Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
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04/21/1988 | WO1988002926A1 Mass separator for ionized cluster beam |
04/19/1988 | US4739165 Mass spectrometer with remote ion source |
04/12/1988 | US4737639 Energy and analysis detection system for surface chemical analysis |
04/12/1988 | US4737638 Preselector source for isotope separation |
04/12/1988 | US4737637 Mass separator for ionized cluster beam |
04/06/1988 | EP0262928A2 Quadrupole mass spectrometer and method of operation thereof |
04/06/1988 | EP0262129A1 Procedure and device for providing an energy filtered charged particle image |
04/05/1988 | US4736101 Method of operating ion trap detector in MS/MS mode |
03/23/1988 | EP0260635A2 Electrophoresis-mass spectrometry probe |
03/23/1988 | EP0260469A2 Apparatus for analytically determining organic substances |
03/16/1988 | EP0259796A2 Improved interface for liquid chromatograph-mass spectrometer |
03/16/1988 | EP0259596A1 Method of removing unwanted charged particles from the measuring cell of an ICR spectrometer |
03/15/1988 | US4731538 Microchannel plate ion detector |
03/15/1988 | US4731533 Method and apparatus for dissociating ions by electron impact |
03/15/1988 | US4731532 Time of flight mass spectrometer using an ion reflector |
03/08/1988 | US4730111 Ion vapor source for mass spectrometry of liquids |
03/02/1988 | EP0257371A2 Device for compensating time-variant field disturbances in magnetic fields |
03/01/1988 | US4728790 Low-abberation spectrometer objective with high secondary electron acceptance |
02/25/1988 | DE3627449A1 Multi-channel atomic particle analyser |
02/23/1988 | US4727249 Magnetic sector mass spectrometer |
02/17/1988 | EP0255981A1 Charged particle optical systems having therein means for correcting aberrations |
02/11/1988 | WO1988001099A1 Multipurpose gaseous detector device for electron microscopes |
02/02/1988 | USH431 Portable laboratory for detection and monitoring of hazardous chemicals |
02/02/1988 | US4723076 Double focusing mass spectrometers |
01/26/1988 | US4721854 Quadrupole mass spectrometer |
01/20/1988 | EP0253336A2 Surface analyzer |
01/20/1988 | CN87104633A 感应耦合等离子体质量分析仪 Inductively coupled plasma mass spectrometer |
01/13/1988 | EP0252758A2 Discharge ionization mass spectrometer |
01/13/1988 | EP0252475A2 Inductively-coupled radio frequency plasma mass spectrometer |
01/12/1988 | US4719355 Ion source for an ion implanter |
01/12/1988 | US4719349 Electrochemical sample probe for use in fast-atom bombardment mass spectrometry |
12/30/1987 | WO1987007978A1 Process for verifying the energy of an ion beam |
12/22/1987 | US4714831 For focussing charged particles |
12/17/1987 | WO1987007762A1 Photo ion spectrometer |
12/17/1987 | DE3619726A1 Method and device for the simultaneous centering of a plurality of separate ion beams into a corresponding number of ion passage openings which are located in the image plane of a magnetic mass separator |
12/16/1987 | EP0249424A2 Glow discharge mass spectrometer |
12/08/1987 | US4712008 Ion mobility spectrometer |
12/03/1987 | WO1987007429A1 Apparatus and method for the chemical analysis of solids by spectroscopy of x photoelectrons |
12/02/1987 | EP0247316A2 Spherical retarding grid analyzer |
12/01/1987 | US4710625 Charged particle energy analyzer based upon isentropic containment |
11/25/1987 | EP0246841A2 Electron spectrometer |
11/24/1987 | US4709148 Quadrupole mass spectrometers |
11/17/1987 | US4707602 Fourier transform time of flight mass spectrometer |
11/17/1987 | US4706700 Valve arrangement |
11/10/1987 | US4705616 Electrophoresis-mass spectrometry probe |
11/05/1987 | DE3614853A1 Method and device for centring an ion beam in an opening through which ions can pass and which is located in the image plane of a magnetic mass separator |
11/04/1987 | EP0244297A1 Device for isotropic separation or mass spectrometry by way of a magnetic field |
