Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
02/2007
02/07/2007EP1046127A4 Method and apparatus for three-dimensional inspection of electronic components
02/07/2007CN2867288Y Non-contact type surface topographic measuring instrument based on vertical displacement scanning
02/07/2007CN2867287Y Non-contact type surface topographic measuring instrument based on vertical displacement scanning
02/07/2007CN2867286Y Cyrtometer
02/07/2007CN2867285Y Suspension particles diameter measuring device
02/07/2007CN2867284Y Grating rule reading head slider
02/07/2007CN2867283Y Butt-joining mechanism for lengthening grating rule
02/07/2007CN2867282Y High precision accuracy angle measuring implement for oscillating recurrent device
02/07/2007CN1910437A A connector box partly embedded in a fibre-reinforced part for protecting and connecting purposes
02/07/2007CN1910436A Device including a system adapted for use in temperature compensation of strain measurements in fibre-reinforced structures
02/07/2007CN1908625A Time resolving two-dimensional laser light scattering apparatus with small and large angle
02/07/2007CN1908579A Sensing method and device for measuring deformation of contact surface
02/07/2007CN1908578A High precision and fast extraction device with optical strip image features and method thereof
02/06/2007US7174061 Extensometer comprising a flexible sensing element and Bragg gratings
02/06/2007US7174037 Imaging apparatus and method
02/06/2007US7173716 Alignment apparatus, exposure apparatus using the same, and method of manufacturing devices
02/06/2007US7173714 Apparatus for parallel detection of the behaviour of mechanical micro-oscillators
02/06/2007US7173699 Spectroscopic scatterometer system
02/06/2007US7173693 Method for inspecting defects and an apparatus of the same
02/06/2007US7173692 Device and method for optically inspecting operating holes formed in heads of screws
02/06/2007US7173691 Method for calibrating the geometry of a multi-axis metrology system
02/06/2007US7173270 Detector system for detecting a height of a particle, and lithographic apparatus and device manufacturing method including the same.
02/06/2007US7173268 Method of measuring pattern dimension and method of controlling semiconductor device process
02/06/2007US7172720 Apparatus and method for measuring and of controlling the gap between polymer sheet cooling rolls
02/01/2007WO2007013299A1 Position detection system
02/01/2007WO2007013215A1 Image display device
02/01/2007WO2006015262A3 Method for processing multiwavelength interferometric imaging data
02/01/2007WO2006009740A3 Monitoring system communication system and method
02/01/2007US20070027442 Ophthalmic device positioning system and associated methods
02/01/2007US20070025612 Image input-and-output apparatus
02/01/2007US20070024871 Method and apparatus for measuring thickness of thin films via transient thermoreflectance
02/01/2007US20070024870 Apparatuses and methods for measuring head suspensions and head suspension assemblies
02/01/2007US20070024869 Diffraction Grating Based Interferometric Systems And Methods
02/01/2007US20070024868 Interferometers for optical coherence domain reflectometry...
02/01/2007US20070024867 Statistical method of generating a synthetic hologram from measured data
02/01/2007US20070024866 Method of combining holograms
02/01/2007US20070024865 Optical encoder having slanted optical detector elements for harmonic suppression
02/01/2007US20070024864 Position measurement apparatus and method and pattern forming apparatus and writing method
02/01/2007US20070024863 Interference measurement apparatus
02/01/2007US20070024862 Interference measurement apparatus
02/01/2007US20070024861 Laser tracking interferometer
02/01/2007US20070024860 Dual laser high precision interferometer
02/01/2007US20070024859 Method for determining the refractive index during interferometric length measurement and interferometric arrangement therefor
02/01/2007US20070024858 Inner surface measuring apparatus
02/01/2007US20070024856 Optical coherence imaging systems having a reduced effective linewidth and methods of using the same
02/01/2007US20070024845 Measuring device and measuring method for determining distance and/or position
02/01/2007US20070022728 Method for determining the effects of fancy yarn
02/01/2007DE10225845B4 Aufschnitt-Schneidemaschine und Verfahren zum Betreiben einer Aufschnitt-Schneidemaschine Food product slicing machine and method of operating a slicing machine
02/01/2007DE102005051812A1 Device for etching layers on semiconductor wafers, uses spectrometer for measurement of etching medium concentration
02/01/2007DE102005035871A1 Vehicle wheel`s contact surface evenness testing method for wheel manufacturing industry, involves transmitting light that comes through gap between contact surface and measuring plate, where gap depends on insufficient evenness of surface
