Patents for G01J 9 - Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength (4,525) |
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09/22/2005 | DE4303178B4 Verfahren und Vorrichtung zum Erfassen von Parametern von Stoffen Method and apparatus for detecting parameters of substances |
09/22/2005 | DE10356968A1 Optical system for use as e.g. interferometer, has phase plate with spherical phase disk at its center, where plate is shifted to introduce phase shift between wave fronts of phase object and zero order diffraction |
09/22/2005 | CA2559324A1 Methods and apparatus for wavefront manipulations and improved 3-d measurements |
09/21/2005 | EP1577637A1 Optical heterodyne interferometer for shape measurement |
09/21/2005 | EP1576389A1 Real-time correction of phase distortion |
09/21/2005 | CN2727714Y X-ray interferometer for testing space coherence of synchronous radiation source |
09/21/2005 | CN1670508A Optical image measuring apparatus |
09/21/2005 | CN1220030C Method for analyzing low-coherence fringe |
09/20/2005 | US6947139 Simultaneous optical isolation and channel monitoring system |
09/15/2005 | WO2005085748A1 Optical readhead |
09/15/2005 | US20050201429 Laser source comprising amplifier and adaptive wavefront/polarization driver |
09/14/2005 | EP1574832A2 Optical phase measurement of target |
09/14/2005 | EP1573370A1 Radiation focussing element |
09/14/2005 | CN1667379A Optical phase measurement of target |
09/13/2005 | US6943896 Reconfigurable interferometer system |
09/13/2005 | US6943890 Compact interferometer and use in wavelength monitoring |
09/09/2005 | WO2005083377A1 Method and apparatus for producing an image containing depth information |
09/08/2005 | US20050195401 Wavelength meter |
09/08/2005 | US20050194523 Optical phase measurement of target |
09/07/2005 | CN1664515A In-cavity aberration detection system and cavity regulating method for lineal confocal unstable cavity |
09/06/2005 | US6940607 Method for absolute calibration of an interferometer |
09/06/2005 | US6940606 Non-etalon reflective wavelength locking optical sub-assembly and associated methods |
09/01/2005 | US20050190378 Exposure apparatus mounted with measuring apparatus |
09/01/2005 | US20050190374 Optical image measuring apparatus |
08/31/2005 | EP1568976A1 Exposure apparatus mounted with measuring apparatus |
08/31/2005 | EP1568963A2 Interferometric apparatus for measuring shapes |
08/31/2005 | CN1661358A Optical image measuring apparatus |
08/30/2005 | US6937346 Wavemeter having two interference elements |
08/25/2005 | US20050185187 Method and apparatus for the direct characterization of the phase of an optical signal |
08/23/2005 | US6934086 Optical component and compact wavelength locking arrangement including such a component |
08/23/2005 | US6934038 Method for optical system coherence testing |
08/23/2005 | US6934035 System and method for measuring optical distance |
08/23/2005 | US6934027 Interferometric measuring device |
08/18/2005 | WO2005048829A3 Ophthalmic binocular wafefront measurement system |
08/18/2005 | US20050180470 Measurement of wavelength transients in tunable lasers |
08/11/2005 | WO2005073689A1 Apparatus and method for correcting for aberrations in a lens system |
08/11/2005 | US20050174576 Gas discharge MOPA laser spectral analysis module |
08/11/2005 | US20050174565 Optical testing method and apparatus |
08/11/2005 | DE102004004004A1 Ansteuerung für ein Heterodyn-Interferometer Control for a heterodyne interferometer |
08/10/2005 | EP1561417A1 Wavefront sensor with off-axis illumination |
08/10/2005 | EP1561416A1 Wavefront sensor with off-axis illumination |
08/10/2005 | EP1561414A1 Method of removing astigmatism from a wavefront in an aberration measurment system |
08/09/2005 | US6927377 Wavelength locking channel monitor |
08/04/2005 | WO2005071844A1 Triggering of a heterodyne interferometer |
08/03/2005 | CN1648622A Systematic error caliberation system and its method for near infrared pulse wavefront interferometer |
08/02/2005 | US6924899 System for measuring wavefront tilt in optical systems and method of calibrating wavefront sensors |
08/02/2005 | US6924898 Phase-shifting interferometry method and system |
08/02/2005 | US6924888 Process and apparatus for recording the deformation of objects |
07/28/2005 | WO2005068951A1 Phtodetection device and production method therefor, optical module |
07/28/2005 | US20050163365 Apparatus and method of information extraction from electromagnetic energy based upon multi-characteristic spatial geometry processing |
07/28/2005 | DE10360570A1 Optisches Meßsystem und optisches Meßverfahren An optical measurement system and optical measurement technique |
