Patents
Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827)
06/2010
06/03/2010US20100136886 Polishing apparatus and substrate processing apparatus
06/02/2010EP2190626A1 Method and device for machining workpieces
06/02/2010DE112005000112B4 Online-Schleifverfahren für Arbeitswalze Online-grinding method for Stripper
06/02/2010DE10314212B4 Verfahren zur Herstellung eines Maskenrohlings, Verfahren zur Herstellung einer Transfermaske A method of producing a mask blank, method of manufacturing a transfer mask
06/02/2010DE102008007175B4 Verfahren zum Schleifen der Haupt- und Hublager einer Kurbelwelle durch Außenrundschleifen und Vorrichtung zur Durchführung des Verfahrens Method for grinding the main and rod bearings of a crankshaft by external cylindrical grinding and apparatus for performing the method
06/02/2010CN101716747A Piezoelectric type grinding force measuring device for ultraprecise grinding machine of silicon wafer
06/02/2010CN101474764B Stepless speed change adjusting and controlling method for grinding wheel of grinding machine
06/01/2010US7727051 Servo stroking apparatus and system
06/01/2010US7727049 Friction sensor for polishing system
06/01/2010US7726808 Rimless spectacle lens bore polishing method and apparatus
05/2010
05/27/2010US20100130101 Two-line mixing of chemical and abrasive particles with endpoint control for chemical mechanical polishing
05/27/2010US20100130100 Using optical metrology for wafer to wafer feed back process control
05/27/2010US20100130099 Retread tire buffing with multiple response curves
05/27/2010DE102008058814A1 Method for round grinding of workpieces on grinding machine, involves clamping workpieces in grinding headstock, and causing uneven material removal by controlled delivery of grinding headstock over circumference of workpieces
05/27/2010DE102008058638A1 Verfahren zum Betreiben einer Doppelseitenschleifmaschine sowie Doppelseitenschleifmaschine Method for operating a double side grinding and double side grinding
05/26/2010EP2188091A1 Process and apparatus for grinding tyres
05/26/2010CN201483338U Novel stone polisher
05/26/2010CN201483318U Beveling device of mask beveling edger
05/26/2010CN201483308U Automatic feeding device for external grinding of vibration reduction sleeve products
05/26/2010CN1890055B Chemical mechanical polishing method for reducing slurry reflux
05/25/2010US7725208 Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
05/25/2010US7722437 Manufacturing method of semiconductor integrated circuit device
05/25/2010US7722436 Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model
05/25/2010US7722435 Sander
05/20/2010US20100124870 Semi-Quantitative Thickness Determination
05/19/2010CN201471261U Equipment for automatically compensate for moving heat sources of mid-waist guide-rail column based on symmetry and balance principles
05/19/2010CN101318280B Overlength bed way precision finishing process
05/18/2010US7720562 Polishing method and polishing apparatus
05/13/2010US20100120334 Automated chemical polishing system adapted for soft semiconductor materials
05/13/2010US20100120333 In-Line Wafer Thickness Sensing
05/13/2010US20100120331 Endpoint control of multiple-wafer chemical mechanical polishing
05/13/2010US20100120330 Endpoint control of multiple-wafer chemical mechanical polishing
05/12/2010EP2184770A1 Polishing apparatus
05/12/2010DE102008056276A1 Method for regulating working gap of double side processing machine, involves deforming working disk of consecutively delivered working disks by adjustment device for changing form of working gap
05/11/2010US7714572 Method of detecting characteristics of films using eddy current
05/11/2010US7713108 Eyeglass lens processing apparatus
05/11/2010US7713106 Device grinding method
05/11/2010US7712219 Process for the aligning of tooth spaces of a workpiece with precut teeth
05/11/2010CA2406848C Method and apparatus for providing a residual stress distribution in the surface of a part
05/06/2010US20100112903 Dishing and defect control of chemical mechanical polishing using real-time adjustable additive delivery
05/06/2010US20100112901 Substrate polishing apparatus and substrate polishing method
05/06/2010US20100112900 Predictive Method to Improve within Wafer CMP Uniformity through Optimized Pad Conditioning
05/06/2010US20100112899 Visual feedback for airfoil polishing
05/06/2010DE102008054309A1 Schleifverfahren und Schleifvorrichtung Grinding method and grinding device
05/05/2010EP2181805A2 Device and method for determining the coefficient of friction of conditioner discs
05/05/2010EP2181803A1 Visual feedback for airfoil polishing
05/05/2010EP2181802A1 Grinding machine and grinding method
05/05/2010EP1138071B1 A method and system for polishing semiconductor wafers
05/05/2010CN201446491U Device for automatically measuring chamfer of processing workpiece
04/2010
