Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525)
09/2005
09/22/2005DE4303178B4 Verfahren und Vorrichtung zum Erfassen von Parametern von Stoffen Method and apparatus for detecting parameters of substances
09/22/2005DE10356968A1 Optical system for use as e.g. interferometer, has phase plate with spherical phase disk at its center, where plate is shifted to introduce phase shift between wave fronts of phase object and zero order diffraction
09/22/2005CA2559324A1 Methods and apparatus for wavefront manipulations and improved 3-d measurements
09/21/2005EP1577637A1 Optical heterodyne interferometer for shape measurement
09/21/2005EP1576389A1 Real-time correction of phase distortion
09/21/2005CN2727714Y X-ray interferometer for testing space coherence of synchronous radiation source
09/21/2005CN1670508A Optical image measuring apparatus
09/21/2005CN1220030C Method for analyzing low-coherence fringe
09/20/2005US6947139 Simultaneous optical isolation and channel monitoring system
09/15/2005WO2005085748A1 Optical readhead
09/15/2005US20050201429 Laser source comprising amplifier and adaptive wavefront/polarization driver
09/14/2005EP1574832A2 Optical phase measurement of target
09/14/2005EP1573370A1 Radiation focussing element
09/14/2005CN1667379A Optical phase measurement of target
09/13/2005US6943896 Reconfigurable interferometer system
09/13/2005US6943890 Compact interferometer and use in wavelength monitoring
09/09/2005WO2005083377A1 Method and apparatus for producing an image containing depth information
09/08/2005US20050195401 Wavelength meter
09/08/2005US20050194523 Optical phase measurement of target
09/07/2005CN1664515A In-cavity aberration detection system and cavity regulating method for lineal confocal unstable cavity
09/06/2005US6940607 Method for absolute calibration of an interferometer
09/06/2005US6940606 Non-etalon reflective wavelength locking optical sub-assembly and associated methods
09/01/2005US20050190378 Exposure apparatus mounted with measuring apparatus
09/01/2005US20050190374 Optical image measuring apparatus
08/2005
08/31/2005EP1568976A1 Exposure apparatus mounted with measuring apparatus
08/31/2005EP1568963A2 Interferometric apparatus for measuring shapes
08/31/2005CN1661358A Optical image measuring apparatus
08/30/2005US6937346 Wavemeter having two interference elements
08/25/2005US20050185187 Method and apparatus for the direct characterization of the phase of an optical signal
08/23/2005US6934086 Optical component and compact wavelength locking arrangement including such a component
08/23/2005US6934038 Method for optical system coherence testing
08/23/2005US6934035 System and method for measuring optical distance
08/23/2005US6934027 Interferometric measuring device
08/18/2005WO2005048829A3 Ophthalmic binocular wafefront measurement system
08/18/2005US20050180470 Measurement of wavelength transients in tunable lasers
08/11/2005WO2005073689A1 Apparatus and method for correcting for aberrations in a lens system
08/11/2005US20050174576 Gas discharge MOPA laser spectral analysis module
08/11/2005US20050174565 Optical testing method and apparatus
08/11/2005DE102004004004A1 Ansteuerung für ein Heterodyn-Interferometer Control for a heterodyne interferometer
08/10/2005EP1561417A1 Wavefront sensor with off-axis illumination
08/10/2005EP1561416A1 Wavefront sensor with off-axis illumination
08/10/2005EP1561414A1 Method of removing astigmatism from a wavefront in an aberration measurment system
08/09/2005US6927377 Wavelength locking channel monitor
08/04/2005WO2005071844A1 Triggering of a heterodyne interferometer
08/03/2005CN1648622A Systematic error caliberation system and its method for near infrared pulse wavefront interferometer
08/02/2005US6924899 System for measuring wavefront tilt in optical systems and method of calibrating wavefront sensors
08/02/2005US6924898 Phase-shifting interferometry method and system
08/02/2005US6924888 Process and apparatus for recording the deformation of objects
07/2005
07/28/2005WO2005068951A1 Phtodetection device and production method therefor, optical module
07/28/2005US20050163365 Apparatus and method of information extraction from electromagnetic energy based upon multi-characteristic spatial geometry processing
07/28/2005DE10360570A1 Optisches Meßsystem und optisches Meßverfahren An optical measurement system and optical measurement technique
07/27/2005EP0882219B1 High spectral resolution fiber optic spectrometer
