| Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
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| 09/22/2004 | CN1531406A Defocus and astigmatism compensation in wavefront aberration measurement system |
| 09/21/2004 | US6795459 Light frequency locker |
| 09/21/2004 | US6795188 High-accuracy wavemeter |
| 09/16/2004 | US20040179203 Interferometric measuring device |
| 09/15/2004 | EP1458066A2 Line selected F2 two chamber laser system |
| 09/15/2004 | EP1456600A1 System and method for measuring optical distance |
| 09/14/2004 | US6791696 Automated optical measurement apparatus and method |
| 09/14/2004 | US6789738 Information card system |
| 09/09/2004 | US20040174919 Line selected F2 two chamber laser system |
| 09/09/2004 | US20040174535 Abberration measuring apparatus |
| 09/09/2004 | US20040174534 Interferometer, exposure apparatus and method for manufacturing device |
| 09/09/2004 | US20040174532 Aberration measuring apparatus |
| 09/08/2004 | EP1455170A1 Apparatus and method for measuring characteristics of light |
| 09/08/2004 | EP1269586B1 Integrated wavelength monitor |
| 09/07/2004 | US6788419 Determination of properties of an optical device |
| 09/07/2004 | US6788408 Wavelength monitoring system |
| 09/07/2004 | US6787747 Fast phase diversity wavefront correction using a neural network |
| 09/02/2004 | US20040169866 Transmission shear grating in checkerboard configuration for EUV wavefront sensor |
| 09/01/2004 | EP1451556A1 Sensor and method for detecting fiber optic faults |
| 09/01/2004 | EP1451524A2 Phase-shifting interferometry method and system |
| 09/01/2004 | EP1451523A1 System and method for wavefront measurement |
| 09/01/2004 | EP1450671A2 Range extending system and spatial filter |
| 09/01/2004 | CN1526067A Method and apparatus for measuring wavefront aberrations |
| 08/31/2004 | US6785006 Wavefront measuring apparatus and wavefront measuring method |
| 08/31/2004 | US6785001 Method and apparatus for measuring wavelength jitter of light signal |
| 08/31/2004 | US6784408 Array of lateral effect detectors for high-speed wavefront sensing and other applications |
| 08/31/2004 | US6783284 Optical module for wavelength reference measurement in WDM systems |
| 08/26/2004 | US20040165623 Wavelength monitoring apparatus |
| 08/25/2004 | CN1523448A Transmission shear grating in checkerboard configuration for EUV wavefront sensor |
| 08/24/2004 | US6781681 System and method for wavefront measurement |
| 08/24/2004 | CA2198714C Temperature compensation method and apparatus for wave meters and tunable lasers controlled thereby |
| 08/17/2004 | US6778281 Phase shift fringe analysis method and apparatus using the same |
| 08/17/2004 | US6777659 Device and method for detecting the phase and amplitude of electromagnetic waves |
| 08/12/2004 | WO2004068090A1 Imaging system |
| 08/12/2004 | WO2004068066A2 Full-filled optical measurements of surface properties of panels, substrates and wafers |
| 08/12/2004 | US20040156015 Eye refractor with active mirror wavefront sensor |
| 08/12/2004 | US20040156014 Multifocal ophthalmic lens |
| 08/11/2004 | EP1444482A1 Scanning interferometer for aspheric surfaces and wavefronts |
| 08/11/2004 | EP1444481A1 Rapid in situ mastering of an aspheric fizeau |
| 08/10/2004 | US6775001 Laser-based spectrometer for use with pulsed and unstable wavelength laser sources |
| 08/05/2004 | WO2004066366A2 Tailored reflecting diffractor for euv lithographic system aberration measurement |
| 08/05/2004 | US20040150829 Interferometric arrangement for determining the transit time of light in a sample |
| 08/05/2004 | DE10302055A1 White light interferometer for depth scanning of an object has an active optical element in the reference and or measurement beam path to enable varying of the optical path lengths relative to each other |
| 08/04/2004 | CN1518720A 信息卡系统 Information Card System |
| 08/04/2004 | CN1517697A Method of monitoring laser recrystallization process |
| 08/04/2004 | CN1517672A Interferometer equipment and method for low coherence measurement and high coherence measurement |
| 08/03/2004 | US6771375 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 07/29/2004 | US20040146077 Integrated wavelength locker for use with more than one wavelength and associated methods |
| 07/29/2004 | US20040145714 Tailored reflecting diffractor for EUV lithographic system aberration measurement |
| 07/28/2004 | EP1441242A1 WAVE LENGTH PLATE, WAVELENGTH FILTER AND WAVELENGTH MONITOR |
| 07/28/2004 | CN1515890A Optical spectrum offset type nano proximity device |
