Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
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04/29/1987 | EP0219557A1 Method and device for checking a measuring connection of a measuring device |
04/22/1987 | EP0218921A2 Alpha-type electron energy filter |
04/22/1987 | EP0218920A2 Omega-type electron energy filter |
04/22/1987 | EP0069750B1 Emission-electron microscope |
04/21/1987 | US4659926 High resolution particle spectrometer |
04/21/1987 | CA1220879A1 Method and apparatus for surface diagnostics |
04/15/1987 | CN85107273A Method of mass spectrum of liq. phase electron bombardment and its source of combined ions |
04/14/1987 | US4658135 Method and apparatus for sensitive atom counting with high isotopic selectivity |
04/09/1987 | WO1987002177A1 Mass spectrograph |
04/08/1987 | EP0217644A2 Quadrupole mass filter |
04/08/1987 | CN86102624A Method for analysis of organic materials |
03/25/1987 | EP0215615A2 Method of operating a quadrupole ion trap |
03/24/1987 | US4652753 Mass spectrometer capable of analyzing an insulator |
03/19/1987 | DE3532326A1 Electron spectrometer |
03/17/1987 | US4650999 Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
03/12/1987 | WO1987001452A1 Mass spectroscope |
03/05/1987 | DE3531338A1 Push rod/field-desorption ion source |
03/03/1987 | US4647772 For the analysis of a liquid sample having an ion source |
02/26/1987 | DE3530315A1 Nuclear-track filter as gas inlet systems for vacuum apparatuses |
02/25/1987 | EP0211645A2 Apparatus and methods for use in the mass analysis of chemical samples |
02/24/1987 | US4645928 Sweeping method for superimposed-field mass spectrometer |
02/24/1987 | CA1218473A1 Process and apparatus for changing the energy of charged particles contained in a gaseous medium |
02/24/1987 | CA1218472A1 Method and apparatus for the mass spectrometric analysis of solutions |
02/17/1987 | US4644161 Mass spectrograph |
02/03/1987 | US4641029 Process and apparatus for heating ionizing strips |
01/29/1987 | WO1987000682A1 Improvements in atom probes |
01/27/1987 | US4639597 Auger electron spectrometer capable of attaining a high resolution |
01/21/1987 | EP0208894A2 Time-of-flight mass spectrometer with an ion reflector |
01/20/1987 | US4638217 Fused metal ion source with sintered metal head |
01/20/1987 | US4638160 High clarity mass spectrometer capable of multiple simultaneous detection |
01/15/1987 | WO1987000273A1 Method for improving the selectivity of spectrometric measurements, as well as device for implementing such method |
01/15/1987 | WO1987000272A1 Method for measuring atomic spectra |
01/14/1987 | EP0208100A2 Reverse field electrostatic spectrometer for electron beam measuring techniques |
01/13/1987 | US4637052 Method and apparatus for enhancing microchannel plate data |
01/08/1987 | DE3617123A1 Method for improving the selectivity of spectrometric measurements, and device for carrying out the method |
01/06/1987 | US4634931 Ion implanter |
01/06/1987 | US4634867 Introduction of samples into a mass spectrometer |
01/06/1987 | US4634866 Introduction of samples into a mass spectrometer |
01/06/1987 | US4634865 Introduction of samples into a mass spectrometer |
12/30/1986 | US4633084 High efficiency direct detection of ions from resonance ionization of sputtered atoms |
12/30/1986 | US4633082 Process for measuring degradation of sulfur hexafluoride in high voltage systems |
12/17/1986 | EP0205185A2 Objective with spectrometer in the electron beam measuring technique |
12/17/1986 | EP0205184A2 Low aberration spectrometer objective with a high secondary electrons acceptance |
12/16/1986 | US4629478 Monodisperse aerosol generator |
12/04/1986 | WO1986007188A1 A device for providing an energy filtered charged particle image |
11/26/1986 | EP0202943A2 Method of operating an ion trap |
11/26/1986 | EP0202937A2 Surface analysis spectroscopy apparatus |
