Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
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08/08/1989 | US4855594 Apparatus and process for improved detection limits in mass spectrometry |
08/08/1989 | US4855593 Method for recording ICR mass spectra and ICR mass spectrometer designed for carrying out the said method |
08/01/1989 | US4853539 Glow discharge mass spectrometer |
07/25/1989 | US4851700 On-axis electron acceleration electrode for liquid chromatography/mass spectrometry |
07/25/1989 | US4851673 Secondary ion mass spectrometer |
07/25/1989 | US4851672 Specimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereof |
07/25/1989 | US4851670 Energy-selected electron imaging filter |
07/25/1989 | US4851669 Surface-induced dissociation for mass spectrometry |
07/25/1989 | US4850371 Novel endotracheal tube and mass spectrometer |
07/18/1989 | US4849629 Charged particle analyzer |
07/18/1989 | US4849628 Atmospheric sampling glow discharge ionization source |
07/13/1989 | WO1989006436A1 Secondary ion mass spectrometer |
07/11/1989 | US4847504 Apparatus and methods for ion implantation |
07/11/1989 | US4847495 Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser |
07/11/1989 | US4847493 Calibration of a mass spectrometer |
07/05/1989 | EP0323284A1 Method for detecting a chemical substance of known mass M |
07/04/1989 | US4845364 Coaxial reentrant ion source for surface mass spectroscopy |
07/04/1989 | US4845361 Process for electron beam guiding with energy selection and electron spectrometer |
07/04/1989 | US4845360 Counterflow leak detector with high and low sensitivity operating modes |
06/29/1989 | WO1989006044A1 Mass spectrometer |
06/29/1989 | DE3838326A1 Massenspektrometer mit hoher empfindlichkeit Mass spectrometer with high sensitivity |
06/28/1989 | EP0321925A2 Apparatus for analysis employing electron |
06/28/1989 | EP0321819A2 Method for the massspectrometric analysis of a gas mixture, and mass sprectrometer for carrying out the method |
06/28/1989 | EP0321792A2 Microwave resonant cavity |
06/27/1989 | US4843239 Compact double focussing mass spectrometer |
06/27/1989 | US4842701 High efficiency |
06/27/1989 | CA1256599A1 Double focusing mass spectrometers |
06/21/1989 | EP0320947A2 Halogen monitoring apparatus |
06/21/1989 | CN1033483A Plasma atomizer for atmospheric pressure allowable coupling of atomic absorption and emissive spectrum method |
06/20/1989 | CA1256220A1 Analytical apparatus |
06/15/1989 | WO1989005514A1 Counterflow leak detector with high and low sensitivity operating modes |
06/15/1989 | WO1989004586A3 Method and apparatus for generating particle beams |
06/14/1989 | EP0320354A1 Process for analysing the time of flight using continuous scanning, and analytical device for carrying out this process |
06/07/1989 | EP0319107A2 Current control circuit |
06/06/1989 | US4837434 Mass spectrometry system and method employing measurement/survey scan strategy |
05/30/1989 | US4835399 Charged particle beam apparatus |
05/30/1989 | US4835383 High mass ion detection system and method |
05/30/1989 | US4834535 Method of measuring atomic spectra compensating for atomic absorption by frequency modulation and using the doppler effect |
05/24/1989 | EP0317060A2 Electron-emission filament cutoff for GC/MS systems |
05/23/1989 | US4833331 Method of holding an electrically insulating sample |
05/23/1989 | US4833322 Method and apparatus for analysis of material |
05/18/1989 | WO1989004586A2 Method and apparatus for generating particle beams |
05/16/1989 | US4831255 Variable-attenuation parallel detector |
05/16/1989 | US4831254 Ion drift detector |
05/09/1989 | US4829179 Surface analyzer |
05/02/1989 | CA1253636A1 Spectrometer lens for particle beam metrology |
04/26/1989 | CN2036703U Plasma spectral torch tube |
04/25/1989 | US4824320 Device for picking up, displacing and delivering products |
04/20/1989 | WO1989003585A1 Mass spectrometer apparatus |
04/18/1989 | US4823003 Charged particle optical systems having therein means for correcting aberrations |
04/12/1989 | EP0311224A1 Electron impact ion source for trace analysis |
