Patents for G01R 27 - Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom (22,286) |
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02/25/2003 | US6525545 Frequency domain reflection measurement device |
02/25/2003 | US6525522 System for determining the phase and magnitude of an incident signal relative to a cyclical reference signal |
02/25/2003 | US6524460 Placing in magnetic field to detect electrical and magnetic properties; using measuring coil; annealing electrode; determining gold distribution |
02/20/2003 | US20030036876 Network-based system for configuring a measurement system using configuration information generated based on a user specification |
02/20/2003 | US20030036875 Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification |
02/20/2003 | US20030036874 Network-based system for configuring a measurement system using configuration information generated based on a user specification |
02/20/2003 | US20030036872 Data acquisition instrument architecture with flexible data acquisition, processing and display |
02/20/2003 | US20030036871 System and method for online specification of measurement hardware |
02/20/2003 | US20030034922 Resonant antennas |
02/18/2003 | US6521841 Test coupon in printed wiring board |
02/18/2003 | US6521467 Characterizing semiconductor wafers with enhanced S parameter contour mapping |
02/18/2003 | US6520535 Occupant detection system |
02/13/2003 | WO2003012857A1 Testing vias and contacts in integrated circuit fabrication |
02/13/2003 | WO2003012828A2 Systems and methods for measuring properties of conductive layers |
02/13/2003 | WO2003012613A1 Electronic measurement apparatus having a function to display a function menu over a plurality of pages in a list and function menu display method |
02/13/2003 | US20030030451 Resistance measurement |
02/13/2003 | US20030030449 Apertured probes for localized measurements of a material's complex permittivity and fabrication method |
02/13/2003 | US20030030426 System for determining the phase and magnitude of an incident signal relative to a cyclical reference signal |
02/12/2003 | EP1166135B1 Circuit arrangement for measuring the resistances of a pressure-sensitive resistance mat |
02/11/2003 | US6519539 Measurement of fuel cell impedance |
02/11/2003 | US6518777 Method and apparatus for measuring insulation resistance |
02/11/2003 | US6518769 Method and device for the electrical monitoring of an electrode lead of a bipolar high-voltage D.C. transmission system |
02/11/2003 | US6518592 Apparatus, method and pattern for evaluating semiconductor device characteristics |
02/11/2003 | US6517106 Occupant detection system |
02/06/2003 | WO2003010546A1 Capacitor insulation resistance measuring method and insulation resistance measuring instrument |
02/06/2003 | WO2001088837A9 Method and apparatus for pressure sensing |
02/06/2003 | US20030028342 Method for the defect analysis of memory modules |
02/06/2003 | US20030025516 Testing vias and contacts in integrated circuit fabrication |
02/05/2003 | EP1131643B1 Method for correcting frequency- and length-dependent line attenuation for fdr-measurements carried out on high-frequency cables |
02/05/2003 | CN1395111A Electronic meter pointer indicated insulation resistance measuring method and its device |
02/05/2003 | CN1395110A Error compensation method of thermal resistance measurement by using multifunctional analogue signal circuit |
02/05/2003 | CN1395093A Square capacitance chromatographic imaging sensor |
02/05/2003 | CN1395092A One-dimensional nano line array material temp. difference electric performance testing system |
02/04/2003 | US6516281 Scanning single electron transistor microscope for imaging ambient temperature objects |
02/04/2003 | US6516222 Apparatus for determining degree of fatigue of human body |
02/04/2003 | US6515491 Structural body having a stochastic surface patterning as well as a capacitive sensor having such a structural body |
02/04/2003 | US6515489 Apparatus for sensing position of electrostatic XY-stage through time-division multiplexing |
01/30/2003 | US20030023394 Resistance measuring circuit |
01/30/2003 | US20030020635 Method and apparatus for active isolation in inductive loop detectors |
01/30/2003 | US20030020486 Method of measuring insulation resistance of capacitor and insulation resistance measuring apparatus of the same |
01/30/2003 | US20030019282 Method for seal testing capacitive sensors |
01/29/2003 | EP1279964A1 Resistance measuring circuit |
01/29/2003 | EP1279941A2 Procedure for testing the leak tightness of capacitive sensors |
01/29/2003 | EP1279042A2 Electronic circuit device with a short circuit switch and method of testing such a device |
01/29/2003 | CN1100260C Electrical measurement method for measuring conducting material structure |
01/28/2003 | US6512688 Device for evaluating cell resistances in a magnetoresistive memory |
01/28/2003 | US6512383 System for measuring the alternating current equivalent series resistance of a conductor |
