Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
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02/26/1986 | EP0172683A2 Mass spectrometer |
02/26/1986 | EP0172477A2 Method and apparatus for recording particles or quantums using a detector |
02/11/1986 | US4570068 Interface for liquid chromatograph and mass spectrometer |
02/04/1986 | US4568831 Chopped molecular beam multiplexing system |
01/29/1986 | EP0169469A2 Analytical apparatus |
01/15/1986 | EP0167561A1 Method and apparatus for surface diagnostics. |
01/07/1986 | US4563579 Procedure for recording ion-cyclotron-resonance spectra and apparatus for carrying out the procedure |
12/31/1985 | US4562355 High current ion source |
12/31/1985 | US4562352 Analyzing apparatus capable of analyzing a surface at a high resolution |
12/31/1985 | US4562351 Sample introduction device for mass spectrometers |
12/31/1985 | CA1198834A1 Combination of time resolution and mass dispersive techniques in mass spectrometry |
12/24/1985 | US4560907 Ion source |
12/20/1985 | CN85200266U Composite source of vacuum gage and mass spectrograph |
12/17/1985 | US4559449 High resolution particle spectrometer |
12/04/1985 | EP0162881A1 Introduction of samples into a mass spectrometer. |
12/03/1985 | US4556794 Secondary ion collection and transport system for ion microprobe |
11/27/1985 | EP0162649A2 Ion cyclotron resonance spectrometer |
11/27/1985 | EP0162073A1 Introduction of samples into a mass spectrometer. |
11/27/1985 | EP0162072A1 Introduction of samples into a mass spectrometer. |
11/21/1985 | EP0161744A1 Mass spectrometer |
11/12/1985 | US4553029 Mass spectrometer |
11/07/1985 | EP0110981A4 High repetition rate transient recorder with automatic integration. |
11/05/1985 | US4551650 Field-emission ion source with spiral shaped filament heater |
11/05/1985 | US4551625 Spectrometer objective for particle beam measurement technique |
10/16/1985 | EP0158295A2 Method and apparatus for improving the sensitivity of a leak detector utilizing a cryopump |
10/08/1985 | US4546254 Charged particle energy analyzer |
10/08/1985 | US4546253 Apparatus for producing sample ions |
10/08/1985 | CA1195013A1 Process for the selective analysis of individual trace-like components in gases and liquids |
10/02/1985 | EP0156473A2 Electron-impact type of ion source |
09/26/1985 | WO1985004283A1 Introduction of samples into a mass spectrometer |
09/26/1985 | WO1985004282A1 Pyrolysis mass spectrometry |
09/26/1985 | WO1985004281A1 Mass spectrometer |
09/25/1985 | EP0155700A2 Apparatus for quantitative secondary ion mass spectrometry |
09/17/1985 | US4542293 Process and apparatus for changing the energy of charged particles contained in a gaseous medium |
09/11/1985 | EP0154590A2 Time-of-flight mass spectrometer |
09/10/1985 | US4540885 Spectrometer objective having parallel objective fields and spectrometer fields for the potential measuring technique |
09/10/1985 | US4540884 Method of mass analyzing a sample by use of a quadrupole ion trap |
08/28/1985 | EP0153113A2 Thermospray ion sampling device |
08/28/1985 | EP0152747A2 Apparatus and method for applying a dissolved sample from a liquid chromatograph to a chemical ionization mass spectrometer |
08/20/1985 | US4536652 Hybrid mass spectrometer |
08/13/1985 | US4535236 Apparatus for and method of operating quadrupole mass spectrometers in the total pressure mode |
08/13/1985 | US4535235 Apparatus and method for injection of ions into an ion cyclotron resonance cell |
08/07/1985 | EP0151078A2 High intensity mass spectrometer with simultaneous multiple detection |
07/23/1985 | US4531056 Method and apparatus for the mass spectrometric analysis of solutions |
07/16/1985 | US4529879 Process for the determination of isotopes by mass spectrometry |
07/16/1985 | CA1190666A1 Method of broad band mass spectrometry and apparatus therefor |
07/04/1985 | WO1985002907A1 Method and apparatus for surface diagnostics |
07/03/1985 | EP0147079A2 Triggering device for a vacuum arc in a plasma centrifuge |
