Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
---|
12/29/1988 | DE3719788C1 Analysis system for ions |
12/27/1988 | US4794253 Ion source for mass spectrometer |
12/27/1988 | US4794252 Discharge ionization mass spectrometer |
12/22/1988 | DE3810406A1 Sample carrier for the electrothermal atomisation of solids |
12/21/1988 | EP0295653A2 High luminosity spherical analyzer for charged particles |
12/21/1988 | EP0295253A1 Electron spectrometer. |
12/14/1988 | EP0294683A2 Method for recording ICR mass spectra and ICR mass spectrometer developed for performance of this method |
12/13/1988 | US4791292 Capillary membrane interface for a mass spectrometer |
12/13/1988 | US4791291 Mass spectrometer sampling system for a liquid stream |
12/13/1988 | US4791273 Vaporizer system for ion source |
12/06/1988 | US4789787 Wien filter design |
12/06/1988 | CA1246246A1 Method and apparatus having rf biasing for sampling a plasma into a vacuum chamber |
12/01/1988 | WO1988009559A1 Improved wien filter design |
11/30/1988 | EP0292974A2 Atmospheric sampling glow discharge ionization source |
11/29/1988 | US4788502 Apparatus for compensating for time-vibrant field interference in magnetic fields |
11/29/1988 | CA1245778A1 Mass analyzer system with reduced drift |
11/23/1988 | EP0292187A1 Method of using an ion trap in the chemical ionization mode |
11/23/1988 | EP0292180A1 Method of operating an ion trap mass spectrometer |
11/22/1988 | US4786806 Retarding field spectrometer |
11/22/1988 | US4786478 Method and apparatus for isotope separation |
11/17/1988 | WO1988009052A1 Process and device for measuring the concentration of gas mixtures |
11/17/1988 | WO1988009051A1 Integrated charge neutralization and imaging system |
11/17/1988 | EP0291420A1 Method of dosing with the aid of the average atomic number of phases containing a light element using a scanning microscope and an image analyser |
11/17/1988 | EP0291341A1 Vaporizer system for ion source |
11/17/1988 | EP0290712A1 Mass spectrometer |
11/17/1988 | EP0290711A1 Method and device for measuring the concentration in a gas mixture |
11/15/1988 | US4785173 Element analyzing apparatus |
11/15/1988 | US4785172 Secondary ion mass spectrometry system and method for focused ion beam with parallel ion detection |
11/09/1988 | EP0290046A2 Surface analyzer |
10/27/1988 | DE3711120A1 Fully automatic sample dispenser |
10/25/1988 | US4780608 Laser sustained discharge nozzle apparatus for the production of an intense beam of high kinetic energy atomic species |
10/20/1988 | WO1988008198A1 Plasma focus apparatus with field distortion elements |
10/20/1988 | WO1988007888A1 Combined electrophoresis-electrospray interface and method |
10/18/1988 | US4778993 Time-of-flight mass spectrometry |
10/12/1988 | EP0286365A2 High stability mass spectrometer |
10/12/1988 | EP0285630A1 Mass separator for ionized cluster beam. |
10/05/1988 | EP0285215A1 Device for picking up, displacing and delivering products |
10/04/1988 | CA1242817A1 Low-abberation spectrometer objective with high secondary electron acceptance |
09/28/1988 | EP0284332A2 Quadruple focusing time of flight mass spectrometer |
09/27/1988 | US4774408 Time of flight mass spectrometer |
09/27/1988 | CA1242536A1 Method of operating ion trap detector in ms/ms mode |
09/21/1988 | EP0162881B1 Introduction of samples into a mass spectrometer |
09/21/1988 | EP0162072B1 Introduction of samples into a mass spectrometer |
09/13/1988 | US4771172 Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode |
09/13/1988 | US4771171 Particle handling device |
09/07/1988 | EP0281413A2 Mass spectrometer for positive and negative ions |
09/06/1988 | US4769543 Spectrometer lens for particle beam apparatus |
09/06/1988 | US4769542 Charged particle energy analyzer |
09/06/1988 | US4769540 Atmospheric pressure ionization mass spectrometer |
