| Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
|---|
| 05/20/2004 | US20040094698 Wave length plate, wavelength filter and wavelength monitor |
| 05/19/2004 | EP1420238A2 Determining an optical property by using superimposed delayed signals |
| 05/19/2004 | EP1418839A2 Defocus and astigmatism compensation in a wavefront aberration measurement system |
| 05/19/2004 | DE10243838B3 Spatially-resolved characterization of wave front curvature from coherent beam source, employs Bessel beam transformation producing interference rings for evaluation |
| 05/18/2004 | US6738140 Wavelength detector and method of detecting wavelength of an optical signal |
| 05/13/2004 | US20040091002 Double etalon optical wavelength reference device |
| 05/13/2004 | US20040090620 Methods and devices for monitoring the wavelength and power of a laser |
| 05/13/2004 | US20040089794 Simple and compact laser wavelength locker |
| 05/13/2004 | DE19504444B4 Interferometeranordnung mit verstellbarer optischer Weglängendifferenz Interferometer optical path length with adjustable |
| 05/13/2004 | DE10260985A1 Shearing interferometry system for measurement of a wave front for use in measuring an optical imaging system in order to quantify its quality, said system having filters to suppress unwanted higher diffraction orders |
| 05/12/2004 | EP1417740A2 Apparatus and method for controlling the operating wavelength of a laser |
| 05/12/2004 | EP1417462A1 Convolution method for measuring laser bandwidth |
| 05/12/2004 | CN1495416A Method and device for measuring wavelength change in high resolution ratio measuring system |
| 05/11/2004 | US6734979 Rapid in situ mastering of an aspheric Fizeau with residual error compensation |
| 05/06/2004 | US20040085548 Interference system and semiconductor exposure apparatus having the same |
| 05/06/2004 | US20040085529 Device for determining the intensity and phase of a coherent beam of light in a cross-section of the beam |
| 05/06/2004 | EP1415133A1 Device for analysing a wavefront with enhanced resolution |
| 05/06/2004 | EP1192414B1 Method and system for measuring the relief of an object |
| 05/04/2004 | US6731659 Frequency locker |
| 04/29/2004 | WO2004005974A3 Heterodyne optical spectrum analyzer |
| 04/29/2004 | US20040080753 Heterodyne based optical spectrum analysis with controlled optical attenuation |
| 04/22/2004 | WO2004033986A1 Interferometer monitoring |
| 04/22/2004 | WO2004032722A2 Imaging systems |
| 04/22/2004 | US20040075839 Novel high-precision lambdameter operating without optical moving parts |
| 04/21/2004 | EP1411339A2 Wavelength dispersion measuring apparatus and polarization dispersion measuring appparatus |
| 04/20/2004 | US6724485 Interferometric measuring device for determining the profile or the pitch of especially rough surfaces |
| 04/20/2004 | US6724479 Method for overlay metrology of low contrast features |
| 04/15/2004 | WO2004031707A1 Phase distribution measuring instrument and phase distribution measuring method |
| 04/11/2004 | WO2004094981A1 Light wavefront measuring instrument, light wavefront measuring method, and light source adjusting method |
| 04/08/2004 | WO2004029545A2 Method and apparatus for determining the wavelength of an input light beam |
| 04/08/2004 | US20040066809 Optical resonator and wavenlength control module using the resonator |
| 04/06/2004 | US6717682 Non-etalon wavelength locking optical sub-assembly and associated methods |
| 04/06/2004 | US6717661 Fourier moire wavefront sensor |
| 04/01/2004 | WO2004027399A1 Time-resolved nonlinear complex sensitivity measuring instrument |
| 04/01/2004 | WO2004027359A1 Method and device for determining a pixel gray scale value image |
| 04/01/2004 | WO2003093777A3 Device and method for determining chirp of a mach-zender type electro-optical modulator |
| 04/01/2004 | US20040061864 Method and apparatus for determing the wavelength of an input light beam |
| 04/01/2004 | US20040060903 Apodized micro-lenses for hartmann wavefront sensing and method for fabricating desired profiles |
| 03/31/2004 | CN1486444A Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
| 03/30/2004 | US6713770 High resolution spectral measurement device |
| 03/25/2004 | US20040057041 Method and apparatus for measuring wavelength changes in a high-resolution measurement system |
| 03/25/2004 | US20040056174 Fast phase diversity wavefront correction using a neural network |
| 03/24/2004 | EP1400794A2 Method and apparatus for measuring wavelength changes in a high-resolution measurement system |
| 03/23/2004 | US6710882 Anisotropy analyzing method and an anisotropy analyzing apparatus |
| 03/18/2004 | US20040051878 Ring optical interferometer |
| 03/18/2004 | US20040051876 Wavelength determining apparatus and method |
| 03/17/2004 | EP1397717A1 Wavefront coding interference contrast imaging systems |