11/26/1986 | EP0131572A4 Method of and apparatus for isotope separation. |
11/26/1986 | CN85104052A Flight time mass spectrometer |
11/25/1986 | US4625112 Time of flight mass spectrometer |
11/20/1986 | WO1986006874A1 Ion beam implant system |
11/20/1986 | EP0202118A2 Magnetic sector mass spectrometer |
11/20/1986 | EP0202117A2 Double focusing mass spectrometers |
11/06/1986 | WO1986006545A1 Method and device for introducing samples for mass spectrometre |
11/05/1986 | EP0200645A1 Sample introduction method and device for a mass spectrometer |
11/05/1986 | EP0200027A2 Ion cyclotron resonance spectrometer |
10/29/1986 | EP0199455A2 Sampling plasma into a vacuum chamber |
10/28/1986 | US4620103 Sample holder for mass analysis |
10/28/1986 | US4620102 Electron-impact type of ion source with double grid anode |
10/22/1986 | CN85205573U Scanning spectrum-identifying tube |
10/21/1986 | CA1213081A1 Quadrupole mass spectrometer |
10/14/1986 | CA1212783A1 Suppression of molecular ions in secondary ion mass spectra |
09/24/1986 | EP0195296A2 Method for the determination of organic matter |
09/23/1986 | US4613755 Method of mass spectrometry |
09/16/1986 | US4612477 Triggering device for a vacuum arc in a plasma centrifuge |
09/16/1986 | US4612440 Device for adjusting slit widths in spectrometers |
09/09/1986 | US4611120 Suppression of molecular ions in secondary ion mass spectra |
09/09/1986 | US4611118 Time-of-flight ion mass analyzer |
09/03/1986 | EP0193311A2 Ion detector |
09/03/1986 | CN86200013U Analysis grid for low energy electron spectrometer |
08/14/1986 | WO1986004733A1 Mass spectrometer having magnetic trapping |
08/14/1986 | WO1986004732A1 Secondary ion collection and transport system for ion microprobe |
08/12/1986 | US4605946 Fet charge sensor and voltage probe |
07/31/1986 | WO1986004261A1 Mass spectrometer ion excitation system |
07/22/1986 | US4601211 Multi-port valve in a gas collection system and method of using same |
07/15/1986 | CA1207918A1 Method of mass analyzing a sample by use of a quadrupole ion trap |
07/02/1986 | EP0185944A2 Fourier transform ion cyclothon resonance mass spectrometer with spatially separated sources and detector |
07/02/1986 | EP0185926A2 Multi-port valve in a gas collection system and method of using same |
07/02/1986 | EP0185789A1 Charged-particles analyser |
06/17/1986 | US4595835 Material ionizing device |
06/17/1986 | US4595831 Multiple mass range triple collector spectrometer |
06/10/1986 | US4593530 Method and apparatus for improving the sensitivity of a leak detector utilizing a cryopump |
06/10/1986 | CN85102774A Method and structure of causing electrostatic 4-porlarity field by using closed boundary |
06/03/1986 | US4593196 Charged particle energy spectrometer |
05/27/1986 | CA1205211A1 Process for the determination of isotopes by mass spectrometry |
05/20/1986 | US4590371 Inlet system for a mass spectrometer |
05/13/1986 | US4588889 Sweeping process for mass spectrometer having superimposed fields |
05/13/1986 | US4588888 Mass spectrometer having magnetic trapping |
05/07/1986 | EP0180328A1 Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
04/30/1986 | EP0179716A2 A secondary ion mass spectrometer |
04/22/1986 | US4584474 Electron energy analyzer with multi-channel detector |
04/16/1986 | EP0177530A1 Pyrolysis mass spectrometry |
04/15/1986 | US4583183 Masked multichannel analyzer |
04/09/1986 | EP0176534A1 Mass spectrometer |
04/08/1986 | US4581533 Mass spectrometer and method |
04/02/1986 | EP0175807A1 Apparatus for the sputtered neutral mass spectrometry |
04/02/1986 | EP0175731A1 Introduction of samples into a mass spectrometer |
04/02/1986 | CN85202304U Auti-interference ion seperating device |
04/01/1986 | US4579144 Electron impact ion source for trace analysis |
03/12/1986 | EP0174222A1 Method of mass spectrometry by time-of-flight, and spectrometer therefor |