11/03/1987 | US4704532 Methods and structures to produce electrostatic quadrupole fields using closed boundaries |
11/03/1987 | US4704197 Ionization |
10/29/1987 | DE3710935A1 Method for operating a mass spectrometer and mass spectrometer for carrying out the method |
10/28/1987 | EP0243060A2 A charged particle energy analyser |
10/28/1987 | EP0243059A2 A charged particle analyser |
10/27/1987 | US4703190 Power supply system for a quadrupole mass spectrometer |
10/20/1987 | US4701419 Digestion; using fast atom bombardment and mass spectroscopy on fragments |
10/13/1987 | US4700069 Mass spectrometer of a quadrupole electrode type comprising a divided electrode |
10/08/1987 | WO1987006056A1 Device for sample introduction to a mass spectrometer |
09/23/1987 | CN86104194A Double focusing mass spectrograph |
09/22/1987 | US4695724 AC-modulation quadrupole mass spectrometer |
09/16/1987 | EP0237268A2 Method of mass analysing a sample |
09/16/1987 | EP0237259A2 Mass spectrometer |
09/16/1987 | EP0236807A2 Spectrometer objective for the corpuscular beam measuring technique |
09/15/1987 | US4694457 Methods of steering and focusing ion and electron beams |
09/15/1987 | US4694169 Mass spectrometer |
09/15/1987 | US4694168 Time-of-flight mass spectrometer |
09/15/1987 | US4694167 Double pulsed time-of-flight mass spectrometer |
09/08/1987 | EP0221056A4 Ion beam implant system. |
09/02/1987 | EP0234560A2 Mass spectrometer with remote ion source |
08/27/1987 | WO1987005151A1 Electron spectrometer |
08/25/1987 | US4689574 Electron impact ion source for trace analysis |
08/25/1987 | CA1226077A1 Mass spectrometer and method |
08/19/1987 | EP0232790A1 Process and arrangement for measuring time-dependent signals with a corpuscular beam probe |
08/19/1987 | EP0232581A1 Capillary switch-valve |
08/18/1987 | US4687930 Ion beam apparatus |
08/18/1987 | US4687929 Monodisperse aerosol generator |
08/12/1987 | EP0231247A1 Improvements in atom probes. |
08/11/1987 | US4686367 Method of operating quadrupole ion trap chemical ionization mass spectrometry |
08/11/1987 | US4686366 Laser mass spectrometer |
08/11/1987 | US4686365 Fourier transform ion cyclothon resonance mass spectrometer with spatially separated sources and detector |
08/05/1987 | EP0231131A2 Inductively coupled plasma mass spectrometer |
08/04/1987 | CA1225155A1 High repetition rate transient recorder with automatic integration |
07/29/1987 | EP0229790A1 Apparatus for measuring atomic spektra. |
07/21/1987 | US4682027 Method and apparatus for sample confirmation in gas chromatography |
07/21/1987 | US4682026 Method and apparatus having RF biasing for sampling a plasma into a vacuum chamber |
07/14/1987 | US4680467 Electron spectroscopy system for chemical analysis of electrically isolated specimens |
07/08/1987 | EP0227766A1 Method for improving the selectivity of spectrometric measurements, as well as device for implementing such method. |
06/30/1987 | US4677295 Process for determining mass spectrum by time of flight and spectrometer carrying out this process |
06/16/1987 | EP0225717A1 High current mass spectrometer using space charge lens |
06/09/1987 | US4672615 Ion and electron beam steering and focussing system |
06/09/1987 | US4672204 Mass spectrometers |
06/09/1987 | US4672203 Two stage valve for use in pressure converter |
06/02/1987 | US4670651 Apparatus for performing the SNMS method |
06/02/1987 | CA1222578A1 Mass spectrometers |
05/27/1987 | EP0223520A1 Charged particle energy analyser |
05/26/1987 | US4668864 Mass spectrometer |
05/19/1987 | US4667100 Methods and apparatus for mass spectrometric analysis of fluids |
05/13/1987 | EP0221339A1 Ion cyclotron resonance spectrometer |
05/13/1987 | EP0221056A1 Ion beam implant system |
05/12/1987 | US4663944 Cryogenic sample stage for an ion microscope |
05/05/1987 | US4663297 Temperature programmed spectroscopy techniques |
05/05/1987 | US4662914 Flow restrictor at inlet to ionization chamber of spectrometer |