Patents
Patents for G21G 5 - Alleged conversion of chemical elements by chemical reaction (927)
08/2008
08/26/2008US7417241 Ion implantation method and method for manufacturing semiconductor device
08/26/2008US7417239 Method and device for electron beam irradiation
08/21/2008WO2008100895A2 Universal multidetection system for microplates
08/19/2008US7414252 Method and apparatus for the automated process of in-situ lift-out
08/14/2008US20080191150 Multidirectional Electromagnetic Wave Irradiation System of Workpiece and Laser Material Processing System Employing It
08/14/2008US20080191149 Universal multidetection system for microplates
08/12/2008US7411201 Projection objective for a microlithographic projection exposure apparatus
07/2008
07/22/2008US7402819 Respiration phantom for quality assurance
07/15/2008US7399978 Method and device for irradiating spots on a layer
07/10/2008US20080164424 Reducing Background Fluorescence in Arrays
07/08/2008US7397538 Radiation system and lithographic apparatus
07/08/2008US7397044 Imaging mode for linear accelerators
07/03/2008US20080157006 Debris mitigation system and lithographic apparatus
07/03/2008US20080157004 Projection system and light tunnel thereof
06/2008
06/26/2008WO2008027543A3 Confocal secondary electron imaging
06/26/2008US20080149855 Imaging of two-dimensional arrays
06/26/2008US20080149854 Illumination system, lithographic apparatus, mirror, method of removing contamination from a mirror and device manufacturing method
06/26/2008US20080149853 Light shaping apparatus
06/25/2008CN100397550C Swinging retarding immersion type lens electron optics focusing, deflection and signal collection system
06/25/2008CN100397549C System and method for fast focal length alterations
06/19/2008US20080142739 Synchronous raster scanning lithographic system
06/19/2008US20080142738 Generator for flux specific bursts on nano-particles
06/19/2008US20080142735 Charged-particle-beam processing using a cluster source
06/19/2008US20080142734 Tactical integrated illumination countermeasure system
06/12/2008US20080135782 Apparatus and method for the irradiation of radiation sensitive materials
06/12/2008US20080135751 Sample Inspection method, Sample Inspection Apparatus, and Sample Holder
06/12/2008US20080135041 Kitchen ventilator system
06/10/2008US7385205 Method and device for aligning a charged particle beam column
05/2008
05/27/2008US7378672 Particle beam therapeutic apparatus
05/27/2008US7377228 System for and method of gas cluster ion beam processing
05/20/2008US7375351 Micro-column electron beam apparatus
05/15/2008US20080111087 Infrared Detector and Process for Fabricating the Same
05/13/2008US7372052 Electron beam method and apparatus for reducing or patterning the birefringence of halogenated optical materials
05/13/2008US7372049 Lithographic apparatus including a cleaning device and method for cleaning an optical element
05/13/2008US7371485 Multi-step process for etching photomasks
05/13/2008US7371483 Monitoring apertures in radiation transparent substrate; masking; halftone film; stacks of radiation transparent materials and opacque film ; etching
05/06/2008US7368731 Method and apparatus which enable high resolution particle beam profile measurement
05/02/2008WO2008051478A2 Photobleaching by high power pulses
05/01/2008US20080099695 Sample Preparation System
04/2008
04/29/2008US7365321 Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis
04/24/2008US20080094614 Photobleaching by high power pulses
04/24/2008US20080094544 Surface modification method for polarizer, method of manufacturing polarizer, polarizer, polarizing plate, image display apparatus, liquid crystal panel, and liquid crystal display
04/22/2008US7362416 Exposure apparatus, evaluation method and device fabrication method
04/17/2008US20080088384 Manufacturing method of tuning-fork type quartz crystal resonator
04/15/2008US7358507 Liquid removal in a method and device for irradiating spots on a layer
04/10/2008US20080085559 Micro-pixelated active-matrix fluid-assay performance
04/09/2008CN100380582C Mask and producing method, producing method for semiconductor device with this mask
04/08/2008US7355189 Charged particle therapy system, range modulation wheel device, and method of installing range modulation wheel device
04/08/2008US7355186 Charged particle beam device with cleaning unit and method of operation thereof
04/03/2008US20080078946 Medical device and manufactuing method of colored medical device
04/01/2008US7351988 Beam allocation apparatus and beam allocation method for medical particle accelerators
03/2008
