Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286)
05/2003
05/07/2003EP1308878A2 Capacitive sensor element for fingerprint sensor
05/07/2003EP1247269A4 Method and apparatus for active isolation in inductive loop detectors
05/07/2003EP1039389B1 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time
05/07/2003CN2549466Y Ion exchange membrance conductivity tester
05/06/2003US6559658 Noise resistant electronic presence sensor
05/06/2003US6559656 Permittivity measurement of thin films
05/06/2003US6559654 Method and system for automatic determination of inductance
05/02/2003EP1306682A2 Circuit tester
05/02/2003EP1305994A1 Grain Moisture Sensor
05/02/2003EP1305645A1 Electrical resistance monitoring device
05/01/2003WO2003036315A1 Loop impedance meter
05/01/2003WO2003036310A1 Implantable sensor electrodes and electronic circuitry
05/01/2003US20030083853 Program and method calculating resistance of a conductor in consideration of a skin effect
05/01/2003US20030080755 Proximity sensor and object detecting device
05/01/2003US20030080753 Multiple frequency grain moisture sensor for combines
04/2003
04/29/2003US6556417 Method to construct variable-area capacitive transducers
04/29/2003US6556025 DC/low frequency sub-atto signal level measurement circuit
04/29/2003US6556001 Highly time resolved impedance spectroscopy
04/24/2003WO2003012828A3 Systems and methods for measuring properties of conductive layers
04/24/2003US20030076120 System and method for measuring moisture content in a conductive environment
04/24/2003US20030076115 Display method of parameter correction conditions and recording medium on which program to display parameter correction condition is recorded
04/24/2003US20030076110 Method, apparatus and article to test fuel cells
04/24/2003US20030076082 Implantable sensor electrodes and electronic circuitry
04/24/2003DE10143595C1 Determining distance of single-pole earth connection on stub line involves measuring phase voltages, conductor currents, computing symmetrical components for different null impedances
04/23/2003CN2546883Y Mobile capacitor tester
04/23/2003CN1412795A Method for deciding condensor good or not
04/23/2003CN1106177C Hair-care appliance with hair-moistness measurement by measuring resistance of hair, and circuit for converting resistance value of aresistor into measurement signal
04/22/2003CA2409439A1 Method, apparatus and article to test fuel cells
04/17/2003WO2002084778A3 Tunable phase shifter and applications for same
04/17/2003US20030071604 Electrical resistivity probes
04/16/2003CN1410777A Network analyzer, and testing method and part selector based on same
04/16/2003CN1105921C General inductive near detector
04/16/2003CN1105920C Passive-element testing circuit for printed circuit board
04/15/2003US6549862 Vector network analyzer architecture based on sliding correlator techniques
04/15/2003US6549029 Circuit and method for measuring capacitance
04/15/2003US6549021 Apparatus for measuring the ratio of electrical signals, electric component measuring instrument, method for calibrating electric component measuring instruments and method for measuring the ratio of electrical signals
04/10/2003US20030067310 Apparatus monitoring the deposition of a liquid-to-pasty medium on a substrate
04/10/2003DE10139636C1 Electrical resistance measuring device for detonator for passenger restraint gas generator uses spring-loaded contacts for measuring short-circuit, detonator and insulation resistances
04/09/2003EP1299738A2 Circuit for determining the internal resistance of a linear lambda probe
04/08/2003US6545603 Measuring device using an indirect measurement of permittivity
04/08/2003US6545477 Method and apparatus for determining the resistivity of a formation through which a cased well passes
04/03/2003US20030065470 Method for in-service RAM testing
04/03/2003US20030065461 Laplace transform impedance spectrometer and its measurement method
04/03/2003US20030062971 Band switchable filter
04/03/2003DE10156203C1 Liquid conductivity checking method compares measured voltage across 2 electrodes immersed in liquid with upper and lower threshold values
04/02/2003EP1151310B1 Measuring method for a capacitive measuring system
04/02/2003CN1407731A Resonance antenna
04/01/2003US6542112 Interference cancellation in antenna test
04/01/2003US6541986 Sensor for the capacitive measurement of film with thicknesses
04/01/2003US6541983 Method for measuring fuse resistance in a fuse array
03/2003