07/27/2005CN1647570A Method and device to identify a periodic light source
07/26/2005CA2264051C Method and device for determining the phase- and/or amplitude data of an electromagnetic wave
07/21/2005US20050159733 Method and device for performing online aberrometry in refractive eye correction
07/21/2005US20050157969 Method and system for controlling optical wavelength based on optical frequency pulling
07/20/2005EP1554539A2 Imaging systems
07/20/2005EP1554538A1 Interferometer monitoring
07/19/2005US6919963 Apparatus for detecting wavelength drift and method therefor
07/14/2005US20050151960 Scintillation tolerant optical field sensing system and associated method
07/14/2005DE10202759B4 Echtzeit-wellenlängenkalibrierung für abstimmbare laser Real-time wavelength calibration for tunable laser
07/13/2005CN1639553A Method and arrangement for improving measuring quality during the operation of electro-optical mixing devices
07/12/2005US6917735 Apparatus for interrogating an optical signal
07/12/2005US6917432 Interferometers for measuring changes in optical beam direction
07/12/2005US6917426 Real-time wavefront sensor system
07/07/2005WO2005060823A1 Optical measuring system and optical measuring method
07/07/2005US20050146700 Grating for EUV lithographic system aberration measurement
07/07/2005DE10210038B4 Elektro-optisches Messsystem und Verfahren zur Reduzierung von Störsignalen in einem elektro-optischen Messvorgang Electro-optical measuring system and method for reducing noise in an electro-optical measuring process
07/06/2005CN1635417A An integrated optical M-Z structural module converter
07/05/2005US6914681 Interferometric optical component analyzer based on orthogonal filters
06/2005
06/30/2005WO2005043073A3 Reconfigureable interferometer system
06/30/2005US20050141846 Anti-counterfeit method and system by using a nano metal grating
06/30/2005US20050140853 Liquid crystal display device and inspection method for a transparent substrate
06/28/2005US6912052 Gas discharge MOPA laser spectral analysis module
06/28/2005US6912051 Wavemeter with increased wavelength range
06/28/2005US6911637 Wavefront phase sensors using optically or electrically controlled phase spatial light modulators
06/28/2005US6910770 Eye refractor with active mirror wavefront sensor
06/23/2005WO2005057149A1 Optical measuring system
06/21/2005US6909732 Method and apparatus for controlling optical wavelength based on optical frequency pulling
06/21/2005US6909508 Measuring optical waveforms
06/21/2005CA2126245C Process and device for the differential measurement of refraction indexes and use thereof
06/15/2005EP1541992A1 Time-resolved nonlinear complex sensitivity measuring instrument
06/15/2005EP1541981A1 Spectral phase measurement using phase-diverse coherent optical spectrum analyzer
06/15/2005CN1206514C Wavefront sensor
06/14/2005US6906804 WDM channel monitor and wavelength locker
06/14/2005US6906763 Liquid crystal display device and inspection method for a transparent substrate
06/09/2005WO2005052538A2 Lensometers and wavefront sensors and methods of measuring aberration
06/09/2005US20050125177 Wavelength locker using modulator current and photodetector
06/09/2005US20050122473 Method and apparatus for aberroscope calibration and discrete compensation
06/09/2005DE10349736A1 Feedback-Regelung eines Interferometers Feedback control of an interferometer
06/08/2005EP1537391A1 Method and device for determining a pixel gray scale value image
06/02/2005WO2005048829A2 Ophthalmic binocular wafefront measurement system
06/02/2005US20050117171 Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method
06/02/2005US20050117168 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method
06/02/2005DE4446183B4 Anordnung zur Messung intraokularer Distanzen Arrangement for measuring intraocular distances
06/01/2005EP1536289A2 Measuring method using interference
05/2005
05/31/2005US6900897 Apparatus and method for correcting errors generated by a laser with non-ideal tuning characteristics
05/31/2005US6900896 Method and system for measuring optical characteristics of a sub-component within a composite optical system
05/26/2005WO2005047813A1 Method and apparatus for performing optical imaging using frequency-domain interferometry
05/25/2005EP1533647A1 Method and apparatus for aberroscope calibration and discrete compensation
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