Patents
Patents for H01J 49 - Particle spectrometers or separator tubes (20,265)
12/1988
12/29/1988DE3719788C1 Analysis system for ions
12/27/1988US4794253 Ion source for mass spectrometer
12/27/1988US4794252 Discharge ionization mass spectrometer
12/22/1988DE3810406A1 Sample carrier for the electrothermal atomisation of solids
12/21/1988EP0295653A2 High luminosity spherical analyzer for charged particles
12/21/1988EP0295253A1 Electron spectrometer.
12/14/1988EP0294683A2 Method for recording ICR mass spectra and ICR mass spectrometer developed for performance of this method
12/13/1988US4791292 Capillary membrane interface for a mass spectrometer
12/13/1988US4791291 Mass spectrometer sampling system for a liquid stream
12/13/1988US4791273 Vaporizer system for ion source
12/06/1988US4789787 Wien filter design
12/06/1988CA1246246A1 Method and apparatus having rf biasing for sampling a plasma into a vacuum chamber
12/01/1988WO1988009559A1 Improved wien filter design
11/1988
11/30/1988EP0292974A2 Atmospheric sampling glow discharge ionization source
11/29/1988US4788502 Apparatus for compensating for time-vibrant field interference in magnetic fields
11/29/1988CA1245778A1 Mass analyzer system with reduced drift
11/23/1988EP0292187A1 Method of using an ion trap in the chemical ionization mode
11/23/1988EP0292180A1 Method of operating an ion trap mass spectrometer
11/22/1988US4786806 Retarding field spectrometer
11/22/1988US4786478 Method and apparatus for isotope separation
11/17/1988WO1988009052A1 Process and device for measuring the concentration of gas mixtures
11/17/1988WO1988009051A1 Integrated charge neutralization and imaging system
11/17/1988EP0291420A1 Method of dosing with the aid of the average atomic number of phases containing a light element using a scanning microscope and an image analyser
11/17/1988EP0291341A1 Vaporizer system for ion source
11/17/1988EP0290712A1 Mass spectrometer
11/17/1988EP0290711A1 Method and device for measuring the concentration in a gas mixture
11/15/1988US4785173 Element analyzing apparatus
11/15/1988US4785172 Secondary ion mass spectrometry system and method for focused ion beam with parallel ion detection
11/09/1988EP0290046A2 Surface analyzer
10/1988
10/27/1988DE3711120A1 Fully automatic sample dispenser
10/25/1988US4780608 Laser sustained discharge nozzle apparatus for the production of an intense beam of high kinetic energy atomic species
10/20/1988WO1988008198A1 Plasma focus apparatus with field distortion elements
10/20/1988WO1988007888A1 Combined electrophoresis-electrospray interface and method
10/18/1988US4778993 Time-of-flight mass spectrometry
10/12/1988EP0286365A2 High stability mass spectrometer
10/12/1988EP0285630A1 Mass separator for ionized cluster beam.
10/05/1988EP0285215A1 Device for picking up, displacing and delivering products
10/04/1988CA1242817A1 Low-abberation spectrometer objective with high secondary electron acceptance
09/1988
09/28/1988EP0284332A2 Quadruple focusing time of flight mass spectrometer
09/27/1988US4774408 Time of flight mass spectrometer
09/27/1988CA1242536A1 Method of operating ion trap detector in ms/ms mode
09/21/1988EP0162881B1 Introduction of samples into a mass spectrometer
09/21/1988EP0162072B1 Introduction of samples into a mass spectrometer
09/13/1988US4771172 Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode
09/13/1988US4771171 Particle handling device
09/07/1988EP0281413A2 Mass spectrometer for positive and negative ions
09/06/1988US4769543 Spectrometer lens for particle beam apparatus
09/06/1988US4769542 Charged particle energy analyzer
09/06/1988US4769540 Atmospheric pressure ionization mass spectrometer
08/1988
08/31/1988CN87100772A Charged particles detector
08/30/1988CA1241373A1 Method of operating quadropole ion trap chemical ionization mass spectrometry
08/25/1988WO1988006060A1 Photo ion spectrometer
08/23/1988US4766314 Double focusing
08/23/1988US4766313 Apparatus for quantitative secondary ion mass spectrometry
08/23/1988US4766312 Methods and apparatus for detecting negative ions from a mass spectrometer
08/17/1988EP0278736A2 Secondary ion mass spectrometer
08/17/1988EP0278034A1 Detector of charged particles
08/16/1988US4764673 Electric electron energy analyzer
08/09/1988US4762995 Monodisperse aerosol generator
08/03/1988EP0276731A2 Method for electron beam guidance with energy selection, and electron spectrometer
08/02/1988US4761545 Tailored excitation for trapped ion mass spectrometry
07/1988
07/26/1988US4760261 Alpha-type electron energy filter
07/26/1988US4760253 Mass spectrometer
07/21/1988DE3700337A1 Method and device for ionising the sample substance which is contained in a quistor
07/19/1988US4758723 Electron spectrometer
07/19/1988US4758722 Analyzing the energy of charged particles
07/19/1988US4758721 Thermal cycle recirculating pump for isotope purifier
07/14/1988WO1988005210A1 Thermal cycle recirculating pump for isotope purifier
07/12/1988US4757203 Apparatus for isotope separation or mass analysis by a magnetic field
07/12/1988US4757198 Mass analyzer system for the direct determination of organic compounds in PPB and high PPT concentrations in the gas phase
07/05/1988US4755670 Fourtier transform quadrupole mass spectrometer and method
07/05/1988US4755344 Method and apparatus for the production of cluster ions
06/1988
06/30/1988WO1988004599A1 Apparatus for translational manipulating an element such as a shaft
06/28/1988US4754135 Quadruple focusing time of flight mass spectrometer
06/22/1988EP0271543A1 Process for verifying the energy of an ion beam.
06/21/1988US4752685 Electronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particles
06/16/1988WO1988004421A1 Demand modulated atomization apparatus and method for plasma spectroscopy
06/15/1988EP0270589A1 Apparatus and method for the chemical analysis of solids by spectroscopy of x photoelectrons
06/08/1988EP0270232A1 Apparatus and method for the control and/or analysis of charged particles
06/08/1988CN86108029A Four electrodes mass analyzer
06/07/1988US4749860 Method of isolating a single mass in a quadrupole ion trap
06/01/1988EP0162073B1 Introduction of samples into a mass spectrometer
06/01/1988CN87103626A Electron spectrometer
05/1988
05/31/1988US4748407 Method and apparatus for measuring time dependent signals with a particle probe
05/31/1988US4748324 Electrostatic opposing field spectrometer for electron beam test methods
05/25/1988EP0268232A2 Charged particle analyzer
05/25/1988EP0268048A2 Quartz quadrupole for mass filter
05/24/1988US4746802 Ion cyclotron resonance spectrometer
05/24/1988US4746794 Mass analyzer system with reduced drift
05/24/1988US4746068 Micro-nebulizer for analytical instruments
05/17/1988US4745277 Rotary turret and reusable specimen holder for mass spectrometer
05/10/1988US4743756 Parallel-detection electron energy-loss spectrometer
05/04/1988EP0266039A2 Time-of-flight mass spectrometry
05/04/1988EP0265617A2 Micro-nebulizer for analytical instruments
05/03/1988US4742224 Charged particle energy filter
05/03/1988US4742223 High resolution particle spectrometer
04/1988
04/26/1988US4740704 Omega-type electron energy filter
04/26/1988US4740697 Secondary ion mass spectrometer
04/26/1988US4740696 ICP mass spectrometer
04/26/1988US4740692 Laser mass spectroscopic analyzer and method