| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/23/2008 | CN101109619A Three-dimensional on-line measuring method and system using synthesis wave to interfere whole-field nano surface |
| 01/23/2008 | CN101109618A Three-dimensional on-line measuring method and system using synthesis wave to interfere whole-field nano surface |
| 01/23/2008 | CN101109617A Converse measuring method and device based on axial direction stereovision |
| 01/23/2008 | CN101109616A Tri-band heterodyne phase shift phase demodulation method |
| 01/23/2008 | CN100363780C Producing method of optical device, positioning master, optical device and projector |
| 01/23/2008 | CN100363712C Equipment used for space position precise measurement |
| 01/23/2008 | CN100363711C Structured light projector |
| 01/23/2008 | CN100363710C Micro-structural 3D information obtaining method based on phase shifting interference image sequence analysis |
| 01/23/2008 | CN100363709C Method for verifying scanning accuracy of laser measurement platform |
| 01/22/2008 | US7321859 Billing system and method for determining transportation charges for packages |
| 01/22/2008 | US7321853 Speech recognition apparatus and speech recognition method |
| 01/22/2008 | US7321841 Three-dimensional shape measuring method and measuring apparatus thereof |
| 01/22/2008 | US7321839 Method and apparatus for calibration of camera system, and method of manufacturing camera system |
| 01/22/2008 | US7321680 Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system |
| 01/22/2008 | US7321433 Method and apparatus for optically measuring the topography of nearly planar periodic structures |
| 01/22/2008 | US7321432 Measurement and compensation of errors in interferometers |
| 01/22/2008 | US7321431 Method and system for analyzing low-coherence interferometry signals for information about thin film structures |
| 01/22/2008 | US7321430 Vibration resistant interferometry |
| 01/22/2008 | US7321427 Multiple beam ellipsometer |
| 01/22/2008 | US7321426 Optical metrology on patterned samples |
| 01/22/2008 | US7321420 Survey system |
| 01/22/2008 | US7321112 Optical elements, related manufacturing methods and assemblies incorporating optical elements |
| 01/22/2008 | US7320237 Method for measuring misalignment of continuance mill and apparatus for measuring the same |
| 01/17/2008 | WO2008008575A2 Portable optical wound scanner |
| 01/17/2008 | WO2008008210A2 Handheld laser light detector with height correction, using a gps receiver to provide two-dimensional position data |
| 01/17/2008 | WO2008007838A1 Stage with displacement magnification mechanism for measuring |
| 01/17/2008 | WO2008007781A1 Visual axis direction detection device and visual line direction detection method |
| 01/17/2008 | WO2008007765A1 Surface position detecting apparatus, exposure apparatus and device manufacturing method |
| 01/17/2008 | WO2008007614A1 Surface inspecting apparatus |
| 01/17/2008 | WO2007135465A3 Glazing inspection method |
| 01/17/2008 | WO2007135159A3 Measuring instrument for determining the actual condition of wheel sets |
| 01/17/2008 | WO2007124010A3 Camera based six degree-of-freedom target measuring and target tracking device |
| 01/17/2008 | WO2007033069A3 Tracking algorithm for linear array signal processor for fabry-perot cross-correlation pattern and method of using same |
| 01/17/2008 | WO2007010537A3 Reconstruction stabilizer and active vision |
| 01/17/2008 | WO2005033628A3 Invisible target illuminators for 3d camera-based alignment systems |
| 01/17/2008 | US20080015812 Parallel profile determination for an optical metrology system |
| 01/17/2008 | US20080015811 Handheld laser light detector with height correction, using a GPS receiver to provide two-dimensional position data |
| 01/17/2008 | US20080013879 Optical fiber based sensor system suitable for monitoring remote aqueous infiltration |
| 01/17/2008 | US20080013824 Defect inspection method, defect inspection apparatus, and semiconductor device manufacturing method |
| 01/17/2008 | US20080013108 Parallel profile determination in optical metrology |
| 01/17/2008 | US20080013107 Generating a profile model to characterize a structure to be examined using optical metrology |
| 01/17/2008 | US20080013106 Optical position transducer systems and methods employing reflected illumination for limited rotation motor systems |
| 01/17/2008 | US20080013105 Scale Reading Apparatus |
| 01/17/2008 | US20080013104 Pick and place machine with improved component placement inspection |
| 01/17/2008 | US20080013103 Displacement sensor |
| 01/17/2008 | US20080013102 Micro-electromechanical sensor device |
| 01/17/2008 | US20080013101 Repairing method for dark areas on a surface profile and a surface profile measuring method |
| 01/17/2008 | US20080013100 Surface profile measuring method and an apparatus thereof |
| 01/17/2008 | US20080013099 Exposure apparatus |
| 01/17/2008 | US20080013098 Displacement interferometer system and exposer using the same |
| 01/17/2008 | US20080013097 Resonant scanning mirror |
| 01/17/2008 | US20080013093 Methods, Systems and Computer Program Products for Removing Undesired Artifacts in Fourier Domain Optical Coherence Tomography (FDOCT) Systems Using Continuous Phase Modulation and Related Phase Modulators |
