Patents
Patents for H01J 49 - Particle spectrometers or separator tubes (20,265)
08/1989
08/08/1989US4855594 Apparatus and process for improved detection limits in mass spectrometry
08/08/1989US4855593 Method for recording ICR mass spectra and ICR mass spectrometer designed for carrying out the said method
08/01/1989US4853539 Glow discharge mass spectrometer
07/1989
07/25/1989US4851700 On-axis electron acceleration electrode for liquid chromatography/mass spectrometry
07/25/1989US4851673 Secondary ion mass spectrometer
07/25/1989US4851672 Specimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereof
07/25/1989US4851670 Energy-selected electron imaging filter
07/25/1989US4851669 Surface-induced dissociation for mass spectrometry
07/25/1989US4850371 Novel endotracheal tube and mass spectrometer
07/18/1989US4849629 Charged particle analyzer
07/18/1989US4849628 Atmospheric sampling glow discharge ionization source
07/13/1989WO1989006436A1 Secondary ion mass spectrometer
07/11/1989US4847504 Apparatus and methods for ion implantation
07/11/1989US4847495 Method of quantitative analysis by means of the mean atomic number of phases containing a light element using a scanning microscope and an image analyser
07/11/1989US4847493 Calibration of a mass spectrometer
07/05/1989EP0323284A1 Method for detecting a chemical substance of known mass M
07/04/1989US4845364 Coaxial reentrant ion source for surface mass spectroscopy
07/04/1989US4845361 Process for electron beam guiding with energy selection and electron spectrometer
07/04/1989US4845360 Counterflow leak detector with high and low sensitivity operating modes
06/1989
06/29/1989WO1989006044A1 Mass spectrometer
06/29/1989DE3838326A1 Massenspektrometer mit hoher empfindlichkeit Mass spectrometer with high sensitivity
06/28/1989EP0321925A2 Apparatus for analysis employing electron
06/28/1989EP0321819A2 Method for the massspectrometric analysis of a gas mixture, and mass sprectrometer for carrying out the method
06/28/1989EP0321792A2 Microwave resonant cavity
06/27/1989US4843239 Compact double focussing mass spectrometer
06/27/1989US4842701 High efficiency
06/27/1989CA1256599A1 Double focusing mass spectrometers
06/21/1989EP0320947A2 Halogen monitoring apparatus
06/21/1989CN1033483A Plasma atomizer for atmospheric pressure allowable coupling of atomic absorption and emissive spectrum method
06/20/1989CA1256220A1 Analytical apparatus
06/15/1989WO1989005514A1 Counterflow leak detector with high and low sensitivity operating modes
06/15/1989WO1989004586A3 Method and apparatus for generating particle beams
06/14/1989EP0320354A1 Process for analysing the time of flight using continuous scanning, and analytical device for carrying out this process
06/07/1989EP0319107A2 Current control circuit
06/06/1989US4837434 Mass spectrometry system and method employing measurement/survey scan strategy
05/1989
05/30/1989US4835399 Charged particle beam apparatus
05/30/1989US4835383 High mass ion detection system and method
05/30/1989US4834535 Method of measuring atomic spectra compensating for atomic absorption by frequency modulation and using the doppler effect
05/24/1989EP0317060A2 Electron-emission filament cutoff for GC/MS systems
05/23/1989US4833331 Method of holding an electrically insulating sample
05/23/1989US4833322 Method and apparatus for analysis of material
05/18/1989WO1989004586A2 Method and apparatus for generating particle beams
05/16/1989US4831255 Variable-attenuation parallel detector
05/16/1989US4831254 Ion drift detector
05/09/1989US4829179 Surface analyzer
05/02/1989CA1253636A1 Spectrometer lens for particle beam metrology
04/1989
04/26/1989CN2036703U Plasma spectral torch tube
04/25/1989US4824320 Device for picking up, displacing and delivering products
04/20/1989WO1989003585A1 Mass spectrometer apparatus
04/18/1989US4823003 Charged particle optical systems having therein means for correcting aberrations
