Patents
Patents for G21G 5 - Alleged conversion of chemical elements by chemical reaction (927)
02/2005
02/01/2005US6849858 Apparatus and method for forming alignment layers
02/01/2005US6849856 Electron beam duplication lithography method and apparatus
01/2005
01/20/2005US20050012050 Method and device for aligning a charged particle beam column
01/13/2005US20050008946 Mask for charged particle beam exposure, and method of forming the same
01/13/2005US20050008945 plasma/dry etching; photolithographic reticle; oxygen-free gas etches anti-reflective coating and patterned photoresistive material; integrated circuits
01/13/2005US20050006598 Method and device for aligning a charged particle beam column
01/06/2005WO2005001876A2 Electrostatic parallelizing lens for ion beams
01/06/2005WO2004027684B1 Photolithography mask repair
01/06/2005US20050001177 Apparatus and method for forming alignment layers
01/05/2005EP1283734B1 Device for positioning a tumour patient with a tumour in the head or neck region in a heavy-ion therapy chamber
01/04/2005US6838683 Focused ion beam microlathe
12/2004
12/30/2004US20040265709 Method for manufacturing mask for focus monitoring, and method for manufacturing semiconductor device
12/30/2004US20040263819 Airtight processing apparatus, airtight processing method, and electron beam processing apparatus
12/30/2004US20040262542 Electrostatic lens for ion beams
12/29/2004WO2004114369A2 Three-dimensional and color sensing
12/29/2004WO2004013692A3 System and method for maskless lithography using an array of sources and an array of focusing elements
12/23/2004WO2004031861A3 Method for fabrication of diffractive optical elements for maskless lithography
12/23/2004US20040256577 Focused ion beam microlathe
12/16/2004US20040253523 Embedded bi-layer structure for attenuated phase shifting mask
12/14/2004US6831419 Exhaust system for a microwave excited ultraviolet lamp
12/09/2004US20040248044 Method for manufacturing a semiconductor device, stencil mask and method for manufacturing a the same
12/02/2004US20040239256 Exhaust system for a microwave excited ultraviolet lamp
11/2004
11/11/2004US20040224238 maintenance of photomasks by coating photoresist layers on masks, then aligning using optical projectors, exposing and developing; microelectronics
11/04/2004WO2004027684A3 Photolithography mask repair
10/2004
10/20/2004EP1468426A2 Air-cooled lamp, and article treatment system and method utilizing an air-cooled lamp
10/07/2004WO2004086143A2 Multi-step process for etching photomasks
10/05/2004US6800865 Adhering nanotubes to be used as probe needles to electrode in protruding fashion, adhering base end of nanotube to surface of holder with tip end protruding, irradiating with electron beam to fasten nanotube to holder with coating film
09/2004
09/23/2004WO2004031867A3 System and method for holographic fabrication and replication of diffractive optical elements for maskless lithography
09/16/2004US20040178363 Method and apparatus for irradiation of active energy beam
09/02/2004US20040168527 Coated nanotube surface signal probe
08/2004
08/12/2004WO2004053592A8 Reticle manipulations
08/12/2004US20040155204 Mask and method for producing thereof and a semiconductor device using the same
08/10/2004US6774377 Electrostatic parallelizing lens for ion beams
08/05/2004US20040151991 Photolithography mask repair
08/04/2004CN1160762C Electronic beam exposure mask, exposure method and equipment and method for making semiconductor device
08/03/2004US6770402 Method for manufacturing a semiconductor device, stencil mask and method for manufacturing the same
07/2004
07/29/2004WO2004044653A3 Method and device for rastering source redundancy
07/15/2004US20040135100 System and method for holographic fabrication and replication of diffractive optical elements for maskless lithography
07/08/2004US20040131953 Photomask correction method using composite charged particle beam, and device used in the correction method
07/08/2004US20040131946 System and method for fabrication and replication of diffractive optical elements for maskless lithography
07/07/2004CN1510719A Mask and producing method, producing method for semiconductor device with this mask
07/01/2004US20040124372 System and method for maskless lithography using an array of sources and an array of focusing elements
06/2004
06/24/2004WO2004053592A1 Reticle manipulations
06/17/2004US20040117757 Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program
06/03/2004US20040105160 Particle-optical apparatus, electron microscopy system and electron lithography system
06/03/2004US20040104357 Electron beam exposure apparatus, electron beam exposing method, semiconductor element manufacturing method, and pattern error detection method
05/2004
05/27/2004WO2004044653A2 Method and device for rastering source redundancy
05/18/2004US6737660 Electron beam irradiation apparatus and electron beam irradiating method
05/11/2004US6734437 System and method for electron beam irradiation
05/06/2004US20040085024 Method and device for rastering source redundancy
04/2004