| 03/17/2004 | EP1397638A2 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 03/17/2004 | CN1482437A Apparatus and method for detecting semiconductor laser and coherent optical source detecting process |
| 03/16/2004 | US6708048 Phase modulation spectrophotometric apparatus |
| 03/16/2004 | US6707550 Wavelength monitor for WDM systems |
| 03/16/2004 | US6707020 Adaptive dynamic range wavefront sensor |
| 03/11/2004 | WO2002087428A3 Defocus and astigmatism compensation in a wavefront aberration measurement system |
| 03/11/2004 | US20040047385 Very narrow band, two chamber, high reprate gas discharge laser system |
| 03/10/2004 | EP1395799A2 Method and apparatus for measuring wavefront aberrations |
| 03/04/2004 | WO2004019017A1 Spectroscopic measurement of dispersion |
| 03/04/2004 | WO2003021728A3 Very narrow band, two chamber, high rep rate gas discharge laser system |
| 03/04/2004 | US20040041978 Method and system for sensing and analyzing a wavefront of an optically transmissive system |
| 03/03/2004 | EP1393030A2 System for monitoring wavelength |
| 02/26/2004 | WO2003042649A3 Range extending system and spatial filter |
| 02/26/2004 | US20040036889 Polarization effect averaging |
| 02/25/2004 | EP1390722A1 Interferometric determination of three-dimensional refractive index distribution |
| 02/25/2004 | CN1477940A Method and apparatus for measuring wavefront aberrations |
| 02/24/2004 | US6697389 Tunable laser source device |
| 02/24/2004 | US6697160 Light wavelength measuring apparatus and method for measuring wavelength of subject light with high speed by using two-beam interferometer |
| 02/19/2004 | US20040032885 Optical fiber wavelength reference device |
| 02/19/2004 | US20040032884 Device and method for inspecting wavelength-variable semiconductor laser, and method for inspecting coherent source |
| 02/19/2004 | US20040031906 Very fast time resolved imaging in multiparameter measurement space |
| 02/18/2004 | CN1475769A Method for analyzing low-coherence fringe |
| 02/17/2004 | US6693704 Wave surface aberration measurement device, wave surface aberration measurement method, and projection lens fabricated by the device and the method |
| 02/11/2004 | EP0981733B1 Grating based phase control optical delay line |
| 02/10/2004 | US6690977 Data processor and data processing method for wavemeter |
| 02/05/2004 | US20040022283 Interferometric filter wavelength meter and controller |
| 02/04/2004 | CN1137377C Derivative field measuring method |
| 02/03/2004 | US6687006 Heterodyne based optical spectrum analysis with reduced data acquisition requirement |
| 01/29/2004 | US20040019445 Calibration methodology and system for optical network analyzer |
| 01/28/2004 | EP1384044A1 Reducing coherent artifacts in an interferometer |
| 01/27/2004 | US6683686 Temporally resolved wavelength measurement method and apparatus |
| 01/22/2004 | WO2004008078A1 Delaying interferometer |
| 01/22/2004 | US20040013430 Wavelength monitor and motor driving and controlling device |
| 01/21/2004 | CN1469993A Wavelength detector and method of detecting wavelength of an optical signal |
| 01/21/2004 | CN1469107A Measuring device and method for atmosphere coherence length in limited inclined range |
| 01/20/2004 | US6680472 Device for measuring of optical wavelengths |
| 01/20/2004 | CA2242518C Radiation field analyzer |
| 01/15/2004 | WO2004005974A2 Heterodyne optical spectrum analyzer |
| 01/15/2004 | WO2004005846A1 Shearing interferometer calibrating method, production method for projection optical system, projection opticalsystem, and projection exposure system |
| 01/15/2004 | US20040008748 Wavelength detector apparatus and method therefor |
| 01/15/2004 | US20040008297 Liquid crystal display device and inspection method for a transparent substrate |
| 01/15/2004 | DE10230225A1 Photomischdetektor und Verfahren zu seinem Betrieb und zu seiner Herstellung Photonic Mixer Device and method for its operation and its manufacture |
| 01/15/2004 | DE10101057B4 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Method and apparatus for detecting the deformation of objects |
| 01/14/2004 | EP1381090A1 Wavelength detector apparatus and method therefor |
| 01/14/2004 | EP1380822A1 Wavelength determining apparatus and method |
| 01/14/2004 | EP1379857A1 Interferometric arrangement for determining the transit time of light in a sample |
| 01/08/2004 | US20040004696 Method and apparatus for measuring wavefront aberrations |
| 01/07/2004 | EP1377927A1 Information card system |
| 01/07/2004 | CN2597969Y Laser double frequency synthesis wavelength interferometer |
| 01/06/2004 | US6674519 Optical phase front measurement unit |
| 12/31/2003 | WO2004001354A1 Image sensing device and method of |
| 12/31/2003 | CN1464968A Optical signal interleaver and deinterleaver devices with chromatic dispersion compensation |
| 12/30/2003 | USRE38372 Narrow band excimer laser and wavelength detecting apparatus |