01/22/2003 | EP1278407A1 Laminate with inside layer circuit used for multilayer printed circuit board for high frequency circuit, and method and device for measuring circuit impedance of the laminate with inside layer circuit |
01/21/2003 | US6509745 Method and apparatus for measuring liquid dielectric behavior |
01/21/2003 | US6509741 Method for screening multi-layer ceramic electronic component |
01/16/2003 | US20030011384 Method of measuring a characteristic of a capacitive type of sensor, a sensor charateristic measuring apparatus, a capacitive type of sensor apparatus, and an IC chip for measuring a sensor characteristic |
01/16/2003 | US20030011378 Capacitive sensor apparatus |
01/16/2003 | US20030010089 Methods and apparatus for increasing appliance measuring system accuracy |
01/16/2003 | DE10134635C1 Resistance measuring circuit e.g. for heating energy meter has charged capacitance discharged via reference resistance and measuring resistance during successive cycles |
01/15/2003 | EP1275010A2 Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester |
01/15/2003 | EP1275009A1 Method and device for analysing a network of conductors |
01/15/2003 | CN1390698A System and method for producing tyres and online determining conductivity |
01/09/2003 | WO2003003536A1 Electric circuit providing selectable short circuit for instrumentation applications |
01/09/2003 | WO2003003032A1 Method for charging a structure comprising an insulating body |
01/09/2003 | WO2002090928A3 Apparatus for automatically measuring the resistivity of semiconductor boules using the method of four probes |
01/09/2003 | US20030009109 Bioelectrical impedance measuring apparatus |
01/09/2003 | US20030006783 Apparatus and method for measuring change in capacitance |
01/07/2003 | US6504384 Apparatus of measuring capacitance and method thereof |
01/07/2003 | US6504381 Two-output voltage test system |
01/07/2003 | US6503774 Embedding parasitic model for pi-fet layouts |
01/07/2003 | US6503765 Testing vias and contacts in integrated circuit fabrication |
01/03/2003 | WO2003001438A1 Image acquisition apparatus |
01/03/2003 | CA2391182A1 Bioelectrical impedance measuring apparatus |
01/02/2003 | US20030001594 Device for the comparison of two resistors, and integrated resistor compensation system incorporating this device |
01/02/2003 | US20030001185 Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory |
12/31/2002 | US6502046 Laplace transform impedance spectrometer and its measurement method |
12/31/2002 | US6501287 Apparatus and method for measuring thickness |
12/31/2002 | US6501283 Circuit configuration for measuring the capacitance of structures in an integrated circuit |
12/31/2002 | US6501282 Highly sensitive capacitance comparison circuit |
12/27/2002 | WO2002103341A1 Conduvtivity sensor |
12/26/2002 | US20020196036 Reading apparatus |
12/26/2002 | US20020196033 Probe tone S-parameter measurements |
12/26/2002 | US20020196030 Insulation resistance measuring apparatus for capacitive electronic parts |
12/26/2002 | US20020196025 System and method for measuring fuel cell voltage and high frequency resistance |
12/25/2002 | CN1387396A 阻抗测量结构 Impedance measurement structure |
12/24/2002 | US6498709 Digital distance relay |
12/24/2002 | US6498499 Device for measuring the capacitance of electrical wires |
12/24/2002 | US6498494 Diagnostic circuit for measuring the resistance and the leakage current of at least one firing cap of a motor vehicle occupant protection system, and a motor vehicle occupant protection system including the diagnostic circuit |
12/19/2002 | WO2002101401A1 Fault detection system and method |
12/19/2002 | CA2450344A1 Fault detection system and method |
12/18/2002 | WO2001098777A1 Method and device for the determination of at least one parameter of a mixture of a support, water and gas |
12/18/2002 | EP1097385B1 Capacitative voltage divider for measuring high voltage pulses with a millisecond pulse duration |
12/18/2002 | CN2526855Y Aid for measuring leak current of capacitor |
12/18/2002 | CN1096613C Detector for organism |
12/18/2002 | CA2413495A1 Method and device for the determination of at least one parameter of a mixture of a support, water and gas |
12/17/2002 | US6496785 Network analyzer, network analytical method and recording medium |
12/17/2002 | US6496020 Method and apparatus for capacitance measurement of a dielectric medium utilizing the ratio of capacitance measurement made at different frequencies |
12/17/2002 | US6496018 Method and device for measuring dielectric constant |
12/17/2002 | US6496011 Monitoring method and monitoring device for a filter |
12/12/2002 | DE10125359A1 Potentialfreie Wechselstromquelle Potential-free AC power source |
12/11/2002 | EP1264191A2 Device and method for monitoring a capacitor bushing |
12/11/2002 | CN1096013C Apparatus for detecting output load |
12/05/2002 | WO2001029500A9 A digital eddy current proximity system: apparatus and method |
12/05/2002 | US20020180458 Method and system for automatic determination of inductance |
12/05/2002 | US20020178800 Apparatus for evaluating electrical characteristics |