| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/20/2010 | US7702982 Electronic device testing system and method |
| 04/20/2010 | US7702981 Structural testing using boundary scan techniques |
| 04/20/2010 | US7702980 Scan-load-based dynamic scan configuration |
| 04/20/2010 | US7702979 Semiconductor integrated circuit incorporating test configuration and test method for the same |
| 04/20/2010 | US7702978 Soft error location and sensitivity detection for programmable devices |
| 04/20/2010 | US7702977 Programmable logic devices with custom identification systems and methods |
| 04/20/2010 | US7702976 Integration of LBIST into array BISR flow |
| 04/20/2010 | US7702975 Integration of LBIST into array BISR flow |
| 04/20/2010 | US7702974 TAP time division multiplexing with scan test |
| 04/20/2010 | US7702964 Compression of data traces for an integrated circuit with multiple memories |
| 04/20/2010 | US7702810 Detecting a label-switched path outage using adjacency information |
| 04/20/2010 | US7702806 Statistics collection for network traffic |
| 04/20/2010 | US7702486 Apparatus and method for managing liquid crystal substrate |
| 04/20/2010 | US7702480 Manufacturing test and programming system |
| 04/20/2010 | US7702475 Method for inspecting electrical characteristics of chips and a storage medium for storing a program of the method |
| 04/20/2010 | US7702079 Adapter unit and method |
| 04/20/2010 | US7701902 Scheduling for sharing channel access in wireless networks |
| 04/20/2010 | US7701866 Method and device for determining a time-parameter |
| 04/20/2010 | US7701863 Decentralized SLS monitoring for throughput in a differentiated service environment |
| 04/20/2010 | US7701848 Efficient trap avoidance and shared protection method in survivable networks with shared risk link groups and a survivable network |
| 04/20/2010 | US7701845 Forwarding data in a data communications network |
| 04/20/2010 | US7701844 Method and apparatus for recognizing radio link failures associated with HSUPA and HSDPA channels |
| 04/20/2010 | US7701843 Intelligent-topology-driven alarm placement |
| 04/20/2010 | US7701542 Liquid crystal display device with data switching thin film transistor for inspection and inspection method thereof |
| 04/20/2010 | US7701280 Semiconductor integrated circuit device |
| 04/20/2010 | US7701249 IC output signal path with switch, bus holder, and buffer |
| 04/20/2010 | US7701243 Electronic device testing using a probe tip having multiple contact features |
| 04/20/2010 | US7701242 Method and apparatus for array-based electrical device characterization |
| 04/20/2010 | US7701241 Circuit for protecting DUT, method for protecting DUT, testing apparatus and testing method |
| 04/20/2010 | US7701240 Integrated circuit with error correction mechanisms to offset narrow tolerancing |
| 04/20/2010 | US7701239 Detection circuit |
| 04/20/2010 | US7701238 Active thermal control using a burn-in socket heating element |
| 04/20/2010 | US7701237 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests |
| 04/20/2010 | US7701236 Each inspection units of a probe apparatus is provided with an imaging unit to take an image of a wafer |
| 04/20/2010 | US7701235 Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same |
| 04/20/2010 | US7701234 Inspection contact structure and probe card |
| 04/20/2010 | US7701233 Heat-resistant lens kit |
| 04/20/2010 | US7701232 Rotational positioner and methods for semiconductor wafer test systems |
| 04/20/2010 | US7701231 Apparatus, system, and method for detecting cracking within an aftertreatment device |
| 04/20/2010 | US7701226 Systems and methods for determining the state of a programmable fuse in an IC |
| 04/20/2010 | US7701225 Dielectric strength test method of superconducting cable |
| 04/20/2010 | US7701224 Wire abnormality detecting device |
| 04/20/2010 | US7701223 Method for contact-free testing of antennas applied to a material web |
| 04/20/2010 | US7701200 Active test socket |
| 04/20/2010 | US7701192 System and method for removal of frequency-dependent timing distortion |
| 04/20/2010 | US7701175 Method for detecting acid stratification in a battery |
| 04/20/2010 | US7701174 Method and device for determining the charge that can be drawn from an energy accumulator |
| 04/20/2010 | US7700944 Semiconductor wafer, semiconductor chip, and semiconductor chip inspection method |
| 04/20/2010 | US7700407 Method of forming a bump-on-lead flip chip interconnection having higher escape routing density |
| 04/20/2010 | US7700394 Method for manufacturing silicon wafer method |
| 04/20/2010 | US7700382 Impurity introducing method using optical characteristics to determine annealing conditions |
| 04/20/2010 | US7700381 Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them |
| 04/20/2010 | US7700380 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 04/20/2010 | US7700379 Methods of conducting wafer level burn-in of electronic devices |
