| Patents for H01J 49 - Particle spectrometers or separator tubes (20,265) |
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| 08/01/1995 | US5438195 Method and device for the digital generation of an additional alternating voltage for the resonant excitation of ions in ion traps |
| 08/01/1995 | US5438194 Ultra-sensitive molecular identifier |
| 08/01/1995 | US5437203 Sampling device comprising a revolvable sampling wheel with a metal wheel rim |
| 08/01/1995 | CA2016129C Monodisperse aerosol generator for use with infrared spectrometry |
| 07/26/1995 | EP0664449A1 Process and apparatus for feeding gas to a gas impurity trace analyser |
| 07/25/1995 | US5436447 Method and apparatus for determining relative ion abundances in mass spectrometry utilizing wavelet transforms |
| 07/25/1995 | US5436446 Analyzing time modulated electrospray |
| 07/25/1995 | US5436445 Mass spectrometry method with two applied trapping fields having same spatial form |
| 07/20/1995 | WO1995019638A2 Ion spray with intersecting flow |
| 07/13/1995 | WO1995019042A1 Quadrupole trap ion isolation method |
| 07/13/1995 | WO1995019041A1 Space change control method for improved ion isolation in ion trap mass spectrometer by dynamically adaptive sampling |
| 07/13/1995 | WO1995018670A1 A method of space charge control in an ion trap mass spectrometer |
| 07/13/1995 | WO1995018669A1 A method of selective ion trapping for quadrupole ion trap mass spectrometers |
| 07/12/1995 | EP0662242A1 Electron energy spectrometer |
| 07/11/1995 | US5432343 Ion focusing lensing system for a mass spectrometer interfaced to an atmospheric pressure ion source |
| 07/05/1995 | EP0660966A1 Reducing interferences in plasma source mass spectrometers. |
| 06/22/1995 | WO1995012894A3 Micromachined mass spectrometer |
| 06/20/1995 | US5426301 Off-axis interface for a mass spectrometer |
| 06/20/1995 | US5426300 In a gas analyzing system |
| 06/20/1995 | US5426299 Inductive plasma mass spectrometer |
| 06/13/1995 | US5424539 Process for the analysis of gaseous components by mass spectrometry |
| 06/13/1995 | US5423964 Combined electrophoresis-electrospray interface and method |
| 06/08/1995 | DE4341144A1 Energy analyser for charged particles |
| 06/07/1995 | EP0655942A1 Method for generating filtered noise signal and broadband signal having reduced dynamic range in mass spectrometry |
| 06/06/1995 | US5422482 Mass spectrometric apparatus |
| 06/01/1995 | WO1995015001A2 Enhanced resolution maldi tof-ms sample surface |
| 06/01/1995 | WO1995008774A3 Automated continuous and random access analytical system and components thereof |
| 05/31/1995 | EP0655771A1 Quadrupole mass analyzers |
| 05/31/1995 | EP0655770A1 Vacuum inlet |
| 05/31/1995 | EP0655769A1 Method and apparatus for preparing an electrospray ion source sample |
| 05/31/1995 | EP0509986B1 Generation of an exact three-dimensional quadrupole electric field |
| 05/30/1995 | US5420425 Ion trap mass spectrometer system and method |
| 05/30/1995 | US5420423 Mass spectrometer for time dependent mass separation |
| 05/24/1995 | EP0378648B1 Icr ion trap |
| 05/16/1995 | US5416322 Interface for linking an atmospheric pressure thermogravimetric analyzer to a low pressure mass spectrometer |
| 05/11/1995 | WO1995012894A2 Micromachined mass spectrometer |
| 05/02/1995 | US5412208 Ion spray with intersecting flow |
| 05/02/1995 | US5412207 Method and apparatus for analyzing a gas sample |
| 04/19/1995 | CN2195138Y Enclosed gas discharge ion source for mass spectrograph |
| 04/18/1995 | US5408315 Glow discharge analytical instrument for performing excitation and analyzation on the same side of a sample |
| 04/12/1995 | EP0647963A2 Method and apparatus for analyzing a gas sample |
| 04/12/1995 | EP0647960A1 Energy filter with correction of a second-order chromatic aberration |
| 04/11/1995 | US5406079 Ionization device for ionizing liquid sample |
| 04/11/1995 | US5404765 Inlet valve for a high-vacuum analyzer with bypass evacuation |
| 04/07/1995 | EP0746769A4 Automated continuous and random access analytical system and components thereof |
| 04/04/1995 | US5404011 MSn using CID |
| 03/30/1995 | WO1995008774A2 Automated continuous and random access analytical system and components thereof |
| 03/29/1995 | EP0644797A1 Improved methods of using ion trap mass spectrometers |
| 03/29/1995 | EP0644796A1 Atmospheric pressure ion interface for a mass analyzer |
| 03/29/1995 | CN1100808A Quadrupole mass spectrometer |