04/27/2004US6727508 Method and apparatus for irradiating active energy ray
04/15/2004WO2004031867A2 System and method for holographic fabrication and replication of diffractive optical elements for maskless lithography
04/15/2004WO2004031861A2 Method for fabrication of diffractive optical elements for maskless lithography
04/15/2004WO2002080213A9 Irradiation system and method
04/01/2004WO2004027684A2 Photolithography mask repair
03/2004
03/25/2004US20040056215 Electron beam exposure mask, electron beam exposure method, method of fabricating semiconductor device, and electron beam exposure apparatus
03/11/2004US20040048169 For use in irradiating a wafer with an electron beam for cell projection
03/04/2004US20040041103 Positioning apparatus, charged-particle-beam exposure apparatus, and device manufacturing method
02/2004
02/26/2004WO2004017140A1 Mask blank manufacturing method, transfer mask manufacturing method, sputtering target for manufacturing mask blank
02/19/2004WO2003081286A3 Swinging objectif retarding immersion lens electron optics focusing, deflection and signal collection system and method
02/19/2004US20040031935 Thermoelectron generating source and ion beam radiating apparatus with the same
02/18/2004EP1389797A2 Particle-optical apparatus, electron microscopy system and electron lithography system
02/12/2004WO2004013692A2 System and method for maskless lithography using an array of sources and an array of focusing elements
02/11/2004EP1388854A1 Optical disc adhesive curing device
02/05/2004US20040023133 Photoresist pattern and forming method thereof
02/05/2004US20040022426 Apparatus and method for inspecting articles
02/05/2004US20040021093 Optical disk adhesive curing device
12/2003
12/04/2003US20030223053 Methods and devices for charge management for three-dimensional and color sensing
11/2003
11/13/2003US20030209673 Electrooptic system array, charged-particle beam exposure apparatus using the same, and device manufacturing method
11/11/2003US6645676 Electron beam exposure mask, electron beam exposure method, method of fabricating semiconductor device, and electron beam exposure apparatus
10/2003
10/02/2003WO2003081286A2 Swinging objectif retarding immersion lens electron optics focusing, deflection and signal collection system and method
09/2003
09/30/2003US6627903 Methods and devices for calibrating a charged-particle-beam microlithography apparatus, and microelectronic-device fabrication methods comprising same
09/25/2003US20030178582 System and method for electron beam irradiation
09/25/2003US20030178581 Electron beam irradiation apparatus and electron beam irradiating method
09/10/2003EP0904594B9 Monolithic anode adapted for inclusion in an actinic radiation source and method of manufacturing the same
09/09/2003US6617597 Circuits and methods for electron-beam control
09/09/2003US6617596 On-line measurement of absorbed electron beam dosage in irradiated product
09/04/2003US20030164459 Device for positioning a tumour patient with a tumour in the head or neck region in a heavy-ion theraphy chamber
08/2003
08/28/2003WO2003071358A1 Method and system for repairing defected photomasks
08/27/2003EP1339085A2 System and method for electron beam irradiation
08/27/2003EP1339084A2 Electron beam irradiation apparatus and method
08/21/2003US20030155523 Quantum wells; etching, writing using electron beams; forming semiconductors
08/13/2003EP1334378A1 On-line measurement of absorbed electron beam dosage in irradiated product
08/12/2003US6605805 Swinging objective retarding immersion lens electron optics focusing, deflection and signal collection system and method
07/2003
07/03/2003US20030122073 Coated nanotube surface signal probe and method of attaching nanotube to probe holder
06/2003
06/05/2003US20030102442 Circuits and methods for electron-beam control
05/2003
05/08/2003US20030087191 Applying photosensitive layer to substrate; electron beam exposure; contacting developers
05/02/2003EP1306878A2 Method and device for aligning a charged particle beam column
05/02/2003EP0904594B1 Monolithic anode adapted for inclusion in an actinic radiation source and method of manufacturing the same
04/2003
04/16/2003EP1302971A2 Method and device for aligning a charged particle beam column
03/2003
03/05/2003EP1287549A1 An apparatus and a method for forming a pattern using a crystal structure of material
03/04/2003US6528785 Microscope probe needle
02/2003
02/27/2003WO2002080213A3 Irradiation system and method
02/19/2003EP1283734A2 Device for positioning a tumour patient with a tumour in the head or neck region in a heavy-ion therapy chamber
12/2002
12/19/2002WO2002101463A1 Patterning compositions using e-beam lithography and structures and devices made thereby
11/2002
11/21/2002WO2002093570A1 Optical disc adhesive curing device
11/07/2002US20020162971 Irradiation system and method
10/2002
10/17/2002WO2002082518A1 An apparatus and a method for forming a pattern using a crystal structure of material
10/10/2002WO2002080213A2 Irradiation system and method
10/10/2002CA2443150A1 Irradiation system and method
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