04/12/1989 | EP0310888A2 Method for the introduction of ions into the ion trap of an ion cyclotron resonance spectrometer and ion cyclotron resonance spectrometer used in this method |
04/11/1989 | US4820648 Removing end groups from biopolymer; radiation ionising end groups |
04/05/1989 | EP0310210A1 Measuring trace elements in gas |
04/05/1989 | EP0309767A1 Beam generating system for electron beam measuring instruments |
04/04/1989 | US4818872 Integrated charge neutralization and imaging system |
04/04/1989 | US4818869 Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer |
04/04/1989 | US4818864 Method for eliminating undesirable charged particles from the measuring cell of an ICR spectrometer |
04/04/1989 | US4818863 Ion source for use in a mass spectrometer |
04/04/1989 | US4818862 Characterization of compounds by time-of-flight measurement utilizing random fast ions |
04/04/1989 | US4817449 Device for moving samples in a controlled atmosphere enclosure |
03/29/1989 | EP0308427A1 Photo ion spectrometer |
03/28/1989 | US4816685 Ion volume ring |
03/28/1989 | US4816675 Quadrupole mass filter with unbalanced R.F. voltage |
03/28/1989 | CA1251871A1 Fourier transform ion cyclotron resonance mass spectrometer with spatially separated sources and detector |
03/28/1989 | CA1251870A1 Quadrupole mass spectrometer |
03/22/1989 | EP0308304A1 Method for analysing a sample by etching with a beam of particles, and apparatus therefor |
03/21/1989 | US4814613 Method of transmitting ions |
03/21/1989 | US4814612 Method and means for vaporizing liquids for detection or analysis |
03/14/1989 | US4812649 Control in mass analyzer |
03/08/1989 | EP0306333A2 Method and apparatus for the determination of isotopic composition |
03/07/1989 | US4810883 Device for providing an energy filtered charge particle image |
03/07/1989 | US4810882 Mass spectrometer for positive and negative ions |
03/07/1989 | US4810879 For investigating a selected area of a specimen |
03/07/1989 | US4810878 Ion source for mass spectrometer |
03/07/1989 | US4810877 Mass spectrometer with means to correct for threshold carbon dioxide |
03/01/1989 | EP0304525A1 Pulsed microfocused ion beams |
02/28/1989 | US4808821 Spectrometer objective for electron beam mensuration techniques |
02/28/1989 | US4808820 Electron-emission filament cutoff for gas chromatography + mass spectrometry systems |
02/28/1989 | US4808819 Mass spectrometric apparatus |
02/28/1989 | US4808818 Method of operating a mass spectrometer and a mass spectrometer for carrying out the method |
02/23/1989 | DE3726952A1 Ion reflectors having novel electrode geometries for temporal and spatial focusing of ion beams |
02/21/1989 | US4806765 Method and apparatus for checking the signal path of a measuring system |
02/21/1989 | US4806754 High luminosity spherical analyzer for charged particles |
02/21/1989 | CA1250375A1 Improved mass spectrometer |
02/14/1989 | US4804879 Deflecting electromagnet apparatus with moveable pole piece |
02/14/1989 | US4804839 Heating system for GC/MS instruments |
02/14/1989 | US4804838 Inductively-coupled radio frequency plasma mass spectrometer |
02/14/1989 | US4804271 Process for the improvement of selectivity of spectrometric measurements and an apparatus for the performance of the process |
02/09/1989 | WO1989000883A1 High mass ion detection system and method |
02/07/1989 | US4803355 Mass spectrometer |
01/24/1989 | US4800273 Secondary ion mass spectrometer |
01/24/1989 | CA1249381A1 Low noise tandem quadrupole mass spectrometers and method |
01/24/1989 | CA1249380A1 Method for the analysis of organic materials |
01/17/1989 | CA1249078A1 Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
01/11/1989 | EP0298754A1 Super-critical fluid mass spectrometer |
01/11/1989 | EP0298608A2 Mass spectrometry system and method employing measurement/survey scan strategy |
01/11/1989 | EP0298597A2 Heating system for GC/MS instruments |
01/10/1989 | CA1248642A1 Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer |
01/04/1989 | EP0297548A2 Sample holder for glow discharge mass spectrometer |