07/02/1985 | US4527059 Laser activated mass spectrometer for the selective analysis of individual trace-like components in gases and liquids |
06/19/1985 | EP0145120A1 Apparatus for ion implantation |
06/19/1985 | EP0145119A1 Apparatus for ion implantation |
06/18/1985 | US4524275 Multiple collector mass spectrometers |
06/18/1985 | CA1189201A1 Method and apparatus for sampling a plasma into a vacuum chamber |
06/06/1985 | WO1985002492A1 Introduction of samples into a mass spectrometer |
06/06/1985 | WO1985002491A1 Introduction of samples into a mass spectrometer |
06/06/1985 | WO1985002490A1 Introduction of samples into a mass spectrometer |
06/05/1985 | EP0143146A1 Process and device for storing measuring data from sub-domains of a sputter crater produced and analyzed in a secondary ion mass spectrometer |
06/04/1985 | US4521687 Mass spectrometer |
05/29/1985 | EP0045771B1 Mass spectrometer with modulated molecular beam |
05/15/1985 | EP0141059A2 Method of recording ion cyclotron resonance spectra and apparatus for carrying out this method |
05/14/1985 | US4517462 Device for measuring an ion current produced by an ion beam |
05/07/1985 | US4516052 Dispenser for ion source |
05/02/1985 | EP0139377A1 Apparatus and methods for ion implantation |
05/02/1985 | EP0138898A1 Mass spectrometer |
04/30/1985 | US4514682 Secondary electron spectrometer for measuring voltages on a sample utilizing an electron probe |
04/30/1985 | US4514637 Atomic mass measurement system |
04/30/1985 | US4514628 Coaxial miniature magnetic spectrometer |
04/17/1985 | EP0137650A2 Charged particle energy spectrometer |
04/17/1985 | EP0137649A1 Apparatus and method for ion implantation |
04/10/1985 | EP0136610A2 Samples holder for secondary ion mass spectroscopy (SIMS) and other high accuracy methods of analyzing particle rays, and method of operating it |
03/27/1985 | EP0135366A1 System and method for ion implantation |
03/26/1985 | US4507555 Parallel mass spectrometer |
03/19/1985 | US4506227 Mass spectrometer |
02/26/1985 | US4501965 Method and apparatus for sampling a plasma into a vacuum chamber |
02/19/1985 | US4500787 Method and a device for furnishing an ion stream |
02/19/1985 | US4500782 Method of calibrating ion cyclotron resonance spectrometers |
02/12/1985 | CA1182588A1 Method and apparatus for separating substances of different atomic weights using a plasma centrifuge |
01/23/1985 | EP0131572A1 Method of and apparatus for isotope separation. |
01/22/1985 | US4495414 Automatic mass spectrometer inlet system |
12/25/1984 | US4490806 High repetition rate transient recorder with automatic integration |
12/25/1984 | US4490610 Time of flight mass spectrometer |
12/19/1984 | EP0128716A2 Inlet system for a mass spectrometer |
12/18/1984 | US4489237 Method of broad band mass spectrometry and apparatus therefor |
12/11/1984 | US4488045 Metal ion source |
12/05/1984 | EP0126729A1 Combination of time resolution and mass dispersive techniques in mass spectrometry |
12/04/1984 | US4486664 Arrangement and process for adjusting imaging systems |
12/04/1984 | US4486659 Emisson-electron microscope |
11/21/1984 | EP0125950A2 Mass spectrometers |
11/13/1984 | CA1177976A1 Photoionizer |
11/07/1984 | EP0124440A1 High luminosity mass spectrometer |
11/07/1984 | EP0123860A2 Electron energy analyser with a multichannel detector |
11/06/1984 | US4481415 Quadrupole mass spectrometer |
10/31/1984 | EP0123553A1 Process and apparatus for changing the energy of charged particles contained in a gaseous medium |
10/31/1984 | EP0123552A1 Method and apparatus for the mass spectrometric analysis of solutions |
10/30/1984 | US4480187 Mass spectrometer |
10/17/1984 | EP0122006A2 System for supplying gas at controlled pressure |
10/11/1984 | WO1984003994A1 Mass spectrometer |
10/09/1984 | US4476392 Photoelectron source for use in a gas chromatograph detector and mass spectrometer ion source |
10/03/1984 | EP0120576A2 Atomic mass measurement system |
10/03/1984 | EP0120106A1 Charged particle energy analyzer |