| 01/17/2008 | US20080013091 Position detecting method and apparatus |
| 01/17/2008 | US20080013090 Measurement method, measurement unit, processing unit, pattern forming method , and device manufacturing method |
| 01/17/2008 | US20080013089 Positioning method, processing system, measurement method of substrate loading repeatability, position measurement method, exposure method, substrate processing apparatus, measurement method, and measurement apparatus |
| 01/17/2008 | US20080013088 Device And Method For Representing The Direction Of Action Of A Working Means |
| 01/17/2008 | US20080013087 Alignment form |
| 01/17/2008 | US20080013081 Set of sensors determining alignment angles, angle measurement system and process of vehicle wheels alignment |
| 01/17/2008 | US20080013078 Optical Mapping Apparatus with Optimized OCT Configuration |
| 01/17/2008 | US20080011977 Oriented magnetic particle-fluorescence detectable moiety compositions and methods of making and using the same |
| 01/17/2008 | US20080011229 Optical film thickness controlling method, optical film thickness controlling apparatus, dielectric multilayer film manufacturing apparatus, and dielectric multilayer film manufactured using the same controlling apparatus or manufacturing apparatus |
| 01/17/2008 | US20080010844 Method and Arrangement for Measuring the Position of a Circular Object |
| 01/17/2008 | DE102006040407A1 Verfahren und Vorrichtung zur Bewertung eines Oberflächenprofils eines Gelenkbauteils Method and apparatus for evaluating a surface profile of a joint member |
| 01/17/2008 | DE102006032769A1 Device for optimization of geometrical parameters of vehicle installations in surrounding of person sitting on vehicle seat, has detecting device which comprises electronic camera, directed toward person, and image evaluation unit |
| 01/17/2008 | DE102006032744A1 Method for determination of abrasiveness of fluid flow, particularly in injectors of injecting systems of motor vehicles, involves detecting rate of change of phase difference between reference light beam and object light beam |
| 01/17/2008 | DE102006031580A1 Verfahren und Vorrichtung zum dreidimensionalen Erfassen eines Raumbereichs Method and apparatus for three-dimensionally detecting a region of space |
| 01/17/2008 | DE102006023745A1 Verfahren zur Erfassung von Unregelmäßigkeiten an einem Messobjekt A method of detecting irregularities on a measurement object |
| 01/16/2008 | EP1879049A1 Space information detecting device, and space information detecting system using the device |
| 01/16/2008 | EP1879015A1 Heterodyne laser doppler probe and measurement system using the same |
| 01/16/2008 | EP1878997A2 Displacement sensor |
| 01/16/2008 | EP1878996A1 Distance/speed meter and distance/speed measurement method |
| 01/16/2008 | EP1877758A2 Wafer edge inspection |
| 01/16/2008 | EP1877726A1 Auto-referenced system and apparatus for three-dimensional scanning |
| 01/16/2008 | EP1877725A2 A device and method for measuring the thickness of a layer of a substance or material deposited on a section of road, and a monitoring system comprising said device |
| 01/16/2008 | EP1186004B1 Processing chamber with optical window cleaned using process gas |
| 01/16/2008 | CN201007646Y Liquid auxiliary dislocation scanning three-dimensional shape measuring apparatus |
| 01/16/2008 | CN201007645Y Paper size detecting mechanism of image scanning equipment |
| 01/16/2008 | CN201007644Y Non-contact type manual vehicle bilateral symmetry point height difference detecting instrument |
| 01/16/2008 | CN201005489Y Pressure testing apparatus of the electric pressure cooker |
| 01/16/2008 | CN101107495A Metrological characterization of microelectronic circuits |
| 01/16/2008 | CN101105935A Optical transducer system, optical modulator and musical instrument using the same |
| 01/16/2008 | CN101105394A Rudder angle sensor |
| 01/16/2008 | CN101105393A Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile |
| 01/16/2008 | CN101105392A 位移传感器 Displacement sensors |
| 01/16/2008 | CN101105391A Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
| 01/16/2008 | CN101105390A Synthetic wave interference nano surface tri-dimensional on-line measuring system and method |
| 01/16/2008 | CN101105389A High accuracy non-contact tri-dimensional facial type measuring device |
| 01/16/2008 | CN100362711C Mfg. method of spark plug and its mfg. appts. |
| 01/16/2008 | CN100362317C Device for detecting probe element position in multipe coodinate measurers |
| 01/15/2008 | US7319777 Image analysis apparatus |
| 01/15/2008 | US7319530 System and method for measuring germanium concentration for manufacturing control of BiCMOS films |
| 01/15/2008 | US7319529 Method and apparatus for colour imaging a three-dimensional structure |
| 01/15/2008 | US7319528 Surface texture measuring instrument |
| 01/15/2008 | US7319527 Sensor with cantilever and optical resonator |
| 01/15/2008 | US7319526 Apparatus for detecting displacement |
| 01/15/2008 | US7319521 Measuring device |
| 01/15/2008 | US7319516 Measurement instrument for inspecting painted bodywork parts, the instrument being provided with an anti-damage device |
| 01/15/2008 | US7319515 Rotary laser apparatus |
| 01/15/2008 | US7319514 Optical inclination sensor |
| 01/15/2008 | US7319506 Alignment system and method |