| 04/20/2010 | US7699616 High density planar electrical interface |
| 04/20/2010 | US7698932 Device for measuring uneven wear of starter brushes for vehicle |
| 04/20/2010 | US7698802 Method for manufacturing a calibration device |
| 04/15/2010 | WO2010042740A2 In situ battery tester |
| 04/15/2010 | WO2010042643A2 Photovoltaic module monitoring system |
| 04/15/2010 | WO2010042385A2 Storage device emulator and method of use thereof |
| 04/15/2010 | WO2010042176A1 Impedance optimized interface for membrane probe application |
| 04/15/2010 | WO2010041331A1 Probe pin aligning apparatus |
| 04/15/2010 | WO2010041324A1 Circuit board, circuit board assembly and misinsertion detecting device |
| 04/15/2010 | WO2010041317A1 Interface member, test section unit, and electronic component testing device |
| 04/15/2010 | WO2010041036A1 Backlit vision machine |
| 04/15/2010 | WO2010040767A1 Method and device for detecting short-circuits in the stator core of electric machines |
| 04/15/2010 | WO2008157246A8 Integrated circuit with self-test feature for validating functionality of external interfaces |
| 04/15/2010 | US20100095179 Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit |
| 04/15/2010 | US20100095178 Optimized jtag interface |
| 04/15/2010 | US20100095177 Implementing Diagnosis of Transitional Scan Chain Defects Using LBIST Test Patterns |
| 04/15/2010 | US20100095176 Parallel scan distributors and collectors and process of testing integrated circuits |
| 04/15/2010 | US20100095175 Position independent testing of circuits |
| 04/15/2010 | US20100095174 Scan frame based test access mechanisms |
| 04/15/2010 | US20100095173 Matrix system and method for debugging scan structure |
| 04/15/2010 | US20100095172 Low power testing of very large circuits |
| 04/15/2010 | US20100095171 Scan testing system, method and apparatus |
| 04/15/2010 | US20100095170 Semiconductor integrated circuit device and delay fault testing method thereof |
| 04/15/2010 | US20100095169 Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns |
| 04/15/2010 | US20100094580 Method and system for device reconfiguration for defect amelioration |
| 04/15/2010 | US20100094575 Method for diagnosing the lead-acid battery of an automobile and system for implementing the same |
| 04/15/2010 | US20100091292 Holographic condition assessment system for a structure including a semiconductor material |
| 04/15/2010 | US20100090719 Switch control unit, test apparatus and method for liquid crystal cell |
| 04/15/2010 | US20100090718 Semiconductor device, and development supporting device |
| 04/15/2010 | US20100090717 Programmable Integrated Circuit Device to Support Inductive Sensing |
| 04/15/2010 | US20100090716 Integrated Circuit Device to Support Inductive Sensing |
| 04/15/2010 | US20100090715 Active device array substrate |
| 04/15/2010 | US20100090707 Test module for radio frequency identification chips and method of the same |
| 04/15/2010 | US20100090706 Device and method for testing a circuit |
| 04/15/2010 | US20100090705 Lsi test apparatus, lsi test method, and computer product |
| 04/15/2010 | US20100090704 Test fixture |
| 04/15/2010 | US20100090675 Semiconductor device and test method therefor |
| 04/15/2010 | DE112008001433T5 Halbleiter-Testgerät und Testverfahren A semiconductor test apparatus and test procedure |
| 04/15/2010 | DE112008001358T5 Testgerät Tester |
| 04/15/2010 | DE102009034838A1 Verfahren und Vorrichtung zur Fehleranalyse von integrierten Halbleiterschaltungsvorrichtungen Method and apparatus for fault analysis of semiconductor integrated circuit devices |
| 04/15/2010 | DE102009027594A1 Verschlechterungsbestimmungsvorrichtung für eine Energiespeichervorrichtung und Verschlechterungsbestimmungsverfahren für eine Energiespeichervorrichtung Deterioration determination device for an energy storage device and deterioration determining method for an energy storage device |
| 04/15/2010 | DE102009000823B3 Photoleitende Messspitze, Messaufbau und Verwendung der photoleitenden Messspitze und/oder des Messaufbaus Photoconductive measuring tip, structure and use of the photoconductive probe tip and / or the measurement setup |
| 04/15/2010 | DE102008051028A1 Anordnung zur Absorption von elektromagnetischen Wellen und Absorberplatte Arrangement for the absorption of electromagnetic waves and absorber plate |
| 04/15/2010 | DE102008047569A1 Vorrichtung zur Batteriestatusabfrage Apparatus for battery status query |
| 04/15/2010 | DE102008047347A1 Interfaces operation testing method for smart card, involves synchronously sending data packets that are assigned to different interfaces of smart card such that last sent part of data packets simultaneously arrives at interfaces |
| 04/15/2010 | DE102008042820A1 Sensorvorrichtung sowie Verfahren für den Betrieb einer Sensorvorrichtung Sensor apparatus and method for operating a sensor device |