Patents for B23H 5 - Combined machining (1,281)
07/2005
07/27/2005CN1212651C Electrolysis polishing method
07/21/2005WO2004078411A3 Method and apparatus for local polishing control
07/21/2005US20050155868 Electrolytic processing apparatus and electrolytic processing method
07/14/2005US20050150776 Electrolytic etching method and apparatus
07/07/2005WO2005061177A1 Pad assembly for electrochemical mechanical processing
07/07/2005WO2004111314B1 Algorithm for real-time process control of electro-polishing
07/07/2005US20050145507 Amines, amides, carboxylate, dicarboxylate or tri-carboxylate groups containing chelating agents, a substituted or unsubstituted benzotriazole or a polymeric corrosion resistance agent, sodium hydroxide or ammonium hydroxide as pH adjuster, a solvent
07/07/2005US20050145489 Electroetching process and system
06/2005
06/30/2005WO2005059970A2 Controlling removal rate uniformity of an electropolishing process in integrated circuit fabrication
06/30/2005WO2005058543A1 Method of electrochemical chemical mechanical planarization process
06/23/2005US20050133380 Electroetching methods and systems using chemical and mechanical influence
06/23/2005US20050133363 Conductive polishing article for electrochemical mechanical polishing
06/23/2005US20050133277 Superhard mill cutters and related methods
06/21/2005US6908860 Method for manufacturing semiconductor device and apparatus for manufacturing thereof
06/09/2005WO2004111314A3 Algorithm for real-time process control of electro-polishing
06/09/2005WO2004108358A3 Conductive polishing article for electrochemical mechanical polishing
06/08/2005EP1536919A1 Method and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate
06/02/2005US20050115838 Electrolytic processing apparatus and method
05/2005
05/31/2005US6899804 Electrolyte composition and treatment for electrolytic chemical mechanical polishing
05/26/2005WO2005046872A1 Integrated circuit interconnect fabrication systems and methods
05/17/2005US6893328 Conductive polishing pad with anode and cathode
05/12/2005WO2005042810A2 Membrane -mediated electropolishing
05/12/2005US20050101138 System and method for applying constant pressure during electroplating and electropolishing
05/12/2005US20050098446 comprising backing layers secured to the polishing layers, having compressibility and hardness, used for chemical mechanical polishing
05/05/2005US20050092621 Improved contact element with holes formed through the pad body, filled with a conductive material, exposing the electrode to the processing surface; remove copper material from printed circuits surface; electrical apparatus
05/05/2005US20050092620 Incrementally introducing abrasive particles; accurate removal of conductive barrier material; reduced defects
04/2005
04/28/2005US20050087451 Abrasive electrolyte
04/28/2005US20050087450 For thinning layer on semiconductor/integrated circuit substrate, without damaging underlying layer
04/26/2005US6884153 Apparatus for electrochemical processing
04/19/2005US6881664 Process for planarizing upper surface of damascene wiring structure for integrated circuit structures
04/14/2005US20050077188 Establishing electrically conductive path through electrolyte between exposed layer of barrier material on substrate and electrode, electrochemically removing portion of exposed layer during first processing step in barrier processing station, detecting endpoint, processing exposed barrier layer
04/06/2005EP1520281A2 Low-force electrochemical mechanical processing method and apparatus
04/05/2005US6875322 Electrochemical assisted CMP
03/2005
03/31/2005WO2005002794A3 Cell, system and article for electrochemical mechanical processing (ecmp)
03/24/2005US20050061674 Endpoint compensation in electroprocessing
03/17/2005US20050059324 Methods and apparatus for removing conductive material from a microelectronic substrate
03/17/2005US20050056550 Methods and apparatus for removing conductive material from a microelectronic substrate
03/17/2005US20050056537 Planarization of substrates using electrochemical mechanical polishing
03/16/2005CN1192857C Contact-discharge truing/dressing method and device therefor
03/15/2005US6867448 Electro-mechanically polished structure
03/15/2005US6867136 Method for electrochemically processing a workpiece
03/10/2005US20050051432 Electrolytic processing apparatus and method
03/08/2005US6863797 Electrolyte with good planarization capability, high removal rate and smooth surface finish for electrochemically controlled copper CMP
03/08/2005US6863794 Method and apparatus for forming metal layers
02/2005
02/24/2005US20050040050 Polishing apparatus
02/22/2005US6858531 Electro chemical mechanical polishing method
02/22/2005US6857940 Electrodes configured to apply pressure to a fluid including dielectric abrasive particles on the workpiece and arrange the particles uniformly by a Coulomb force produced by applying an alternating current voltage; antiagglomerants
02/17/2005US20050035000 Positioning microelecrtrons substrate between electrodes; polishing; removal electroconductive materials; detecting signals
02/17/2005US20050034999 Methods and apparatus for electrically and/or chemically-mechanically removing conductive material from a microelectronic substrate
02/16/2005EP1506572A1 Substrate processing apparatus and substrate processing method
02/15/2005US6855634 Polishing method and polishing apparatus
02/10/2005WO2002084714A3 Method and apparatus for electrochemically depositing a material onto a workpiece surface
