for wavelength calibration
01/08/2003EP1273113A1 Wavelength division multiplex (wdm) signal monitor
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