03/27/2003US20030060092 Systems and methods for measuring properties of conductive layers
03/27/2003US20030058058 Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions
03/27/2003US20030057968 Liquid property sensor
03/27/2003US20030057965 Apparatus and method for measuring a phase delay characteristic
03/27/2003US20030057964 Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test
03/27/2003US20030057963 Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment
03/26/2003EP1296151A1 Collecting RF input and output and biasing signal data
03/26/2003EP1296149A1 Characterizing non-linear behavior
03/26/2003EP1296148A1 An apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test
03/26/2003CN1405569A Testing method for complex dielectric permittivity of multi-mould in one chamber, wide-frequency and multi-point microwave medium
03/26/2003CN1405568A Microwave automatic measuring device
03/25/2003US6538459 Automatic calibration system for apparatus for measuring variations in thickness of elongated samples of thin plastic film
03/25/2003US6538456 Capacitive fingerprint sensor with adjustable gain
03/20/2003WO2003023424A1 Current density vector estimating apparatus and electric conductivity estimating apparatus
03/20/2003WO2003023423A2 Dielectric constant measuring apparatus and dielectric constant measuring method
03/20/2003WO2003023422A1 Capacitance measuring circuit, capacitance measuring instrument, and microphone device
03/20/2003WO2003023421A1 Capacitance measuring circuit, capacitance measuring instrument, and microphone device
03/20/2003WO2003023420A1 Impedance measuring circuit, its method, and capacitance measuring circuit
03/20/2003WO2003023419A1 Impedance measuring circuit and capacitance measuring circuit
03/20/2003WO2003023418A2 Potential fixing device and potential fixing method
03/20/2003WO2003023417A1 Sensor capacity sensing apparatus and sensor capacity sensing method
03/20/2003US20030055613 Semi-physical modeling of HEMT DC-to high frequency electrothermal characteristics
03/20/2003US20030055586 Regularization model for electrical resistance mapping
03/19/2003EP1292836A1 Windshield dual moisture sensor
03/19/2003EP1292824A1 Method and device for the determination of at least one parameter of a mixture of a support, water and gas
03/19/2003EP1018025B1 Capacitance measurement of a dielectric medium
03/19/2003CN1403824A Check terminal for testing electronic chip element, checking method and verifying attachment thereof
03/12/2003CN2539970Y Detector for testing electric resistance of passive element
03/11/2003US6531882 Method and apparatus for measuring capacitance
03/06/2003WO2003019184A1 Biometric quality control process
03/06/2003WO2003019167A1 Regularization model for electrical resistance mapping
03/06/2003WO2002094090A3 Transformer-isolated alternating current power supply
03/06/2003US20030042928 S-parameter microscopy for semiconductor devices
03/06/2003US20030042924 Inspection terminal for inspecting electronic chip component, and inspection method and inspection apparatus using the same
03/06/2003US20030042917 Capacitance measuring systems
03/06/2003US20030041445 Measuring the impedance spectrum of the individual unit cells in a predetermined frequency region, fitting to an equivalent circuit model composed of parameters, calculating total resistances and combining like ones
03/06/2003CA2456296A1 Biometric quality control process
03/06/2003CA2451601A1 Regularization model for electrical resistance mapping
03/04/2003US6529844 Vector network measurement system
03/04/2003US6529016 Apparatus monitoring the deposition of a liquid-to-pasty medium on a substrate
03/04/2003US6529015 Signal processing apparatus
03/04/2003US6529014 Coating thickness gauge with automated zero adjustment and/or calibration
03/04/2003US6529012 Arrangement for determining the complex transmission function of a measuring device
02/2003
02/27/2003WO2003017479A2 Electronic device and method of testing and of manufacturing
02/27/2003WO2003017090A2 Network-based system for configuring a measurement system using programs generated based on a user specification
02/27/2003US20030038643 Analog method and circuit for monitoring digital events performance
02/27/2003US20030038618 Network analyzer using time sequenced measurements
02/26/2003EP1286418A1 Resonant antennas
02/26/2003EP1285393A1 S-parameter microscopy for semiconductor devices
02/25/2003US6526365 Low-power/wideband transfer function measurement method and apparatus
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