07/27/2005 | EP0882219B1 High spectral resolution fiber optic spectrometer |
07/27/2005 | CN1647570A Method and device to identify a periodic light source |
07/26/2005 | CA2264051C Method and device for determining the phase- and/or amplitude data of an electromagnetic wave |
07/21/2005 | US20050159733 Method and device for performing online aberrometry in refractive eye correction |
07/21/2005 | US20050157969 Method and system for controlling optical wavelength based on optical frequency pulling |
07/20/2005 | EP1554539A2 Imaging systems |
07/20/2005 | EP1554538A1 Interferometer monitoring |
07/19/2005 | US6919963 Apparatus for detecting wavelength drift and method therefor |
07/14/2005 | US20050151960 Scintillation tolerant optical field sensing system and associated method |
07/14/2005 | DE10202759B4 Echtzeit-wellenlängenkalibrierung für abstimmbare laser Real-time wavelength calibration for tunable laser |
07/13/2005 | CN1639553A Method and arrangement for improving measuring quality during the operation of electro-optical mixing devices |
07/12/2005 | US6917735 Apparatus for interrogating an optical signal |
07/12/2005 | US6917432 Interferometers for measuring changes in optical beam direction |
07/12/2005 | US6917426 Real-time wavefront sensor system |
07/07/2005 | WO2005060823A1 Optical measuring system and optical measuring method |
07/07/2005 | US20050146700 Grating for EUV lithographic system aberration measurement |
07/07/2005 | DE10210038B4 Elektro-optisches Messsystem und Verfahren zur Reduzierung von Störsignalen in einem elektro-optischen Messvorgang Electro-optical measuring system and method for reducing noise in an electro-optical measuring process |
07/06/2005 | CN1635417A An integrated optical M-Z structural module converter |
07/05/2005 | US6914681 Interferometric optical component analyzer based on orthogonal filters |
06/30/2005 | WO2005043073A3 Reconfigureable interferometer system |
06/30/2005 | US20050141846 Anti-counterfeit method and system by using a nano metal grating |
06/30/2005 | US20050140853 Liquid crystal display device and inspection method for a transparent substrate |
06/28/2005 | US6912052 Gas discharge MOPA laser spectral analysis module |
06/28/2005 | US6912051 Wavemeter with increased wavelength range |
06/28/2005 | US6911637 Wavefront phase sensors using optically or electrically controlled phase spatial light modulators |
06/28/2005 | US6910770 Eye refractor with active mirror wavefront sensor |
06/23/2005 | WO2005057149A1 Optical measuring system |
06/21/2005 | US6909732 Method and apparatus for controlling optical wavelength based on optical frequency pulling |
06/21/2005 | US6909508 Measuring optical waveforms |
06/21/2005 | CA2126245C Process and device for the differential measurement of refraction indexes and use thereof |
06/15/2005 | EP1541992A1 Time-resolved nonlinear complex sensitivity measuring instrument |
06/15/2005 | EP1541981A1 Spectral phase measurement using phase-diverse coherent optical spectrum analyzer |
06/15/2005 | CN1206514C Wavefront sensor |
06/14/2005 | US6906804 WDM channel monitor and wavelength locker |
06/14/2005 | US6906763 Liquid crystal display device and inspection method for a transparent substrate |
06/09/2005 | WO2005052538A2 Lensometers and wavefront sensors and methods of measuring aberration |
06/09/2005 | US20050125177 Wavelength locker using modulator current and photodetector |
06/09/2005 | US20050122473 Method and apparatus for aberroscope calibration and discrete compensation |
06/09/2005 | DE10349736A1 Feedback-Regelung eines Interferometers Feedback control of an interferometer |
06/08/2005 | EP1537391A1 Method and device for determining a pixel gray scale value image |
06/02/2005 | WO2005048829A2 Ophthalmic binocular wafefront measurement system |
06/02/2005 | US20050117171 Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method |
06/02/2005 | US20050117168 Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method |
06/02/2005 | DE4446183B4 Anordnung zur Messung intraokularer Distanzen Arrangement for measuring intraocular distances |
06/01/2005 | EP1536289A2 Measuring method using interference |
05/31/2005 | US6900897 Apparatus and method for correcting errors generated by a laser with non-ideal tuning characteristics |
05/31/2005 | US6900896 Method and system for measuring optical characteristics of a sub-component within a composite optical system |
05/26/2005 | WO2005047813A1 Method and apparatus for performing optical imaging using frequency-domain interferometry |
05/25/2005 | EP1533647A1 Method and apparatus for aberroscope calibration and discrete compensation |