03/27/2008US20080073571 Exposure apparatus, pressure control method for the same, and device manufacturing method
03/27/2008US20080073570 Method of repeatedly using a control wafer to monitor treatments
03/25/2008US7348574 Position measurement system and lithographic apparatus
03/25/2008US7348104 Performing multilevel alignment; forming resist areas of different thicknesses using varied exposure characteristics; producing large focusing element arrays
03/20/2008US20080067427 Via-hole processing method
03/20/2008US20080067423 Writing error diagnosis method for charged particle beam photolithography apparatus and charged particle beam photolithography apparatus
03/20/2008US20080067421 Electron Beam Etching Apparatus and Method for the same
03/18/2008US7345291 Device for irradiation therapy with charged particles
03/18/2008US7344805 Mask and method for producing thereof and a semiconductor device using the same
03/06/2008US20080059070 Systems for autofluorescent imaging and target ablation
03/06/2008US20080054191 Novel wafer repair method using direct-writing
02/2008
02/26/2008US7335901 Method of calibrating light delivery systems, light delivery systems and radiometer for use therewith
02/26/2008US7335893 Method and device for aligning a charged particle beam column
02/21/2008US20080044740 Photomask having haze reduction layer
02/20/2008EP1292361B1 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
02/13/2008EP1540665A4 Photolithography mask repair
02/07/2008US20080029823 Semiconductor Device Having a Dual Stress Liner and Light Exposure Apparatus for Forming the Dual Stress Liner
02/05/2008US7326940 Exposure apparatus, exposure method and semiconductor device production method
02/05/2008US7326927 Focusing lens and charged particle beam device for titled landing angle operation
01/2008
01/24/2008US20080020304 Electrical, Plating And Catalytic Uses Of Metal Nanomaterial Compositions
01/17/2008US20080011969 Apparatus and Method for Forming an Alignment Layer
01/17/2008US20080011966 Direct production of thermal antineutrons and antiprotons
01/08/2008US7317192 High energy polyenergetic ion selection systems, ion beam therapy systems, and ion beam treatment centers
01/03/2008WO2006083415A3 Improving beam neutralization in low-energy high-current ribbon-beam implanters
12/2007
12/20/2007US20070290148 Sensor and sytem for sensing an electron beam
12/11/2007US7307262 Lithographic apparatus and device manufacturing method
12/11/2007US7306896 Electron beam duplication lithography method
12/04/2007US7304318 System and method for maskless lithography using an array of sources and an array of focusing elements
11/2007
11/27/2007US7301162 Particle beam irradiation system
11/22/2007WO2007133308A2 Centralized processing and management system
11/22/2007US20070267579 Photomask correction method using composite charged particle beam, and device used in the correction method
11/15/2007US20070264501 Multi-photon reactive compositions with inorganic particles and method for fabricating structures
11/15/2007US20070262272 Semiconductor mask correcting device and semiconductor mask correcting method
11/15/2007US20070262268 Method for imaging a pattern onto a target portion of a substrate
11/08/2007US20070257200 Liquid metal ion gun
11/08/2007US20070256703 Method for removing contaminant from surface of glass substrate
10/2007
10/24/2007EP1846508A2 Laser-accelerated proton therapy units and superconducting eletromagnetig systems for same
10/23/2007US7285792 Scratch repairing processing method and scanning probe microscope (SPM) used therefor
10/16/2007US7282706 Advanced optics for rapidly patterned laser profiles in analytical spectrometry
10/11/2007WO2007035389A8 Vacuum reaction chamber with x-lamp heater
10/11/2007US20070235663 Insulator system for a terminal structure of an ion implantation system
10/11/2007US20070235659 Method and device for aligning a charged particle beam column
10/04/2007US20070228525 Substrate earthing mechanism for use in charged-particle beam writing apparatus
10/04/2007US20070228293 Pattern writing and forming method
10/04/2007US20070228289 Apparatus and method for exposing a substrate to uv radiation while monitoring deterioration of the uv source and reflectors
09/2007
09/18/2007US7271400 Methods, apparatus, and systems involving ion beam generation
09/18/2007US7271396 Method and device for aligning a charged particle beam column
09/13/2007US20070210264 UV-C Sensitive composition and dosimeter
09/11/2007US7268356 Method and apparatus for specimen fabrication
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