04/12/1989EP0311224A1 Electron impact ion source for trace analysis
04/12/1989EP0310888A2 Method for the introduction of ions into the ion trap of an ion cyclotron resonance spectrometer and ion cyclotron resonance spectrometer used in this method
04/11/1989US4820648 Removing end groups from biopolymer; radiation ionising end groups
04/05/1989EP0310210A1 Measuring trace elements in gas
04/05/1989EP0309767A1 Beam generating system for electron beam measuring instruments
04/04/1989US4818872 Integrated charge neutralization and imaging system
04/04/1989US4818869 Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer
04/04/1989US4818864 Method for eliminating undesirable charged particles from the measuring cell of an ICR spectrometer
04/04/1989US4818863 Ion source for use in a mass spectrometer
04/04/1989US4818862 Characterization of compounds by time-of-flight measurement utilizing random fast ions
04/04/1989US4817449 Device for moving samples in a controlled atmosphere enclosure
03/1989
03/29/1989EP0308427A1 Photo ion spectrometer
03/28/1989US4816685 Ion volume ring
03/28/1989US4816675 Quadrupole mass filter with unbalanced R.F. voltage
03/28/1989CA1251871A1 Fourier transform ion cyclotron resonance mass spectrometer with spatially separated sources and detector
03/28/1989CA1251870A1 Quadrupole mass spectrometer
03/22/1989EP0308304A1 Method for analysing a sample by etching with a beam of particles, and apparatus therefor
03/21/1989US4814613 Method of transmitting ions
03/21/1989US4814612 Method and means for vaporizing liquids for detection or analysis
03/14/1989US4812649 Control in mass analyzer
03/08/1989EP0306333A2 Method and apparatus for the determination of isotopic composition
03/07/1989US4810883 Device for providing an energy filtered charge particle image
03/07/1989US4810882 Mass spectrometer for positive and negative ions
03/07/1989US4810879 For investigating a selected area of a specimen
03/07/1989US4810878 Ion source for mass spectrometer
03/07/1989US4810877 Mass spectrometer with means to correct for threshold carbon dioxide
03/01/1989EP0304525A1 Pulsed microfocused ion beams
02/1989
02/28/1989US4808821 Spectrometer objective for electron beam mensuration techniques
02/28/1989US4808820 Electron-emission filament cutoff for gas chromatography + mass spectrometry systems
02/28/1989US4808819 Mass spectrometric apparatus
02/28/1989US4808818 Method of operating a mass spectrometer and a mass spectrometer for carrying out the method
02/23/1989DE3726952A1 Ion reflectors having novel electrode geometries for temporal and spatial focusing of ion beams
02/21/1989US4806765 Method and apparatus for checking the signal path of a measuring system
02/21/1989US4806754 High luminosity spherical analyzer for charged particles
02/21/1989CA1250375A1 Improved mass spectrometer
02/14/1989US4804879 Deflecting electromagnet apparatus with moveable pole piece
02/14/1989US4804839 Heating system for GC/MS instruments
02/14/1989US4804838 Inductively-coupled radio frequency plasma mass spectrometer
02/14/1989US4804271 Process for the improvement of selectivity of spectrometric measurements and an apparatus for the performance of the process
02/09/1989WO1989000883A1 High mass ion detection system and method
02/07/1989US4803355 Mass spectrometer
01/1989
01/24/1989US4800273 Secondary ion mass spectrometer
01/24/1989CA1249381A1 Low noise tandem quadrupole mass spectrometers and method
01/24/1989CA1249380A1 Method for the analysis of organic materials
01/17/1989CA1249078A1 Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
01/11/1989EP0298754A1 Super-critical fluid mass spectrometer
01/11/1989EP0298608A2 Mass spectrometry system and method employing measurement/survey scan strategy
01/11/1989EP0298597A2 Heating system for GC/MS instruments
01/10/1989CA1248642A1 Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
01/04/1989EP0297548A2 Sample holder for glow discharge mass spectrometer