02/01/2007DE102005035553A1 Photolithographic mask optical analysis method for use in semiconductor industry, involves classifying flaws on mask based on comparison of images of defined flaws during confocal and dark field lighting
02/01/2007DE102005035410A1 Optical detecting device for packaged foods, has camera for visual detection of packaged goods that are fed on conveyor, and mirrors deflecting beam paths of camera to form beam paths, which are larger than vertical dimension of housing
02/01/2007DE102005032246A1 Vorrichtung und Verfahren zur Detektierung des Durchfahrtsprofils eines 3D-Objektes Apparatus and method for detecting the passage profile of a 3D object
02/01/2007DE102005031490A1 Kostengünstige multi-sensorielle Oberflächeninspektion Cost-effective multi-sensory surface inspection
02/01/2007DE102004062412B4 Verfahren zur räumlichen Vermessung sich schnell bewegender Objekte Method for the spatial measurement of fast-moving objects
02/01/2007DE10136513B4 Verfahren und Vorrichtung zur Messung von temperaturbedingten Längenänderungen eines Piezoaktors Method and device for measurement of temperature-induced changes in length of a piezoelectric actuator
02/01/2007DE10043467B4 System und Verfahren zum Ermitteln einer Straßenmarkierungslinie System and method for determining a road marking line
02/01/2007CA2615847A1 Method for measuring a shape anomaly on an aircraft structural panel and system therefor
01/2007
01/31/2007EP1747663A2 Hand held portable three dimensional scanner
01/31/2007EP1747422A1 Method and device for detecting the condition of and machining switches in track systems
01/31/2007EP0910785B1 Easy toe adjustment
01/31/2007CN2864591Y Measuring device for tumbler type collimating target
01/31/2007CN2864590Y Laser alignment modulation position finder
01/31/2007CN2864589Y Automatic detecting apparatus for physical dimension unevenness of workpiece surface
01/31/2007CN1906478A Advanced roughness metrology
01/31/2007CN1906461A Method and device for detecting direction of member having outer periphery formed in vertically asymmetrical shape
01/31/2007CN1906102A Installation for processing plate-shaped substrates
01/31/2007CN1905633A Systems and methods for controlling strobe illumination
01/31/2007CN1904548A Equipment used for space position precise measurement
01/31/2007CN1904547A Asymmetric checking device and asymmetric checking method
01/31/2007CN1904546A Subdivision device of position detection signal
01/31/2007CN1904545A Method of measuring occluded features for high precision machine vision metrology
01/31/2007CN1298036C Surface checking method and surface checker
01/31/2007CN1297799C Measurement of wheel and axle alignment of motor vehicles
01/31/2007CN1297798C 2-D, large range laser deflection / displacement measuring method and apparatus
01/31/2007CN1297797C Method for raising location accuracy of laser heterodyne difference interferometer
01/31/2007CN1297796C Linear array photoelectric sensor chromatographic scanning three-dimension measuring method and device thereof
01/30/2007US7171332 Method of assessing a surface of a fuel injector assembly
01/30/2007US7171330 Rotation and/or tilt angle detection means for a ball and socket joint
01/30/2007US7171320 Coordinate measuring system and method of correcting coordinates measured in coordinate measuring machine
01/30/2007US7171285 Mobile robot using image sensor and method for measuring moving distance thereof
01/30/2007US7171041 Position-orientation recognition device
01/30/2007US7170648 Device for scanning register marks into a polychrome printing machine
01/30/2007US7170613 Surface inspecting apparatus that determines an edge position of an object
01/30/2007US7170612 Scanning ultrasound detection device using two-wave mixing in photorefractive crystal interferometry
01/30/2007US7170610 Low-coherence inferometric device for light-optical scanning of an object
01/30/2007US7170606 Multi-way LED-based surface reflectance sensor and spectrophotometer
01/30/2007US7170604 Overlay metrology method and apparatus using more than one grating per measurement direction
01/30/2007US7170603 Position detection apparatus and exposure apparatus
01/30/2007US7170593 Method of reviewing detected defects
01/30/2007US7170590 Distributed optical fiber sensor system
01/30/2007US7170494 Optical navigation sensor device and image processing method using 2-dimensional sequential image process
01/30/2007US7170075 Inspection tool with a 3D point sensor to develop a focus map
01/30/2007US7168290 Aligning components of a measuring system
01/30/2007US7168164 Methods for forming via shielding
01/30/2007CA2427344C Wheel alignment measuring method and apparatus
01/25/2007WO2007011970A2 Methods and systems for ultra-precise measurement and control of object motion in six degrees of freedom by projection and measurement of interference fringes
01/25/2007WO2007010875A1 Shape inspection method and device
01/25/2007WO2007010636A1 Device for inspecting container outer shape
01/25/2007WO2007010635A1 Outer shape inspection device for container