| 07/22/2004 | WO2004061518A1 Adaptive optical system with self-referencing contrast control |
| 07/22/2004 | WO2004061473A1 Real-time correction of phase distortion |
| 07/22/2004 | US20040141184 Interferometer apparatus for both low and high coherence measurement and method thereof |
| 07/22/2004 | DE10328126A1 Verfahren und Vorrichtung zur Wellenlängen- Sollwertabstimmung und zur Spektrumsüberwachung Method and device for wavelength tuning setpoint and spectrum monitoring |
| 07/21/2004 | EP1439427A2 Shearing interferometer for euv wavefront measurement |
| 07/21/2004 | EP1438774A2 Very narrow band, two chamber, high rep rate gas discharge laser system |
| 07/21/2004 | EP1438772A2 Line selected f 2? two chamber laser system |
| 07/20/2004 | US6765682 Method and apparatus for wavelength and power measurement for tunable laser control |
| 07/20/2004 | US6765211 Micro-optic absorption spectrometer |
| 07/20/2004 | CA2289598C Grating based phase control optical delay line |
| 07/15/2004 | US20040136413 Controlling an optical source using a beat frequency |
| 07/15/2004 | US20040136070 Speckle reduction method and system for EUV interferometry |
| 07/15/2004 | DE19938103B4 Vorrichtung und Verfahren zum Messen der chromatischen Dispersion für optische Systeme mit einem Fernzugriffspunkt Apparatus and method for measuring the chromatic dispersion of optical systems with a remote access point |
| 07/15/2004 | DE10344025A1 Wellenlängenstabilisier-Steuervorrichtung und zugehöriges Verfahren Wellenlängenstabilisier control device and associated method |
| 07/08/2004 | US20040130724 Determining an optical property by using superimposed delayed signals |
| 07/08/2004 | US20040130705 System and method of wavefront sensing |
| 07/08/2004 | US20040130677 Apparatus and method for measuring vision defects of a human eye |
| 07/06/2004 | CA2319546C Wavelength monitoring device and its adjusting method, and wavelength stabilizing light source and transmission system having plural wavelength stabilizing light sources |
| 07/01/2004 | WO2004055601A1 Method for coherent imaging with turbulence effect correction |
| 07/01/2004 | WO2004055557A1 Radiation focussing element |
| 07/01/2004 | US20040125380 Adaptive optical system with self-referencing contrast control |
| 07/01/2004 | US20040124335 Real-time correction of phase distortion |
| 06/29/2004 | US6757316 Four KHz gas discharge laser |
| 06/29/2004 | CA2233305C Integrated optic interferometric sensor |
| 06/24/2004 | WO2004052189A1 Optical wavefront analyzer |
| 06/24/2004 | US20040120721 Wavelength stabilizing control device and method thereof |
| 06/24/2004 | US20040120635 Method and device for wavelength locking and spectrum monitoring |
| 06/24/2004 | US20040119984 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method |
| 06/24/2004 | DE10258142A1 Vorrichtung zur optischen Vermessung eines Abbildungssystems Apparatus for the optical measurement of an imaging system |
| 06/17/2004 | WO2004051206A1 Device for the optical mapping of an imaging system |
| 06/17/2004 | WO2004049979A1 Multifocal ophthalmic lens |
| 06/17/2004 | WO2003107494A3 Gas discharge ultraviolet wavemeter with enhanced illumination |
| 06/17/2004 | US20040114149 WDM channel monitor and wavelength locker |
| 06/17/2004 | CA2763036A1 Multifocal ophthalmic lens |
| 06/16/2004 | EP1427328A1 Adaptive optics in a scanning lase ophtalmoscope |
| 06/16/2004 | EP0932814B1 An optical wavelength scanner employing a reference system |
| 06/16/2004 | CN1504787A Cramping arrangement for casing and micro interferometer equipped with the same |
| 06/15/2004 | US6750972 Gas discharge ultraviolet wavemeter with enhanced illumination |
| 06/15/2004 | US6750957 Method and device for analysing a highly dynamic wavefront |
| 06/10/2004 | US20040109168 Interferometer |
| 06/09/2004 | EP1426746A1 Apparatus and method for determining wavelength from coarse and fine measurements |
| 06/08/2004 | US6746121 Defocus and astigmatism compensation in a wavefront aberration measurement system |
| 06/08/2004 | CA2220940C Device for determining phase faults in electromagnetic waves |
| 06/03/2004 | US20040105098 Apparatus and method for determining wavelength from coarse and fine measurements |
| 06/02/2004 | EP1424049A1 Multifocal ophthalmic lens |
| 05/27/2004 | US20040100635 Coarse spectrometer with a grating |
| 05/26/2004 | CN1151379C Millimeter wave measuring meter and method |
| 05/25/2004 | US6741362 Method, system, and computer program product for determining refractive index distribution |
| 05/25/2004 | US6741338 In-situ source metrology instrument and method of use |