04/29/2010US20100105292 Method for machining that combines fine boring and honing and machining equipment for the execution of the method
04/29/2010US20100105291 Methods and apparatus for polishing a notch of a substrate
04/29/2010US20100105290 Methods and apparatus for indicating a polishing tape end
04/29/2010US20100105289 Grinding machine and grinding method
04/29/2010US20100105288 Multiple libraries for spectrographic monitoring of zones of a substrate during processing
04/28/2010CN201442197U Roller grinding machine provided with rapid aligning device
04/28/2010CN201442193U Precision grinding machine for drill bits
04/28/2010CN1796050B Tools for grinding samples of detection for electron microscope
04/28/2010CN1791491B 基片抛光设备 Substrate polishing equipment
04/28/2010CN1751857B Automatic optimizing design method for constant force griding wave filter
04/28/2010CN101698269A Method for deep rolling crankshafts
04/27/2010US7704122 Customized polish pads for chemical mechanical planarization
04/27/2010US7703193 Methods and apparatus for controlling the lapping of a slider based on an amplitude of a readback signal produced from an externally applied magnetic field
04/22/2010US20100099334 Eddy Current Gain Compensation
04/21/2010EP2176028A1 Methods of crystallographically reorienting single crystal bodies
04/21/2010EP2094440B1 Precision abrasive machining of work piece surfaces
04/21/2010CN201439174U Quick drill bit grinder
04/20/2010US7699685 Method and apparatus for grinding a workpiece
04/15/2010US20100093260 Method of making diagram for use in selection of wavelength of light for polishing endpoint detection, method and apparatus for selecting wavelength of light for polishing endpoint detection, polishing endpoint detection method, polishing endpoint detection apparatus, and polishing monitoring method
04/15/2010US20100093259 Chemical Mechanical Polish Process Control for Improvement in Within-Wafer Thickness Uniformity
04/14/2010EP2174092A1 Apparatus and method for checking thickness dimensions of an element while it is being machined
04/14/2010CN1807020B Calibration method and corrosion and milling machine used thereof
04/14/2010CN101693354A Substrate polishing apparatus
04/14/2010CN101693352A Method and system for controlling the chemical mechanical polishing by using a sensor signal of a pad conditioner
04/14/2010CN101693350A Drill bit grinding device and testing method
04/13/2010US7698012 Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
04/08/2010WO2010037469A1 Method for measuring the thickness of disc-shaped work pieces machined in a machine tool
04/08/2010US20100087123 Method For Assessing Workpiece Nanotopology Using A Double Side Wafer Grinder
04/07/2010CN101439489B Centering indicator for numerical control accurate grinding of high-hardness revolving spherical surface
04/06/2010US7691279 Method of producing a glass substrate for a mask blank and method of producing a mask blank
04/06/2010US7690967 Mounting structure for measuring device and grinding machine with the structure
04/06/2010US7690966 Method and apparatus for detecting planarization of metal films prior to clearing
04/06/2010US7690127 Apparatus for the dimensional checking of an orbitally rotating crankpin of a crankshaft
04/01/2010US20100081360 Use of pad conditioning in temperature controlled cmp
04/01/2010DE102008048566A1 Schleifmaschine für die Oberflächenbearbeitung von Rohren Grinding machine for surface treatment of tubes
03/2010
03/31/2010EP2167275A1 Grinding center and method for the simultaneous grinding of multiple crankshaft bearings
03/31/2010CN201432247Y Compensation measuring device of polishing wheel
03/31/2010CN201432222Y Form grinding device for insulation sheath of cable conductor
03/31/2010CN101687301A Method for grinding the main and rod bearings of a crankshaft through out-of-round grinding and device for carrying out the method
03/25/2010WO2009152008A3 Cmp pad identification and layer ratio modeling
03/25/2010US20100075576 Polishing state monitoring apparatus and polishing apparatus and method
03/24/2010EP2165804A2 Grinding machine for the surface machining of tubes
03/23/2010US7682223 Gear manufacturing machine and process for the operation of such a gear manufacturing machine
03/23/2010US7682222 Variable rate method of machining gears
03/23/2010US7682221 Integrated endpoint detection system with optical and eddy current monitoring
03/23/2010US7682220 Glass-plate working apparatus
03/17/2010CN101670553A External grinding multiparameter integrated quality monitoring device and method
03/17/2010CN101670552A Material removing rate control system based on fast polishing technology
03/16/2010US7678245 Method and apparatus for electrochemical mechanical processing
03/16/2010US7677959 Multilayer polishing pad and method of making
03/16/2010US7677955 Grinding method for wafer
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