| 03/28/1995 | US5401965 Secondary ion mass spectrometer for analyzing positive and negative ions |
| 03/28/1995 | US5401963 For analyzing a sample |
| 03/28/1995 | US5401962 Residual gas sensor utilizing a miniature quadrupole array |
| 03/28/1995 | US5400665 Sample introduction system for inductively coupled plasma and other gas-phase, or particle, detectors utilizing an enclosed filter solvent removal system, and method of use |
| 03/22/1995 | EP0644576A2 Portable gas chromatograph-mass spectrometer system using getter pump. |
| 03/22/1995 | EP0632896A4 Automated continuous and random access analytical system. |
| 03/21/1995 | US5399865 Liquid metal ion source with high temperature cleaning apparatus for cleaning the emitter and reservoir |
| 03/21/1995 | US5399857 Method and apparatus for trapping ions by increasing trapping voltage during ion introduction |
| 03/16/1995 | DE4331002A1 Laser mass spectrometer |
| 03/15/1995 | EP0643415A2 Mass spectroscopy using collision induced dissociation |
| 03/14/1995 | US5397901 Forming charges in a fluid and generation of a charged beam |
| 03/14/1995 | US5397895 Photoionization mass spectroscopy flux monitor |
| 03/14/1995 | US5397894 Method of high mass resolution scanning of an ion trap mass spectrometer |
| 03/08/1995 | EP0407539B2 Plasma mass spectrometer |
| 03/07/1995 | US5396076 Ion implantation system with protective plates of silicon in mass analyzing region |
| 03/07/1995 | US5396065 Sequencing ion packets for ion time-of-flight mass spectrometry |
| 03/07/1995 | US5396064 Quadrupole trap ion isolation method |
| 03/02/1995 | DE4430017A1 Wien's filter |
| 02/28/1995 | US5393975 Electrospray ion source and interface apparatus and method |
| 02/21/1995 | US5391870 High-speed precision mass selection system |
| 02/15/1995 | EP0511961B1 Electrospray ion source for mass spectrometry |
| 02/14/1995 | US5389793 Apparatus and methods for ion implantation |
| 02/14/1995 | US5389785 ION filter apparatus and method of production thereof |
| 02/14/1995 | US5389784 Ion cyclotron resonance cell |
| 02/09/1995 | WO1995004369A1 An ultra-sensitive molecular identifier |
| 02/08/1995 | EP0637283A1 Plastic assay cuvette having low birefringence |
| 02/07/1995 | US5387797 Detector having selective photon and neutral particle absorbent coating |
| 02/01/1995 | EP0636877A1 Glow discharge analytical instrument |
| 01/31/1995 | US5386116 Method for reducing isobaric interferences in accelerator mass spectrometry |
| 01/31/1995 | US5386115 Solid state micro-machined mass spectrograph universal gas detection sensor |
| 01/31/1995 | US5386113 Method and device for in-phase measuring of ions from ion trap mass spectrometers |
| 01/25/1995 | EP0635164A1 Sample introducing apparatus and sample modules for mass spectrometer |
| 01/24/1995 | US5384465 Spectrum analyzer in an ion implanter |
| 01/24/1995 | US5384461 Process for the manufacture of a multipolar elongate-electrode lens or mass filter |
| 01/19/1995 | WO1994027311A3 Method of plasma mass analysis with reduced space charge effects |
| 01/18/1995 | EP0634016A1 Assay verification control for analytical methods |
| 01/17/1995 | US5383019 Inductively coupled plasma spectrometers and radio-frequency power supply therefor |
| 01/17/1995 | US5382794 Laser induced mass spectrometry |
| 01/17/1995 | US5382793 Laser desorption ionization mass monitor (LDIM) |
| 01/11/1995 | EP0633602A2 High sensitivity, wide dynamic range time-of-flight mass spectrometer provided with a gas phase ion source |
| 01/11/1995 | EP0633601A2 Large aperture, low flight-time distortion detector for a time-of-flight mass spectrometer |
| 01/11/1995 | EP0633593A1 Electrom beam source and electron beam application apparatus and electronic apparatus using the same |
| 01/11/1995 | EP0632896A1 Automated continuous and random access analytical system |
| 01/11/1995 | EP0632894A1 Methods for providing homogeneous reagents |
| 01/10/1995 | US5381008 Method of plasma mass analysis with reduced space charge effects |
| 01/10/1995 | US5381007 Mass spectrometry method with two applied trapping fields having same spatial form |
| 01/10/1995 | US5381006 Methods of using ion trap mass spectrometers |
| 01/10/1995 | US5381003 Auger electron spectroscopy |
| 01/05/1995 | WO1995000237A1 Quadrupole with applied signal having off-resonance frequency |
| 01/05/1995 | WO1995000236A1 Transient recorder in time-of-flight mass spectrometer |