02/10/2005US20050029122 purification of electrolytic polishing bath; loop feedback system; power source; controllers; for semiconductor wafer
02/08/2005US6852630 Electroetching process and system
02/03/2005WO2003028048A3 Low-force electrochemical mechanical processing method and apparatus
02/03/2005US20050022938 Apparatus for bonding substrates and method for bonding substrates
02/02/2005EP1501653A1 A method, an apparatus, a control system and a computer program to perform an automatic removal of cathode depositions during a bipolar electrochemical machining
02/01/2005US6848975 Electrochemical planarization of metal feature surfaces
02/01/2005US6848970 Process control in electrochemically assisted planarization
01/2005
01/27/2005WO2005008806A2 Photoelectrolysis of water using proton exchange membranes
01/27/2005US20050020004 Method and apparatus for simultaneously removing multiple conductive materials from microelectronic substrates
01/27/2005US20050016869 Applying an alternating or bipolar pulsed electrical current between a metal containing substrate and an electrolyte; removal of platinum from semiconductor wafers
01/27/2005US20050016868 Providing a wafer electrical connection by holding the conductive surface against the surface of the belt pad, applying a potential difference between the electrode and the wafer electrical connection and establishing a relative motion between the surface of the belt pad and the wafer
01/27/2005US20050016681 Method and apparatus for the electrochemical deposition and planarization of a material on a workpiece surface
01/26/2005EP1500466A1 Device for alternately machining a workpiece
01/13/2005WO2005002794A2 Cell, system and article for electrochemical mechanical processing (ecmp)
01/13/2005US20050005963 Photoelectrolysis of water using proton exchange membranes
01/11/2005US6841057 Conductive polishing pad and electrode having membrane disposed therebetween; membrane orientated relative to conductive pad in manner that facilitates removal of entrained gas from electrolyte flowing towards conductive pad
01/06/2005WO2005000525A1 Polishing pad for electrochemical-mechanical polishing
01/06/2005WO2005000512A1 Rotation surface-reducing head, electrolytic surface-reducing device, and electrolytic surface-reducing method
01/06/2005US20050000801 Method and apparatus for electrochemical mechanical processing
01/05/2005CN1559733A High speed high quality electric spark processing liquid storage tank system
01/04/2005US6837984 Methods and apparatus for electropolishing metal interconnections on semiconductor devices
01/04/2005US6837983 Endpoint detection for electro chemical mechanical polishing and electropolishing processes
12/2004
12/30/2004US20040266327 Conductive polishing article for electrochemical mechanical polishing
12/30/2004US20040266193 Means to improve center-to edge uniformity of electrochemical mechanical processing of workpiece surface
12/28/2004US6835292 Electrochemical thin film polishing method and polishing apparatus
12/23/2004WO2004111314A2 Algorithm for real-time process control of electro-polishing
12/23/2004WO2004111146A1 Polishing composition and method for polishing a conductive material
12/23/2004US20040259479 Polishing pad for electrochemical-mechanical polishing
12/23/2004US20040259365 Polishing method polishing system and method for fabricating semiconductor device
12/23/2004US20040256245 Moveable nozzle moves from a first to apply a stream of electrolyte to a first portion of the metal layer to a second position to apply the stream of electrolyte to a second portion when the wafer is rotated by the wafer chuck; shorter polishing time and uses less quantity of slurry
12/23/2004US20040256237 Ion exchanger between a pair of electrodes and a section for supplying a liquid to the ion exchanger; can flatten or clean a workpiece, especially a semiconductor wafer, while eliminating or reducing a load upon a CMP treatment
12/16/2004WO2004108358A2 Conductive polishing article for electrochemical mechanical polishing
12/09/2004US20040248412 Method and composition for fine copper slurry for low dishing in ECMP
12/08/2004CN1554113A Planar metal electroprocessing
12/01/2004EP1480784A1 Methods and apparatus for electrochemical-mechanical processing of microelectronic workpieces
11/2004
11/24/2004EP1478708A1 Method and composition for polishing a substrate
11/23/2004US6821409 Electroetching methods and systems using chemical and mechanical influence
11/11/2004US20040224509 Method to remove copper without pattern density effect
11/04/2004WO2004095571A1 Substrate processing method and substrate processing apparatus
11/04/2004WO2004094107A1 Conductive polishing pad with anode and cathode
11/04/2004US20040217013 Apparatus and method for electropolishing a metal wiring layer on a semiconductor device
11/03/2004CN1543668A Forming a semiconductor structure using a combination of planarizing methods and electropolishing
11/02/2004US6811680 Forming a passivation layer on a substrate surface; polishing substrate in an electrolyte solution; applying an anodic bias to substrate surface; removing material from portion of substrate surface
10/2004
10/28/2004US20040214510 Conductive polishing pad with anode and cathode
10/28/2004US20040214431 Electropolishing endpoint detection method
10/28/2004US20040211662 Method and apparatus for the electrochemical deposition and removal of a material on a workpiece surface
10/27/2004EP1470576A1 Electrolytic processing apparatus and substrate processing apparatus and method
10/26/2004US6809284 Wire cut electric discharge machine
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