08/31/1988 | CN87100772A Charged particles detector |
08/30/1988 | CA1241373A1 Method of operating quadropole ion trap chemical ionization mass spectrometry |
08/25/1988 | WO1988006060A1 Photo ion spectrometer |
08/23/1988 | US4766314 Double focusing |
08/23/1988 | US4766313 Apparatus for quantitative secondary ion mass spectrometry |
08/23/1988 | US4766312 Methods and apparatus for detecting negative ions from a mass spectrometer |
08/17/1988 | EP0278736A2 Secondary ion mass spectrometer |
08/17/1988 | EP0278034A1 Detector of charged particles |
08/16/1988 | US4764673 Electric electron energy analyzer |
08/09/1988 | US4762995 Monodisperse aerosol generator |
08/03/1988 | EP0276731A2 Method for electron beam guidance with energy selection, and electron spectrometer |
08/02/1988 | US4761545 Tailored excitation for trapped ion mass spectrometry |
07/26/1988 | US4760261 Alpha-type electron energy filter |
07/26/1988 | US4760253 Mass spectrometer |
07/21/1988 | DE3700337A1 Method and device for ionising the sample substance which is contained in a quistor |
07/19/1988 | US4758723 Electron spectrometer |
07/19/1988 | US4758722 Analyzing the energy of charged particles |
07/19/1988 | US4758721 Thermal cycle recirculating pump for isotope purifier |
07/14/1988 | WO1988005210A1 Thermal cycle recirculating pump for isotope purifier |
07/12/1988 | US4757203 Apparatus for isotope separation or mass analysis by a magnetic field |
07/12/1988 | US4757198 Mass analyzer system for the direct determination of organic compounds in PPB and high PPT concentrations in the gas phase |
07/05/1988 | US4755670 Fourtier transform quadrupole mass spectrometer and method |
07/05/1988 | US4755344 Method and apparatus for the production of cluster ions |
06/30/1988 | WO1988004599A1 Apparatus for translational manipulating an element such as a shaft |
06/28/1988 | US4754135 Quadruple focusing time of flight mass spectrometer |
06/22/1988 | EP0271543A1 Process for verifying the energy of an ion beam. |
06/21/1988 | US4752685 Electronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particles |
06/16/1988 | WO1988004421A1 Demand modulated atomization apparatus and method for plasma spectroscopy |
06/15/1988 | EP0270589A1 Apparatus and method for the chemical analysis of solids by spectroscopy of x photoelectrons |
06/08/1988 | EP0270232A1 Apparatus and method for the control and/or analysis of charged particles |
06/08/1988 | CN86108029A Four electrodes mass analyzer |
06/07/1988 | US4749860 Method of isolating a single mass in a quadrupole ion trap |
06/01/1988 | EP0162073B1 Introduction of samples into a mass spectrometer |
06/01/1988 | CN87103626A Electron spectrometer |
05/31/1988 | US4748407 Method and apparatus for measuring time dependent signals with a particle probe |
05/31/1988 | US4748324 Electrostatic opposing field spectrometer for electron beam test methods |
05/25/1988 | EP0268232A2 Charged particle analyzer |
05/25/1988 | EP0268048A2 Quartz quadrupole for mass filter |
05/24/1988 | US4746802 Ion cyclotron resonance spectrometer |
05/24/1988 | US4746794 Mass analyzer system with reduced drift |
05/24/1988 | US4746068 Micro-nebulizer for analytical instruments |
05/17/1988 | US4745277 Rotary turret and reusable specimen holder for mass spectrometer |
05/10/1988 | US4743756 Parallel-detection electron energy-loss spectrometer |
05/04/1988 | EP0266039A2 Time-of-flight mass spectrometry |
05/04/1988 | EP0265617A2 Micro-nebulizer for analytical instruments |
05/03/1988 | US4742224 Charged particle energy filter |
05/03/1988 | US4742223 High resolution particle spectrometer |
04/26/1988 | US4740704 Omega-type electron energy filter |
04/26/1988 | US4740697 Secondary ion mass spectrometer |
04/26/1988 | US4740696 ICP mass spectrometer |
04/26/1988 | US4740692 Laser mass spectroscopic analyzer and method |